TWI563272B - Test circuit board design with jtag signal series circuit - Google Patents

Test circuit board design with jtag signal series circuit

Info

Publication number
TWI563272B
TWI563272B TW104144014A TW104144014A TWI563272B TW I563272 B TWI563272 B TW I563272B TW 104144014 A TW104144014 A TW 104144014A TW 104144014 A TW104144014 A TW 104144014A TW I563272 B TWI563272 B TW I563272B
Authority
TW
Taiwan
Prior art keywords
board design
signal series
circuit board
jtag signal
series circuit
Prior art date
Application number
TW104144014A
Other languages
Chinese (zh)
Other versions
TW201723518A (en
Inventor
Ping Song
Original Assignee
Inventec Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inventec Corp filed Critical Inventec Corp
Priority to TW104144014A priority Critical patent/TWI563272B/en
Application granted granted Critical
Publication of TWI563272B publication Critical patent/TWI563272B/en
Publication of TW201723518A publication Critical patent/TW201723518A/en

Links

TW104144014A 2015-12-28 2015-12-28 Test circuit board design with jtag signal series circuit TWI563272B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW104144014A TWI563272B (en) 2015-12-28 2015-12-28 Test circuit board design with jtag signal series circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW104144014A TWI563272B (en) 2015-12-28 2015-12-28 Test circuit board design with jtag signal series circuit

Publications (2)

Publication Number Publication Date
TWI563272B true TWI563272B (en) 2016-12-21
TW201723518A TW201723518A (en) 2017-07-01

Family

ID=58227448

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104144014A TWI563272B (en) 2015-12-28 2015-12-28 Test circuit board design with jtag signal series circuit

Country Status (1)

Country Link
TW (1) TWI563272B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI803428B (en) * 2022-09-19 2023-05-21 英業達股份有限公司 System for inspecting test probe board of boundary scan interconnect equipment

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997022013A1 (en) * 1995-12-08 1997-06-19 Samsung Electronics Co., Ltd. Jtag testing of buses using plug-in cards with jtag logic mounted thereon
US20050028062A1 (en) * 2003-04-30 2005-02-03 Konrad Herrmann Test method and apparatus for high-speed semiconductor memory devices
TWM346011U (en) * 2008-07-14 2008-12-01 Inventec Corp Memory testing fixture
TW201310458A (en) * 2011-08-26 2013-03-01 Powertech Technology Inc Testing interface board specially for DRAM memory packages

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997022013A1 (en) * 1995-12-08 1997-06-19 Samsung Electronics Co., Ltd. Jtag testing of buses using plug-in cards with jtag logic mounted thereon
TW311176B (en) * 1995-12-08 1997-07-21 Ast Res Inc
US20050028062A1 (en) * 2003-04-30 2005-02-03 Konrad Herrmann Test method and apparatus for high-speed semiconductor memory devices
TWM346011U (en) * 2008-07-14 2008-12-01 Inventec Corp Memory testing fixture
TW201310458A (en) * 2011-08-26 2013-03-01 Powertech Technology Inc Testing interface board specially for DRAM memory packages

Also Published As

Publication number Publication date
TW201723518A (en) 2017-07-01

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