DE4010720C2 - Verfahren zur Herstellung eines geschichteten Grabenkondensators zur Verwendung in einem dynamischen Speicher - Google Patents

Verfahren zur Herstellung eines geschichteten Grabenkondensators zur Verwendung in einem dynamischen Speicher

Info

Publication number
DE4010720C2
DE4010720C2 DE4010720A DE4010720A DE4010720C2 DE 4010720 C2 DE4010720 C2 DE 4010720C2 DE 4010720 A DE4010720 A DE 4010720A DE 4010720 A DE4010720 A DE 4010720A DE 4010720 C2 DE4010720 C2 DE 4010720C2
Authority
DE
Germany
Prior art keywords
trench
silicon layer
layer
thermal oxide
mos transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE4010720A
Other languages
German (de)
English (en)
Other versions
DE4010720A1 (de
Inventor
Young Jong Lee
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SK Hynix Inc
Original Assignee
Goldstar Electron Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Goldstar Electron Co Ltd filed Critical Goldstar Electron Co Ltd
Publication of DE4010720A1 publication Critical patent/DE4010720A1/de
Application granted granted Critical
Publication of DE4010720C2 publication Critical patent/DE4010720C2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B12/00Dynamic random access memory [DRAM] devices
    • H10B12/30DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
    • H10B12/37DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells the capacitor being at least partially in a trench in the substrate
    • H10B12/377DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells the capacitor being at least partially in a trench in the substrate having a storage electrode extension located over the transistor
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B12/00Dynamic random access memory [DRAM] devices
    • H10B12/01Manufacture or treatment
    • H10B12/02Manufacture or treatment for one transistor one-capacitor [1T-1C] memory cells
    • H10B12/03Making the capacitor or connections thereto
    • H10B12/038Making the capacitor or connections thereto the capacitor being in a trench in the substrate

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Semiconductor Memories (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE4010720A 1989-08-23 1990-04-03 Verfahren zur Herstellung eines geschichteten Grabenkondensators zur Verwendung in einem dynamischen Speicher Expired - Fee Related DE4010720C2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019890012019A KR930006973B1 (ko) 1989-08-23 1989-08-23 디램의 스택 트렌치 커패시터 제조방법

Publications (2)

Publication Number Publication Date
DE4010720A1 DE4010720A1 (de) 1991-02-28
DE4010720C2 true DE4010720C2 (de) 1994-05-05

Family

ID=19289171

Family Applications (1)

Application Number Title Priority Date Filing Date
DE4010720A Expired - Fee Related DE4010720C2 (de) 1989-08-23 1990-04-03 Verfahren zur Herstellung eines geschichteten Grabenkondensators zur Verwendung in einem dynamischen Speicher

Country Status (6)

Country Link
JP (1) JPH0724282B2 (ko)
KR (1) KR930006973B1 (ko)
DE (1) DE4010720C2 (ko)
FR (1) FR2651368B1 (ko)
GB (1) GB2235335B (ko)
NL (1) NL193765C (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20000058506A (ko) * 2000-06-07 2000-10-05 이순환 열기관 압축링에 삽입하여 열효율을 높이는 황동핀
GB201617276D0 (en) 2016-10-11 2016-11-23 Big Solar Limited Energy storage

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62120070A (ja) * 1985-11-20 1987-06-01 Toshiba Corp 半導体記憶装置
JPH01101664A (ja) * 1987-10-15 1989-04-19 Nec Corp 半導体集積回路装置
JPH01179450A (ja) * 1988-01-08 1989-07-17 Oki Electric Ind Co Ltd Mos型ダイナミックメモリ集積回路とその製造方法
KR900019227A (ko) * 1988-05-18 1990-12-24 아오이 죠이치 적층형 캐피시터를 갖춘 반도체기억장치 및 그 제조방법
JPH02177359A (ja) * 1988-12-27 1990-07-10 Nec Corp 半導体記憶装置
JP4093614B2 (ja) * 1997-06-11 2008-06-04 旭化成ケミカルズ株式会社 固着剤組成物
JPH1179450A (ja) * 1997-09-12 1999-03-23 Mita Ind Co Ltd 自動原稿搬送装置の原稿分離機構

Also Published As

Publication number Publication date
DE4010720A1 (de) 1991-02-28
GB9017025D0 (en) 1990-09-19
NL193765C (nl) 2000-09-04
JPH0724282B2 (ja) 1995-03-15
NL9001849A (nl) 1991-03-18
GB2235335A (en) 1991-02-27
FR2651368A1 (fr) 1991-03-01
JPH0385757A (ja) 1991-04-10
FR2651368B1 (fr) 1991-11-29
GB2235335B (en) 1994-03-02
KR910005297A (ko) 1991-03-30
KR930006973B1 (ko) 1993-07-24
NL193765B (nl) 2000-05-01

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee