TW200613586A - Leveler compounds - Google Patents
Leveler compoundsInfo
- Publication number
- TW200613586A TW200613586A TW094124026A TW94124026A TW200613586A TW 200613586 A TW200613586 A TW 200613586A TW 094124026 A TW094124026 A TW 094124026A TW 94124026 A TW94124026 A TW 94124026A TW 200613586 A TW200613586 A TW 200613586A
- Authority
- TW
- Taiwan
- Prior art keywords
- plating baths
- layer
- methods
- diffusion coefficient
- copper
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/182—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing using pre-adducts of epoxy compounds with curing agents
- C08G59/184—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing using pre-adducts of epoxy compounds with curing agents with amines
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/38—Electroplating: Baths therefor from solutions of copper
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/288—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
- H01L21/2885—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition using an external electrical current, i.e. electro-deposition
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/42—Plated through-holes or plated via connections
- H05K3/423—Plated through-holes or plated via connections characterised by electroplating method
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US59039604P | 2004-07-22 | 2004-07-22 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200613586A true TW200613586A (en) | 2006-05-01 |
TWI321167B TWI321167B (zh) | 2010-03-01 |
Family
ID=35107035
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094124026A TW200613586A (en) | 2004-07-22 | 2005-07-15 | Leveler compounds |
Country Status (6)
Country | Link |
---|---|
US (1) | US7510639B2 (zh) |
EP (2) | EP2327814B1 (zh) |
JP (2) | JP5020486B2 (zh) |
KR (1) | KR101203217B1 (zh) |
CN (1) | CN1733978B (zh) |
TW (1) | TW200613586A (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI707989B (zh) * | 2018-08-28 | 2020-10-21 | 日商傑希優股份有限公司 | 電鍍銅浴 |
TWI787534B (zh) * | 2018-08-28 | 2022-12-21 | 日商傑希優股份有限公司 | 硫酸銅鍍敷液及使用其之硫酸銅鍍敷方法 |
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EP1741804B1 (en) * | 2005-07-08 | 2016-04-27 | Rohm and Haas Electronic Materials, L.L.C. | Electrolytic copper plating method |
TWI328622B (en) | 2005-09-30 | 2010-08-11 | Rohm & Haas Elect Mat | Leveler compounds |
JP2007146289A (ja) * | 2005-10-31 | 2007-06-14 | Mitsui Mining & Smelting Co Ltd | 電解銅箔の製造方法、該製造方法で得られる電解銅箔、該電解銅箔を用いて得られる表面処理銅箔及び該電解銅箔又は該表面処理銅箔を用いて得られる銅張積層板 |
JP4816901B2 (ja) * | 2005-11-21 | 2011-11-16 | 上村工業株式会社 | 電気銅めっき浴 |
US7153408B1 (en) * | 2006-04-13 | 2006-12-26 | Herdman Roderick D | Copper electroplating of printing cylinders |
JP4932370B2 (ja) * | 2006-07-28 | 2012-05-16 | 日本マクダーミッド株式会社 | 電解めっき方法、プリント配線板及び半導体ウェハー |
JP5497261B2 (ja) * | 2006-12-15 | 2014-05-21 | ローム・アンド・ハース・エレクトロニック・マテリアルズ,エル.エル.シー. | インジウム組成物 |
WO2008142770A1 (ja) * | 2007-05-21 | 2008-11-27 | C. Uyemura & Co., Ltd. | 電気銅めっき浴 |
JP4682285B2 (ja) * | 2007-08-30 | 2011-05-11 | 日立電線株式会社 | 配線及び層間接続ビアの形成方法 |
US8784636B2 (en) * | 2007-12-04 | 2014-07-22 | Ebara Corporation | Plating apparatus and plating method |
SI2130948T1 (sl) * | 2008-06-02 | 2011-04-29 | Atotech Deutschland Gmbh | Kopel, ki vsebuje pirofosfat, za elektrolitsko nanašanje zlitin bakra-kositra brez cianida |
US20110139626A1 (en) * | 2008-06-12 | 2011-06-16 | Furukawa Electric Co., Ltd. | Electrolytic copper coating, method of manufacturing the same, and copper electrolyte for manufacturing electrolytic copper coating |
US8388824B2 (en) | 2008-11-26 | 2013-03-05 | Enthone Inc. | Method and composition for electrodeposition of copper in microelectronics with dipyridyl-based levelers |
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JP5471276B2 (ja) * | 2009-10-15 | 2014-04-16 | 上村工業株式会社 | 電気銅めっき浴及び電気銅めっき方法 |
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US20110220512A1 (en) * | 2010-03-15 | 2011-09-15 | Rohm And Haas Electronic Materials Llc | Plating bath and method |
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US8262895B2 (en) * | 2010-03-15 | 2012-09-11 | Rohm And Haas Electronic Materials Llc | Plating bath and method |
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EP2392692A1 (en) | 2010-06-01 | 2011-12-07 | Basf Se | Composition for metal electroplating comprising leveling agent |
SG185736A1 (en) | 2010-06-01 | 2012-12-28 | Basf Se | Composition for metal electroplating comprising leveling agent |
DE102011008836B4 (de) * | 2010-08-17 | 2013-01-10 | Umicore Galvanotechnik Gmbh | Elektrolyt und Verfahren zur Abscheidung von Kupfer-Zinn-Legierungsschichten |
JP5731802B2 (ja) * | 2010-11-25 | 2015-06-10 | ローム・アンド・ハース電子材料株式会社 | 金めっき液 |
JP2012127003A (ja) * | 2010-12-15 | 2012-07-05 | Rohm & Haas Electronic Materials Llc | 銅層を均一にする電気めっき方法 |
JP5595301B2 (ja) * | 2011-02-22 | 2014-09-24 | Jx日鉱日石金属株式会社 | 銅電解液 |
US8747643B2 (en) * | 2011-08-22 | 2014-06-10 | Rohm And Haas Electronic Materials Llc | Plating bath and method |
DE102011116764A1 (de) | 2011-10-22 | 2013-04-25 | Gonzalo Urrutia Desmaison | Polykationen und Derivate |
US8454815B2 (en) * | 2011-10-24 | 2013-06-04 | Rohm And Haas Electronics Materials Llc | Plating bath and method |
GB201200482D0 (en) * | 2012-01-12 | 2012-02-22 | Johnson Matthey Plc | Improvements in coating technology |
EP2871260B1 (en) * | 2012-07-09 | 2019-03-06 | Shikoku Chemicals Corporation | Copper film-forming agent and method for forming copper film |
CN103103586B (zh) * | 2013-02-22 | 2016-05-04 | 陕西师范大学 | 含有噻唑类化合物的电镀铜溶液 |
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US9273407B2 (en) | 2014-03-17 | 2016-03-01 | Hong Kong Applied Science and Technology Research Institute Company Limited | Additive for electrodeposition |
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TWI647342B (zh) * | 2017-08-03 | 2019-01-11 | 國家中山科學研究院 | Copper-silver two-component metal plating liquid for semiconductor wires and plating method |
US10329681B2 (en) * | 2017-11-02 | 2019-06-25 | National Chung Shan Institute Of Science And Technology | Copper-silver dual-component metal electroplating solution and electroplating method for semiconductor wire |
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-
2005
- 2005-07-15 TW TW094124026A patent/TW200613586A/zh unknown
- 2005-07-16 US US11/182,311 patent/US7510639B2/en active Active
- 2005-07-16 EP EP10197474A patent/EP2327814B1/en active Active
- 2005-07-16 EP EP05254450A patent/EP1619274B1/en active Active
- 2005-07-19 KR KR1020050065390A patent/KR101203217B1/ko active IP Right Grant
- 2005-07-20 CN CN2005100875108A patent/CN1733978B/zh active Active
- 2005-07-21 JP JP2005211401A patent/JP5020486B2/ja active Active
-
2012
- 2012-03-29 JP JP2012076233A patent/JP5518925B2/ja active Active
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI707989B (zh) * | 2018-08-28 | 2020-10-21 | 日商傑希優股份有限公司 | 電鍍銅浴 |
TWI787534B (zh) * | 2018-08-28 | 2022-12-21 | 日商傑希優股份有限公司 | 硫酸銅鍍敷液及使用其之硫酸銅鍍敷方法 |
Also Published As
Publication number | Publication date |
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US20060016693A1 (en) | 2006-01-26 |
EP2327814B1 (en) | 2013-03-20 |
JP2006037232A (ja) | 2006-02-09 |
JP2012149351A (ja) | 2012-08-09 |
CN1733978A (zh) | 2006-02-15 |
US7510639B2 (en) | 2009-03-31 |
CN1733978B (zh) | 2011-09-14 |
JP5020486B2 (ja) | 2012-09-05 |
JP5518925B2 (ja) | 2014-06-11 |
EP1619274A3 (en) | 2010-08-11 |
EP1619274A2 (en) | 2006-01-25 |
EP1619274B1 (en) | 2011-11-23 |
KR101203217B1 (ko) | 2012-11-20 |
EP2327814A1 (en) | 2011-06-01 |
KR20060053908A (ko) | 2006-05-22 |
TWI321167B (zh) | 2010-03-01 |
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