TW484060B - Nonvolatile semiconductor memory device and data storage system comprising the nonvolatile semiconductor memory device - Google Patents
Nonvolatile semiconductor memory device and data storage system comprising the nonvolatile semiconductor memory device Download PDFInfo
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- TW484060B TW484060B TW089119222A TW89119222A TW484060B TW 484060 B TW484060 B TW 484060B TW 089119222 A TW089119222 A TW 089119222A TW 89119222 A TW89119222 A TW 89119222A TW 484060 B TW484060 B TW 484060B
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- 238000013500 data storage Methods 0.000 title 1
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Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
- G11C11/5642—Sensing or reading circuits; Data output circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
- G11C11/5628—Programming or writing circuits; Data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
- G11C11/5628—Programming or writing circuits; Data input circuits
- G11C11/5635—Erasing circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2211/00—Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C2211/56—Indexing scheme relating to G11C11/56 and sub-groups for features not covered by these groups
- G11C2211/564—Miscellaneous aspects
- G11C2211/5641—Multilevel memory having cells with different number of storage levels
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2211/00—Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C2211/56—Indexing scheme relating to G11C11/56 and sub-groups for features not covered by these groups
- G11C2211/564—Miscellaneous aspects
- G11C2211/5642—Multilevel memory with buffers, latches, registers at input or output
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Read Only Memory (AREA)
- Memory System (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000014557A JP4282197B2 (ja) | 2000-01-24 | 2000-01-24 | 不揮発性半導体記憶装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW484060B true TW484060B (en) | 2002-04-21 |
Family
ID=18542004
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW089119222A TW484060B (en) | 2000-01-24 | 2000-09-19 | Nonvolatile semiconductor memory device and data storage system comprising the nonvolatile semiconductor memory device |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US6353553B1 (https=) |
| JP (1) | JP4282197B2 (https=) |
| KR (1) | KR100406612B1 (https=) |
| DE (1) | DE10046022A1 (https=) |
| TW (1) | TW484060B (https=) |
Families Citing this family (84)
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| JPH11224491A (ja) * | 1997-12-03 | 1999-08-17 | Sony Corp | 不揮発性半導体記憶装置およびそれを用いたicメモリカード |
| KR100332950B1 (ko) * | 1998-04-10 | 2002-08-21 | 삼성전자 주식회사 | 단일비트동작모드와다중비트동작모드를갖는불휘발성반도체메모리장치및그것의기입/독출방법 |
| JP3629144B2 (ja) * | 1998-06-01 | 2005-03-16 | 株式会社東芝 | 不揮発性半導体記憶装置 |
-
2000
- 2000-01-24 JP JP2000014557A patent/JP4282197B2/ja not_active Expired - Fee Related
- 2000-07-12 US US09/615,073 patent/US6353553B1/en not_active Expired - Lifetime
- 2000-09-16 KR KR10-2000-0054397A patent/KR100406612B1/ko not_active Expired - Fee Related
- 2000-09-18 DE DE10046022A patent/DE10046022A1/de not_active Withdrawn
- 2000-09-19 TW TW089119222A patent/TW484060B/zh active
Also Published As
| Publication number | Publication date |
|---|---|
| JP2001210082A (ja) | 2001-08-03 |
| JP4282197B2 (ja) | 2009-06-17 |
| KR20010077868A (ko) | 2001-08-20 |
| DE10046022A1 (de) | 2001-08-02 |
| US6353553B1 (en) | 2002-03-05 |
| KR100406612B1 (ko) | 2003-11-21 |
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