ATE227487T1 - Bildaufnahmesystem, integrierte festkörperbildaufnahmehalbleiterschaltung - Google Patents
Bildaufnahmesystem, integrierte festkörperbildaufnahmehalbleiterschaltungInfo
- Publication number
- ATE227487T1 ATE227487T1 AT96926633T AT96926633T ATE227487T1 AT E227487 T1 ATE227487 T1 AT E227487T1 AT 96926633 T AT96926633 T AT 96926633T AT 96926633 T AT96926633 T AT 96926633T AT E227487 T1 ATE227487 T1 AT E227487T1
- Authority
- AT
- Austria
- Prior art keywords
- image recording
- timing
- photoelectric conversion
- conversion element
- signal
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N25/771—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising storage means other than floating diffusion
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
- H04N25/621—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels for the control of blooming
- H04N25/623—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels for the control of blooming by evacuation via the output or reset lines
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
- H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
- H04N25/677—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction for reducing the column or line fixed pattern noise
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
- H10F39/182—Colour image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/803—Pixels having integrated switching, control, storage or amplification elements
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Printers Or Recording Devices Using Electromagnetic And Radiation Means (AREA)
- Facsimile Heads (AREA)
Applications Claiming Priority (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20614395 | 1995-08-11 | ||
| JP20614495 | 1995-08-11 | ||
| JP20614295 | 1995-08-11 | ||
| JP20614095 | 1995-08-11 | ||
| JP5322096 | 1996-03-11 | ||
| JP5984596 | 1996-03-15 | ||
| PCT/JP1996/002285 WO1997007631A1 (en) | 1995-08-11 | 1996-08-12 | Image system, solid-state imaging device semiconductor integrated circuit, and differential output method used in the system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE227487T1 true ATE227487T1 (de) | 2002-11-15 |
Family
ID=27550518
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT96926633T ATE227487T1 (de) | 1995-08-11 | 1996-08-12 | Bildaufnahmesystem, integrierte festkörperbildaufnahmehalbleiterschaltung |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7113213B2 (de) |
| EP (1) | EP0845900B1 (de) |
| JP (1) | JP3966557B2 (de) |
| KR (1) | KR100267383B1 (de) |
| AT (1) | ATE227487T1 (de) |
| DE (1) | DE69624714T2 (de) |
| WO (1) | WO1997007631A1 (de) |
Families Citing this family (57)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100267383B1 (ko) | 1995-08-11 | 2000-10-16 | 니시무로 타이죠 | 화상시스템, 그 시스템에 이용되는 고체촬상장치 반도체 집적회로 및 차분출력방법 |
| US6977684B1 (en) | 1998-04-30 | 2005-12-20 | Canon Kabushiki Kaisha | Arrangement of circuits in pixels, each circuit shared by a plurality of pixels, in image sensing apparatus |
| JP4200545B2 (ja) * | 1998-06-08 | 2008-12-24 | ソニー株式会社 | 固体撮像素子およびその駆動方法、並びにカメラシステム |
| US6677996B1 (en) * | 1999-04-21 | 2004-01-13 | Pictos Technologies, Inc. | Real time camera exposure control |
| US6704050B1 (en) | 1999-04-23 | 2004-03-09 | Polaroid Corporation | Active-pixel image sensing device with linear mode voltage to current conversion |
| JP2001298663A (ja) | 2000-04-12 | 2001-10-26 | Semiconductor Energy Lab Co Ltd | 半導体装置およびその駆動方法 |
| JP3658278B2 (ja) * | 2000-05-16 | 2005-06-08 | キヤノン株式会社 | 固体撮像装置およびそれを用いた固体撮像システム |
| US7430025B2 (en) | 2000-08-23 | 2008-09-30 | Semiconductor Energy Laboratory Co., Ltd. | Portable electronic device |
| JP2002189533A (ja) * | 2000-08-23 | 2002-07-05 | Semiconductor Energy Lab Co Ltd | 携帯型の電子機器 |
| US6750437B2 (en) * | 2000-08-28 | 2004-06-15 | Canon Kabushiki Kaisha | Image pickup apparatus that suitably adjusts a focus |
| US6781567B2 (en) * | 2000-09-29 | 2004-08-24 | Seiko Epson Corporation | Driving method for electro-optical device, electro-optical device, and electronic apparatus |
| CN101257743B (zh) | 2001-08-29 | 2011-05-25 | 株式会社半导体能源研究所 | 发光器件及这种发光器件的驱动方法 |
| JP4135360B2 (ja) * | 2001-12-25 | 2008-08-20 | ソニー株式会社 | 固体撮像装置 |
| JP4082056B2 (ja) | 2002-03-28 | 2008-04-30 | コニカミノルタホールディングス株式会社 | 固体撮像装置 |
| JP2003324239A (ja) * | 2002-04-26 | 2003-11-14 | Motorola Inc | 発光素子駆動回路 |
| JP3934506B2 (ja) * | 2002-08-06 | 2007-06-20 | オリンパス株式会社 | 撮像システムおよび画像処理プログラム |
| JP2004112422A (ja) | 2002-09-19 | 2004-04-08 | Canon Inc | 撮像装置 |
| US20040085469A1 (en) * | 2002-10-30 | 2004-05-06 | Eastman Kodak Company | Method to eliminate bus voltage drop effects for pixel source follower amplifiers |
| JP3988189B2 (ja) * | 2002-11-20 | 2007-10-10 | ソニー株式会社 | 固体撮像装置 |
| US7436010B2 (en) | 2003-02-13 | 2008-10-14 | Matsushita Electric Industrial Co., Ltd. | Solid state imaging apparatus, method for driving the same and camera using the same |
| DE602004021985D1 (de) * | 2003-03-25 | 2009-08-27 | Panasonic Corp | Bildaufnahmevorrichtung, die Detailverlust schattiger Bereiche vermeidet |
| US7136763B2 (en) * | 2003-06-17 | 2006-11-14 | General Motors Corporation | Increasing current and voltage sensor accuracy and resolution in electric and hybrid electric vehicles |
| KR100959775B1 (ko) * | 2003-09-25 | 2010-05-27 | 삼성전자주식회사 | 스캔 드라이버와, 이를 갖는 평판표시장치 및 이의 구동방법 |
| US7385636B2 (en) * | 2004-04-30 | 2008-06-10 | Eastman Kodak Company | Low noise sample and hold circuit for image sensors |
| JP2006005711A (ja) * | 2004-06-18 | 2006-01-05 | Iwate Toshiba Electronics Co Ltd | Cmosイメージセンサ |
| JP4279880B2 (ja) * | 2004-07-06 | 2009-06-17 | パナソニック株式会社 | 固体撮像装置 |
| JP2006033631A (ja) * | 2004-07-20 | 2006-02-02 | Matsushita Electric Ind Co Ltd | 固体撮像装置及びサンプリング回路 |
| JP4425809B2 (ja) * | 2005-02-03 | 2010-03-03 | 富士通マイクロエレクトロニクス株式会社 | 撮像装置 |
| JPWO2006093096A1 (ja) * | 2005-02-28 | 2008-08-07 | 松下電器産業株式会社 | 固体撮像装置、及びその駆動方法 |
| US7568628B2 (en) | 2005-03-11 | 2009-08-04 | Hand Held Products, Inc. | Bar code reading device with global electronic shutter control |
| JP4768305B2 (ja) * | 2005-04-15 | 2011-09-07 | 岩手東芝エレクトロニクス株式会社 | 固体撮像装置 |
| US7770799B2 (en) | 2005-06-03 | 2010-08-10 | Hand Held Products, Inc. | Optical reader having reduced specular reflection read failures |
| US9107568B2 (en) * | 2005-06-17 | 2015-08-18 | Intellectual Ventures Ii Llc | Capsule type endoscope and method for fabricating the same |
| KR100818027B1 (ko) * | 2005-09-16 | 2008-03-31 | 가시오게산키 가부시키가이샤 | 촬상장치 및 촬상방법 |
| JP4713997B2 (ja) * | 2005-10-28 | 2011-06-29 | 株式会社東芝 | 固体撮像装置 |
| US7952158B2 (en) * | 2007-01-24 | 2011-05-31 | Micron Technology, Inc. | Elevated pocket pixels, imaging devices and systems including the same and method of forming the same |
| JP5016255B2 (ja) * | 2006-02-22 | 2012-09-05 | 富士フイルム株式会社 | ノイズ低減装置ならびにその制御方法およびその制御プログラムならびに撮像装置およびディジタル・カメラ |
| JP2008011297A (ja) * | 2006-06-30 | 2008-01-17 | Fujitsu Ltd | 撮像装置及び増幅回路 |
| US8184190B2 (en) * | 2006-11-28 | 2012-05-22 | Youliza, Gehts B.V. Limited Liability Company | Simultaneous global shutter and correlated double sampling read out in multiple photosensor pixels |
| GB2451678A (en) * | 2007-08-10 | 2009-02-11 | Sensl Technologies Ltd | Silicon photomultiplier circuitry for minimal onset and recovery times |
| DE102008031498B4 (de) * | 2008-07-03 | 2012-03-08 | Infineon Technologies Ag | Taktbestimmung eines Sensors |
| JP5045380B2 (ja) | 2007-11-13 | 2012-10-10 | ソニー株式会社 | 撮像装置および撮像データ補正方法並びにプログラム |
| US8059173B2 (en) * | 2008-09-26 | 2011-11-15 | On Semiconductor Trading Ltd. | Correlated double sampling pixel and method |
| US20100098399A1 (en) * | 2008-10-17 | 2010-04-22 | Kurt Breish | High intensity, strobed led micro-strip for microfilm imaging system and methods |
| WO2010058631A1 (ja) * | 2008-11-21 | 2010-05-27 | シャープ株式会社 | 2次元センサアレイ、表示装置、電子機器 |
| JP5495711B2 (ja) * | 2009-10-26 | 2014-05-21 | キヤノン株式会社 | 撮像装置及び撮像システム、それらの制御方法及びそのプログラム |
| JP5866089B2 (ja) * | 2009-11-20 | 2016-02-17 | 株式会社半導体エネルギー研究所 | 電子機器 |
| TWI507934B (zh) * | 2009-11-20 | 2015-11-11 | Semiconductor Energy Lab | 顯示裝置 |
| CN102713999B (zh) | 2010-01-20 | 2016-01-20 | 株式会社半导体能源研究所 | 电子设备和电子系统 |
| JP5470181B2 (ja) * | 2010-07-09 | 2014-04-16 | パナソニック株式会社 | 固体撮像装置 |
| US9052497B2 (en) | 2011-03-10 | 2015-06-09 | King Abdulaziz City For Science And Technology | Computing imaging data using intensity correlation interferometry |
| US8976340B2 (en) | 2011-04-15 | 2015-03-10 | Advanced Scientific Concepts, Inc. | Ladar sensor for landing, docking and approach |
| US9099214B2 (en) | 2011-04-19 | 2015-08-04 | King Abdulaziz City For Science And Technology | Controlling microparticles through a light field having controllable intensity and periodicity of maxima thereof |
| JP6183718B2 (ja) | 2012-06-25 | 2017-08-23 | パナソニックIpマネジメント株式会社 | 固体撮像装置 |
| WO2016129163A1 (ja) * | 2015-02-12 | 2016-08-18 | ソニー株式会社 | 撮像装置およびその制御方法、ならびに電子機器 |
| JP7327916B2 (ja) * | 2018-09-11 | 2023-08-16 | キヤノン株式会社 | 光電変換装置および機器 |
| CN114257763B (zh) * | 2020-09-24 | 2025-03-28 | 思特威(上海)电子科技股份有限公司 | 一种电源噪声抑制电路及图像传感器 |
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| JPH0556357A (ja) | 1991-08-27 | 1993-03-05 | Konica Corp | 固体撮像装置 |
| JP2965777B2 (ja) | 1992-01-29 | 1999-10-18 | オリンパス光学工業株式会社 | 固体撮像装置 |
| JP2977060B2 (ja) | 1992-01-29 | 1999-11-10 | オリンパス光学工業株式会社 | 固体撮像装置及びその制御方法 |
| JP2884205B2 (ja) | 1992-01-29 | 1999-04-19 | オリンパス光学工業株式会社 | 固体撮像装置 |
| JP3000782B2 (ja) | 1992-02-14 | 2000-01-17 | ソニー株式会社 | 固体撮像装置 |
| JPH05316438A (ja) * | 1992-05-11 | 1993-11-26 | Sony Corp | 固体撮像装置 |
| JP3463301B2 (ja) * | 1992-05-25 | 2003-11-05 | ソニー株式会社 | 固体撮像装置及びその駆動方法 |
| JPH05336314A (ja) * | 1992-06-04 | 1993-12-17 | Matsushita Electric Ind Co Ltd | イメージセンサ |
| US5402171A (en) | 1992-09-11 | 1995-03-28 | Kabushiki Kaisha Toshiba | Electronic still camera with improved picture resolution by image shifting in a parallelogram arrangement |
| JPH0698080A (ja) | 1992-09-14 | 1994-04-08 | Hitachi Ltd | 固体撮像素子 |
| JPH06189199A (ja) * | 1992-12-21 | 1994-07-08 | Olympus Optical Co Ltd | 固体撮像装置 |
| US5625411A (en) | 1992-12-22 | 1997-04-29 | Fuji Photo Film, Ltd. | Video camera printer apparatus and method of controlling same and apparatus and method for detecting print inhibit signal |
| JPH06217205A (ja) * | 1993-01-13 | 1994-08-05 | Sony Corp | 固体撮像素子 |
| JPH06350886A (ja) | 1993-06-11 | 1994-12-22 | Olympus Optical Co Ltd | カメラ |
| JPH0730086A (ja) | 1993-06-24 | 1995-01-31 | Sony Corp | 増幅型固体撮像素子 |
| US5488415A (en) | 1993-07-09 | 1996-01-30 | Olympus Optical Co., Ltd. | Solid-state image pickup device having a photoelectric conversion detection cell with high sensitivity |
| JPH07231076A (ja) | 1994-02-17 | 1995-08-29 | Canon Inc | 光電変換装置 |
| JP3793250B2 (ja) | 1995-03-08 | 2006-07-05 | 日本放送協会 | 固体撮像装置 |
| JP3031606B2 (ja) | 1995-08-02 | 2000-04-10 | キヤノン株式会社 | 固体撮像装置と画像撮像装置 |
| JP3838665B2 (ja) | 1995-08-11 | 2006-10-25 | 株式会社 東芝 | Mos型固体撮像装置 |
| KR100267383B1 (ko) | 1995-08-11 | 2000-10-16 | 니시무로 타이죠 | 화상시스템, 그 시스템에 이용되는 고체촬상장치 반도체 집적회로 및 차분출력방법 |
-
1996
- 1996-08-12 KR KR1019980701011A patent/KR100267383B1/ko not_active Expired - Fee Related
- 1996-08-12 EP EP96926633A patent/EP0845900B1/de not_active Expired - Lifetime
- 1996-08-12 JP JP50914497A patent/JP3966557B2/ja not_active Expired - Fee Related
- 1996-08-12 WO PCT/JP1996/002285 patent/WO1997007631A1/ja not_active Ceased
- 1996-08-12 DE DE69624714T patent/DE69624714T2/de not_active Expired - Lifetime
- 1996-08-12 AT AT96926633T patent/ATE227487T1/de not_active IP Right Cessation
-
2001
- 2001-08-13 US US09/927,632 patent/US7113213B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| KR19990036343A (ko) | 1999-05-25 |
| US7113213B2 (en) | 2006-09-26 |
| EP0845900A4 (de) | 1998-12-16 |
| WO1997007631A1 (en) | 1997-02-27 |
| EP0845900B1 (de) | 2002-11-06 |
| KR100267383B1 (ko) | 2000-10-16 |
| JP3966557B2 (ja) | 2007-08-29 |
| DE69624714D1 (de) | 2002-12-12 |
| US20010052941A1 (en) | 2001-12-20 |
| DE69624714T2 (de) | 2003-08-07 |
| EP0845900A1 (de) | 1998-06-03 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |