SG146620A1 - Boosted substrate/tub programming for flash memories - Google Patents

Boosted substrate/tub programming for flash memories

Info

Publication number
SG146620A1
SG146620A1 SG200806592-2A SG2008065922A SG146620A1 SG 146620 A1 SG146620 A1 SG 146620A1 SG 2008065922 A SG2008065922 A SG 2008065922A SG 146620 A1 SG146620 A1 SG 146620A1
Authority
SG
Singapore
Prior art keywords
substrate
programming
floating gate
tub
boosted
Prior art date
Application number
SG200806592-2A
Other languages
English (en)
Inventor
Hagop A Nazarian
Original Assignee
Micron Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micron Technology Inc filed Critical Micron Technology Inc
Publication of SG146620A1 publication Critical patent/SG146620A1/en

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/10Programming or data input circuits
    • G11C16/12Programming voltage switching circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/04Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/04Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0483Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
SG200806592-2A 2003-09-16 2004-09-14 Boosted substrate/tub programming for flash memories SG146620A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/663,277 US6977842B2 (en) 2003-09-16 2003-09-16 Boosted substrate/tub programming for flash memories

Publications (1)

Publication Number Publication Date
SG146620A1 true SG146620A1 (en) 2008-10-30

Family

ID=34274335

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200806592-2A SG146620A1 (en) 2003-09-16 2004-09-14 Boosted substrate/tub programming for flash memories

Country Status (9)

Country Link
US (2) US6977842B2 (ja)
EP (1) EP1665281B1 (ja)
JP (1) JP4417383B2 (ja)
KR (1) KR100769795B1 (ja)
CN (1) CN100479063C (ja)
AT (1) ATE371250T1 (ja)
DE (1) DE602004008490T2 (ja)
SG (1) SG146620A1 (ja)
WO (1) WO2005029501A1 (ja)

Families Citing this family (100)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7233522B2 (en) * 2002-12-31 2007-06-19 Sandisk 3D Llc NAND memory array incorporating capacitance boosting of channel regions in unselected memory cells and method for operation of same
US7505321B2 (en) * 2002-12-31 2009-03-17 Sandisk 3D Llc Programmable memory array structure incorporating series-connected transistor strings and methods for fabrication and operation of same
US6982905B2 (en) * 2003-10-09 2006-01-03 Micron Technology, Inc. Method and apparatus for reading NAND flash memory array
US7023739B2 (en) * 2003-12-05 2006-04-04 Matrix Semiconductor, Inc. NAND memory array incorporating multiple write pulse programming of individual memory cells and method for operation of same
US20050128807A1 (en) * 2003-12-05 2005-06-16 En-Hsing Chen Nand memory array incorporating multiple series selection devices and method for operation of same
US7221588B2 (en) * 2003-12-05 2007-05-22 Sandisk 3D Llc Memory array incorporating memory cells arranged in NAND strings
US7161833B2 (en) * 2004-02-06 2007-01-09 Sandisk Corporation Self-boosting system for flash memory cells
US7170793B2 (en) * 2004-04-13 2007-01-30 Sandisk Corporation Programming inhibit for non-volatile memory
US7644239B2 (en) 2004-05-03 2010-01-05 Microsoft Corporation Non-volatile memory cache performance improvement
US7045368B2 (en) * 2004-05-19 2006-05-16 Headway Technologies, Inc. MRAM cell structure and method of fabrication
JP4680195B2 (ja) * 2004-06-25 2011-05-11 スパンション エルエルシー 半導体装置及びソース電圧制御方法
US7457156B2 (en) * 2004-09-02 2008-11-25 Micron Technology, Inc. NAND flash depletion cell structure
US7490197B2 (en) 2004-10-21 2009-02-10 Microsoft Corporation Using external memory devices to improve system performance
JP4284300B2 (ja) * 2005-05-02 2009-06-24 株式会社東芝 半導体記憶装置
US7443009B2 (en) 2005-05-11 2008-10-28 Micron Technology, Inc. N well implants to separate blocks in a flash memory device
KR100735929B1 (ko) * 2005-06-11 2007-07-06 삼성전자주식회사 낸드형 플래시 메모리 어레이 및 그 동작 방법
US7239557B2 (en) * 2005-06-17 2007-07-03 Micron Technology, Inc. Program method with optimized voltage level for flash memory
JP4761872B2 (ja) * 2005-08-01 2011-08-31 株式会社東芝 不揮発性半導体記憶装置
US7212447B2 (en) * 2005-08-04 2007-05-01 Micron Technology, Inc. NAND flash memory cell programming
US7751242B2 (en) * 2005-08-30 2010-07-06 Micron Technology, Inc. NAND memory device and programming methods
US7388789B2 (en) 2005-08-31 2008-06-17 Micron Technology NAND memory device and programming methods
US7206235B1 (en) * 2005-10-14 2007-04-17 Sandisk Corporation Apparatus for controlled programming of non-volatile memory exhibiting bit line coupling
US7286406B2 (en) * 2005-10-14 2007-10-23 Sandisk Corporation Method for controlled programming of non-volatile memory exhibiting bit line coupling
US7459748B2 (en) * 2005-10-17 2008-12-02 Kabushiki Kaisha Toshiba Semiconductor memory device
US8914557B2 (en) 2005-12-16 2014-12-16 Microsoft Corporation Optimizing write and wear performance for a memory
EP1966803A2 (en) * 2005-12-29 2008-09-10 SanDisk Corporation Non-volatile memory operated on the basis of a two-step bit-line precharge operation and a two-pass sensing operation
US7733704B2 (en) * 2005-12-29 2010-06-08 Sandisk Corporation Non-volatile memory with power-saving multi-pass sensing
US7447094B2 (en) * 2005-12-29 2008-11-04 Sandisk Corporation Method for power-saving multi-pass sensing in non-volatile memory
US7400532B2 (en) * 2006-02-16 2008-07-15 Micron Technology, Inc. Programming method to reduce gate coupling interference for non-volatile memory
US7408810B2 (en) * 2006-02-22 2008-08-05 Micron Technology, Inc. Minimizing effects of program disturb in a memory device
US7561469B2 (en) * 2006-03-28 2009-07-14 Micron Technology, Inc. Programming method to reduce word line to word line breakdown for NAND flash
US7511995B2 (en) * 2006-03-30 2009-03-31 Sandisk Corporation Self-boosting system with suppression of high lateral electric fields
US7440321B2 (en) * 2006-04-12 2008-10-21 Micron Technology, Inc. Multiple select gate architecture with select gates of different lengths
US7512029B2 (en) 2006-06-09 2009-03-31 Micron Technology, Inc. Method and apparatus for managing behavior of memory devices
US7525841B2 (en) * 2006-06-14 2009-04-28 Micron Technology, Inc. Programming method for NAND flash
US7518914B2 (en) * 2006-08-07 2009-04-14 Micron Technology, Inc. Non-volatile memory device with both single and multiple level cells
US7471565B2 (en) * 2006-08-22 2008-12-30 Micron Technology, Inc. Reducing effects of program disturb in a memory device
US7440326B2 (en) * 2006-09-06 2008-10-21 Sandisk Corporation Programming non-volatile memory with improved boosting
KR100770754B1 (ko) * 2006-10-12 2007-10-29 삼성전자주식회사 비휘발성 반도체 메모리 장치 및 그것의 프로그램 방법
WO2008047416A1 (fr) * 2006-10-18 2008-04-24 Spansion Llc Circuit de détection de tension
US7596031B2 (en) * 2006-10-30 2009-09-29 Sandisk Corporation Faster programming of highest multi-level state for non-volatile memory
US7696035B2 (en) * 2006-11-13 2010-04-13 Sandisk Corporation Method for fabricating non-volatile memory with boost structures
KR100811278B1 (ko) * 2006-12-29 2008-03-07 주식회사 하이닉스반도체 셀프 부스팅을 이용한 낸드 플래시 메모리소자의 읽기 방법
US7468919B2 (en) * 2006-12-30 2008-12-23 Sandisk Corporation Biasing non-volatile storage based on selected word line
US7525843B2 (en) * 2006-12-30 2009-04-28 Sandisk Corporation Non-volatile storage with adaptive body bias
US7468920B2 (en) 2006-12-30 2008-12-23 Sandisk Corporation Applying adaptive body bias to non-volatile storage
US7583539B2 (en) * 2006-12-30 2009-09-01 Sandisk Corporation Non-volatile storage with bias for temperature compensation
US7583535B2 (en) * 2006-12-30 2009-09-01 Sandisk Corporation Biasing non-volatile storage to compensate for temperature variations
US7554853B2 (en) * 2006-12-30 2009-06-30 Sandisk Corporation Non-volatile storage with bias based on selective word line
JP4939971B2 (ja) * 2007-02-20 2012-05-30 株式会社東芝 不揮発性半導体メモリ
US7738291B2 (en) * 2007-03-12 2010-06-15 Micron Technology, Inc. Memory page boosting method, device and system
US7606072B2 (en) * 2007-04-24 2009-10-20 Sandisk Corporation Non-volatile storage with compensation for source voltage drop
US7606071B2 (en) * 2007-04-24 2009-10-20 Sandisk Corporation Compensating source voltage drop in non-volatile storage
US8654592B2 (en) 2007-06-12 2014-02-18 Micron Technology, Inc. Memory devices with isolation structures
JP4504405B2 (ja) 2007-09-12 2010-07-14 株式会社東芝 半導体記憶装置
US7978520B2 (en) 2007-09-27 2011-07-12 Sandisk Corporation Compensation of non-volatile memory chip non-idealities by program pulse adjustment
ITRM20070621A1 (it) * 2007-11-28 2009-05-29 Micron Technology Inc Compensazione dell'effetto della configurazione a ritroso in un dispositivo di memorizzazione.
US8631203B2 (en) 2007-12-10 2014-01-14 Microsoft Corporation Management of external memory functioning as virtual cache
US7733705B2 (en) * 2008-03-13 2010-06-08 Micron Technology, Inc. Reduction of punch-through disturb during programming of a memory device
KR20090120205A (ko) * 2008-05-19 2009-11-24 삼성전자주식회사 플래시 메모리 장치 및 그것의 동작 방법
US7719902B2 (en) 2008-05-23 2010-05-18 Sandisk Corporation Enhanced bit-line pre-charge scheme for increasing channel boosting in non-volatile storage
JP5331405B2 (ja) * 2008-08-01 2013-10-30 株式会社東芝 不揮発性半導体記憶装置および不揮発性半導体記憶システム
US9032151B2 (en) 2008-09-15 2015-05-12 Microsoft Technology Licensing, Llc Method and system for ensuring reliability of cache data and metadata subsequent to a reboot
US8032707B2 (en) 2008-09-15 2011-10-04 Microsoft Corporation Managing cache data and metadata
US7953774B2 (en) 2008-09-19 2011-05-31 Microsoft Corporation Aggregation of write traffic to a data store
JP5193815B2 (ja) 2008-11-12 2013-05-08 株式会社東芝 半導体記憶装置
US8692310B2 (en) 2009-02-09 2014-04-08 Spansion Llc Gate fringing effect based channel formation for semiconductor device
JP2010198685A (ja) * 2009-02-25 2010-09-09 Toshiba Corp 不揮発性半導体メモリ
CN102498475A (zh) * 2009-07-10 2012-06-13 柰米闪芯积体电路有限公司 高速高密度以nand为基础的双晶体管-nor闪存的新构成
US20110128766A1 (en) * 2009-11-30 2011-06-02 Ward Parkinson Programmable Resistance Memory
US8102712B2 (en) * 2009-12-22 2012-01-24 Intel Corporation NAND programming technique
KR101691088B1 (ko) 2010-02-17 2016-12-29 삼성전자주식회사 불휘발성 메모리 장치, 그것의 동작 방법, 그리고 그것을 포함하는 메모리 시스템
US9324440B2 (en) 2010-02-09 2016-04-26 Samsung Electronics Co., Ltd. Nonvolatile memory devices, operating methods thereof and memory systems including the same
KR101658479B1 (ko) 2010-02-09 2016-09-21 삼성전자주식회사 불휘발성 메모리 장치, 그것의 동작 방법, 그리고 그것을 포함하는 메모리 시스템
US9378831B2 (en) 2010-02-09 2016-06-28 Samsung Electronics Co., Ltd. Nonvolatile memory devices, operating methods thereof and memory systems including the same
KR101691092B1 (ko) 2010-08-26 2016-12-30 삼성전자주식회사 불휘발성 메모리 장치, 그것의 동작 방법, 그리고 그것을 포함하는 메모리 시스템
US8923060B2 (en) 2010-02-17 2014-12-30 Samsung Electronics Co., Ltd. Nonvolatile memory devices and operating methods thereof
US8908431B2 (en) 2010-02-17 2014-12-09 Samsung Electronics Co., Ltd. Control method of nonvolatile memory device
JP5788183B2 (ja) 2010-02-17 2015-09-30 三星電子株式会社Samsung Electronics Co.,Ltd. 不揮発性メモリ装置、それの動作方法、そしてそれを含むメモリシステム
US8792282B2 (en) * 2010-03-04 2014-07-29 Samsung Electronics Co., Ltd. Nonvolatile memory devices, memory systems and computing systems
US8331127B2 (en) 2010-05-24 2012-12-11 Macronix International Co., Ltd. Nonvolatile memory device having a transistor connected in parallel with a resistance switching device
US8537618B2 (en) 2010-08-26 2013-09-17 Steven Jeffrey Grossman RAM memory device with NAND type interface
KR101762828B1 (ko) 2011-04-05 2017-07-31 삼성전자주식회사 불휘발성 메모리 장치 및 불휘발성 메모리 장치의 동작 방법
US8630125B2 (en) 2011-06-02 2014-01-14 Micron Technology, Inc. Memory cell sensing using a boost voltage
US8988947B2 (en) 2013-03-25 2015-03-24 Sandisk Technologies Inc. Back bias during program verify of non-volatile storage
KR102242022B1 (ko) 2013-09-16 2021-04-21 삼성전자주식회사 불휘발성 메모리 및 그것의 프로그램 방법
JP2017162526A (ja) * 2016-03-07 2017-09-14 東芝メモリ株式会社 記憶装置
JP2018125052A (ja) 2017-01-31 2018-08-09 東芝メモリ株式会社 半導体記憶装置
CN107507646A (zh) * 2017-08-31 2017-12-22 长江存储科技有限责任公司 一种降低编程干扰的控制方法及装置
KR102252531B1 (ko) * 2017-12-15 2021-05-14 청두 아날로그 써키트 테크놀로지 인코퍼레이티드 플래시 메모리에 프로그래밍하는 회로 및 방법
CN110718258B (zh) * 2018-07-13 2021-10-08 西安格易安创集成电路有限公司 一种非易失存储器处理电路及方法
CN110838318A (zh) * 2018-08-17 2020-02-25 北京兆易创新科技股份有限公司 提高存储器数据可靠性的方法和系统
CN109378028B (zh) * 2018-08-22 2020-11-17 长江存储科技有限责任公司 一种降低编程干扰的控制方法及装置
KR20210070761A (ko) * 2019-12-05 2021-06-15 에스케이하이닉스 주식회사 메모리 장치 및 그 동작 방법
JP7446879B2 (ja) 2020-03-18 2024-03-11 キオクシア株式会社 半導体記憶装置
CN111445938B (zh) * 2020-03-26 2022-03-18 北京大学 编码型闪存结构及数据处理方法
CN112201295B (zh) * 2020-09-11 2021-09-17 中天弘宇集成电路有限责任公司 Nand闪存编程方法
CN112365913B (zh) * 2020-09-29 2021-09-03 中天弘宇集成电路有限责任公司 3d nand闪存编程方法
CN116156890B (zh) * 2023-04-19 2023-07-18 杭州领开半导体技术有限公司 Nor闪存阵列的制作方法
CN116437669A (zh) * 2023-04-19 2023-07-14 杭州领开半导体技术有限公司 Nor闪存阵列及其操作方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5257225A (en) * 1992-03-12 1993-10-26 Micron Technology, Inc. Method for programming programmable devices by utilizing single or multiple pulses varying in pulse width and amplitude
US5357463A (en) * 1992-11-17 1994-10-18 Micron Semiconductor, Inc. Method for reverse programming of a flash EEPROM
KR100217910B1 (ko) * 1995-08-17 1999-09-01 김영환 플래쉬 메모리셀의 리페어 회로 및 리페어 방법
KR0172441B1 (ko) 1995-09-19 1999-03-30 김광호 불휘발성 반도체 메모리의 프로그램 방법
KR0172403B1 (ko) * 1995-11-15 1999-03-30 김광호 불휘발성 반도체 메모리의 데이타 리드회로
JPH10223866A (ja) * 1997-02-03 1998-08-21 Toshiba Corp 半導体記憶装置
KR100316706B1 (ko) * 1999-02-01 2001-12-12 윤종용 벌크 바이어스를 사용하는 낸드형 플래쉬 메모리소자의 프로그램 방법
US6515889B1 (en) * 2000-08-31 2003-02-04 Micron Technology, Inc. Junction-isolated depletion mode ferroelectric memory

Also Published As

Publication number Publication date
US20050111260A1 (en) 2005-05-26
CN1849670A (zh) 2006-10-18
KR20060053000A (ko) 2006-05-19
EP1665281B1 (en) 2007-08-22
ATE371250T1 (de) 2007-09-15
DE602004008490T2 (de) 2008-05-15
JP4417383B2 (ja) 2010-02-17
US6977842B2 (en) 2005-12-20
CN100479063C (zh) 2009-04-15
US20050057966A1 (en) 2005-03-17
WO2005029501A1 (en) 2005-03-31
JP2007506207A (ja) 2007-03-15
US7149124B2 (en) 2006-12-12
KR100769795B1 (ko) 2007-10-25
DE602004008490D1 (de) 2007-10-04
EP1665281A1 (en) 2006-06-07

Similar Documents

Publication Publication Date Title
SG146620A1 (en) Boosted substrate/tub programming for flash memories
US7630244B2 (en) Methods of operating memory devices including discharge of source/drain regions and related electronic devices
US7596026B2 (en) Program method of non-volatile memory device
US7733702B2 (en) Semiconductor memory device and method of erasing data therein
TWI453748B (zh) 快閃記憶體程式禁止方案
TWI394163B (zh) 減少記憶體裝置中程式干擾之影響之方法與裝置
TW200802381A (en) Self-boosting method for flash memory cells
TW200623137A (en) Substrate electron injection techniques for programming non-volatile charge storage memory cells
TW200739890A (en) Method and apparatus for programming non-volatile memory with reduced program disturb using modified pass voltages
US20150294726A1 (en) Nand-type flash memory device and method of programming the same
TW200636731A (en) Word line compensation in non-volatile memory erase operations
US7440322B2 (en) Method and system for flash memory devices
WO2005078733A3 (en) Self-boosting system for flash memory cells
TW201432887A (zh) 具有多格基材之反及快閃記憶體
GB2431027A (en) Method of improving erase voltage distribution for a flash memory array having dummy wordlines
TWI319878B (en) A method of erasing non-volatile storage and a non-volatile memory system
JP2017228325A (ja) 不揮発性半導体記憶装置
WO2013137995A1 (en) A non-volatile memory device and a method of operating same
CN109378028B (zh) 一种降低编程干扰的控制方法及装置
CN101573764A (zh) 双晶体管nor式非挥发性内存单元数组与双晶体管nor式非挥发性内存的数据处理方法
WO2007035284A3 (en) High performance flash memory device using a programming window for predetermination of bits to be programmed and dc-to-dc converter
KR101767228B1 (ko) 불휘발성 반도체 메모리 장치 및 그 소거 방법
TW200636722A (en) Recovery method of nand flash memory device
US20090129170A1 (en) Method of programming non-volatile memory device
US5894438A (en) Method for programming and erasing a memory cell of a flash memory device