CN1116613C - 在使用单台设备的密闭环境中用作集成电路的探测、测试、老化、修复和编程的方法及设备 - Google Patents

在使用单台设备的密闭环境中用作集成电路的探测、测试、老化、修复和编程的方法及设备 Download PDF

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CN1116613C
CN1116613C CN96195460A CN96195460A CN1116613C CN 1116613 C CN1116613 C CN 1116613C CN 96195460 A CN96195460 A CN 96195460A CN 96195460 A CN96195460 A CN 96195460A CN 1116613 C CN1116613 C CN 1116613C
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integrated circuits
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CN1191019A (zh
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格伦·利迪
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    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
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  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
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CN96195460A 1995-06-07 1996-05-31 在使用单台设备的密闭环境中用作集成电路的探测、测试、老化、修复和编程的方法及设备 Expired - Fee Related CN1116613C (zh)

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US08/474,489 US6288561B1 (en) 1988-05-16 1995-06-07 Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus
US08/474,489 1995-06-07

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