DE69826538D1 - Verfahren und Einrichtung zur Reinigung eines Gegenstandes - Google Patents

Verfahren und Einrichtung zur Reinigung eines Gegenstandes

Info

Publication number
DE69826538D1
DE69826538D1 DE69826538T DE69826538T DE69826538D1 DE 69826538 D1 DE69826538 D1 DE 69826538D1 DE 69826538 T DE69826538 T DE 69826538T DE 69826538 T DE69826538 T DE 69826538T DE 69826538 D1 DE69826538 D1 DE 69826538D1
Authority
DE
Germany
Prior art keywords
cleaning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69826538T
Other languages
English (en)
Other versions
DE69826538T2 (de
Inventor
Yuji Kamikawa
Kinya Ueno
Satoshi Nakashima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Application granted granted Critical
Publication of DE69826538D1 publication Critical patent/DE69826538D1/de
Publication of DE69826538T2 publication Critical patent/DE69826538T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67017—Apparatus for fluid treatment
    • H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/04—Cleaning involving contact with liquid
    • B08B3/08—Cleaning involving contact with liquid the liquid having chemical or dissolving effect
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S134/00—Cleaning and liquid contact with solids
    • Y10S134/902—Semiconductor wafer

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Cleaning By Liquid Or Steam (AREA)
  • Drying Of Solid Materials (AREA)
DE69826538T 1997-01-24 1998-01-23 Verfahren und Einrichtung zur Reinigung eines Gegenstandes Expired - Lifetime DE69826538T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP01155397A JP3171807B2 (ja) 1997-01-24 1997-01-24 洗浄装置及び洗浄方法
JP1155397 1997-01-24

Publications (2)

Publication Number Publication Date
DE69826538D1 true DE69826538D1 (de) 2004-11-04
DE69826538T2 DE69826538T2 (de) 2005-03-03

Family

ID=11781148

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69826538T Expired - Lifetime DE69826538T2 (de) 1997-01-24 1998-01-23 Verfahren und Einrichtung zur Reinigung eines Gegenstandes

Country Status (7)

Country Link
US (3) US6131588A (de)
EP (1) EP0855736B1 (de)
JP (1) JP3171807B2 (de)
KR (1) KR100385037B1 (de)
CN (1) CN1205651C (de)
DE (1) DE69826538T2 (de)
TW (1) TW406330B (de)

Families Citing this family (95)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6050275A (en) * 1996-09-27 2000-04-18 Tokyo Electron Limited Apparatus for and method of cleaning objects to be processed
JP3171807B2 (ja) 1997-01-24 2001-06-04 東京エレクトロン株式会社 洗浄装置及び洗浄方法
US6068002A (en) * 1997-04-02 2000-05-30 Tokyo Electron Limited Cleaning and drying apparatus, wafer processing system and wafer processing method
US6864186B1 (en) * 1998-07-28 2005-03-08 Micron Technology, Inc. Method of reducing surface contamination in semiconductor wet-processing vessels
US6419455B1 (en) * 1999-04-07 2002-07-16 Alcatel System for regulating pressure in a vacuum chamber, vacuum pumping unit equipped with same
US6495215B1 (en) * 1999-05-26 2002-12-17 Tokyo Electron Limited Method and apparatus for processing substrate
WO2000074116A2 (en) * 1999-05-27 2000-12-07 Oliver Design, Inc. Apparatus and methods for drying batches of disks
JP3557601B2 (ja) * 1999-07-15 2004-08-25 東京エレクトロン株式会社 洗浄・乾燥処理装置及びその方法
US6982006B1 (en) * 1999-10-19 2006-01-03 Boyers David G Method and apparatus for treating a substrate with an ozone-solvent solution
US6352623B1 (en) * 1999-12-17 2002-03-05 Nutool, Inc. Vertically configured chamber used for multiple processes
US7377053B1 (en) * 2000-01-17 2008-05-27 Daikin Industries, Ltd. Method and device for drying substrate
DE10036691A1 (de) * 2000-07-27 2002-02-14 Wacker Siltronic Halbleitermat Verfahren zur chemischen Behandlung von Halbleiterscheiben
KR100691241B1 (ko) * 2000-08-24 2007-03-12 삼성전자주식회사 습식 세정 장치의 건조 장치 및 건조 방법
JP4014127B2 (ja) * 2000-10-04 2007-11-28 東京エレクトロン株式会社 基板処理方法及び基板処理装置
US6544342B1 (en) * 2000-11-28 2003-04-08 Husky Injection Molding Systems, Ltd. Acid bath for removing contaminants from a metallic article
KR100440891B1 (ko) * 2001-02-01 2004-07-19 에이펫(주) 웨이퍼 건조 방법
KR100427008B1 (ko) * 2001-02-21 2004-04-13 에이펫(주) 기판 처리 장치
JP2002353182A (ja) * 2001-05-25 2002-12-06 Mitsubishi Electric Corp 半導体装置の洗浄方法および洗浄装置、ならびに半導体装置の製造方法
US6564469B2 (en) * 2001-07-09 2003-05-20 Motorola, Inc. Device for performing surface treatment on semiconductor wafers
TW589676B (en) * 2002-01-22 2004-06-01 Toho Kasei Co Ltd Substrate drying method and apparatus
JP4020791B2 (ja) * 2002-01-22 2007-12-12 東邦化成株式会社 基板乾燥方法及び装置
JP3684356B2 (ja) 2002-03-05 2005-08-17 株式会社カイジョー 洗浄物の乾燥装置及び乾燥方法
JP3939178B2 (ja) * 2002-03-25 2007-07-04 大日本スクリーン製造株式会社 高圧乾燥装置、高圧乾燥方法および基板処理装置
JP4349606B2 (ja) * 2002-03-25 2009-10-21 大日本スクリーン製造株式会社 基板洗浄方法
DE10216786C5 (de) * 2002-04-15 2009-10-15 Ers Electronic Gmbh Verfahren und Vorrichtung zur Konditionierung von Halbleiterwafern und/oder Hybriden
JP3802446B2 (ja) * 2002-05-15 2006-07-26 東邦化成株式会社 基板乾燥方法およびその装置
US6824622B2 (en) * 2002-06-27 2004-11-30 Taiwan Semiconductor Manufacturing Co., Ltd Cleaner and method for removing fluid from an object
US6752897B2 (en) * 2002-10-22 2004-06-22 Taiwan Semiconductor Manufacturing Co., Ltd. Wet etch system with overflow particle removing feature
JP2004193329A (ja) * 2002-12-11 2004-07-08 Dainippon Screen Mfg Co Ltd 基板処理装置
JP4219799B2 (ja) * 2003-02-26 2009-02-04 大日本スクリーン製造株式会社 基板処理装置
JP4291034B2 (ja) * 2003-04-25 2009-07-08 大日本スクリーン製造株式会社 洗浄装置および基板処理装置
TW594841B (en) * 2003-05-28 2004-06-21 Au Optronics Corp Apparatus and method for preventing contamination of substrate from condensate liquid
US7244315B2 (en) * 2003-06-27 2007-07-17 Fsi International, Inc. Microelectronic device drying devices and techniques
KR100412258B1 (ko) * 2003-07-01 2003-12-31 주식회사 에스에프에이 오존수를 이용한 엘시디기판 세정방법
JP3560962B1 (ja) * 2003-07-02 2004-09-02 エス・イー・エス株式会社 基板処理法及び基板処理装置
KR100568103B1 (ko) * 2003-08-19 2006-04-05 삼성전자주식회사 반도체 기판 세정 장치 및 세정 방법
US7338565B2 (en) 2003-08-21 2008-03-04 Cinetic Automation Corporation Housingless washer
US7353832B2 (en) * 2003-08-21 2008-04-08 Cinetic Automation Corporation Housingless washer
US8361548B2 (en) * 2003-09-05 2013-01-29 Yield Engineering Systems, Inc. Method for efficient coating of substrates including plasma cleaning and dehydration
KR100653687B1 (ko) * 2003-11-04 2006-12-04 삼성전자주식회사 반도체기판들을 건조시키는 장비들 및 이를 사용하여반도체기판들을 건조시키는 방법들
JP4493649B2 (ja) * 2004-04-02 2010-06-30 東京エレクトロン株式会社 基板処理装置、基板処理方法、記録媒体およびソフトウエア
JP2006310767A (ja) * 2005-03-28 2006-11-09 Dainippon Screen Mfg Co Ltd 基板処理装置
KR100696379B1 (ko) * 2005-04-26 2007-03-19 삼성전자주식회사 세정 장치 및 이를 이용한 세정 방법
KR100697288B1 (ko) * 2005-07-20 2007-03-20 삼성전자주식회사 반도체 기판 건조 장치
GB0515754D0 (en) 2005-07-30 2005-09-07 Dyson Technology Ltd Drying apparatus
GB2428569B (en) 2005-07-30 2009-04-29 Dyson Technology Ltd Dryer
GB0515749D0 (en) 2005-07-30 2005-09-07 Dyson Technology Ltd Drying apparatus
GB0515750D0 (en) 2005-07-30 2005-09-07 Dyson Technology Ltd Drying apparatus
GB0515744D0 (en) * 2005-07-30 2005-09-07 Dyson Technology Ltd Dryer
JP4668088B2 (ja) * 2005-10-14 2011-04-13 大日本スクリーン製造株式会社 基板処理装置
KR100725108B1 (ko) * 2005-10-18 2007-06-04 삼성전자주식회사 가스 공급 장치 및 이를 갖는 기판 가공 장치
GB2434094A (en) 2006-01-12 2007-07-18 Dyson Technology Ltd Drying apparatus with sound-absorbing material
US20080066339A1 (en) * 2006-09-14 2008-03-20 Mike Wallis Apparatus and method for drying a substrate
JP5248058B2 (ja) * 2006-09-26 2013-07-31 大日本スクリーン製造株式会社 基板処理装置
JP2008082569A (ja) * 2006-09-26 2008-04-10 Kojiro Okawa 水切り乾燥装置及び水切り乾燥方法
JP4536711B2 (ja) * 2006-12-25 2010-09-01 東京エレクトロン株式会社 基板処理装置
US7775219B2 (en) * 2006-12-29 2010-08-17 Applied Materials, Inc. Process chamber lid and controlled exhaust
JP5122265B2 (ja) * 2007-10-01 2013-01-16 東京エレクトロン株式会社 基板処理装置および基板処理方法
US7727025B2 (en) * 2007-10-09 2010-06-01 Tyco Electronics Corporation Modular electrical connector with enhanced plug interface
KR101457428B1 (ko) * 2008-07-31 2014-11-06 주식회사 케이씨텍 기판세정장치
DE102008061521B4 (de) * 2008-12-10 2011-12-08 Siltronic Ag Verfahren zur Behandlung einer Halbleiterscheibe
JP5458857B2 (ja) * 2009-12-14 2014-04-02 株式会社Ｓｕｍｃｏ 洗浄方法
US20110186088A1 (en) * 2010-01-31 2011-08-04 Miller Kenneth C Substrate nest with drip remover
JP5522028B2 (ja) * 2010-03-09 2014-06-18 東京エレクトロン株式会社 基板処理装置、基板処理方法及び記憶媒体
CN101780460B (zh) * 2010-03-19 2015-04-29 上海集成电路研发中心有限公司 硅片清洗水槽和清洗方法
KR101258002B1 (ko) 2010-03-31 2013-04-24 다이닛뽕스크린 세이조오 가부시키가이샤 기판처리장치 및 기판처리방법
JP5710921B2 (ja) * 2010-09-22 2015-04-30 株式会社Ｓｃｒｅｅｎホールディングス 基板処理装置
JP4776044B1 (ja) * 2010-11-16 2011-09-21 ジャパン・フィールド株式会社 被洗浄物の洗浄装置
JP5679424B2 (ja) * 2010-11-24 2015-03-04 富士機械製造株式会社 ノズル洗浄装置および電子部品実装機
US20120305526A1 (en) * 2011-06-03 2012-12-06 Himax Technologies Limited Method of wet etching substrates for forming through holes to embed wafer level optical lens modules
JP5923300B2 (ja) * 2011-12-28 2016-05-24 株式会社Ｓｃｒｅｅｎホールディングス 基板処理装置および基板処理方法
JP2013161924A (ja) 2012-02-03 2013-08-19 Tokyo Electron Ltd 基板収容容器のパージ装置及びパージ方法
JP6133120B2 (ja) 2012-05-17 2017-05-24 株式会社荏原製作所 基板洗浄装置
JP6455962B2 (ja) 2013-03-18 2019-01-23 芝浦メカトロニクス株式会社 基板処理装置及び基板処理方法
JP6302700B2 (ja) * 2013-03-18 2018-03-28 芝浦メカトロニクス株式会社 基板処理装置及び基板処理方法
JP6351993B2 (ja) 2013-03-18 2018-07-04 芝浦メカトロニクス株式会社 基板処理装置及び基板処理方法
KR20160009656A (ko) 2013-06-24 2016-01-26 미쓰비시덴키 가부시키가이샤 태양광 발전 장치용 기판의 제조 방법 및 태양광 발전 장치용 기판의 제조 장치
CN103871938B (zh) * 2014-03-31 2016-10-12 上海华力微电子有限公司 用于清洗半导体晶圆的清洗槽
JP6275578B2 (ja) * 2014-07-30 2018-02-07 株式会社東芝 処理装置、処理方法、および電子デバイスの製造方法
JP6289341B2 (ja) * 2014-10-31 2018-03-07 東京エレクトロン株式会社 基板液処理装置、排気切替ユニットおよび基板液処理方法
CN104624568B (zh) * 2014-12-18 2016-07-27 深圳市华星光电技术有限公司 一种清洗设备
SG11201710129RA (en) * 2015-06-15 2018-01-30 J E T Co Ltd Substrate processing device
JP6367763B2 (ja) * 2015-06-22 2018-08-01 株式会社荏原製作所 ウェーハ乾燥装置およびウェーハ乾燥方法
TWI550683B (zh) * 2015-07-01 2016-09-21 弘塑科技股份有限公司 用於濕製程槽的進液管路裝置
JP6509104B2 (ja) * 2015-09-30 2019-05-08 東京エレクトロン株式会社 基板液処理装置
US11194259B2 (en) * 2018-08-30 2021-12-07 Taiwan Semiconductor Manufacturing Co., Ltd. Equipment module with enhanced protection from airborne contaminants, and method of operation
TWI690991B (zh) * 2019-01-23 2020-04-11 弘塑科技股份有限公司 批次基板濕式處理裝置及批次基板濕式處理方法
JP7281925B2 (ja) * 2019-03-07 2023-05-26 東京エレクトロン株式会社 基板処理装置、基板処理方法および記憶媒体
JP7314634B2 (ja) * 2019-06-11 2023-07-26 東京エレクトロン株式会社 塗布装置及び塗布方法
CN110335839B (zh) * 2019-07-05 2022-02-22 西安奕斯伟材料科技有限公司 一种片盒清洗装置及方法
CN110694991A (zh) * 2019-10-22 2020-01-17 长江存储科技有限责任公司 晶圆清洗装置
KR102266933B1 (ko) * 2019-12-30 2021-06-21 주식회사 금호 도금액 제거용 초음파 세척장치
CN112371611B (zh) * 2020-10-13 2022-02-01 江苏亚电科技有限公司 一种无篮晶圆清洗装置
TWI809449B (zh) * 2020-10-22 2023-07-21 南亞科技股份有限公司 氣體沖洗裝置以及氣體沖洗方法
CN112744419B (zh) * 2020-11-27 2023-11-03 乐金显示光电科技(中国)有限公司 显示面板斑点抑制方法及抑制设备

Family Cites Families (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU565727A1 (ru) * 1975-06-06 1977-07-25 Предприятие П/Я Р-6793 Установка дл очистки деталей
US4077467A (en) * 1976-01-28 1978-03-07 Spigarelli Donald J Method and apparatus for soldering, fusing or brazing
SU707994A1 (ru) * 1977-04-13 1980-01-05 Предприятие П/Я В-2190 Установка дл очистки в органических растворител х
US4558524A (en) * 1982-10-12 1985-12-17 Usm Corporation Single vapor system for soldering, fusing or brazing
US4493333A (en) * 1982-11-23 1985-01-15 Interlab, Inc. Corrosion-resistant work transfer system
JPS61152020A (ja) 1984-12-26 1986-07-10 Hitachi Tokyo Electronics Co Ltd 処理装置
US4736758A (en) * 1985-04-15 1988-04-12 Wacom Co., Ltd. Vapor drying apparatus
DE3884435T2 (de) 1987-03-25 1994-02-17 Hitachi Ltd Verfahren zur Erzeugung hochreinen Wassers und Verfahren zur Verwendung dieses Wassers.
US5105556A (en) 1987-08-12 1992-04-21 Hitachi, Ltd. Vapor washing process and apparatus
JPS6481230A (en) 1987-09-24 1989-03-27 Hitachi Ltd Treatment device
JPH088228B2 (ja) 1988-12-09 1996-01-29 株式会社エンヤシステム リフトドライ装置
US4983527A (en) * 1989-05-26 1991-01-08 Arizona Board Of Regents Oocyte test for detection of tumor promoting compounds
JPH0370134A (ja) * 1989-08-09 1991-03-26 Fujitsu Ltd 溶剤蒸気乾燥装置および乾燥方法
US4983223A (en) * 1989-10-24 1991-01-08 Chenpatents Apparatus and method for reducing solvent vapor losses
JPH0371627U (de) * 1989-11-14 1991-07-19
JPH0831409B2 (ja) * 1990-02-14 1996-03-27 株式会社東芝 化合物半導体装置およびその製造方法
NZ241034A (en) 1990-12-17 1995-03-28 Minnesota Mining & Mfg Inhaler device with a dosage control that deactivates an aerosol generator after predetermined time or dosage
JPH04225230A (ja) * 1990-12-26 1992-08-14 Nippon Semiconductor Kk 湿式洗浄装置
JPH04251930A (ja) 1990-12-29 1992-09-08 Dainippon Screen Mfg Co Ltd 洗浄処理後の基板の乾燥処理方法並びに乾燥処理装置
US5488964A (en) * 1991-05-08 1996-02-06 Tokyo Electron Limited Washing apparatus, and washing method
US5156173A (en) * 1991-05-14 1992-10-20 Envirosolv High-efficiency, low-emissions cleaning method and apparatus
JP3154814B2 (ja) 1991-06-28 2001-04-09 株式会社東芝 半導体ウエハの洗浄方法および洗浄装置
US5267581A (en) * 1992-01-03 1993-12-07 Morinaud Pierre C Pollution abating vapor trap and condenser apparatus
JP2804210B2 (ja) * 1992-01-22 1998-09-24 ジャパン・フィールド株式会社 洗浄装置
JPH06459A (ja) * 1992-06-19 1994-01-11 T H I Syst Kk 洗浄乾燥方法とその装置
JP2902222B2 (ja) 1992-08-24 1999-06-07 東京エレクトロン株式会社 乾燥処理装置
JP3003016B2 (ja) * 1992-12-25 2000-01-24 東京エレクトロン株式会社 処理装置及び処理方法
US5327920A (en) * 1993-02-23 1994-07-12 Detrex Corporation Automated apparatus and vapor/immersion cleaning method for soiled parts
JPH06283496A (ja) 1993-03-26 1994-10-07 Dainippon Screen Mfg Co Ltd 洗浄処理後の基板の乾燥処理装置
JPH06283497A (ja) 1993-03-26 1994-10-07 Dainippon Screen Mfg Co Ltd 洗浄処理後の基板の乾燥処理装置
JP3347814B2 (ja) * 1993-05-17 2002-11-20 大日本スクリーン製造株式会社 基板の洗浄・乾燥処理方法並びにその処理装置
JP3341033B2 (ja) * 1993-06-22 2002-11-05 忠弘 大見 回転薬液洗浄方法及び洗浄装置
JP3126858B2 (ja) 1993-10-29 2001-01-22 大日本スクリーン製造株式会社 基板の表面処理装置
JPH08148457A (ja) 1994-11-15 1996-06-07 Tadahiro Omi ウェットステーション並びにそのウェットステーションを用いたウェット洗浄方法及びウェット洗浄装置
TW301761B (de) * 1994-11-29 1997-04-01 Sharp Kk
TW310452B (de) * 1995-12-07 1997-07-11 Tokyo Electron Co Ltd
JP3690619B2 (ja) * 1996-01-12 2005-08-31 忠弘 大見 洗浄方法及び洗浄装置
US6045624A (en) * 1996-09-27 2000-04-04 Tokyo Electron Limited Apparatus for and method of cleaning objects to be processed
US6050275A (en) * 1996-09-27 2000-04-18 Tokyo Electron Limited Apparatus for and method of cleaning objects to be processed
JP3171807B2 (ja) * 1997-01-24 2001-06-04 東京エレクトロン株式会社 洗浄装置及び洗浄方法
US6068002A (en) * 1997-04-02 2000-05-30 Tokyo Electron Limited Cleaning and drying apparatus, wafer processing system and wafer processing method
US6164297A (en) * 1997-06-13 2000-12-26 Tokyo Electron Limited Cleaning and drying apparatus for objects to be processed
JPH1126423A (ja) * 1997-07-09 1999-01-29 Sugai:Kk 半導体ウエハ等の処理方法並びにその処理装置
DE19832038A1 (de) * 1997-07-17 1999-01-28 Tokyo Electron Ltd Verfahren und Einrichtung zum Reinigen und Trocknen

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US6131588A (en) 2000-10-17
TW406330B (en) 2000-09-21
DE69826538T2 (de) 2005-03-03
JPH10209110A (ja) 1998-08-07
CN1194454A (zh) 1998-09-30
US6319329B1 (en) 2001-11-20
JP3171807B2 (ja) 2001-06-04
EP0855736A2 (de) 1998-07-29
EP0855736B1 (de) 2004-09-29
US6491045B2 (en) 2002-12-10
KR19980070821A (ko) 1998-10-26
CN1205651C (zh) 2005-06-08
KR100385037B1 (ko) 2003-08-21
US20020017315A1 (en) 2002-02-14
EP0855736A3 (de) 1998-08-19

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