CN1283830C - 钽溅蚀靶和形成金属件的方法 - Google Patents
钽溅蚀靶和形成金属件的方法 Download PDFInfo
- Publication number
- CN1283830C CN1283830C CNB988141183A CN98814118A CN1283830C CN 1283830 C CN1283830 C CN 1283830C CN B988141183 A CNB988141183 A CN B988141183A CN 98814118 A CN98814118 A CN 98814118A CN 1283830 C CN1283830 C CN 1283830C
- Authority
- CN
- China
- Prior art keywords
- tantalum
- forging
- sputter target
- blank
- target
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C27/00—Alloys based on rhenium or a refractory metal not mentioned in groups C22C14/00 or C22C16/00
- C22C27/02—Alloys based on vanadium, niobium, or tantalum
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
- B21J—FORGING; HAMMERING; PRESSING METAL; RIVETING; FORGE FURNACES
- B21J5/00—Methods for forging, hammering, or pressing; Special equipment or accessories therefor
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C27/00—Alloys based on rhenium or a refractory metal not mentioned in groups C22C14/00 or C22C16/00
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Forging (AREA)
- Physical Vapour Deposition (AREA)
- Laminated Bodies (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/098,760 US6348139B1 (en) | 1998-06-17 | 1998-06-17 | Tantalum-comprising articles |
| US09/098760 | 1998-06-17 | ||
| US09/098,760 | 1998-06-17 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1307646A CN1307646A (zh) | 2001-08-08 |
| CN1283830C true CN1283830C (zh) | 2006-11-08 |
Family
ID=22270767
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB988141183A Expired - Lifetime CN1283830C (zh) | 1998-06-17 | 1998-09-08 | 钽溅蚀靶和形成金属件的方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (3) | US6348139B1 (enExample) |
| EP (1) | EP1088115A4 (enExample) |
| JP (1) | JP2002518593A (enExample) |
| KR (1) | KR100512295B1 (enExample) |
| CN (1) | CN1283830C (enExample) |
| TW (1) | TW515848B (enExample) |
| WO (1) | WO1999066100A1 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102517550A (zh) * | 2011-12-20 | 2012-06-27 | 宁波江丰电子材料有限公司 | 高纯钽靶材的制备方法和高纯钽靶材 |
Families Citing this family (61)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6569270B2 (en) | 1997-07-11 | 2003-05-27 | Honeywell International Inc. | Process for producing a metal article |
| US6323055B1 (en) | 1998-05-27 | 2001-11-27 | The Alta Group, Inc. | Tantalum sputtering target and method of manufacture |
| US6348139B1 (en) | 1998-06-17 | 2002-02-19 | Honeywell International Inc. | Tantalum-comprising articles |
| US6348113B1 (en) * | 1998-11-25 | 2002-02-19 | Cabot Corporation | High purity tantalum, products containing the same, and methods of making the same |
| US20040072009A1 (en) * | 1999-12-16 | 2004-04-15 | Segal Vladimir M. | Copper sputtering targets and methods of forming copper sputtering targets |
| US6878250B1 (en) | 1999-12-16 | 2005-04-12 | Honeywell International Inc. | Sputtering targets formed from cast materials |
| US6331233B1 (en) | 2000-02-02 | 2001-12-18 | Honeywell International Inc. | Tantalum sputtering target with fine grains and uniform texture and method of manufacture |
| US7517417B2 (en) * | 2000-02-02 | 2009-04-14 | Honeywell International Inc. | Tantalum PVD component producing methods |
| JP2001303240A (ja) * | 2000-04-26 | 2001-10-31 | Toshiba Corp | スパッタリングターゲット |
| CN1328409C (zh) | 2000-05-22 | 2007-07-25 | 卡伯特公司 | 铌溅射靶及其制造方法 |
| AU2001265309A1 (en) * | 2000-06-02 | 2001-12-17 | Honeywell International, Inc. | Fine grain size material, sputtering target, methods of forming, and micro-arc reduction method |
| JP4825345B2 (ja) * | 2000-08-24 | 2011-11-30 | 株式会社東芝 | スパッタリングターゲットとそれを用いたバリア層および電子デバイスの形成方法 |
| CN1257998C (zh) | 2001-01-11 | 2006-05-31 | 卡伯特公司 | 钽和铌的坯料及其制造方法 |
| HUP0303269A3 (en) * | 2001-02-20 | 2004-05-28 | H C Starck Inc Newton | Refractory metal plates with uniform texture and methods of making the same |
| US6770154B2 (en) | 2001-09-18 | 2004-08-03 | Praxair S.T. Technology, Inc. | Textured-grain-powder metallurgy tantalum sputter target |
| US20040016635A1 (en) * | 2002-07-19 | 2004-01-29 | Ford Robert B. | Monolithic sputtering target assembly |
| JP4883546B2 (ja) * | 2002-09-20 | 2012-02-22 | Jx日鉱日石金属株式会社 | タンタルスパッタリングターゲットの製造方法 |
| JP4263900B2 (ja) * | 2002-11-13 | 2009-05-13 | 日鉱金属株式会社 | Taスパッタリングターゲット及びその製造方法 |
| US6921470B2 (en) * | 2003-02-13 | 2005-07-26 | Cabot Corporation | Method of forming metal blanks for sputtering targets |
| US20040186810A1 (en) * | 2003-02-14 | 2004-09-23 | Michaluk Christopher A. | Method of supplying sputtering targets to fabricators and other users |
| JP4256388B2 (ja) * | 2003-04-01 | 2009-04-22 | 日鉱金属株式会社 | タンタルスパッタリングターゲット |
| US7228722B2 (en) * | 2003-06-09 | 2007-06-12 | Cabot Corporation | Method of forming sputtering articles by multidirectional deformation |
| JP2007523993A (ja) * | 2003-06-20 | 2007-08-23 | キャボット コーポレイション | スパッタターゲットをバッキングプレートに結合させるための方法及び設計 |
| US7892367B2 (en) * | 2003-11-06 | 2011-02-22 | Jx Nippon Mining & Metals Corporation | Tantalum sputtering target |
| US20050236076A1 (en) * | 2003-12-22 | 2005-10-27 | Michaluk Christopher A | High integrity sputtering target material and method for producing bulk quantities of same |
| WO2005080961A2 (en) * | 2004-02-18 | 2005-09-01 | Cabot Corporation | Ultrasonic method for detecting banding in metals |
| JP4980883B2 (ja) * | 2004-03-26 | 2012-07-18 | ハー ツェー シュタルク インコーポレイテッド | 高融点金属ポット |
| US8252126B2 (en) * | 2004-05-06 | 2012-08-28 | Global Advanced Metals, Usa, Inc. | Sputter targets and methods of forming same by rotary axial forging |
| US7998287B2 (en) | 2005-02-10 | 2011-08-16 | Cabot Corporation | Tantalum sputtering target and method of fabrication |
| CN101171362B (zh) * | 2005-04-28 | 2010-06-09 | 日矿金属株式会社 | 溅射靶 |
| JP4949259B2 (ja) * | 2005-10-04 | 2012-06-06 | Jx日鉱日石金属株式会社 | スパッタリングターゲット |
| US20070084527A1 (en) * | 2005-10-19 | 2007-04-19 | Stephane Ferrasse | High-strength mechanical and structural components, and methods of making high-strength components |
| JP5114812B2 (ja) | 2006-03-07 | 2013-01-09 | キャボット コーポレイション | 変形させた金属部材の製造方法 |
| US20070251818A1 (en) * | 2006-05-01 | 2007-11-01 | Wuwen Yi | Copper physical vapor deposition targets and methods of making copper physical vapor deposition targets |
| US20080110746A1 (en) * | 2006-11-09 | 2008-05-15 | Kardokus Janine K | Novel manufacturing design and processing methods and apparatus for sputtering targets |
| US9279178B2 (en) * | 2007-04-27 | 2016-03-08 | Honeywell International Inc. | Manufacturing design and processing methods and apparatus for sputtering targets |
| JP5389802B2 (ja) | 2007-08-06 | 2014-01-15 | エイチ.シー. スターク インコーポレイテッド | 組織の均一性が改善された高融点金属プレート |
| US8250895B2 (en) * | 2007-08-06 | 2012-08-28 | H.C. Starck Inc. | Methods and apparatus for controlling texture of plates and sheets by tilt rolling |
| JP5696051B2 (ja) * | 2008-11-03 | 2015-04-08 | トーソー エスエムディー,インク. | スパッターターゲットを製造する方法 |
| JP4675421B2 (ja) | 2009-03-27 | 2011-04-20 | Thk株式会社 | シリンジ駆動ユニット |
| KR101288651B1 (ko) | 2009-05-22 | 2013-07-22 | 제이엑스 닛코 닛세키 킨조쿠 가부시키가이샤 | 탄탈륨 스퍼터링 타겟 |
| CN102575336B (zh) | 2009-08-11 | 2014-03-26 | 吉坤日矿日石金属株式会社 | 钽溅射靶 |
| JP5681368B2 (ja) * | 2010-02-26 | 2015-03-04 | 株式会社神戸製鋼所 | Al基合金スパッタリングターゲット |
| EP2604718B1 (en) * | 2010-08-09 | 2015-03-18 | JX Nippon Mining & Metals Corporation | Tantalum sputtering target |
| CN103069044B (zh) | 2010-08-09 | 2015-02-18 | 吉坤日矿日石金属株式会社 | 钽溅射靶 |
| JP5731770B2 (ja) * | 2010-08-23 | 2015-06-10 | 株式会社東芝 | スパッタリングターゲットの製造方法及びスパッタリングターゲット |
| JP5291754B2 (ja) * | 2011-04-15 | 2013-09-18 | 三井金属鉱業株式会社 | 太陽電池用スパッタリングターゲット |
| KR101690394B1 (ko) | 2012-03-21 | 2016-12-27 | 제이엑스금속주식회사 | 탄탈 스퍼터링 타깃의 제조 방법 |
| CN103572223B (zh) * | 2012-08-01 | 2016-01-27 | 宁波江丰电子材料股份有限公司 | 钽靶材及钽靶材组件的制造方法 |
| SG11201501370PA (en) | 2012-12-19 | 2015-04-29 | Jx Nippon Mining & Metals Corp | Tantalum sputtering target and method for producing same |
| JP5847309B2 (ja) * | 2012-12-19 | 2016-01-20 | Jx日鉱日石金属株式会社 | タンタルスパッタリングターゲット及びその製造方法 |
| WO2014136679A1 (ja) | 2013-03-04 | 2014-09-12 | Jx日鉱日石金属株式会社 | タンタルスパッタリングターゲット及びその製造方法 |
| CN104128740A (zh) * | 2013-05-02 | 2014-11-05 | 宁波江丰电子材料股份有限公司 | 一种铜靶材的制备方法 |
| SG11201600781YA (en) | 2013-10-01 | 2016-03-30 | Jx Nippon Mining & Metals Corp | Tantalum sputtering target |
| US10655214B2 (en) | 2015-04-10 | 2020-05-19 | Tosoh Smd, Inc. | Method of making a tantalum sputter target and sputter targets made thereby |
| SG11201704463VA (en) | 2015-05-22 | 2017-07-28 | Jx Nippon Mining & Metals Corp | Tantalum sputtering target, and production method therefor |
| EP3260572A4 (en) | 2015-05-22 | 2018-08-01 | JX Nippon Mining & Metals Corporation | Tantalum sputtering target, and production method therefor |
| CN116043176A (zh) | 2015-08-03 | 2023-05-02 | 霍尼韦尔国际公司 | 具有改善性质的无摩擦锻造铝合金溅射靶 |
| TW201738395A (zh) * | 2015-11-06 | 2017-11-01 | 塔沙Smd公司 | 具有提高的沉積速率的製備鉭濺鍍靶材的方法 |
| US10900102B2 (en) | 2016-09-30 | 2021-01-26 | Honeywell International Inc. | High strength aluminum alloy backing plate and methods of making |
| KR102445159B1 (ko) * | 2020-12-21 | 2022-09-22 | 한국재료연구원 | 정적 재결정법을 이용한 금속의 강도 강화방법 |
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-
1998
- 1998-06-17 US US09/098,760 patent/US6348139B1/en not_active Expired - Lifetime
- 1998-09-08 JP JP2000554901A patent/JP2002518593A/ja active Pending
- 1998-09-08 WO PCT/US1998/018676 patent/WO1999066100A1/en not_active Ceased
- 1998-09-08 KR KR10-2000-7014206A patent/KR100512295B1/ko not_active Expired - Lifetime
- 1998-09-08 CN CNB988141183A patent/CN1283830C/zh not_active Expired - Lifetime
- 1998-09-08 EP EP98945933A patent/EP1088115A4/en not_active Ceased
-
1999
- 1999-04-27 TW TW088106727A patent/TW515848B/zh active
-
2001
- 2001-12-11 US US10/014,310 patent/US20020063056A1/en not_active Abandoned
-
2002
- 2002-04-12 US US10/122,042 patent/US20020153248A1/en not_active Abandoned
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102517550A (zh) * | 2011-12-20 | 2012-06-27 | 宁波江丰电子材料有限公司 | 高纯钽靶材的制备方法和高纯钽靶材 |
| CN102517550B (zh) * | 2011-12-20 | 2014-07-09 | 宁波江丰电子材料有限公司 | 高纯钽靶材的制备方法和高纯钽靶材 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2002518593A (ja) | 2002-06-25 |
| EP1088115A4 (en) | 2005-03-30 |
| EP1088115A1 (en) | 2001-04-04 |
| CN1307646A (zh) | 2001-08-08 |
| US20020063056A1 (en) | 2002-05-30 |
| WO1999066100A1 (en) | 1999-12-23 |
| KR20010071476A (ko) | 2001-07-28 |
| US20020153248A1 (en) | 2002-10-24 |
| US6348139B1 (en) | 2002-02-19 |
| KR100512295B1 (ko) | 2005-09-05 |
| TW515848B (en) | 2003-01-01 |
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