WO2004032274A1 - 電極基板、光電変換素子、導電性ガラス基板およびその製造方法、並びに色素増感太陽電池 - Google Patents
電極基板、光電変換素子、導電性ガラス基板およびその製造方法、並びに色素増感太陽電池 Download PDFInfo
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- WO2004032274A1 WO2004032274A1 PCT/JP2003/012738 JP0312738W WO2004032274A1 WO 2004032274 A1 WO2004032274 A1 WO 2004032274A1 JP 0312738 W JP0312738 W JP 0312738W WO 2004032274 A1 WO2004032274 A1 WO 2004032274A1
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- electrode substrate
- metal wiring
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES OR LIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/20—Light-sensitive devices
- H01G9/2068—Panels or arrays of photoelectrochemical cells, e.g. photovoltaic modules based on photoelectrochemical cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES OR LIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/20—Light-sensitive devices
- H01G9/2027—Light-sensitive devices comprising an oxide semiconductor electrode
- H01G9/2031—Light-sensitive devices comprising an oxide semiconductor electrode comprising titanium oxide, e.g. TiO2
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M14/00—Electrochemical current or voltage generators not provided for in groups H01M6/00 - H01M12/00; Manufacture thereof
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/80—Constructional details
- H10K30/81—Electrodes
- H10K30/82—Transparent electrodes, e.g. indium tin oxide [ITO] electrodes
- H10K30/83—Transparent electrodes, e.g. indium tin oxide [ITO] electrodes comprising arrangements for extracting the current from the cell, e.g. metal finger grid systems to reduce the serial resistance of transparent electrodes
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/542—Dye sensitized solar cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the present invention relates to an electrode substrate and a conductive glass substrate used for a photoelectric conversion element and the like, a photoelectric conversion element, and a dye-sensitized solar cell.
- Dye-sensitized solar cells are attracting attention as photoelectric conversion devices that are inexpensive and can achieve high conversion efficiency (for example, Japanese Patent Application Laid-Open No. H01-220380, and M. Graetzel et al. (Nature), (UK), 1991, Issue 737, p. 353).
- a porous film using oxide semiconductor nanoparticles such as titanium dioxide is formed on a transparent conductive substrate, and a sensitizing dye is carried on the porous film to form a semiconductor.
- An electrode is configured.
- This semiconductor electrode is combined with a counter electrode such as platinum-plated conductive glass, and an organic electrolyte containing oxidized and reduced species such as iodine and iodide ions is used as a charge transport layer between the two electrodes. Will be filled.
- the semiconductor electrode When the semiconductor electrode has a porous film structure having a large specific surface with a roughness factor of 1,000 or more, the light absorption rate can be increased. Photovoltaic conversion efficiencies with light absorptivity of 10% or more have also been reported.
- the cost of dye-sensitized solar cells is expected to be about 1/2 to 1 Z6 of current silicon-based solar cells in terms of cost. Dye-sensitized solar cells are not necessarily complex, do not require large-scale manufacturing equipment, and contain no harmful substances.Therefore, they have high potential as inexpensive and mass-produced solar cells that can be used in large quantities. .
- a transparent conductive substrate As a transparent conductive substrate, a glass substrate surface is generally coated with a transparent conductive film such as tin-added indium oxide (IT0) or fluorine-added tin oxide (FTO) in advance by a method such as sputtering or CVD.
- a transparent conductive film such as tin-added indium oxide (IT0) or fluorine-added tin oxide (FTO) in advance by a method such as sputtering or CVD.
- I TO and FTO is on the order of 1 0- 4 ⁇ 1 0- 3 ⁇ ⁇ cm, silver, also about 1 00 times the electrical resistivity of metal such as gold Shows the value of For this reason, commercially available transparent conductive glass has a high resistance value, and when used in a solar cell, particularly in the case of a large-area cell, the photoelectric conversion efficiency is significantly reduced.
- the thickness of the transparent conductive layer ITO, FTO, etc.
- the film is formed with a thickness sufficient to obtain a sufficient resistance value, the light absorption by the transparent conductive layer increases, and the transmission efficiency of the incident light through the window material is remarkably reduced. As a result, the photoelectric conversion efficiency of the solar cell also decreases.
- a metal wiring layer is provided on the surface of a substrate with a transparent conductive layer used as a window electrode of a solar cell so as not to significantly impair the aperture ratio, thereby lowering the resistance of the substrate.
- a transparent conductive layer used as a window electrode of a solar cell
- the metal wiring layer is provided on the substrate surface as described above, at least the surface of the metal wiring layer must have a certain surface in order to prevent corrosion of the metal wiring by the electrolytic solution and reverse electron transfer from the metal wiring layer to the electrolytic solution. Must be protected by a shielding layer. This shielding layer must cover the circuit surface closely.
- FIGS 26 2 and 26 2 show examples of dye-sensitized solar cells.
- This dye-sensitized solar cell has a working electrode 63 comprising an oxide semiconductor fine particle of titanium oxide or the like on an electrode substrate 61 and having an oxide semiconductor porous film 62 carrying a photosensitizing dye, A counter electrode 64 provided opposite to the working electrode 63 is provided.
- An electrolyte layer 65 is formed between the working electrode 63 and the counter electrode 64 by being filled with an electrolytic solution.
- the electrode substrate 61 is formed by forming a transparent conductive layer 611 made of tin-added indium oxide (ITO) or fluorine-added tin oxide (FTO) on a base material 610 such as a glass plate. .
- a lattice-shaped metal wiring layer 612 made of gold, platinum, silver, or the like is provided on the transparent conductive layer 611.
- the surface of the metal wiring layer 612 or the transparent conductive layer 611 may cause inconveniences such as corrosion of the metal wiring layer 612, a short circuit with the electrolyte layer 65, and a reduction in output due to leakage current (reverse electron transfer).
- a shielding layer 613 made of an oxide semiconductor such as ITO, FTO, titanium oxide, and zinc oxide.
- Electrolyte layer 6 5 instead, a solid charge transfer layer 66 made of a p-type semiconductor or the like may be used.
- the shielding layer 613 can be formed by forming a film made of an oxide semiconductor on the metal wiring layer 62 by using a thin film forming method such as a sputtering method or a spray pyrolysis method (SPD). .
- a thin film forming method such as a sputtering method or a spray pyrolysis method (SPD).
- SPD spray pyrolysis method
- the dense shielding layer 613 can be uniformly formed. It is difficult to form, and an uncovered portion where the metal wiring layer 612 is exposed may be generated due to the poor formation of the shielding layer 613.
- the effect of suppressing problems such as corrosion of the metal wiring layer 612 and output reduction due to generation of leakage current due to reverse electron transfer from the metal wiring layer 612 to the electrolyte layer 65, etc. is reduced. Therefore, the characteristics of the solar battery (cell) may be significantly impaired.
- the coating thickness of the shielding layer 613 is increased in order to suppress the formation failure of the shielding layer 613, photoelectron transfer may be hindered, and the light transmittance may be reduced, which may lower the photoelectric conversion efficiency. There is.
- the metal wiring layer 612 is formed using a conductive paste mainly composed of conductive particles such as metal fine particles and a binder such as glass frit, the metal wiring layer 612 is formed. From the viewpoint of electrical conductivity, it is better that the mixing ratio of the binder is small, but fine and steep irregularities and shadows such as voids and pinholes are likely to occur inside and on the surface of the metal wiring layer 612. Is difficult to form. When the compounding ratio of the binder is increased, the conductivity of the metal wiring layer 612 decreases, so that the current collection efficiency decreases and the cell characteristics may be significantly impaired.
- the metal wiring layer 6 12 is not provided on the electrode substrate 6 1 and the current collection from the oxide semiconductor porous film 6 2 is to be performed only by the transparent conductive layer 6 11, the FT which forms the transparent conductive layer 6 11 semiconductors and resistivity of about 1 0- 4 ⁇ 1 0- 3 ⁇ ⁇ cm , such as, gold, since the 1 0 0 times or more metals such as silver, the photoelectric conversion efficiency particularly in the case of large-area cell The drop is noticeable. If the thickness of the transparent conductive layer 611 is increased in order to reduce the resistance, the light transmittance of the transparent conductive layer 611 is significantly reduced, and the photoelectric conversion efficiency is also lowered.
- the metal wiring layer In order to maintain an aperture ratio that does not impair light transmittance as much as possible and to provide sufficient conductivity, the metal wiring layer needs to have a certain height. Therefore, when the metal wiring layer is formed, the surface of the substrate has many irregularities. For this reason, for example, in forming a semiconductor porous film for a dye solar cell, there is a problem that the film thickness uniformity is impaired, and the unevenness tends to cause cracking or peeling of the film.
- a transparent conductive film having a thickness of about Atm such as indium oxide tin oxide (ITO) or fluorine-doped tin oxide (FTO), is formed on one surface of a glass plate denoted by reference numeral 71. Are formed to form the conductive glass 73.
- an oxide semiconductor porous film 74 carrying a photosensitizing dye composed of fine particles of an oxide semiconductor such as titanium oxide or zinc oxide is provided on the transparent conductive film 72 of the conductive glass 73. , It is formed.
- Reference numeral 75 denotes a conductive glass serving as a counter electrode, and a gap between the conductive glass and the oxide semiconductor porous film 74 is filled with an electrolytic solution composed of a non-aqueous solution containing a redox pair such as iodine / iodine ions. It is formed.
- electrolyte layer 76 copper iodide, thiosia Some have a hole transport layer made of a solid p-type semiconductor such as copper nitride. In this dye-sensitized solar cell, when light such as sunlight enters from the conductive glass 73 side, an electromotive force is generated between the transparent conductive film 72 and the counter electrode 75.
- a circuit electrode is formed on a transparent conductive film, and an oxide semiconductor porous film is provided thereon, and an electrolyte containing iodine or the like is filled. Therefore, the circuit electrode comes into contact with the electrolytic solution via the porous oxide semiconductor film, so that a leakage current in which electrons flow backward from the circuit electrode to the electrolytic solution may flow. This occurs because the energy level of the electrolyte is low when comparing the energy levels between the circuit electrodes and the electrolyte. Therefore, a barrier layer made of a semiconductor material or an insulator material is formed at the interface between the circuit electrode and the electrolyte to prevent leakage current.
- the electrode substrate of the present invention is an electrode substrate having a metal wiring layer and a transparent conductive layer on a base material, wherein the metal wiring layer and the transparent conductive layer are electrically connected. At least the surface of the metal wiring layer is insulated and covered with an insulating layer.
- the metal wiring layer is reliably shielded from the electrolyte solution and the like, and its corrosion and leakage current can be effectively suppressed. Therefore, it becomes an electrode substrate having excellent conductivity.
- the insulating layer is preferably formed from a material containing a glass component, and is particularly preferably formed by printing a paste containing glass frit. This makes it possible to easily form an insulating layer for reliably insulating and shielding the metal wiring layer.
- the metal wiring layer is preferably formed by a printing method. Thereby, a metal wiring layer having a desired pattern can be easily formed.
- a photoelectric conversion element or a dye-sensitized solar cell according to one embodiment of the present invention includes the above-described electrode substrate. As a result, the output due to corrosion of the metal wiring layer of the electrode substrate, leakage current, etc. The decrease is suppressed, and the photoelectric conversion efficiency is increased.
- An electrode substrate has a metal wiring layer and a transparent conductive layer on a transparent substrate, and the metal wiring layer is composed of at least two layers, an inner layer and an outer layer.
- the outer layer is preferably formed by a printing method. It is preferable that the volume resistivity of the inner layer is smaller than the volume resistivity of the outer layer.
- the outer layer is formed of a paste composition containing at least conductive particles and a binder material, and the binder composition ratio of the paste composition is such that the binder in the composition forming another layer in the metal wiring layer It is preferable that the ratio is larger than the material mixing ratio.
- composition forming the metal wiring layer contains silver or nickel.
- a shielding layer may be provided on the surface of the conductive layer composed of the metal wiring layer and / or the transparent conductive layer.
- a photoelectric conversion element or a dye-sensitized solar cell according to another aspect of the present invention has the above-described electrode substrate.
- An electrode substrate has a metal wiring layer and a transparent conductive layer on a transparent substrate.
- a metal wiring layer is formed along a wiring pattern formed on the transparent substrate by a groove processing, and at least a part of the metal wiring layer reaches a height below the surface of the transparent substrate.
- At least the surface of the metal wiring layer is preferably covered with a shielding layer.
- the shielding layer preferably contains at least one of a glass component, a metal oxide component, and an electrochemically inactive resin component.
- a photoelectric conversion element or a dye-sensitized solar cell of the present invention has the above electrode substrate.
- a conductive glass substrate according to another embodiment of the present invention includes: a glass plate provided with a transparent conductive film; and a glass plate provided on the glass plate and having a catalytic action with a passive metal or a substitutional metal or the metal.
- a conductive circuit layer made of a material having the same; and an insulating circuit protection layer formed on the conductive circuit layer.
- a passivation metal is formed in a pinhole generated in the circuit protection layer.
- the aperture ratio of the conductive circuit layer is preferably 75% or more, and may be 90 to 99%. This is common to both embodiments.
- the conductive circuit layer may be formed of a conductive paste containing at least one selected from gold, silver, platinum, palladium, copper, and aluminum. No.
- the insulating circuit protection layer may be formed from an insulating paste material.
- the passive metal may be formed by an electroless metal plating process.
- the electroless metal plating may be electroless nickel plating, electroless cobalt plating, or electroless tin plating.
- a dye-sensitized solar cell includes the conductive glass substrate.
- a transparent conductive film layer is formed on a surface of a glass plate, and a metal having a catalytic action or a substitution type metal or a material containing the metal is formed thereon.
- a conductive circuit layer is formed by screen printing, a circuit protective layer is formed thereon by an insulating paste, and a passivated metal is formed by electroless plating of nickel, cobalt, or tin metal.
- An electrode substrate includes a base material, a metal wiring layer provided on the base material, and a transparent conductive layer electrically connected to the metal wiring layer.
- the metal wiring layer is insulated and covered with an insulating layer mainly composed of a heat-resistant ceramic.
- heat-resistant ceramic for example, a ceramic containing at least one of alumina, zirconia, and silica can be used.
- the insulating layer for example, a layer containing at least one of a silicate, a phosphate, colloidal silica, an alkyl silicate, and a metal alkoxide can be used.
- the insulating layer is preferably formed by a printing method.
- the metal wiring layer is preferably formed by a printing method.
- At least a part of the metal wiring layer can be located in a concave portion formed on the surface of the base material.
- a photoelectric conversion element and a dye-sensitized solar cell according to another embodiment of the present invention include the above-described electrode substrate.
- the metal wiring layer is reliably shielded, and the problems such as corrosion of the metal wiring layer, alteration of the electrolyte due to contact with the metal constituting the metal wiring layer, and leakage current can be solved.
- the function as a transparent electrode substrate can be fully exhibited. For this reason, for example, in a large-area cell having a size of about 100 mm square, the photoelectric conversion efficiency can be increased as compared with a cell having an unwiring substrate.
- FIG. 1A is a cross-sectional view showing one embodiment of the photoelectric conversion element of the present invention.
- FIG. 1B is a sectional view showing an example of the electrode substrate.
- FIG. 2 is a plan view showing an example of the metal wiring layer.
- FIG. 3 to 7 are cross-sectional views showing other embodiments of the electrode substrate of the present invention.
- 8 to 11 are sectional views showing still another embodiment of the electrode substrate of the present invention.
- FIG. 12 to FIG. 12C are cross-sectional views showing still another embodiment of the electrode substrate of the present invention.
- FIG. 12D is a cross-sectional view illustrating another embodiment of the photoelectric conversion element.
- FIG. 13 is a cross-sectional view of one embodiment of the conductive glass substrate of the present invention.
- FIG. 14 is a cross-sectional view showing still another embodiment of the electrode substrate of the present invention.
- FIG. 15 is a plan view showing an example of the plane shape of the metal wiring layer.
- FIGS. 16 to 24 are sectional views showing another embodiment of the electrode substrate of the present invention.
- FIG. 25 is a cross-sectional view showing another embodiment of the photoelectric conversion element of the present invention.
- FIGS. 26A and 26B are cross-sectional views illustrating an example of a conventional photoelectric conversion element.
- FIG. 27 is a cross-sectional view of a conventional dye-sensitized solar cell. BEST MODE FOR CARRYING OUT THE INVENTION
- FIG. 1A is a cross-sectional view illustrating an example of the photoelectric conversion element of the present invention
- FIG. 1B is a cross-sectional view illustrating an electrode substrate 1 used in the photoelectric conversion element.
- This photoelectric conversion element is a dye-sensitized solar cell in which, when light such as sunlight enters from the base material 10 side, an electromotive force is generated between the working electrode 3 and the counter electrode 4 to thereby obtain power.
- an electrode substrate 1 is provided on a base material 10, a transparent conductive layer 11, and a metal wiring formed on the transparent conductive layer 11.
- layer 1 and an insulating layer 14 that covers only the surface of the metal wiring layer 12. The entire surface except the lower surface of the metal wiring layer 12 is covered with the insulating layer 14. In this embodiment, no insulating layer 14 is formed on the surface of the transparent conductive layer 11 between the metal wiring layers 12.
- a material having high light transmittance is preferable for use.
- transparent plastic sheets such as glass, polyethylene terephthalate (PE), polyethylene naphthalate (PEN), polycarbonate (PC), polyether sulfone (PES), titanium oxide, and alumina A polished ceramic plate can be used.
- the transparent conductive layer 11 is formed over the base 10 over a region wider than the region where the metal wiring layer 12 is formed.
- Material of the transparent conductive layer 1 1 Although not particularly limited, for example, indium tin oxide (I TO), tin oxide (S N_ ⁇ 2), a conductive metal such as fluoridation acid tin (FTO) Oxides.
- the transparent conductive layer 11 As a method for forming the transparent conductive layer 11, an appropriate method according to the material of the transparent conductive layer 11 may be used. For example, a sputtering method, a vapor deposition method, an SPD method, a CVD method and the like can be mentioned. In consideration of light transmittance and conductivity, the transparent conductive layer 1 is usually formed to a thickness of about 0.001 m to 10 m. However, it is not limited to this range.
- the metal wiring layer 12 is formed of a metal such as gold, silver, platinum, aluminum, nickel, titanium, or the like, as a wiring having a lattice, stripe, or comb pattern shown in FIG. .
- the wiring width of the metal wiring layer 12 is not more than 1 000 ⁇ m.
- the thickness (height) of each wiring of the metal wiring layer 12 is not particularly limited, but is preferably 0.1 to 10 Am.
- a paste is prepared by mixing a metal powder to be conductive particles and a binder such as glass fine particles, and the paste is formed by a screen printing method, a metal mask method, an ink jet method.
- a coating film is formed so as to form a predetermined pattern by using a printing method such as a heating method, and the conductive particles are fused by heating and firing.
- the firing temperature is, for example, 600 ° C. or less when the substrate 10 is glass, More preferably, the temperature is set to 550 ° C. or lower.
- a forming method such as a sputtering method, an evaporation method, and a plating method can be used.
- the metal wiring layer 12 preferably has a volume resistivity of 10 to 5 ⁇ ⁇ cm or less. It is preferable that the surface of the metal wiring layer 12 is smooth, but the presence of a small amount of undulations and unevenness may be acceptable.
- the insulating layer 14 is formed by using one or more types of insulating materials such as resin, ceramics, and glass, and is formed as one or more layers by overlapping on the region where the metal wiring layer 12 is formed. I have.
- the region where the insulating layer 14 is formed may protrude to the periphery of the pattern of the metal wiring layer 12 as long as it does not significantly impede light incidence or charge transfer to the transparent conductive layer 11.
- the method for forming the insulating layer 14 is not necessarily limited.
- a metal wiring is formed by a printing method such as a screen printing method, a metal mask method, and an ink jet method.
- a coating film may be applied so as to overlap the pattern of the layer 12 and may be heated and fired. This method is suitable from the viewpoint of ease of pattern formation, cost, and the like.
- the firing temperature is preferably 600 ° C. or lower, more preferably 550 ° C. or lower.
- Glasses that can be fired at such temperatures include lead-free solder glasses such as lead oxide, lead borate, and bismuth lead borate as amorphous or crystalline glass, as well as non-lead glass. Solder glass or the like can be used.
- the number of layers of the insulating layer 14 may be one or more. In the case of a plurality of layers, one kind of glass paste may be formed twice or more, or the melting temperature is different. Two or more types of glass paste may be used.
- An oxide semiconductor porous film 2 carrying a sensitizing dye is formed on the surface of the electrode substrate 1, and the electrode substrate 1 and the oxide semiconductor porous film 2 constitute a working electrode 3 of the photoelectric conversion element. Is done.
- the oxide semiconductor porous film 2 is a titanium oxide (T i 0 2), tin oxide (S n 0 2), tungsten oxide (W 0 3), zinc oxide (Z n O), niobium oxide (N b 2 0 5 ), Etc., composed of oxide semiconductor fine particles with an average particle size of 1 to 100 nm and a thickness of about 0.5 to 50 m. is there. However, this It is not limited to the range.
- the oxide semiconductor porous film 2 for example, a commercially available dispersion liquid in which oxide semiconductor particles are dispersed in a desired dispersion medium or a colloid solution that can be prepared by a sol-gel method is used, if necessary.
- a method of applying by a known coating method such as a screen printing method, an ink-jet printing method, a roll coating method, a doctor blade method, a spin coating method, a spray coating method, and the like.
- the polymer microbeads are removed by heat treatment or chemical treatment to form voids, and And a method in which can be applied.
- the sensitizing dye supported on the oxide semiconductor porous film 2 is not particularly limited.
- ruthenium complexes with ligands containing a biviridine structure, Yuichi pyridine structure, etc. can be appropriately selected and used depending on the material of the oxide semiconductor porous film.
- an organic solvent containing a redox couple, a room temperature molten salt, or the like can be used as an electrolytic solution for forming the electrolyte layer 5.
- the organic solvent include acetonitrile, methoxyacetonitrile, propionitrile, ethylene-carbonate, propylene-carbonate, getylcarbonate, and carboxylactone.
- the room-temperature molten salt include salts composed of a quaternized imidazolyl cation and an iodide ion or bisulfurylmethylsulfonylimidaione.
- the redox couple contained in the electrolyte is not particularly limited.
- it may be a pair of iodine noodide ion, bromine bromide ion, or the like.
- iodide ion or bromide ion lithium salt, quaternized imidazonium salt, tetrabutylammonium salt and the like can be used alone or in combination.
- Additives such as tert-butylpyridine can be added to the electrolyte as needed. It is also possible to use a gel that has been gelled with a suitable gelling agent to suppress the fluidity.
- a solid charge transfer layer 6 made of a p-type semiconductor or the like can be used.
- the p-type semiconductor for example, a monovalent copper compound such as copper iodide and copper cyanide can be suitably used.
- the method for forming the charge transport layer 6 is not particularly limited, and a known method can be applied. Examples thereof include a casting method, a sputtering method, and a vapor deposition method.
- the charge transfer layer 6 may contain an additive as necessary for forming the layer.
- the counter electrode 4 is, for example, a thin film made of a conductive oxide semiconductor such as IT0 or FT0 formed on a substrate made of a nonconductive material such as glass, or gold or platinum on a substrate.
- An electrode formed by depositing or applying a conductive material such as a carbon-based material can be used.
- a layer of platinum, carbon, or the like may be formed on a thin film of a conductive oxide semiconductor such as ITO or FTO.
- a method for producing such a counter electrode 4 for example, a method of forming a platinum layer by performing a heat treatment after application of chloroplatinic acid can be mentioned.
- the electrodes may be formed on the substrate by a vapor deposition method and a sputtering method.
- a method of forming a conductive material to be the electrode of the counter electrode 4 directly on the charge transport layer 6 by a method such as sputtering or coating may be used. it can.
- the transparent conductive layer 11 and the metal wiring layer 12 are in contact with and electrically connected to each other, electrons from the oxide semiconductor porous film 2 are transferred to the transparent conductive layer.
- the power collection efficiency can be increased through the metal wiring layer 12 through the current collection by the metal wiring layer 12.
- the metal wiring layer 12 is reliably shielded from the solution of the electrolyte layer 5 and the like, and its corrosion and leakage current can be effectively suppressed. Therefore, since the electrode substrate 1 having excellent conductive properties can be obtained, contact between the metal wiring layer 12 and the electrolyte layer 5 can be prevented by forming the working electrode of the photoelectric conversion element using the electrode substrate of this embodiment.
- FIG. 3 is a schematic sectional view showing a second embodiment of the electrode substrate of the present invention.
- the metal wiring layer 12 is provided on the substrate 10, and the transparent conductive layer 11 straddles the metal wiring layer ⁇ 2 to form the metal wiring layer 12. It is formed over a wider area than the area in which it is formed.
- the insulating layer ⁇ 4 is formed on the transparent conductive layer 11 1
- the metal wiring layer 12 is formed so as to cover the top and side surfaces of the metal wiring layer 12 so as to overlap with the pattern of the metal wiring layer 12. That is, the insulating layer 14 is provided on the metal wiring layer 12 via the transparent conductive layer 11.
- the metal wiring layer 12 can be insulated and shielded by the insulating layer 14, similarly to the electrode substrate 1 of the first embodiment.
- the electrode substrate 1 is excellent in quality. Even if this electrode substrate 1 is used, a photoelectric conversion element having high photoelectric conversion efficiency can be manufactured.
- FIG 5 shows another embodiment of the electrode substrate of the present invention.
- a transparent conductive layer 11 is formed on a base material 10, and a metal wiring layer 12 is formed on the transparent conductive layer 11 as a pattern such as a lattice. Have been.
- a shielding layer 13 made of an oxide semiconductor thin film is provided on the transparent conductive layer 11, and an insulating layer 14 is formed on the metal wiring layer 12.
- the metal wiring layer 12 is formed on the base material 10 as a pattern such as a lattice, and the metal wiring layer 12 is formed on the metal wiring layer 12.
- the transparent conductive layer 11 is formed over an area wider than the area covered by the transparent conductive layer.
- a shielding layer 13 made of an oxide semiconductor thin film is provided on the transparent conductive layer 11.
- an insulating layer 14 is formed on the shielding layer 13 so as to overlap the pattern of the metal wiring layer # 2 so as to cover the upper and side surfaces of the metal wiring layer 12.
- a compound having a low electron transfer reaction rate with an electrolytic solution containing a redox species, a high light transmission property, and a high photoelectron transfer ability is selected. Titanium oxide, zinc oxide, niobium oxide , Tin oxide, fluorine-added tin oxide (FTO), tin-added indium oxide (ITO) and the like.
- the shielding layer 13 needs to be formed thin enough not to hinder electron transfer to the transparent conductive layer 11, and preferably has a thickness of about 10 to 300 nm.
- Examples of the method for forming the shielding layer 13 include a sputtering method, an evaporation method, an SPD method, a spin coat method, a dive method, and a doctor blade method. But these According to the method, the density of the shielding layer 13 and the adaptability to the surface shape of the base material 10 are not always sufficient, and it is difficult to sufficiently obtain the shielding performance of the metal wiring layer 12. Therefore, even when the shielding layer 13 is formed, the insulating layer 14 must be formed directly on the metal wiring layer 12 or via the transparent conductive layer 11 or the shielding layer 13. Therefore, the insulating insulation of the metal wiring layer 12 can be sufficiently performed.
- the method for forming the shielding layer 13 is not particularly limited.
- an oxide semiconductor as a target compound or a precursor thereof is formed by a dry method (vapor phase method) such as a sputtering method, an evaporation method, or a CVD method.
- a dry method vapor phase method
- the shielding layer 13 can be obtained by oxidizing the film by heat treatment or chemical treatment.
- a liquid containing the target compound or its precursor is applied by a method such as spin coating, divebing, or blade coating, and then chemically changed to the target compound by heat treatment or chemical treatment.
- the shielding layer 13 can be obtained.
- the precursor include salts and complexes having the constituent metal elements of the target compound.
- a solution is more preferable than a dispersion.
- the shielding layer 13 As another method for forming the shielding layer 13, for example, by using a spray pyrolysis method (SPD), while heating the substrate 10 having the transparent conductive layer 11, A method of forming the shielding layer 13 by spraying a substance serving as a precursor of the shielding layer 13 and thermally decomposing the substance into a target oxide semiconductor can also be used.
- SPD spray pyrolysis method
- a method of forming the shielding layer 13 by spraying a substance serving as a precursor of the shielding layer 13 and thermally decomposing the substance into a target oxide semiconductor can also be used.
- the shielding layer 13 can have an effect as a protective layer for a purpose different from, for example, the insulating layer 14 as necessary in terms of characteristics.
- the shielding layer 13 is formed not only on the transparent conductive layer, but also on the metal wiring layer 12 and the insulating layer 14.
- the shielding layer 13 can be used as a protective layer for the metal wiring layer 12 and the insulating layer 14.
- the metal wiring layer 12 is formed on the first transparent conductive layer 11 a as a wiring pattern such as a grid, a stripe, or a comb.
- This An insulating layer 14 for covering the metal wiring layer 12 is provided on the metal wiring layer 12.
- a second transparent conductive layer 11 b is formed on the metal wiring layer 12 and the insulating layer 14. That is, the metal wiring layer 12 and the insulating layer 14 are sandwiched between the first transparent conductive layer 11a and the second transparent conductive layer 11b.
- the first and second transparent conductive layers 1 ⁇ a and 1 1b are the same as the above-described transparent conductive layer ⁇ 1, and are thin films made of conductive metal oxides such as ITO and F ⁇ . .
- the insulating layer 14 allows the metal wiring layer 12 to be insulated and shielded, and the second transparent conductive layer 11 b enables the metal wiring layer 12 and the insulating layer 14. Can be protected.
- the second transparent conductive layer 11b in addition to the first transparent conductive layer 11a, an improvement in current collection efficiency can be expected.
- the electrode substrate of this embodiment can be applied to photoelectric conversion elements other than solar cells, such as photochemical cells and optical sensors. Also in this case, the metal wiring layer 12 of the electrode substrate 1 is covered with the insulating layer 14 and the contact of the metal wiring layer 12 with the electrolyte solution or the like is prevented, so that problems such as corrosion and short circuit are suppressed. As a result, it is possible to suppress deterioration in quality, photoelectric conversion characteristics, and light responsiveness.
- a 100 mm ⁇ 100 mm glass substrate with an FTO film was used as the transparent conductive layer 1 1 (1 1 a) and the substrate 10.
- a silver paste for printing (volume resistivity after sintering was 3 X 10 — 6 ⁇ ) was screen-printed in a grid pattern. After leveling for 10 minutes, it was dried in a hot air circulating oven at 135 ° C. for 20 minutes and baked at 550 ° C. for 15 minutes to form a metal wiring layer 12 composed of a silver circuit.
- the circuit width of the metal wiring layer 12 was 150 tm and the film thickness was 5 m.
- the width of the obtained insulating layer 14 was 250_tm, and the film thickness from the surface of the glass substrate was 10 e. For this reason, about 5 m This means that the insulating layer 14 is formed with a thickness of.
- the FTO film serving as the second transparent conductive layer 11 b serving as the protective layer and the shielding layer 13 is formed so as to extend over the metal wiring layer 12 and the insulating layer 14.
- the electrode substrate 1 having the configuration shown in FIG. 6 (and FIG. 7) was manufactured.
- An aqueous dispersion of titanium oxide (average particle size: 25 nm) is applied on the obtained electrode substrate 1, dried, and heated at 450 ° C. for 1 hour to form a 10 m-thick oxide.
- Semiconductor porous film 2 was formed. Further, the electrode was immersed in an ethanol solution of a ruthenium biviridine complex (N3 pigment) for 8 hours to carry a dye, thereby preparing a working electrode 3.
- a platinum electrode FTO glass electrode substrate was used as the counter electrode 4, and the counter electrode 4 and the working electrode 3 were opposed to each other with a 50 / m-thick thermoplastic polyolefin resin sheet interposed as a spacer. Both electrodes 3 and 4 were fixed by heat melting of the resin sheet.
- a part on the counter electrode 4 side was left open to serve as the electrolyte injection port.
- a methoxyacetonitrile solution containing 0.5 M iodide salt and 0.05 M iodine as a main component is injected from the injection port to form an electrolyte layer 5, and then the peripheral portion and the liquid are injected.
- the opening was completely sealed with an epoxy-based sealing resin, and a silver paste was applied to the current collecting portion to produce a photoelectric conversion element serving as a test cell.
- a 100 mm XI 00 mm heat-resistant glass substrate was used as the base material 10, and a circuit width of 50 m and a film thickness of 5 mm were formed on this surface using a silver paste for printing in the same procedure as in Example A1.
- an FT0 film to be the transparent conductive layer 11 was formed on the metal wiring layer 2 by the SPD method. Further, using the same method as in Example A1, the pattern of the metal wiring layer 12 was printed by printing a glass paste.
- An insulating layer 14 was formed in accordance with the above, to fabricate an electrode substrate 1 having the configuration shown in FIG.
- a photoelectric conversion element serving as a test cell was manufactured in the same procedure as in Example A1.
- the photoelectric conversion characteristics of this test cell were evaluated using simulated sunlight having an air mass (AM) of 1.5, the conversion efficiency was 2.5%.
- a glass substrate with an FTO film of 10 Omm x 10 Omm was used as the transparent conductive layer 11 and the base material 10, and a surface with a circuit width of 50 tm and a film thickness of 5 Atm was formed on this surface by the additive plating method.
- a metal wiring layer 12 made of a gold circuit was formed.
- An insulating layer 14 was formed on the metal wiring layer 12 in accordance with the pattern of the metal wiring layer 12 by printing a glass paste using the same method as in Example A1.
- An electrode substrate 1 having the configuration shown was produced.
- a photoelectric conversion element serving as a test cell was manufactured in the same procedure as in Example A1.
- the photoelectric conversion characteristics of this test cell were evaluated using simulated sunlight with an air mass (AM) of 1.5, the conversion efficiency was 3.3%.
- a 100 mm ⁇ 100 mm heat-resistant glass substrate was used as the base material 10, and a circuit width of 100 Atm and a film thickness of 5 mm were formed on this surface by using a silver paste for printing in the same procedure as in Example A1.
- an FTO film to be the transparent conductive layer 11 and the shielding layer 13 is formed on the metal wiring layer 12 by the same procedure as in Example A2, and the electrode substrate is formed. ⁇ was prepared.
- a photoelectric conversion element serving as a test cell was produced in the same procedure as in Example A1. Observation of the electrolyte injected into this test cell showed that it had a brown color immediately after injection, but was almost transparent several minutes later. This is because I “ions in the electrolyte are exposed due to insufficient shielding of the silver circuit. It is thought that it was reduced to I- by reacting with silver.
- the photoelectric conversion characteristics of this test cell were evaluated using simulated sunlight having an air mass (AM) of 1.5, the photoelectric conversion efficiency was 0.24%.
- a glass substrate with FT0 film of 100 Omm x 100 mm was used as the transparent conductive layer 11 and substrate 10, and a circuit width of 50 ⁇ m and a film thickness of 5 Atm were applied to this surface by the additive plating method.
- a metal wiring layer 12 made of a gold circuit was formed.
- a 300 nm-thick FTO film serving as the transparent conductive layer 11 and the shielding layer 13 was formed on the metal wiring layer 12 by using the same method as in Example A2, and the electrode substrate 1 was formed. Produced.
- a photoelectric conversion element serving as a test cell was manufactured in the same procedure as in Example A1.
- the photoelectric conversion characteristics of this test cell were evaluated using simulated sunlight with an air mass (AM) of 1.5, the conversion efficiency was 0.30%.
- the shielding layer 13 is provided without providing the insulating layer 14 to shield the conductive layer, the metal wiring layer 12 is easily exposed, and the metal wiring layer 12 is exposed.
- the photoelectric conversion efficiency of the photoelectric conversion element may be significantly reduced, which proves to be a problem.
- a glass substrate with an FT0 film of 10 OmmX ⁇ 00 mm was used, and the glass substrate with an FTO film itself was used without providing the metal wiring layer 12 on this surface.
- the same procedure as in Example A1 was used by using it as the electrode substrate 1.
- a photoelectric conversion element serving as a test cell was manufactured.
- the photoelectric conversion characteristics of this test cell were evaluated using simulated sunlight having an air mass (AM) of 1.5, the conversion efficiency was 0.1%. This indicates that when the metal wiring layer 12 is not provided, the photoelectric conversion efficiency of the photoelectric conversion element is low because the resistance of the electrode substrate 1 is large.
- AM air mass
- An electrode substrate according to another embodiment of the present invention has a metal wiring layer and a transparent conductive layer on a transparent substrate, and the metal wiring layer is composed of at least two layers, an inner layer and an outer layer.
- a structure in which a metal wiring layer 24 is arranged on a transparent conductive layer 23 formed on the transparent substrate 22—surface may be used.
- a structure in which a transparent conductive layer 23 is formed on a transparent substrate 22 on which a metal wiring layer 24 is disposed may be used.
- the same reference numerals as those in FIG. 8 denote the same configuration as the configuration in FIG.
- the material of the transparent substrate 22 may be the same as that of the base material 10 described above. Those having high light transmittance are preferable.
- the material for forming the transparent conductive layer 23 may be the same as the transparent conductive layer 11 described above. It is preferable to select a material having a light transmittance as high as possible as much as possible according to the combination and use of the materials.
- a known method such as a sputtering method or an evaporation method is used, and an appropriate method is used according to a material for forming the transparent conductive layer 23. Just fine.
- the material for forming the inner layer 24a of the metal wiring layer 24 is not particularly limited.
- gold, silver, platinum, aluminum, nickel, titanium, and the like can be used.
- silver or nickel can be suitably used because they are relatively inexpensive and easily available as general-purpose printing pastes.
- Binder materials and appropriate additives can be added as long as properties such as conductivity are not impaired.
- the method for forming the inner layer 24a is not particularly limited, and includes a printing method, a sputtering method, a vapor deposition method, a plating method, and the like. Among these, the printing method is particularly preferable.
- the inner layer 24a thus formed has a smaller volume resistivity than that of the outer layer 24b.
- the coating surface of the inner layer 24 a The layer is preferably smooth, but since this layer is formed in accordance with the original purpose as the metal wiring layer 24 for lowering the resistance of the electrode substrate 21, high priority is given to high conductivity.
- the outer layer 24 b described later is a conductive layer, but its main purpose is to make the wiring surface smooth and facilitate the formation of the shielding layer 25, so that the volume resistance is lower than that of the inner layer 24 a. The rate can be large.
- the volume resistivity of the inner layer 2 4 a is preferably not more than at least 5 XI 0 _ 5 ⁇ ⁇ cm . Under this condition, even if some pinholes or cracks occur on the surface of the coating film, there is no problem because it can be corrected by the outer layer 24b. If this layer is included in the metal wiring layer 24, another layer different from the outer layer 24b may be formed inside and outside the inner layer 24a for some purpose.
- the outer layer 24 b of the metal wiring layer 24 is desirably formed of a paste composition containing at least conductive particles and a binder material.
- the conductive particles are not particularly limited, and examples thereof include silver, nickel, gold, and platinum. Among these, silver or nickel can be suitably used because they are relatively inexpensive and easily available as general-purpose printing pastes.
- the binder material is not particularly limited.
- the heat treatment at about 400 to 500 ° C. is included in the manufacturing process, so the The firing composition is selected from firing types, such as glass frit.
- the glass frit serving as the binder material is not particularly limited as long as it can be melted at the firing temperature or lower.
- the compounding ratio of the binder material in the paste composition forming the outer layer 24 b is preferably larger than the compounding ratio of the binder material in the composition forming the other layers in the metal wiring layer 24. .
- the mixing ratio of the binder material in the paste composition forming the outer layer 24b is preferably at least 10% by mass, more preferably at least 20%, with respect to the conductive particles.
- the conductivity of the film (outer layer 24b) is remarkably reduced with an increase in the blending ratio of the binder material, so that the blending ratio of the binder material is smaller as long as the surface condition satisfies the above requirements. Is preferably 90% or less, more preferably 70% or less.
- a printing method is preferable.
- the printing method includes a screen printing method, an ink jet method, and a metal mask method.
- the surface roughness is small and cracks and pinholes are not generated, so that the surface of the metal wiring layer 24 is smoothed and the shielding layer 2 is formed. 5 can be easily formed.
- the manufacturing cost can be reduced and the manufacturing efficiency can be improved.
- the outer layer 24b in the present specification means a printed layer formed by a printing method for the above-mentioned purpose, and is not necessarily arranged on the outermost surface of the metal wiring layer 24, and may be changed as necessary. Another layer may be formed on the outside for some purpose.
- the thickness of the outer layer 24b does not exceed 100% of the thickness of the inner layer 24a. If the thickness of the outer layer 24b exceeds 100% of the thickness of the inner layer 24a, the conductivity per unit volume of the circuit becomes low, so the circuit thickness becomes too thick or the conductivity becomes too large. Shortages and other inconveniences are likely to occur.
- a firing step for example, for the purpose of fusing conductive particles, considering the application to a glass substrate, etc. It is preferable that the required characteristics can be obtained at a firing temperature of 550 ° C. or lower. In the present embodiment, it is preferable that a shielding layer 25 is provided on the surface of the conductive layer composed of the metal wiring layer 24 and / or the transparent conductive layer 23.
- the electron transfer reaction speed with the oxidation-reduction pair-containing electrolytic solution that comes into contact with a solar cell is slow, the light transmission is excellent, and the movement of generated photons is prevented.
- the property of not having such properties For example, titanium oxide, zinc oxide, niobium oxide, tin oxide, fluorine-added tin oxide (FTO), tin-added indium oxide (ITO), etc. Can be mentioned.
- the method for forming the shielding layer 25 is not particularly limited, and examples thereof include a method of forming a target compound or a precursor thereof by a dry method (gas phase method) such as a sputtering method, an evaporation method, and a CVD method.
- a dry method gas phase method
- the shielding layer 25 can be formed by oxidizing the film by a heat treatment or a chemical treatment.
- a solution obtained by dissolving or dispersing the target compound or its precursor is applied by a spin coating method, a dive method, a blade coating method, or the like, and then the target compound is chemically or chemically treated by heat treatment or chemical treatment.
- the shielding layer 25 can be formed.
- the precursor include salts and complexes having the constituent metal element of the target compound.
- the shielding layer 25 it is preferable to be in a dissolved state rather than a dispersed state.
- the shielding layer 25 In the case of spray pyrolysis (SPD) or the like, a substance serving as a precursor of the shielding layer 25 is sprayed toward the heated state of the transparent substrate 22 having the transparent conductive layer 23 and thermally decomposed.
- the shielding layer 25 can be formed by changing the intended oxide semiconductor.
- the thickness of the shielding layer 25 is not particularly limited, but is preferably as thin as possible in order to exhibit the effect, and is preferably about 10 to 3000 mm.
- the transparent conductive layer 23 forms the shielding layer 25 as shown in FIG. It may be double.
- the electrode substrate 21 of the present embodiment does not have a shadowed portion such as a pinhole or a crack on the surface of the outer layer 24 b of the metal wiring layer 24, the surface is densely covered by the shielding layer 25. Can be coated.
- the dye-sensitized solar cell of the present embodiment includes, on the electrode substrate 21 described above, a working electrode including a dye-supported oxide semiconductor porous film, and a counter electrode disposed to face the working electrode.
- An electrolyte layer containing a redox couple is provided between the working electrode and the counter electrode.
- Ti i 0 2 titanium oxide
- S n0 2 tin oxide
- W0 3 tungsten oxide
- Z nO zinc oxide
- Etc As a material of the semiconductor porous film, titanium oxide (T i 0 2), tin oxide (S n0 2), tungsten oxide (W0 3), zinc oxide (Z nO), niobium oxide (N b 2 O s). Etc.
- Examples of the method for producing a porous semiconductor film include a screen printing method, an ink jet printing method, a roll coating method, a doctor blade method, and a spin coating method using a colloid solution or a dispersion liquid (including an additive as necessary).
- various coating methods such as spray coating, spray electrophoresis of fine particles, combined use of a foaming agent, and compounding with polymer beads (only the type II component is removed later) can be applied.
- Dyes supported on the semiconductor porous membrane include ruthenium complexes containing a biviridine structure, a terpyridine structure, etc. as ligands, metal-containing complexes such as porphyrins and phthalocyanines, and organic dyes such as echinosine, rhodamine and merocyanine.
- a material having an excitation behavior suitable for the application and the semiconductor to be used can be selected without particular limitation.
- an organic solvent containing a redox couple, a molten salt at room temperature, or the like can be used.
- a pseudo-solidified so-called gel electrolyte may be used by introducing an appropriate gelling agent into such an electrolytic solution.
- the redox couple is not particularly restricted but includes, for example, iodine noodide ion and bromine / bromide ion.
- specific examples of the former include iodide salt (lithium salt, quaternary Imidazolymium salt, tetrabutylammonium salt, etc. can be used alone or in combination) and iodine.
- Various additives such as t-tert-butylpyridine can be further added to the electrolytic solution as needed.
- a P-type semiconductor or the like can be used as the charge transport layer.
- the p-type semiconductor for example, Monovalent copper compounds such as copper iodide and copper cyanide can be suitably used.
- Various additives can be contained as required for the function and film formation.
- the method for forming the charge transfer layer is not particularly limited, and examples thereof include a film forming method such as a casting method, a sputtering method, and an evaporation method.
- the counter electrode for example, various carbon-based materials, platinum, gold, and the like can be formed on a conductive or non-conductive substrate by a method such as vapor deposition or sputtering.
- a technique such as direct sputtering or coating on the surface may be used.
- the dye-sensitized solar cell of the present embodiment has the electrode substrate 21 corrosion of metal wiring due to the electrolyte and reverse electron transfer from the metal wiring layer 24 to the electrolyte are suppressed, and the output effect of the photoelectric conversion element is reduced. Further improve.
- a silver paste (silver particles 92, glass frit 8 (mass ratio)) forming the inner layer 24a was screen-printed in a grid pattern on the surface of the glass with the FTO film of 100 ⁇ 100 mm. After a leveling time of 10 minutes, this was dried in a hot air circulating furnace at 135 ° C for 20 minutes, and baked at 550 ° C for 15 minutes. Next, using a CCD camera, silver paste (silver particles 55 glass frit 45 (mass ratio)) forming the outer layer 24b is overprinted while performing alignment, and after a leveling time of 10 minutes, 1 35 ° C,
- Circuit width 250 Am (outer layer 24 b), 150 m (inner layer 24 a), film thickness 8 Aim (outer layer
- An FTO layer was formed to a thickness of 300 nm by spray pyrolysis on the surface of the substrate with wiring thus produced to form a shielding layer 25, thereby obtaining an electrode substrate (i).
- a silver circuit was formed on a heat-resistant glass substrate in the same manner as in Example 1, and an FTO film was formed on the substrate surface. This was used as a transparent conductive layer 23 and a shielding layer 25 to obtain an electrode substrate (ii).
- a gold circuit was formed on a 100 mm square FTO glass substrate by the additive plating method.
- the gold circuit was formed in a grid on the substrate surface, and had a circuit width of 50 tm.
- a silver printed circuit was overprinted as the outer layer 24b, and dried and sintered in the same manner as in Example B1.
- the silver paste contained silver particles 55Z glass frit 45 (mass ratio) and had a film thickness of 8 tm (3 im outer layer + 5 m inner layer).
- An FTO layer having a thickness of 300 nm was formed on this surface in the same manner as in Example B1 to form a shielding layer 25, thereby obtaining an electrode substrate (iii).
- a wiring cell (Mi) was obtained in the same manner as in Example 1.
- the photoelectric conversion characteristics were evaluated using simulated sunlight of AM 1.5, the conversion efficiency of the wired cell (iii) was 3.1%.
- Example B 1 A silver paste (silver particles 92 glass frit 8 (mass ratio)) was printed on a 100 mm square FTO glass substrate so as to have a circuit width of 250 m and a film thickness of 8 m. Dried and sintered in the same manner as in An FTO layer of 300 nm was formed on this surface in the same manner as in Example B1 to form a shielding layer 25, and an electrode substrate (iv) was obtained.
- silver paste silver particles 92 glass frit 8 (mass ratio)
- a wiring type cell (iv) was obtained in the same manner as in Example ⁇ 1. Focusing on the electrolyte injected into the wiring type cell (iv), the brownish brown immediately after the injection turned almost transparent after a few minutes. This is probably because I 3 in the electrolyte reacted with unexposed silver that had been exposed and was reduced to I.
- Example B A silver paste (silver particles 55 / glass frit 45 (mass ratio)) was printed on a 100 mm square FT0 glass substrate so as to have a circuit width of 250 m and a film thickness of 8 m. Dried and sintered in the same manner as 1. An FTO layer of 300 nm was formed on this surface in the same manner as in Example B1 to form a shielding layer 25, and an electrode substrate (v) was obtained.
- a wiring cell (V) was obtained in the same manner as in Example B1.
- the photoelectric conversion characteristics were evaluated using simulated sunlight of AM 1.5, the conversion efficiency of the wiring type cell (V) was 0.18%.
- a gold circuit was formed on a 100 mm square FTO glass substrate by the additive plating method.
- the gold circuit was formed in a lattice pattern on the substrate surface, the circuit width was 50 mm, and the film thickness was 5 Aim.
- An FTO layer having a thickness of 300 nm was formed on this surface in the same manner as in Example B1 to form a shielding layer 25, and an electrode substrate ( ⁇ ) was obtained.
- this electrode substrate ( ⁇ ) was confirmed using SEM and EDX, there was a recess at the bottom of the circuit (wiring), which was thought to be caused by the tailing of the plating resist, and FT 0 was found in the shadow. It was not coated.
- a wiring-type cell ( ⁇ ⁇ ⁇ ) was obtained in the same manner as in Example B1.
- the photoelectric conversion characteristics were evaluated using simulated sunlight of AM 1.5, the wiring type cell (vi) The conversion efficiency was 0.3%.
- a test cell (vii) was obtained in the same manner as in Example B1 using a FT glass substrate of 100 mm square without wiring.
- the conversion efficiency of the test cell (vii) was 0.11%.
- the wiring cells of Examples B1 to B3 were all excellent in photoelectric conversion efficiency, whereas the wiring cell ( ⁇ ) of Comparative Example B1 had a single metal wiring layer 24. Since the shielding by the shielding layer 25 was insufficient, the characteristics of the electrode substrate could not be brought out, and the conversion efficiency was not good.
- Comparative Example ⁇ The wiring type cell (V) of 2 has a single metal wiring layer 24 and has a high volume resistivity, so that the resistance of the electrode substrate cannot be reduced and a high output cannot be obtained.
- Comparative Example ⁇ In the wiring type cell (vi) of 3, since the metal wiring layer 24 was composed of one layer and the shielding by the shielding layer 25 was insufficient, the characteristics of the electrode substrate could not be brought out. The conversion efficiency was not good.
- the electrode substrate 21 reduces the surface roughness (roughness) of the metal wiring layer 24 and provides a substrate surface on which a dense shielding layer 25 without pinholes or the like can be formed. According to the dye-sensitized solar cell having such an electrode substrate 21, corrosion of metal wiring due to the electrolyte and reverse electron transfer from the metal wiring layer 24 to the electrolyte are suppressed, and the output effect of the photoelectric conversion element is reduced. Further improve.
- FIG. 10 is a schematic sectional view showing another embodiment of the present invention.
- the transparent substrate 32 has a wiring pattern that has been grooved by laser or etching.
- the concave portion formed by the groove processing means a state reaching below the surface of the transparent substrate 32, and there is no limitation on a shape such as a lens shape, a concave shape, and a V-valley shape.
- the term “surface” refers to the surface of the substrate surface on which a semiconductor porous film or the like is formed and which is disposed to face the counter electrode.
- glass such as heat-resistant glass is generally used as the transparent substrate 32.
- the metal wiring layer 33 is formed along the wiring pattern formed in the transparent substrate 32 by the groove processing, and at least a part of the metal wiring layer 33 reaches a height equal to or lower than the surface of the transparent substrate 32. There is no particular limitation as long as it has a structure. For example, as shown in FIG. 10, the surface of the metal wiring layer 33 has the same height as the surface of the transparent substrate 32, and as shown in FIG.
- the surface of the metal wiring layer 33 has the surface of the transparent substrate 32. It may be one that has reached a position higher than the surface, or one in which the metal wiring layer 33 is entirely formed below the surface of the transparent substrate 32 (not shown). In any of the embodiments, when viewed from the direction in which the shielding layer 35 is formed, it is preferable that the shape be as smooth as possible with no noticeable unevenness, shading or voids. It is preferable that the step between the surface of the metal wiring layer 33 and the surface of the transparent substrate 32 be smaller.
- the material for forming the metal wiring layer 33 is not particularly limited. For example, gold, silver, platinum, aluminum, nickel, titanium and the like can be used.
- a method for forming the metal wiring layer 33 for example, various methods such as a screen printing, a metal mask, an inkjet method, and a plating method, a sputtering method, and an evaporation method are used without any particular limitation. it can. Particularly preferably, a method including at least one of a plating method and a printing method is selected.
- the height of the surface of the metal wiring layer 33 can be adjusted, for example, by making the surface height of the transparent substrate 32 uniform by polishing.
- the positional relationship between the metal wiring layer 33 and the transparent conductive layer 34 is not particularly limited. In the embodiment of FIG.
- the metal wiring layer 33 is buried in the groove formed on the surface of the substrate 32, and then the transparent conductive layer 34 is formed over the entire surface of the substrate 32. I have. In this case, the entire upper surface of the metal wiring layer 33 is electrically connected to the lower surface of the transparent conductive layer 34.
- the transparent conductive layer 34 is formed over the entire surface of the substrate 32, and then a groove is formed so as to form a wiring pattern, and the metal wiring layer 33 is embedded in the groove. Have been.
- the upper end of the metal wiring layer 33 rises above the transparent conductive layer 34, and the edge of the adjacent transparent conductive layer 34 is formed. It is preferable to cover over a certain width.
- the overhang 33 A makes it possible to ensure conduction.
- a shielding layer 35 is formed over the entire surface of the substrate 32. As shown in FIG. 11, the shielding layer 35 may be raised one step above the metal wiring layer 33, or may be a flat surface over the entire surface. Is also good.
- a transparent conductive layer 34 is formed on the entire surface of the substrate 32 including the inside of the groove.
- a metal wiring layer 33 is formed in the groove.
- the upper end of the metal wiring layer 33 rises above the transparent conductive layer 34, and the gap between the transparent conductive layer 34 and the adjacent transparent conductive layer 34 increases. Is preferably covered over a certain width.
- the overhang 33 A makes it possible to ensure conduction.
- a shielding layer 35 is formed over the entire surface of the metal wiring layer 33 and the substrate 32. As shown in FIG. 12, the shielding layer 35 may be raised one step above the metal wiring layer 33, or may be a flat surface over the entire surface.
- FIG. 12B is a modification of the embodiment of FIG. 11, and is characterized in that the shielding layer 35 is formed only at a position covering the metal wiring layer 33. As shown in FIG. 12C, the upper end surface of the metal wiring layer 33 may be concave due to volume shrinkage when the metal wiring layer 33 is formed.
- FIG. 12D is a cross-sectional view of an example of a dye-sensitized solar cell using the electrode substrate 31 of FIG. 12B.
- the same reference numerals are given to the same components as those in FIG. 12B.
- a material for forming the transparent conductive layer 3 4 is not particularly limited, for example, tin added pressure indium oxide (ITO), tin oxide (S n 0 2), fluorine-doped tin oxide (FT 0) etc. may be mentioned. However, it is preferable to appropriately select a material having the highest possible light transmittance according to the combination of materials and the application.
- ITO indium oxide
- S n 0 2 tin oxide
- FT 0 fluorine-doped tin oxide
- a method for forming the transparent conductive layer 34 for example, a known method such as a sputtering method, an evaporation method, CVD or SPD, or an appropriate method depending on the material for forming the transparent conductive layer 34 is used. Good.
- the transparent conductive layer 34 when the transparent conductive layer 34 is formed on the substrate on which the metal wiring layer 33 is disposed, the transparent conductive layer 34 may also serve as the shielding layer 35. .
- a shielding layer 35 is formed on the surface of the conductive layer composed of the metal wiring layer 33 and the transparent or conductive layer 34.
- the shielding layer 35 preferably contains at least one of a glass component, a metal oxide component, and an electrochemically inactive resin component.
- the glass component is a low-melting amorphous or crystalline glass component such as lead oxide or lead borate
- the metal oxide component is titanium oxide, zinc oxide, or fluorine-added tin oxide (F
- electrochemically inactive resin components such as D0
- tin-added indium oxide (ITO) include polyolefin resins, polyimide resins, polybenzoxazole resins, and polyurethane resins. These can be used alone or in combination of two or more.
- the shielding layer 35 made of a metal oxide component (oxide semiconductor) will be described in more detail.
- a material the rate of electron transfer reaction with a redox species-containing electrolytic solution that comes into contact with a dye-sensitized solar cell is considered. It is required to have characteristics such as low speed, excellent light transmittance, and not hinder the movement of generated photoelectrons.
- the material is not particularly limited as long as it satisfies such required characteristics, but examples thereof include titanium oxide, zinc oxide, niobium oxide, tin oxide, FTO, and ITO.
- the formation range of the shielding layer 35 is not particularly limited as long as it includes at least the surface of the metal wiring layer 33, and may be limited to only the surface of the metal wiring layer 33, or may be limited to the surface of the metal wiring layer 33.
- a wider range including the transparent portion where the transparent conductive layer 34 is disposed may be used.
- the problem is small compared to the metal wiring layer 33, it has been pointed out that reverse electron transfer from the transparent conductive layer 34 has been pointed out, so it shields a wider area including the transparent part where the transparent conductive layer 34 is arranged.
- the method for forming the shielding layer 35 is not particularly limited.
- a method in which a target compound or a precursor thereof is formed by a dry method such as a sputtering method, an evaporation method, or a CVD method.
- a precursor such as a metal
- the shielding layer 35 can be formed by oxidizing the film by a heat treatment or a chemical treatment.
- a solution obtained by dissolving or dispersing the target compound or its precursor is applied by a spin coating method, a dive method, a blade coating method, or the like, and then the target compound is heated or chemically treated. Shielding by chemical change to Layer 35 can be formed.
- the precursor include salts and complexes having the constituent metal element of the target compound.
- the shielding layer 35 can be formed by changing the oxide semiconductor into a target oxide semiconductor.
- the circuit thickness can be increased without increasing the level difference, so that the aperture ratio (the ratio of non-wiring portions) of the electrode substrate 31 can be increased and the resistance can be reduced. it can.
- the dye-sensitized solar cell according to the present embodiment includes a working electrode including a dye-supported oxide semiconductor porous film on the above-described electrode substrate 3 ⁇ , and a counter electrode disposed to face the working electrode.
- An electrolyte layer containing a redox couple is provided between the working electrode and the counter electrode.
- the material of the semiconductor porous film may be the same as in the above embodiment.
- a method for producing a semiconductor porous film for example, a colloid solution or a dispersion liquid (including an additive, if necessary) is prepared by a screen printing method, an ink jet printing method, a roll coating method, a doctor blade method, In addition to coating using various coating methods such as spin coating and spray coating, electrophoretic deposition of fine particles, combined use of a foaming agent, and compounding with polymer beads (removing only type II components later) can be applied.
- the dye carried on the semiconductor porous film and the electrolytic solution for forming the electrolyte layer may be the same as in the previous embodiment.
- a quasi-solidified material, that is, a so-called gel electrolyte may be used by introducing an appropriate gelling agent into the electrolytic solution.
- the redox couple may be the same as in the previous embodiment.
- a p-type semiconductor or the like can be used as the charge transport layer.
- the p-type semiconductor for example, Monovalent copper conjugates such as copper iodide and copper cyanide can be suitably used.
- Various additives can be contained as required for the function and film formation.
- the method for forming the charge transport layer is not particularly limited, and examples thereof include a film forming method such as a casting method, a sputtering method, and an evaporation method.
- the counter electrode for example, various carbon-based materials, platinum, gold, and the like can be formed on a conductive or non-conductive substrate by a method such as vapor deposition or sputtering.
- a technique such as direct sputtering or coating on the surface may be used.
- the dye-sensitized solar cell of this embodiment has the above-described electrode substrate 31, corrosion of metal wiring due to the electrolytic solution and reverse electron transfer from the metal wiring layer 33 to the electrolytic solution are suppressed. The output effect is further improved.
- Grooves having a depth of 5 m were formed in a lattice circuit pattern on the surface of the glass with the FTO film of 100 ⁇ 100 mm.
- a metal conductive layer seed layer
- a metal wiring layer 33 was formed by additive plating.
- the metal wiring layer 33 was formed in a convex lens shape from the surface of the transparent substrate 32 to a height of 3 m.
- the circuit width was 60 m.
- an FTO film having a thickness of 400 nm was formed as a shielding layer 35 by the SPD method to obtain an electrode substrate ( ⁇ ).
- the cross-sectional shape of the electrode substrate ( ⁇ ) conforms to FIG.
- a titanium oxide dispersion having an average particle size of 25 nm was applied onto the electrode substrate (i), dried, and heated and sintered at 450 at 1 hour. This was immersed in an ethanol solution of a ruthenium bipyridine complex (N 3 dye) for 10 minutes to carry the dye.
- N 3 dye ruthenium bipyridine complex
- a 50 tm-thick thermoplastic polyolefin resin sheet was placed opposite to a platinum sputter FT0 substrate, and the resin sheet portion was melted by heat to fix the bipolar plates. Open the electrolyte injection port on the platinum electrode in advance, and add a methoxy acetate solution containing 0.5M iodide and 0.05M iodine as the main components between the electrodes. Injected.
- test cell (i) Photoelectric conversion of test cell (i) by AM 1.5 simulated sunlight When the characteristics were evaluated, the conversion efficiency was 2.8%.
- a circuit board was engraved on a heat-resistant glass surface of 100 ⁇ 10 Omm using a laser engraving machine to form a metal wiring layer 33 similar to that of Example C1.
- an FTO film having a thickness of 1,000 nm was formed as a transparent conductive layer 34 and a shielding layer 35 by the SPD method to obtain an electrode substrate (ii).
- the cross-sectional shape of the electrode substrate (ii) conforms to that of FIG. 11 except that the transparent conductive layer 34 extends over the metal wiring.
- a test cell (ii) was produced in the same manner as in Example C1. When the photoelectric conversion characteristics of the test cell (ii) were evaluated using simulated sunlight of AM 1.5, the conversion efficiency was 3.0%.
- the metal wiring layer 33 was polished to almost the same height as the substrate surface using a wafer polisher. From above, an FTO film was formed as a transparent conductive layer 34 and a shielding layer 35 to a thickness of 1,000 nm by an SPD method. Further, a titanium oxide film having a thickness of 30 nm was formed thereon by a sputtering method to form a shielding layer 35, which was used as an electrode substrate (iii). The cross-sectional shape of the electrode substrate (iii) conforms to FIG.
- test cell (iii) was produced in the same manner as in Example C1.
- the photoelectric conversion characteristics of the test cell (Mi) were evaluated using simulated sunlight of AM 1.5, the conversion efficiency was 3.1%.
- a metal wiring layer 33 (gold circuit) was formed on a 10 Omm square FTO glass substrate by an additive plating method.
- the metal wiring layer 33 (gold circuit) was formed in a grid pattern on the substrate surface, with a circuit width of 50 Am and a circuit thickness of 5 Atm.
- a 300 nm thick FTO film was formed as a shielding layer 35 by an SPD method to obtain an electrode substrate (iv).
- the cross section of the electrode substrate (iv) was confirmed using SEM and EDX, there was a sneaking in at the bottom of the wiring, probably due to the tailing of the plating resist, and the FTO was not covered in the shadow area .
- test cell (iv) was produced in the same manner as in Example C1.
- the photoelectric conversion characteristics of the test cell ( ⁇ ) were evaluated using simulated sunlight of AM 1.5, the conversion efficiency was 0.3%.
- test cell (V) was prepared using a 10-Omm square FTO glass substrate by the same method as in Example C1 with no wiring as a comparison.
- the photoelectric conversion characteristics of the test cell (V) were evaluated using simulated sunlight of AM 1.5, the conversion efficiency was 0.11%. From the above results, all of the test cells (i) to (iii) obtained in Examples C1 to 3 were excellent in photoelectric conversion efficiency, whereas those in Comparative Example C1 were excellent in photoelectric conversion efficiency.
- the characteristics of the electrode substrate could not be brought out because the shielding by the shielding layer 35 was insufficient, and the conversion efficiency was not good.
- a conductive circuit layer formed of a metal having a catalytic action or a substitutional metal or a material having the metal on a glass plate provided with a transparent conductive film.
- a conductive glass substrate having an insulating circuit protection layer formed on a conductive circuit layer a conductive material for a photoelectric conversion element, wherein a passivation metal is formed in a pinhole generated in the circuit protection layer.
- a glass substrate is used.
- a conductive glass substrate for a photoelectric conversion element having high transparency and excellent in chemical resistance, leakage current and conductivity can be obtained.
- reference numeral 41 denotes a glass plate, which is usually made of soda glass, heat-resistant glass or the like having a thickness of about 1 to 5 mm.
- Reference numeral 42 denotes a transparent conductive film provided on a glass plate 41, which is usually made of indium-doped tin oxide (ITO) or fluorine-doped tin oxide (FTO) having a thickness of about 0.2 to 1 tm. Thin film.
- ITO indium-doped tin oxide
- FTO fluorine-doped tin oxide
- a conductive circuit 44 is formed on the transparent conductive film 42.
- the conductive circuit 44 is formed by using a metal having a catalytic action or a substitutional metal with a passivated metal to be subsequently applied, or a material having the metal.
- the conductive circuit 44 is formed with an edge width of about 100 to 100 Oiim by plating or screen printing. Usually, a planar shape is formed in a grid shape or a comb tooth shape. The present invention is not limited to this.
- Conductivity The aperture ratio of the circuit 44 is preferably 75% or more, and may be 90 to 99%. If the aperture ratio is less than 75%, the light transmittance decreases and the amount of incident light is not sufficient. If it exceeds 9.9%, the conductivity may be insufficient. For example, the aperture ratio may be 75-85%, but is not limited to this range. The aperture ratio is defined as the ratio of the total area of the circuit to a unit area.
- the conductive circuit layer is formed of a conductive paste containing gold, silver, platinum, palladium, copper or aluminum metal, and at least one of these metals.
- the conductive paste includes conductive fine particles made of glass frit as an adhesive component, and the conductive fine particles simultaneously act as a catalyst for a passive metal to be subsequently applied or are substituted metal.
- those containing at least one of gold, silver, platinum, palladium, copper and aluminum metals are preferred, and those containing silver fine particles are particularly preferred.
- an insulating circuit protection layer 45 is formed on the conductive circuit 44.
- the insulating circuit protection layer 45 is formed to prevent a leakage current in which electrons flow back into the electrolyte from the conductive circuit 44, and is designed to sufficiently insulate the circuit 41. It is formed.
- a paste material having a glass frit as an adhesive component is used due to problems such as adhesion to the circuit 41, but this insulating paste material is used to form the conductive circuit 44 with a conductive paste.
- the baking treatment can be performed at a lower temperature than the conductive paste.
- a lead borosilicate glass frit, an inorganic adhesive, an organic adhesive, or the like is used.
- This insulating paste is formed on the circuit 41 so as to completely cover the circuit, usually by screen printing. It is preferable that the coating forming process is also performed a plurality of times. Originally, it is desirable to function as a sufficiently insulating circuit protective layer 45 at this stage. However, since this protective layer is a thin layer and is a fired type layer using glass frit, the circuit protective layer 4 5 is required. 5 was prone to pinholes, in which case the problem of leakage current occurred.
- a passive metal is formed on the insulating circuit protection layer 45. Specifically, it is formed by electroless metal plating.
- This uses a passive metal such as nickel, copper, or aluminum, which has been confirmed to be usable as a low-resistance circuit. It is preferable to select a material that can form the passivation of the metal by the electrolytic metal plating. That is, the electroless metal plating is electroless nickel plating, electroless cobalt plating or electroless tin plating.
- a passivated metal such as nickel, cobalt or tin is deposited on a pinhole portion to form a passivated metal.
- the conductive circuit 44 cuts off conduction between the electrolyte and the electrolyte. It is formed as the state described as 46 in FIG.
- Such a phenomenon is caused by adding one of palladium, platinum, gold, silver, copper and aluminum metal, which is a metal used for forming the circuit 41, as a catalyst metal or a substitution metal. Effect. That is, the catalyst type or the substitution type electroless metal plating is performed because metal plating is deposited on the metal having the catalytic action.
- these catalyst type or substitution type metal are both conductive elements, they can be used by adding them to a conductive paste for forming a circuit.
- electroless nickel plating, electroless cobalt plating, and electroless tin plating as the electroless metal plating to form the passivated metal, pinholes in the circuit protection layer are completely prevented.
- a conductive glass substrate 43 for a photoelectric conversion element can be obtained.
- Such a conductive glass substrate for a photoelectric conversion element is highly transparent, has excellent leakage current characteristics and conductivity, and has excellent chemical resistance.
- a dye-sensitized solar cell using the above-described conductive glass substrate will be described.
- a conductive circuit layer made of a metal having a catalytic action or a substitutional metal or a material containing the metal On a glass plate on which a transparent conductive film is applied, a conductive circuit layer made of a metal having a catalytic action or a substitutional metal or a material containing the metal, an insulating circuit protection layer, and a circuit protection layer.
- Ruthenium containing ligands such as biviridine and pyridine structures, which are called photosensitizing dyes, are placed on a conductive glass substrate for a photoelectric conversion element made of a passive metal formed in the pinholes of the layer.
- Complexes metal complexes such as porphyrins and phthalocyanines, and organic dyes such as titanium oxide, rhodamine, and merocyanine can be used to form metal oxide fine particles such as titanium oxide, tin oxide, tungsten oxide, zinc oxide, zirconium oxide, and titanium oxide.
- the supported material is formed as an oxide semiconductor porous film with a thickness of about 5 to 5 O ⁇ m, and an electrode circuit as a counter electrode is provided above this. , Between the counter electrode and the oxide semiconductor porous film, the electrolytic solution is filled. As this electrolyte, a non-aqueous electrolyte containing a redox pair is usually used.
- a hole transport layer made of a p-type semiconductor can be used instead of the electrolyte.
- a hole transport layer made of a p-type semiconductor can be used.
- the dye-sensitized solar cell having such a structure since the pinhole generated in the circuit protection layer by the electroless metal plating treatment is completely closed, there is no problem of leakage current, and the The circuit is not eroded by the electrolyte.
- this type of solar cell can be manufactured at relatively low cost, and it can be said that it is practical.
- a transparent conductive film layer is formed on the surface of the glass plate, and a conductive circuit layer having a catalytic action or a substitutional metal or a material having the metal is formed thereon by a plating method or screen printing. Then, a thin layer is formed thereon by, for example, an insulative paste using a screen printing method, a spin coat method, a doctor blade method, or the like, and a circuit protective layer is provided. Passive metal is formed in the pinhole of the circuit protection layer by electrolytic plating. According to this method, the conductive glass substrate for a photoelectric conversion element having high transparency, excellent leakage current characteristics and conductivity, and excellent chemical resistance, and a conductive glass for the photoelectric conversion element.
- the lath substrate can be manufactured at low cost. That is, using a conductive base containing at least one of gold, silver, platinum, palladium, copper, and aluminum, and at least one of these metals, a desired conductive circuit layer is formed by a plating method or a screen printing method. 41 is formed thereon, and a thin film is formed thereon by using an insulating paste by a screen printing method, a spin coating method, a doctor blade coating method or the like to form a circuit protection layer. Then, since it is preferably manufactured by performing electroless plating of nickel, cobalt or tin, a high-performance conductive glass substrate for a photoelectric conversion element can be manufactured by a relatively simple method. In the obtained conductive glass substrate for a photoelectric conversion element, the passivation of metal is formed by an electroless metal plating so as to cover the pinhole portion of the circuit protective layer. The electrolyte circuit and the electrolyte can be sufficiently shut off.
- Example D1 corresponding to this embodiment will be described, and the effect thereof will be described.
- a sintering type silver paste is used for screen printing, and the line width is 1 OO tm and the aperture ratio is 90%. , 95% and 99% of three types of grid-like conductive circuits were formed.
- screen printing was performed at an edge width of 200 tm, and then sintering was performed at 550 ° C for 1 hour. I went.
- Comparative Example D 1 the one up to the stage where the insulating circuit protective layer was formed was immersed in an iodine electrolytic solution in the same manner as in Example D 1 and observed in the same manner.
- Example D1 The results show that the conductive glass substrate subjected to the electroless nickel plating treatment, the electroless cobalt plating treatment and the electroless tin plating treatment of Example D1 has needle-like silver, cobalt and tin on the insulating circuit protective layer. No metal was detected. The leakage current was 0.1 mA / cm 2 or less. On the other hand, in Comparative Example D1, a large number of portions where needle-like silver was deposited on the circuit protective layer were observed. The leakage current was also 0.5 mAZ cm 2 or more.
- the conductive glass substrate for photoelectric conversion elements has almost no leakage current and excellent conductivity. In addition, it has high transparency and chemical resistance, and its production method is also performed by electroless metal plating. A transparent glass substrate.
- the conductive glass substrate of this embodiment is obtained by forming a catalyst having a catalytic action with a passive metal or a substitutional metal or the metal on a glass plate provided with a transparent conductive film.
- a transparent conductive layer is formed on the surface of the glass plate, and then a metal plate having a catalytic action or a substitution type metal or a material containing the metal is used for the metal plate or the screen.
- a conductive circuit layer is formed by printing, a circuit protective layer is formed thereon by an insulating paste, and a passivated metal is formed by electroless plating of nickel, cobalt or tin metal. According to this method, it is possible to manufacture a conductive glass substrate for a photoelectric conversion element having excellent conductivity without a problem of leakage current at a relatively low cost.
- the conductive circuit may be a conductive metal and a metal acting as a catalyst or a substitution metal, such as gold, silver, platinum, palladium, copper or aluminum metal, or a conductive paste having at least one of the above metals.
- the method for producing a conductive glass substrate for a photoelectric conversion element is characterized in that the electroless metal plating is electroless nickel plating, electroless cobalt plating, or electroless tin plating.
- FIG. 14 shows the electrode substrate 51 of the present invention. It is sectional drawing which shows one Embodiment.
- the electrode substrate 51 of this embodiment includes a transparent conductive layer 511 on a base material 510 and a metal wiring layer formed on the transparent conductive layer 511. 5, and an insulating layer 5 14 covering the surface of the metal wiring layer 5 12. That is, the metal wiring layer 5 12 is insulated and covered by the insulating layer 5 14.
- the material of the substrate 5 10 may be the same as that of the substrate 10.
- the transparent conductive layer 511 is formed on the base 510 over an area wider than the area where the metal wiring layer 512 is formed.
- the material is not particularly limited, and the light transmission It is only necessary to select a material that is suitable for the combination of materials and the application in consideration of the efficiency and conductivity. Specific examples include indium tin oxide (I Ding 0), tin oxide (3 n 0 2), conductive metal oxides such as fluorine-doped tin oxide (FTO) and the like.
- a method of forming the transparent conductive layer 511 a known appropriate method according to the material of the transparent conductive layer 511 may be used, and examples thereof include a sputtering method, an evaporation method, an SPD method, and a CVD method. No. In consideration of light transmittance and conductivity, it is usually formed to a thickness of about 0.001 m to 10 A6 IT1.
- the metal wiring layer 512 a metal such as gold, silver, platinum, aluminum, nickel, and titanium was formed as wiring.
- the wiring pattern of the metal wiring layer 512 is not particularly limited, and may be a lattice shape as shown in FIG. 15, or a pattern such as a stripe shape, a strip shape, or a comb shape.
- each wiring of the metal wiring layer 512 is not particularly limited, but is preferably 0.1 to 10 jam.
- a paste is prepared by mixing a metal powder to be conductive particles and a binder such as glass fine particles, and the paste is formed by a screen printing method, a metal mask method, an ink jet method.
- a coating film is formed so as to form a predetermined pattern by using a printing method such as printing, and the conductive particles are fused by heating and firing.
- the firing temperature is, for example, preferably 600 ° C. or lower, more preferably 550 ° C. or lower when the substrate 5 10 is glass.
- sputter method, evaporation A forming method such as a plating method or a plating method can also be used.
- the surface of the metal wiring layer 512 is smooth. However, higher priority is given to having higher conductivity, and there may be some unevenness or unevenness.
- Specific resistance of the metal wiring layers 5 1 2 is at least 9 X 1 0 _ 5 ⁇ ⁇ cm or less, more preferred details, it is desirable that less than 5 X 1 0- 5 ⁇ ⁇ cm .
- the insulating layer 514 covers the metal wiring layer by depositing one or more insulating materials including heat-resistant ceramic on the region where the metal wiring layer 512 is formed. .
- the heat-resistant ceramic examples include, for example, at least one selected from alumina, zirconia, and silica, and a plurality of types may be used in combination.
- the heat resistance of the heat-resistant ceramic is preferably such that it can withstand the heat history when the electrode substrate is manufactured. More specifically, it is preferable to use an aggregate made of a heat-resistant ceramic and a binder containing at least one or more of a silicate, a phosphate, a colloidal silica, an alkyl silicate, and a metal alkoxide.
- Such an insulating layer 504 can be obtained from an adhesive composition (a bar coat material) containing an aggregate serving as a main component, the binder, a curing agent, and the like.
- the adhesive composition has an insulating property mainly composed of heat-resistant ceramics such as alumina, zirconia and silica, and inorganic polymers such as polysiloxane and polysilane by a reaction such as a hydrolysis reaction, a condensation reaction and a polymerization reaction. It provides a cured film (reactive inorganic coating layer).
- a commercially available reactive inorganic adhesive may be used.
- the printing method is preferable as the method for forming the overcoat material in view of process and cost.
- the method is not limited to the printing method, but may be a spray method, a dipping method, a doctor-blade method, or the like.
- the insulating layer 514 be dense without any significant defects such as pinholes.
- the insulating layer 514 may be a single layer or a plurality of layers.
- the insulating layer 514 includes a plurality of layers
- a plurality of types of the above insulating materials may be used in combination.
- configuration one or more layers of a plurality of layers is an insulating layer, for example, P b O, from P b O- B 2 0 3 and low melting point glass of lead-based or non-lead-based low-melting point glass, such as It may be.
- P b O insulating layer
- Low melting point glass of lead-based or non-lead-based low-melting point glass such as It may be.
- At least one layer needs to be a layer mainly composed of the heat-resistant ceramic.
- the insulating layer 514 described above is superior in terms of acid resistance and the like as compared with the case where the insulating layer is formed using only low melting point glass.
- the insulating layer 514 mainly comprises heat-resistant ceramics, it has excellent heat resistance, acid resistance, and the like. Therefore, there is no deterioration due to heat history during manufacturing. As a result, the metal wiring layer 5 1 2 is reliably shielded from the electrolyte and the like, and the corrosion of the metal wiring layer 5 1 2, the deterioration of the electrolyte due to the reaction with the metal constituting the metal wiring layer 5 ⁇ 2, the leakage current, etc. Problem can be effectively suppressed.
- the insulating film exhibits its performance stably and can maintain excellent characteristics for a long time.
- FIG. 16 is a schematic sectional view showing another embodiment of the electrode substrate.
- the metal wiring layer 5 ⁇ 2 is provided on the base material 5 10, and the transparent conductive layer 5 1 1 1 extends over the metal wiring layer 5 1
- the wiring layer 512 is formed over a wider area than the area where the wiring layer 512 is formed.
- the insulating layer 514 is formed on the transparent conductive layer 511 so as to overlap the pattern of the metal wiring layer 512 so as to cover the upper surface and side surfaces of the metal wiring layer 512. That is, the insulating layer 514 is provided on the metal wiring layer 512 via the transparent conductive layer 511.
- the metal wiring layer 5 12 can be insulated and shielded by the insulating layer 5 14 similarly to the electrode substrate 51 of the first embodiment as shown in FIG. The occurrence of leakage current is suppressed, and the electrode substrate 51 has excellent characteristics.
- the metal wiring layer 512 is formed directly on the base material 510 or at a height higher than the surface of the base material 510 via the transparent conductive layer 511 or the like.
- the electrode substrate of the present invention is not limited to this.
- the substrate surface 5110b is the surface on which the transparent conductive layer 511 and the metal wiring layer 512 are formed.
- the concave portion 51 Oa is formed along the wiring pattern as a concave portion such as a groove or a depression.
- the concave portion may be formed by a processing method according to the material of the substrate 510.
- the concave portion can be processed by laser or etching.
- the cross-sectional shape of the concave portion 500a is not particularly limited, such as a lens shape, a semicircular shape, a U-shape, a V-valley shape, and a square shape.
- the material and forming method of the metal wiring layer 512 may be the same as those described above.
- the metal wiring layer 5 12 is located in a recess 5 10 a formed by recessing a base surface 5 10 b of the base 5 10.
- the structure has reached a height of 5 10 b or less.
- the surface of the metal wiring layer 5 12 is the same height as the base surface 5 10 b, and as shown in FIGS. 18 and 19, the metal wiring layer 5 12 where the surface of 2 has reached a position higher than the substrate surface 5 10 b, and as shown in FIG. 20, the entire metal wiring layer 5 1 2 is located below the substrate surface 5 10 b and so on.
- the positional relationship between the metal wiring layer 5 12 and the transparent conductive layer 5 11 is not particularly limited.
- the transparent conductive layer 5 11 And the structure formed on the base material surface 5 10 b.
- the transparent conductive layer 5 11 1 is formed on the base material surface 5 10 b and the metal wiring layer 5 1 2
- a transparent conductive layer 511 is formed on the recess 510a and the substrate surface 510b, and the metal wiring layer 5 ⁇ 2 is formed on the transparent conductive layer 5 11.
- the metal wiring layer 5 1 2 may be in contact with the inner surface of the concave portion 5 10 a, and may be provided between the inner surface of the concave portion 5 10 a and the metal wiring layer 5 12, such as a transparent conductive layer 5 1 1. Layers may be interposed.
- the insulating layer 514 may be formed at least over the region where the metal wiring layer 5-2 is formed. It may be formed directly on the metal wiring layer 5 12 or another layer such as the transparent conductive layer 5 11 may be interposed between the insulating layer 5 14 and the metal wiring layer 5 ⁇ 2. May be present. In any of the embodiments, it is desirable that the metal wiring layer 512 has a smooth state in which there are as few irregularities as possible, and there is as little void as possible. It is desirable that the step between the surface of the metal wiring layer 512 and the substrate surface 5110b of the substrate 510 be as small as possible.
- the metal wiring layer 512 has a structure in which the height of the base material surface 510b or less is reached, the surface of the metal wiring layer 512 and the base material surface 5 The thickness of the metal wiring layer 512 can be increased without increasing the step from 10b. Therefore, the aperture ratio of the substrate 510 (the ratio of the portion where the metal wiring layer 512 is not formed) can be increased, and the electric resistance of the circuit can be reduced.
- a transparent conductive layer 511 is formed on a base material 5 10, and a metal wiring layer 5 1 is formed on the transparent conductive layer 5 1 1 in a predetermined pattern. 2 is formed.
- a shielding layer 513 made of an oxide semiconductor thin film is provided on the transparent conductive layer 511, and an insulating layer 514 is formed on the metal wiring layer 512.
- a metal wiring layer 512 is formed in a predetermined pattern on a base material 510, and a metal wiring layer 512 is formed on the metal wiring layer 512.
- the transparent conductive layer 511 is formed over a region wider than the region where the layer 512 is formed.
- a shielding layer 5-3 made of a thin film of an oxide semiconductor is provided on the transparent conductive layer 511. Further, an insulating layer 5 14 is formed on the shielding layer 5 13 so as to overlap the pattern of the metal wiring layer 5 12 so as to cover the top and side surfaces of the metal wiring layer 5 12. I have.
- a transparent conductive layer 511 is formed on a base material 510, and a metal wiring layer 511 in a predetermined pattern is formed on the transparent conductive layer 511. 2 is formed. On this metal wiring layer 512, an insulating layer 514 is formed.
- the shielding layer 5 13 is formed not only on the transparent conductive layer 5 11 but also on the metal wiring layer 5 12 and the insulating layer 5 14.
- the material of the shielding layer 5 13 is the electron transfer reaction rate with the electrolyte containing the redox species. Is low and and optical transparency, the selected mobile has a high ability compound of photoelectrons, titanium oxide (T i 0 2), zinc oxide (Z n O), niobium oxide (N b 2 0 5), tin oxide ( S n 0 2), fluorine-doped tin oxide (FTO), tin-doped indium oxide (I tO) is exemplified.
- the shielding layer 5 13 needs to be formed thin enough not to hinder electron transfer to the transparent conductive layer 5 11, and preferably has a thickness of about 10 to 3000 nm.
- Examples of the method for forming the shielding layer 513 include a sputtering method, an evaporation method, a spray pyrolysis method (SPD method), a spin coating method, a dive method, and a doctor blade method.
- SPD method spray pyrolysis method
- spin coating method a dive method
- doctor blade method a doctor blade method.
- these methods are not always sufficient in terms of the fineness of the shielding layer 5 13 and the adaptability to the surface shape of the substrate 5 10, and the shielding performance of the metal wiring layer 5 12 is not sufficient. Difficult to get.
- the insulating layer 5 1 1 is formed directly on the metal wiring layer 5 1 2 or via the transparent conductive layer 5 1 1 1 or the shielding layer 5 13. It is necessary to form 4. Thereby, the insulation of the metal wiring layer 512 can be sufficiently performed.
- the method for forming the shielding layer 5 13 is not particularly limited.
- an oxide semiconductor or a precursor thereof as a target compound is formed by a dry method (gas phase method) such as a sputtering method, an evaporation method, or a CVD method.
- a method of forming a film is included.
- the shielding layer 513 can be obtained by oxidizing the film by heat treatment or chemical treatment.
- a liquid containing the target compound or its precursor is applied by a method such as spin coating, divebing, or blade coating, and then chemically changed to the target compound by heat treatment or chemical treatment.
- the shielding layer 513 can be obtained.
- the precursor include salts and complexes having the constituent metal element of the target compound.
- a solution is preferable to a dispersion.
- the substrate 5 10 having the transparent conductive layer 5 11 is heated and directed toward the substrate 5 10. It is also possible to use a method of forming the shielding layer 513 by spraying a substance serving as a precursor of the shielding layer 513 and thermally decomposing the substance into a target oxide semiconductor. You.
- the shielding layer 5-3 for shielding the transparent conductive layer 511 in this manner, the reverse electron transfer from the transparent conductive layer 511 can be suppressed. With the use, a photoelectric conversion element with high photoelectric conversion efficiency can be manufactured.
- the shielding layer 5 13 can have an effect as a protective layer for a purpose different from, for example, the insulating layer 5 14 as necessary in terms of characteristics.
- the shielding layer 513 can be used as a protective layer for the metal wiring layer 512 and the insulating layer 514.
- the electrode substrate 51 shown in FIG. 24 has a metal wiring layer 512 as a wiring pattern such as a lattice, stripe, or comb on the first transparent conductive layer 51a.
- An insulating layer 514 for covering the metal wiring layer 512 is provided on the metal wiring layer 512.
- a second transparent conductive layer 511b is formed over the metal wiring layer 512 and the insulating layer 514. That is, the metal wiring layer 512 and the insulating layer 514 were sandwiched between the first transparent conductive layer 511a and the second transparent conductive layer 511b.
- the first and second transparent conductive layers 5 11 a and 11 b are the same as the above-described transparent conductive layer 5 11 1, and are thin films made of a conductive metal oxide such as ITO and F 0. is there.
- the insulating layer 5 14 provides insulation shielding of the metal wiring layer 5 1 2 and the second transparent conductive layer 5 1 1 b provides the metal wiring layer 5 1 2
- the insulating layer 5 14 can be protected.
- FIG. 25 shows an example of a photoelectric conversion element constituting a dye-sensitized solar cell.
- the photoelectric conversion element 56 includes a working electrode 53 formed of an oxide semiconductor fine particle such as titanium oxide on an electrode substrate 51 and having an oxide semiconductor porous film 52 carrying a photosensitizing dye. And a counter electrode 54 provided opposite to the working electrode 53. Between the working electrode 53 and the counter electrode 54, a charge transfer layer 55 made of an electrolyte such as an electrolyte or a p-type semiconductor is formed.
- an oxide semiconductor porous film 52 carrying a photosensitive dye is formed on the surface of the electrode substrate 51. And the oxide semiconductor porous film 52 constitute a working electrode 53 of the photoelectric conversion element 56.
- the electrode substrate 51 As the electrode substrate 51, the electrode substrate 51 having the configuration shown in FIG. 14 is illustrated, but the present invention is not particularly limited to this, and the electrode substrate of any of the embodiments can be used. .
- the oxide semiconductor porous film 5 titanium oxide (T i 0 2), tin oxide (S n 0 2), oxidation of tungsten (W 0 3), zinc oxide (Z n O), niobium oxide (N b 2 ( 5 )
- the average particle size of the oxide semiconductor fine particles is preferably in the range of 1 to 100 nm.
- the thickness of the oxide semiconductor porous film 52 is preferably about 0.5 to 50.
- the method for forming the oxide semiconductor porous film 52 is not particularly limited.
- a method in which a commercially available oxide semiconductor fine particle is dispersed in a desired dispersion medium or a sol-gel method is used.
- the desired colloid solution is added with the desired additives as required, and then applied by a known coating method such as screen printing, ink jet printing, roll coating, doctor blade, spin coating, or spray coating. Method.
- the electrode substrate 51 was immersed in a colloidal solution, and electrophoretic deposition of the oxide semiconductor fine particles on the electrode substrate 51 was performed. Then, sintering to make it porous, mixing and applying polymer microbeads, removing this polymer microbead by heat treatment or chemical treatment to form voids and make it porous. Applicable.
- the sensitizing dye supported on the oxide semiconductor porous film 52 is not particularly limited, and examples thereof include a ruthenium complex containing a biviridine structure, a Yuichi pyridine structure, and the like as a ligand, an iron complex, a porphyrin-based dye, and the like. From phthalocyanine-based metal-containing complexes, organic dyes such as dyes, rhodamines, and merocyanines, those having an excitation behavior suitable for the use or oxide semiconductor can be appropriately selected and used.
- an electrolyte containing a redox couple can be used.
- a gel electrolyte obtained by quasi-solidifying the above electrolytic solution with a suitable gelling agent may be used.
- Solvents for the electrolyte include acetonitrile and methoxy.
- Organic solvents such as acetic acid, propionitrile, propylene carbonate, getylcaprate, and heptyl lactone; quaternized imidazolyl-based cations; It can be used by selecting from room temperature molten salts such as dione.
- the redox couple contained in the electrolyte is not particularly limited, and can be obtained by adding a pair of iodine / iodide ion, bromine Z bromide ion and the like.
- a source of iodide ion or bromide ion lithium salt, quaternized imidazonium salt, tetrabutylammonium salt and the like can be used alone or in combination. If necessary, additives such as t-tert-butylpyridine may be added to the electrolyte.
- the charge transfer layer 55 may use a p-type semiconductor instead of the electrolyte.
- a p-type semiconductor for example, a monovalent copper compound such as copper iodide and copper cyanide can be suitably used.
- the method for forming the charge transport layer 55 from the p-type semiconductor is not particularly limited, and examples thereof include a casting method, a sputtering method, and a vapor deposition method.
- the p-type semiconductor may contain an appropriate additive as required for film formation.
- the counter electrode 54 includes, for example, a substrate made of a non-conductive material such as glass, various types of carbon-based materials, metal materials such as gold and platinum, and conductive oxide semiconductors such as ITO and FT0. An electrode formed with an electrode can be used.
- the electrode is a platinum film, for example, a method of applying chloroplatinic acid and heat-treating the electrode can be exemplified.
- the electrodes may be formed by an evaporation method or a sputtering method.
- a conductive material serving as an electrode of the counter electrode 54 is directly formed on the charge transfer layer 55 by a method such as sputtering or coating. Can be used.
- the insulating layer 514 of the electrode substrate 51 is mainly composed of heat-resistant ceramics, it has excellent heat resistance, acid resistance, etc., and depends on the heat history during manufacturing. There is no deterioration. For this reason, the metal wiring layer 512 is reliably shielded from the electrolyte solution of the charge transfer layer 55, and corrosion and leakage current of the metal wiring layer 512 can be effectively suppressed. Prevents contact between metal wiring layer 5 1 2 and electrolyte layer 5 5 As a result, it is possible to suppress the decrease in output due to the current and greatly improve the cell characteristics.
- An electrode substrate 51 as shown in FIG. 15 was produced by the following procedure.
- a glass substrate with an FTO film of 10 OmmX ⁇ 0 Omm was used as the transparent conductive layer 511 and the substrate 5110.
- a silver paste for printing (having a volume resistivity of 3 x 10 " 6 ⁇ after sintering) is screen-printed on the surface of the glass substrate, and after leveling for 10 minutes, the temperature is set at 135 ° C, 20 ° C.
- a metal wiring layer 5 12 composed of a silver circuit.
- the circuit width of the metal wiring layer 5 12 was 500 / _tm,
- the film thickness was set to 5 ⁇ , and it was formed in a shape extending in the shape of a strip from the current collector terminal.It was superimposed on the metal wiring layer 512 while performing alignment using a CCD camera.
- the insulating layer 5 14 was formed by printing each of the five types of overcoat materials shown in 1.
- the width of the insulating layer 5 ⁇ 4 was determined on both sides in the width direction of the metal wiring layer 5 12 An extra 1 OO / m per unit and a height from the surface of the glass substrate of 1 O tm was used as a guide. 5 1 4 of the thickness of the metal wiring layers 5 1 2 is about 5 m.
- Example E 1-2 of Table 1 the description “alumina + metal alkoxide / low melting point glass space” refers to a first insulating layer mainly composed of “alumina + metal alkoxide” and a “low melting glass paste”. It means that a second insulating layer mainly composed of “U” is laminated. The second insulating layer is formed by laminating on the P bO- B 2 0 3 system have use commercial me low melting point glass paste of the first insulating layer by screen printing. In this case, the thickness of the first insulating layer is about 5 tm, and the thickness of the second insulating layer is about 5 Atm.
- a titanium oxide dispersion having an average particle diameter of 20 to 25 nm is applied, dried, heated at 450 ° C. for 1 hour, and sintered to obtain an oxide semiconductor porous film 52.
- the electrode was immersed in an ethanol solution of a ruthenium biviridine complex (N 3 dye) for 10 minutes to carry the dye, thereby producing a working electrode 53.
- N 3 dye ruthenium biviridine complex
- a platinum electrode FTO glass electrode substrate is used as the counter electrode 54, and the counter electrode 54 and the working electrode 53 are interposed with a thermoplastic resin sheet having a thickness of 50 Aim as a spacer.
- the electrodes 53 and 54 were fixed by heat-melting the resin sheet. At this time, a part on the counter electrode 54 side was left open for the electrolyte injection port.
- a methoxyxetrile solution containing 0.5 M iodide salt and 0.05 M iodine as a main component was injected from the injection port to form a charge transport layer 55, and then a peripheral portion was formed.
- the liquid injection port was completely sealed with a thermoplastic resin sheet and an epoxy-based sealing resin, and a current collecting terminal portion was formed with glass solder, thereby producing a photoelectric conversion element serving as a test cell.
- a photoelectric conversion element serving as a test cell.
- An electrode substrate 51 as shown in FIG. 16 was produced by the following procedure.
- a 100 mm ⁇ 100 mm glass substrate was used as the base material 5 10, and a gold circuit (metal wiring layer 5 12) was formed on the surface by plating.
- the circuit shape was the same as in Example E1, and the circuit thickness was 2 tm.
- a 1000 nm thick FTOZITO composite film was formed on the glass substrate and the gold circuit by spray pyrolysis. Further, using Sample 1 in Table 1, in the same manner as in Example E1, an insulating layer 514 was formed according to the pattern of the metal wiring layer 512.
- a photoelectric conversion element serving as a test cell was manufactured in the same procedure as in Example E1, and the photoelectric conversion characteristics were evaluated. 0%.
- an electrode substrate 51 as shown in FIG. 19 was produced.
- a 100 mm ⁇ 100 mm glass substrate is used as the base material 5 10, and a groove 10 a having a depth of 10 m and a width of 500 m is formed on this surface along a strip-shaped wiring pattern. Formed. From this, a 1000-nm-thick FTO / ITO composite film was formed by spray pyrolysis. Further, a silver printed wiring layer was formed in the same manner as in Example E1. The silver wiring is formed from the substrate surface 5 ⁇ Ob to a height of 2 ⁇ m by multiple printing, and the width of the metal wiring layer 5 12 is 200 m per side from the width of the groove 5 10 a. I took it wide. Further, using Sample 1 of Table 1 so as to cover the metal wiring layer 5 12, the insulating layer 5 14 was formed in accordance with the pattern of the metal wiring layer 5 12 in the same manner as in Example E1. Formed.
- a photoelectric conversion element serving as a test cell was manufactured in the same procedure as in Example E1, and the photoelectric conversion characteristics were evaluated.
- the photoelectric conversion efficiency was 4.2%. Was.
- a metal wiring layer 512 using a silver paste for printing on the surface of a 100 OmmX 100 mm heat-resistant glass substrate (substrate) in the same procedure as in Example E1
- the metal On the wiring layer 512 an FTO / ITO composite film having a thickness of 1 000 nm, which also serves as a transparent conductive layer and a shielding layer, was formed by the same procedure as in Example E2, and an electrode substrate 51 was produced.
- a photoelectric conversion element serving as a test cell was produced in the same procedure as in Example E1. Observation of the electrolyte injected into the test cell showed that the electrolyte had a brownish color immediately after the injection, but turned almost transparent a few minutes later. This is considered to be due to the insufficient shielding of the silver circuit, and the I “ions in the electrolyte were reduced to I– by reacting with the exposed silver. When the characteristics were evaluated using simulated sunlight of AM 1.5, the photoelectric conversion efficiency was 0.2
- a gold circuit (metal wiring layer) was formed on the surface of a 100-mm-100 mm glass substrate with an FTO film by plating in the same manner as in Example E2.
- An electrode substrate 51 was fabricated by forming a 300 nm-thick FTO film serving also as a transparent conductive layer and a shielding layer on the metal wiring layer using the same method as in Example E2.
- a photoelectric conversion element serving as a test cell was produced in the same procedure as in Example E1, and the photoelectric conversion characteristics of the photoelectric conversion element were evaluated using AM 1.5 pseudo solar light. However, the conversion efficiency was 0.41%. In this case, it was found that the shielding of the metal wiring layer 512 was insufficient, and the characteristics of the substrate with the metal wiring were not sufficiently brought out.
- Example E ⁇ Using a glass substrate with an FTO film itself as the electrode substrate 51 without providing a metal wiring layer on the surface of the glass substrate with a 100 mmX ⁇ 00 mm FT0 film, the same procedure as in Example E ⁇ was used. A photoelectric conversion element serving as a test cell was manufactured. When the photoelectric conversion characteristics of this test cell were evaluated using simulated sunlight of AM 1.5, the conversion efficiency was 0.23%. From this, it was found that when the metal wiring layer was not provided, the photoelectric conversion efficiency of the photoelectric conversion element was lowered because the resistance of the electrode substrate 51 was large. Possibility of industrial use
- the electrode substrate of the present invention has a metal wiring layer and a transparent conductive layer electrically connected to the metal wiring layer on a base material, and the metal wiring layer is insulated and covered with an insulating layer. Therefore, the metal wiring layer is reliably shielded from the electrolyte solution and the like, and its corrosion and leakage current can be effectively suppressed. Superior in conductivity as compared to the case where only the transparent conductive layer is used as the conductor of the electrode.
Abstract
Description
Claims
Priority Applications (3)
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AU2003275542A AU2003275542B2 (en) | 2002-10-03 | 2003-10-03 | Electrode substrate, photoelectric conversion element, conductive glass substrate and production method thereof, and pigment sensitizing solar cell |
EP03758711A EP1548868A4 (en) | 2002-10-03 | 2003-10-03 | ELECTRODE SUBSTRATE, PHOTOELECTRIC CONVERSION ELEMENT, CONDUCTIVE GLASS SUBSTRATE AND METHOD FOR THE PRODUCTION THEREOF, AND PIGMENT SENSITIZATION SOLAR CELL |
US10/529,818 US8629346B2 (en) | 2002-10-03 | 2003-10-03 | Electrode substrate, photoelectric conversion element, conductive glass substrate and production method thereof, and pigment sensitizing solar cell |
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JP2002-291219 | 2002-10-03 | ||
JP2002291219A JP2004128267A (ja) | 2002-10-03 | 2002-10-03 | 光電変換素子用の導電性ガラス基板並びにその製造方法 |
JP2002306723A JP4503226B2 (ja) | 2002-10-22 | 2002-10-22 | 電極基板、光電変換素子、並びに色素増感太陽電池 |
JP2002-306723 | 2002-10-22 | ||
JP2002-328566 | 2002-11-12 | ||
JP2002328109A JP4416997B2 (ja) | 2002-11-12 | 2002-11-12 | 色素増感太陽電池用電極基板、光電変換素子、並びに色素増感太陽電池 |
JP2002-328109 | 2002-11-12 | ||
JP2002328566A JP2004164970A (ja) | 2002-11-12 | 2002-11-12 | 電極基板および光電変換素子 |
JP2003305269A JP4515061B2 (ja) | 2003-08-28 | 2003-08-28 | 色素増感太陽電池の製造方法 |
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- 2003-10-03 US US10/529,818 patent/US8629346B2/en active Active
- 2003-10-03 AU AU2003275542A patent/AU2003275542B2/en not_active Ceased
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Cited By (11)
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JP2005317225A (ja) * | 2004-04-27 | 2005-11-10 | Enplas Corp | 色素増感型太陽電池、及び色素増感型太陽電池の光電極基板 |
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JP4635474B2 (ja) * | 2004-05-14 | 2011-02-23 | ソニー株式会社 | 光電変換素子、及びこれに用いる透明導電性基板 |
WO2006001022A1 (en) * | 2004-06-28 | 2006-01-05 | Power Paper Ltd | Novel electrodes and uses thereof |
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US20110100455A1 (en) * | 2006-12-11 | 2011-05-05 | Fujikura Ltd. | Photoelectric conversion element |
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WO2009069551A1 (ja) | 2007-11-28 | 2009-06-04 | Fujikura Ltd. | 光電変換素子用電極基板 |
US20110094579A1 (en) * | 2009-10-26 | 2011-04-28 | Yukika Yamada | Electrode substrate, method of preparing same, and photoelectric conversion device including same |
Also Published As
Publication number | Publication date |
---|---|
EP1548868A1 (en) | 2005-06-29 |
TWI326920B (en) | 2010-07-01 |
AU2003275542A1 (en) | 2004-04-23 |
EP1548868A4 (en) | 2009-08-12 |
AU2003275542B8 (en) | 2004-04-23 |
US8629346B2 (en) | 2014-01-14 |
US20060162770A1 (en) | 2006-07-27 |
AU2003275542B2 (en) | 2007-06-07 |
TW200423453A (en) | 2004-11-01 |
KR20050053722A (ko) | 2005-06-08 |
KR100689229B1 (ko) | 2007-03-02 |
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