SG128468A1 - Flip chip bonding method for enhancing the performance of connection in flip chip packaging process and layered metal architecture of substrate for stud bump - Google Patents
Flip chip bonding method for enhancing the performance of connection in flip chip packaging process and layered metal architecture of substrate for stud bumpInfo
- Publication number
- SG128468A1 SG128468A1 SG200404949A SG200404949A SG128468A1 SG 128468 A1 SG128468 A1 SG 128468A1 SG 200404949 A SG200404949 A SG 200404949A SG 200404949 A SG200404949 A SG 200404949A SG 128468 A1 SG128468 A1 SG 128468A1
- Authority
- SG
- Singapore
- Prior art keywords
- substrate
- bump
- chip
- flip chip
- bonding method
- Prior art date
Links
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/01—Manufacture or treatment
- H10W74/012—Manufacture or treatment of encapsulations on active surfaces of flip-chip devices, e.g. forming underfills
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/15—Encapsulations, e.g. protective coatings characterised by their shape or disposition on active surfaces of flip-chip devices, e.g. underfills
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/012—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
- H10W72/01221—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using local deposition
- H10W72/01225—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using local deposition in solid form, e.g. by using a powder or by stud bumping
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
- H10W72/07231—Techniques
- H10W72/07232—Compression bonding, e.g. thermocompression bonding
- H10W72/07233—Ultrasonic bonding, e.g. thermosonic bonding
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
- H10W72/07231—Techniques
- H10W72/07236—Soldering or alloying
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07331—Connecting techniques
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/241—Dispositions, e.g. layouts
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
- H10W72/252—Materials comprising solid metals or solid metalloids, e.g. PbSn, Ag or Cu
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/536—Shapes of wire connectors the connected ends being ball-shaped
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/5363—Shapes of wire connectors the connected ends being wedge-shaped
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/5366—Shapes of wire connectors the bond wires having kinks
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5522—Materials of bond wires comprising metals or metalloids, e.g. silver comprising gold [Au]
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5524—Materials of bond wires comprising metals or metalloids, e.g. silver comprising aluminium [Al]
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5525—Materials of bond wires comprising metals or metalloids, e.g. silver comprising copper [Cu]
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/853—On the same surface
- H10W72/856—Bump connectors and die-attach connectors
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/853—On the same surface
- H10W72/859—Bump connectors and bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/921—Structures or relative sizes of bond pads
- H10W72/923—Bond pads having multiple stacked layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/941—Dispositions of bond pads
- H10W72/9415—Dispositions of bond pads relative to the surface, e.g. recessed, protruding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/951—Materials of bond pads
- H10W72/952—Materials of bond pads comprising metals or metalloids, e.g. PbSn, Ag or Cu
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W80/00—Direct bonding of chips, wafers or substrates
- H10W80/301—Bonding techniques, e.g. hybrid bonding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/722—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/732—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Wire Bonding (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR20030083891 | 2003-11-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG128468A1 true SG128468A1 (en) | 2007-01-30 |
Family
ID=34588038
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG200404949A SG128468A1 (en) | 2003-11-25 | 2004-09-02 | Flip chip bonding method for enhancing the performance of connection in flip chip packaging process and layered metal architecture of substrate for stud bump |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7115446B2 (https=) |
| JP (1) | JP2005159356A (https=) |
| KR (1) | KR100604334B1 (https=) |
| CN (1) | CN1622304A (https=) |
| SG (1) | SG128468A1 (https=) |
| TW (1) | TWI255019B (https=) |
| WO (1) | WO2005053013A1 (https=) |
Families Citing this family (51)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7142909B2 (en) * | 2002-04-11 | 2006-11-28 | Second Sight Medical Products, Inc. | Biocompatible bonding method and electronics package suitable for implantation |
| US20060211233A1 (en) * | 2005-03-21 | 2006-09-21 | Skyworks Solutions, Inc. | Method for fabricating a wafer level package having through wafer vias for external package connectivity and related structure |
| US7576426B2 (en) * | 2005-04-01 | 2009-08-18 | Skyworks Solutions, Inc. | Wafer level package including a device wafer integrated with a passive component |
| US7348212B2 (en) * | 2005-09-13 | 2008-03-25 | Philips Lumileds Lighting Company Llc | Interconnects for semiconductor light emitting devices |
| DE112006001506T5 (de) * | 2005-06-16 | 2008-04-30 | Imbera Electronics Oy | Platinenstruktur und Verfahren zu ihrer Herstellung |
| JP4768343B2 (ja) * | 2005-07-27 | 2011-09-07 | 株式会社デンソー | 半導体素子の実装方法 |
| JP4728782B2 (ja) * | 2005-11-15 | 2011-07-20 | パナソニック株式会社 | 半導体装置およびその製造方法 |
| US7408243B2 (en) * | 2005-12-14 | 2008-08-05 | Honeywell International Inc. | High temperature package flip-chip bonding to ceramic |
| US20070141749A1 (en) * | 2005-12-20 | 2007-06-21 | Yi-Fong Lin | Die attachment method for LED chip and structure thereof |
| JP4552916B2 (ja) * | 2005-12-21 | 2010-09-29 | 株式会社大真空 | 圧電振動デバイス |
| US20070222087A1 (en) * | 2006-03-27 | 2007-09-27 | Sangdo Lee | Semiconductor device with solderable loop contacts |
| JP4863746B2 (ja) | 2006-03-27 | 2012-01-25 | 富士通株式会社 | 半導体装置およびその製造方法 |
| KR100762909B1 (ko) * | 2006-08-31 | 2007-10-08 | 주식회사 하이닉스반도체 | 플립 칩 패키지의 제조 방법 |
| EP1978559A3 (en) * | 2007-04-06 | 2013-08-28 | Hitachi, Ltd. | Semiconductor device |
| US20090014852A1 (en) * | 2007-07-11 | 2009-01-15 | Hsin-Hui Lee | Flip-Chip Packaging with Stud Bumps |
| KR100896127B1 (ko) * | 2007-07-20 | 2009-05-07 | 성균관대학교산학협력단 | 솔더가 코팅된 전해 도금 범프 및 이를 사용하는 플립칩접합 방법 |
| TWI362525B (en) * | 2007-07-31 | 2012-04-21 | Chunghwa Picture Tubes Ltd | Active device array substrate and liquid crystal display panel |
| US8283756B2 (en) * | 2007-08-20 | 2012-10-09 | Infineon Technologies Ag | Electronic component with buffer layer |
| KR20100115735A (ko) * | 2007-11-30 | 2010-10-28 | 스카이워크스 솔루션즈, 인코포레이티드 | 플립 칩 실장을 이용하는 웨이퍼 레벨 패키징 |
| US7642135B2 (en) * | 2007-12-17 | 2010-01-05 | Skyworks Solutions, Inc. | Thermal mechanical flip chip die bonding |
| US7749887B2 (en) * | 2007-12-18 | 2010-07-06 | Micron Technology, Inc. | Methods of fluxless micro-piercing of solder balls, and resulting devices |
| US8900931B2 (en) * | 2007-12-26 | 2014-12-02 | Skyworks Solutions, Inc. | In-situ cavity integrated circuit package |
| US8018075B2 (en) * | 2008-07-11 | 2011-09-13 | Advanced Semiconductor Engineering, Inc. | Semiconductor package, method for enhancing the bond of a bonding wire, and method for manufacturing a semiconductor package |
| DE102008040614A1 (de) | 2008-07-22 | 2010-01-28 | Robert Bosch Gmbh | Kontaktierungsverfahren für substratbasierte Schaltungen und zugehörige Schaltungsanordnung |
| KR100958513B1 (ko) | 2008-07-31 | 2010-05-17 | 알티전자 주식회사 | 전극 패드 및 그 전극 패드를 포함하는 발광 다이오드패키지 |
| US8779587B2 (en) * | 2008-09-16 | 2014-07-15 | Agere Systems Llc | PB-free solder bumps with improved mechanical properties |
| KR20100053016A (ko) * | 2008-11-12 | 2010-05-20 | 한국과학기술원 | 접착제의 발열 온도 조절을 통한 전자부품간 접속 방법 및 접착제의 발열 온도 조절을 통한 전자부품간 접속 장치 |
| TWI404198B (zh) * | 2009-04-22 | 2013-08-01 | 財團法人工業技術研究院 | 感測器之封裝結構與封裝方法 |
| US8476757B2 (en) * | 2009-10-02 | 2013-07-02 | Northrop Grumman Systems Corporation | Flip chip interconnect method and design for GaAs MMIC applications |
| JP2011151322A (ja) * | 2010-01-25 | 2011-08-04 | Japan Aviation Electronics Industry Ltd | フリップチップ実装構造及びフリップチップ実装方法 |
| TWI411075B (zh) * | 2010-03-22 | 2013-10-01 | 日月光半導體製造股份有限公司 | 半導體封裝件及其製造方法 |
| US9406658B2 (en) | 2010-12-17 | 2016-08-02 | Advanced Semiconductor Engineering, Inc. | Embedded component device and manufacturing methods thereof |
| TW201243930A (en) * | 2011-04-21 | 2012-11-01 | Lingsen Precision Ind Ltd | Wafer dicing method |
| US20130087915A1 (en) * | 2011-10-10 | 2013-04-11 | Conexant Systems, Inc. | Copper Stud Bump Wafer Level Package |
| US8618795B1 (en) * | 2012-06-29 | 2013-12-31 | General Electric Company | Sensor assembly for use in medical position and orientation tracking |
| US8890274B2 (en) | 2012-07-11 | 2014-11-18 | Taiwan Semiconductor Manufacturing Company, Ltd. | Interconnect structure for CIS flip-chip bonding and methods for forming the same |
| KR102233334B1 (ko) | 2014-04-28 | 2021-03-29 | 삼성전자주식회사 | 주석 도금액, 주석 도금 장치 및 상기 주석 도금액을 이용한 반도체 장치 제조 방법 |
| US9209147B1 (en) | 2014-07-17 | 2015-12-08 | Freescale Semiconductor, Inc. | Method of forming pillar bump |
| KR102380834B1 (ko) | 2015-01-06 | 2022-03-31 | 삼성전기주식회사 | 인쇄회로기판, 반도체 패키지 및 이들의 제조방법 |
| CN104576973B (zh) * | 2015-01-30 | 2017-04-05 | 京东方科技集团股份有限公司 | 封装盖板的密封胶表面的平坦化方法及系统、封装方法 |
| KR20160095520A (ko) | 2015-02-03 | 2016-08-11 | 삼성전기주식회사 | 인쇄회로기판, 반도체 패키지 및 이들의 제조방법 |
| US9683278B2 (en) | 2015-06-08 | 2017-06-20 | Infineon Technologies Ag | Diffusion solder bonding using solder preforms |
| JP2016001752A (ja) * | 2015-08-25 | 2016-01-07 | 日本航空電子工業株式会社 | フリップチップ実装構造、フリップチップ実装方法及びフリップチップ実装構造の使用方法 |
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| KR101880102B1 (ko) * | 2017-05-30 | 2018-07-20 | 제엠제코(주) | 적층식 반도체 패키지 |
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| US11862587B2 (en) * | 2019-07-25 | 2024-01-02 | Advanced Semiconductor Engineering, Inc. | Semiconductor package structure and method of manufacturing the same |
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| CN111009481B (zh) * | 2019-12-19 | 2023-04-18 | 西北电子装备技术研究所(中国电子科技集团公司第二研究所) | 芯片基板大压力倒装键合柔性加压方法 |
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2004
- 2004-05-28 KR KR1020040038214A patent/KR100604334B1/ko not_active Expired - Fee Related
- 2004-08-04 WO PCT/KR2004/001956 patent/WO2005053013A1/en not_active Ceased
- 2004-09-02 SG SG200404949A patent/SG128468A1/en unknown
- 2004-09-21 TW TW093128559A patent/TWI255019B/zh not_active IP Right Cessation
- 2004-09-29 CN CNA2004100803660A patent/CN1622304A/zh active Pending
- 2004-10-13 US US10/964,371 patent/US7115446B2/en not_active Expired - Fee Related
- 2004-11-19 JP JP2004336518A patent/JP2005159356A/ja active Pending
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| US6136681A (en) * | 1997-05-15 | 2000-10-24 | Kulicke & Soffa Investments, Inc. | Tool used in forming a chip scale package |
| US6576499B2 (en) * | 1999-12-10 | 2003-06-10 | Nec Corporation | Electronic device assembly and a method of connecting electronic devices constituting the same |
Also Published As
| Publication number | Publication date |
|---|---|
| CN1622304A (zh) | 2005-06-01 |
| US20050110163A1 (en) | 2005-05-26 |
| US7115446B2 (en) | 2006-10-03 |
| TWI255019B (en) | 2006-05-11 |
| KR20050050155A (ko) | 2005-05-30 |
| JP2005159356A (ja) | 2005-06-16 |
| KR100604334B1 (ko) | 2006-08-08 |
| WO2005053013A1 (en) | 2005-06-09 |
| TW200520175A (en) | 2005-06-16 |
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