RU2427972C1 - Аппаратура для регистрации излучения и система визуализации с помощью излучения - Google Patents

Аппаратура для регистрации излучения и система визуализации с помощью излучения Download PDF

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RU2427972C1
RU2427972C1 RU2010105857/09A RU2010105857A RU2427972C1 RU 2427972 C1 RU2427972 C1 RU 2427972C1 RU 2010105857/09 A RU2010105857/09 A RU 2010105857/09A RU 2010105857 A RU2010105857 A RU 2010105857A RU 2427972 C1 RU2427972 C1 RU 2427972C1
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radiation
electrically connected
idle
signal
switching element
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RU2010105857/09A
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English (en)
Russian (ru)
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Тиори МОТИЗУКИ (JP)
Тиори МОТИЗУКИ
Минору ВАТАНАБЕ (JP)
Минору ВАТАНАБЕ
Такамаса ИСИИ (JP)
Такамаса ИСИИ
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Кэнон Кабусики Кайся
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/30—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from X-rays
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/42—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by switching between different modes of operation using different resolutions or aspect ratios, e.g. switching between interlaced and non-interlaced mode
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
    • H04N25/621—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels for the control of blooming
    • H04N25/623—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels for the control of blooming by evacuation via the output or reset lines
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/63—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current
    • H04N25/633—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current by using optical black pixels
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/673—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/677—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction for reducing the column or line fixed pattern noise
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/778—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising amplifiers shared between a plurality of pixels, i.e. at least one part of the amplifier must be on the sensor array itself
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/011—Manufacture or treatment of image sensors covered by group H10F39/12
    • H10F39/016—Manufacture or treatment of image sensors covered by group H10F39/12 of thin-film-based image sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
    • H10F39/1898—Indirect radiation image sensors, e.g. using luminescent members
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/803—Pixels having integrated switching, control, storage or amplification elements
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/802—Geometry or disposition of elements in pixels, e.g. address-lines or gate electrodes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/811—Interconnections

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  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Multimedia (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Measurement Of Radiation (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
RU2010105857/09A 2007-07-19 2008-07-18 Аппаратура для регистрации излучения и система визуализации с помощью излучения RU2427972C1 (ru)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2007-188206 2007-07-19
JP2007188206 2007-07-19
JP2008-172621 2008-07-01
JP2008172621A JP5406473B2 (ja) 2007-07-19 2008-07-01 放射線検出装置

Publications (1)

Publication Number Publication Date
RU2427972C1 true RU2427972C1 (ru) 2011-08-27

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Country Status (6)

Country Link
US (1) US8680472B2 (https=)
EP (1) EP2168370B1 (https=)
JP (1) JP5406473B2 (https=)
CN (1) CN101682687B (https=)
RU (1) RU2427972C1 (https=)
WO (1) WO2009011465A1 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
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WO2013085428A1 (ru) * 2011-12-05 2013-06-13 Popov Vladimir Yurevich Спектрометр для обнаружения радионуклидов ксенона

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US8729478B2 (en) * 2010-06-09 2014-05-20 Carestream Health, Inc. Dual screen radiographic detector with improved spatial sampling
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US8384041B2 (en) * 2010-07-21 2013-02-26 Carestream Health, Inc. Digital radiographic imaging arrays with reduced noise
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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2178626C1 (ru) * 2000-07-17 2002-01-20 Казанский государственный технический университет им. А.Н. Туполева Способ коррекции искажений видеосигнала фотоприемника
EP1330117A2 (en) * 2002-01-16 2003-07-23 Fuji Photo Film Co., Ltd. Image reading method and image recording and reading device
JP2004179537A (ja) * 2002-11-28 2004-06-24 Hamamatsu Photonics Kk 固体撮像装置及び放射線撮像装置
WO2005050981A1 (en) * 2003-11-21 2005-06-02 Canon Kabushiki Kaisha Radiation image pick-up device and method therefor, and radiation image pick-up system

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5880865A (ja) * 1981-11-10 1983-05-16 Fuji Xerox Co Ltd 原稿読取装置
EP0490997A4 (en) 1989-09-06 1993-01-27 The University Of Michigan, Intellectual Property Office Multi-element-amorphous-silicon-detector-array for real-time imaging and dosimetry of megavoltage photons and diagnostic x-rays
JP3066944B2 (ja) 1993-12-27 2000-07-17 キヤノン株式会社 光電変換装置、その駆動方法及びそれを有するシステム
JP2001056382A (ja) 1999-06-07 2001-02-27 Toshiba Corp 放射線検出器及び放射線診断装置
EP1258738B1 (en) * 2000-01-13 2011-08-03 Hamamatsu Photonics K.K. Radiation image sensor and scintillator panel
JP3870088B2 (ja) * 2001-12-26 2007-01-17 キヤノン株式会社 固体撮像装置及びシステム
US7214945B2 (en) 2002-06-11 2007-05-08 Canon Kabushiki Kaisha Radiation detecting apparatus, manufacturing method therefor, and radiation image pickup system
CN1517069B (zh) * 2003-01-27 2012-03-28 佳能株式会社 放射线摄像装置和放射线摄像系统
EP1593159B1 (en) 2003-02-14 2013-05-29 Canon Kabushiki Kaisha Radiation image pickup device
JP4266656B2 (ja) 2003-02-14 2009-05-20 キヤノン株式会社 固体撮像装置及び放射線撮像装置
JP4323827B2 (ja) 2003-02-14 2009-09-02 キヤノン株式会社 固体撮像装置及び放射線撮像装置
JP2006128644A (ja) * 2004-09-30 2006-05-18 Canon Inc 撮像装置、放射線撮像装置、及び放射線撮像システム
US7557355B2 (en) 2004-09-30 2009-07-07 Canon Kabushiki Kaisha Image pickup apparatus and radiation image pickup apparatus
JP4403045B2 (ja) 2004-09-30 2010-01-20 富士フイルム株式会社 放射線画像検出器
JP2006345406A (ja) 2005-06-10 2006-12-21 Ntt Docomo Inc 携帯通信端末、記憶媒体
CN100471453C (zh) * 2005-06-14 2009-03-25 佳能株式会社 放射线成像装置、其控制方法和放射线成像系统
JP5043373B2 (ja) 2005-07-11 2012-10-10 キヤノン株式会社 変換装置、放射線検出装置、及び放射線検出システム
JP5043374B2 (ja) 2005-07-11 2012-10-10 キヤノン株式会社 変換装置、放射線検出装置、及び放射線検出システム
JP5043380B2 (ja) 2005-07-25 2012-10-10 キヤノン株式会社 放射線検出装置および放射線検出システム
JP5159065B2 (ja) 2005-08-31 2013-03-06 キヤノン株式会社 放射線検出装置、放射線撮像装置および放射線撮像システム
JP3858044B1 (ja) * 2005-09-09 2006-12-13 株式会社日立製作所 放射線検出モジュール、プリント基板および陽電子放出型断層撮影装置
JP4130211B2 (ja) * 2006-05-31 2008-08-06 三洋電機株式会社 撮像装置
JP5489542B2 (ja) 2008-07-01 2014-05-14 キヤノン株式会社 放射線検出装置及び放射線撮像システム

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2178626C1 (ru) * 2000-07-17 2002-01-20 Казанский государственный технический университет им. А.Н. Туполева Способ коррекции искажений видеосигнала фотоприемника
EP1330117A2 (en) * 2002-01-16 2003-07-23 Fuji Photo Film Co., Ltd. Image reading method and image recording and reading device
JP2004179537A (ja) * 2002-11-28 2004-06-24 Hamamatsu Photonics Kk 固体撮像装置及び放射線撮像装置
WO2005050981A1 (en) * 2003-11-21 2005-06-02 Canon Kabushiki Kaisha Radiation image pick-up device and method therefor, and radiation image pick-up system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013085428A1 (ru) * 2011-12-05 2013-06-13 Popov Vladimir Yurevich Спектрометр для обнаружения радионуклидов ксенона
RU2569411C2 (ru) * 2011-12-05 2015-11-27 Владимир Юрьевич Попов Спектрометр для обнаружения радионуклидов ксенона

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