TWI563272B - Test circuit board design with jtag signal series circuit - Google Patents
Test circuit board design with jtag signal series circuitInfo
- Publication number
- TWI563272B TWI563272B TW104144014A TW104144014A TWI563272B TW I563272 B TWI563272 B TW I563272B TW 104144014 A TW104144014 A TW 104144014A TW 104144014 A TW104144014 A TW 104144014A TW I563272 B TWI563272 B TW I563272B
- Authority
- TW
- Taiwan
- Prior art keywords
- board design
- signal series
- circuit board
- jtag signal
- series circuit
- Prior art date
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW104144014A TWI563272B (en) | 2015-12-28 | 2015-12-28 | Test circuit board design with jtag signal series circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW104144014A TWI563272B (en) | 2015-12-28 | 2015-12-28 | Test circuit board design with jtag signal series circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI563272B true TWI563272B (en) | 2016-12-21 |
TW201723518A TW201723518A (en) | 2017-07-01 |
Family
ID=58227448
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW104144014A TWI563272B (en) | 2015-12-28 | 2015-12-28 | Test circuit board design with jtag signal series circuit |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI563272B (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI803428B (en) * | 2022-09-19 | 2023-05-21 | 英業達股份有限公司 | System for inspecting test probe board of boundary scan interconnect equipment |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1997022013A1 (en) * | 1995-12-08 | 1997-06-19 | Samsung Electronics Co., Ltd. | Jtag testing of buses using plug-in cards with jtag logic mounted thereon |
US20050028062A1 (en) * | 2003-04-30 | 2005-02-03 | Konrad Herrmann | Test method and apparatus for high-speed semiconductor memory devices |
TWM346011U (en) * | 2008-07-14 | 2008-12-01 | Inventec Corp | Memory testing fixture |
TW201310458A (en) * | 2011-08-26 | 2013-03-01 | Powertech Technology Inc | Testing interface board specially for DRAM memory packages |
-
2015
- 2015-12-28 TW TW104144014A patent/TWI563272B/en active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1997022013A1 (en) * | 1995-12-08 | 1997-06-19 | Samsung Electronics Co., Ltd. | Jtag testing of buses using plug-in cards with jtag logic mounted thereon |
TW311176B (en) * | 1995-12-08 | 1997-07-21 | Ast Res Inc | |
US20050028062A1 (en) * | 2003-04-30 | 2005-02-03 | Konrad Herrmann | Test method and apparatus for high-speed semiconductor memory devices |
TWM346011U (en) * | 2008-07-14 | 2008-12-01 | Inventec Corp | Memory testing fixture |
TW201310458A (en) * | 2011-08-26 | 2013-03-01 | Powertech Technology Inc | Testing interface board specially for DRAM memory packages |
Also Published As
Publication number | Publication date |
---|---|
TW201723518A (en) | 2017-07-01 |
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