KR970071136A - 화학 증폭 포지티브형 레지스트 재료 - Google Patents
화학 증폭 포지티브형 레지스트 재료 Download PDFInfo
- Publication number
- KR970071136A KR970071136A KR1019970012721A KR19970012721A KR970071136A KR 970071136 A KR970071136 A KR 970071136A KR 1019970012721 A KR1019970012721 A KR 1019970012721A KR 19970012721 A KR19970012721 A KR 19970012721A KR 970071136 A KR970071136 A KR 970071136A
- Authority
- KR
- South Korea
- Prior art keywords
- chemically amplified
- amplified positive
- torr
- positive resist
- nitrogen
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/106—Binder containing
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Materials For Photolithography (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Abstract
원자외선, 전자선 및 X선 등의 고에너지선에 대한 감도가 높고, 특히 고해상도 및 PED에 의한 패턴의 T-톱 형상 또는 기판 면에서의 소매끌기를 해소하는, 알칼리 수용액에서 현상함으로써 해상성, 플라즈마 에칭 내성이 우수하며, 더우기 레지스트 패턴의 내열성도 우수한 미세가공 기술에 적합한 화학 증폭 포지티브형 레지스트 재료가 얻어진다.
(1) pKa 값이 7 이상이고, 100℃에서의 증기압이 2 Torr 미만인 질소 함유 유기 화합물 중에서 선택되는 적어도 1종, 및 (2) pKa 값이 7 이상이고, 100℃에서의 증기압이 2 Torr 내지 100 Torr 범위인 질소 함유 유기화합물 중에서 선택되는 적어도 1종을 배합하여 화학 증폭 포지티브형 레지스트 재료를 제조한다.
(A) 유기 용해, (B) 베이스 수지, (C) 산 발생제, 및 (D) 제1항 기재의 질소 함유 유기 화합물(1) 및 (2)의 혼합물을 배합하여 화학 증폭 포지티브형 레지스트 재료를 수득한다.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
Claims (2)
- (1) pKa 값이 7 이상이고, 100℃에서의 증기압이 2 Torr 미만인 질소 함유 유기 화합물 중에서 선택되는 적어도 1종, 및 (2) pKa 값이 7 이상이고, 100℃에서의 증기압이 2 Torr 내지 100 Torr 범위인 질소 함유 유기화합물 중에서 선택되는 적어도 1종을 함유하여 이루어지는 것을 특징으로 하는 화학 증폭 포지티브형 레지스트 재료.
- (A) 유기 용해, (B) 베이스 수지, (C) 산 발생제, 및 (D) 제1항 기재의 질소 함유 유기 화합물(1) 및 (2)의 혼합물을 이루어지는 것을 특징으로 하는 화학 증폭 포지티브형 레지스트 재료.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP08111309A JP3125678B2 (ja) | 1996-04-08 | 1996-04-08 | 化学増幅ポジ型レジスト材料 |
JP96-111309 | 1996-04-08 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970071136A true KR970071136A (ko) | 1997-11-07 |
KR100255833B1 KR100255833B1 (ko) | 2000-06-01 |
Family
ID=14557969
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019970012721A KR100255833B1 (ko) | 1996-04-08 | 1997-04-07 | 화학 증폭 포지티브형 레지스트 재료 |
Country Status (4)
Country | Link |
---|---|
US (1) | US5985512A (ko) |
JP (1) | JP3125678B2 (ko) |
KR (1) | KR100255833B1 (ko) |
TW (1) | TW565749B (ko) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3875280B2 (ja) * | 1997-07-15 | 2007-01-31 | イー・アイ・デュポン・ドウ・ヌムール・アンド・カンパニー | ミクロリソグラフィーのための改良された溶解抑制レジスト |
KR100571313B1 (ko) * | 1998-03-17 | 2006-04-17 | 후지 샤신 필름 가부시기가이샤 | 포지티브 감광성 조성물 |
JP3955385B2 (ja) * | 1998-04-08 | 2007-08-08 | Azエレクトロニックマテリアルズ株式会社 | パターン形成方法 |
CN1153666C (zh) * | 1998-11-16 | 2004-06-16 | 三菱化学株式会社 | 阳图制版光敏平版印刷板及其制造方法 |
JP3961139B2 (ja) * | 1998-12-24 | 2007-08-22 | 富士フイルム株式会社 | ポジ型感光性組成物 |
KR100576201B1 (ko) * | 2000-01-17 | 2006-05-03 | 신에쓰 가가꾸 고교 가부시끼가이샤 | 화학 증폭형 레지스트 재료 |
KR100553263B1 (ko) * | 2000-04-14 | 2006-02-20 | 주식회사 동진쎄미켐 | 화학 증폭 레지스트용 폴리머 및 이를 이용한 레지스트조성물 |
TWI253543B (en) * | 2000-07-19 | 2006-04-21 | Shinetsu Chemical Co | Chemically amplified positive resist composition |
TW556047B (en) * | 2000-07-31 | 2003-10-01 | Shipley Co Llc | Coated substrate, method for forming photoresist relief image, and antireflective composition |
US7192681B2 (en) | 2001-07-05 | 2007-03-20 | Fuji Photo Film Co., Ltd. | Positive photosensitive composition |
US6645696B1 (en) * | 2001-11-30 | 2003-11-11 | Euv Llc. | Photoimageable composition |
JP4080784B2 (ja) * | 2002-04-26 | 2008-04-23 | 東京応化工業株式会社 | レジスト用現像液及びそれを用いたレジストパターン形成方法、並びにレジスト用現像原液 |
JP4612999B2 (ja) | 2003-10-08 | 2011-01-12 | 富士フイルム株式会社 | ポジ型レジスト組成物及びそれを用いたパターン形成方法 |
CN1914558A (zh) * | 2004-02-11 | 2007-02-14 | 国际商业机器公司 | 混合碱用于提高铬或敏感基材上的图案化抗蚀剂分布的应用 |
JP4524154B2 (ja) | 2004-08-18 | 2010-08-11 | 富士フイルム株式会社 | 化学増幅型レジスト組成物及びそれを用いたパターン形成方法 |
CN101770169B (zh) * | 2008-12-30 | 2012-03-21 | 乐凯集团第二胶片厂 | 一种高分辨力高感光度的阳图平印版感光组合物 |
US10649339B2 (en) * | 2016-12-13 | 2020-05-12 | Taiwan Semiconductor Manufacturing Co., Ltd. | Resist material and method for forming semiconductor structure using resist layer |
Family Cites Families (28)
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EP0249139B2 (en) * | 1986-06-13 | 1998-03-11 | MicroSi, Inc. (a Delaware corporation) | Resist compositions and use |
JPS63149640A (ja) * | 1986-12-12 | 1988-06-22 | Konica Corp | 感光性組成物および感光性平版印刷版 |
JP2578646B2 (ja) * | 1988-07-18 | 1997-02-05 | 三洋電機株式会社 | 非水系二次電池 |
EP0523957A1 (en) * | 1991-07-17 | 1993-01-20 | Japan Synthetic Rubber Co., Ltd. | Radiation-sensitive composition |
EP0537524A1 (en) * | 1991-10-17 | 1993-04-21 | Shipley Company Inc. | Radiation sensitive compositions and methods |
JPH05127369A (ja) * | 1991-10-31 | 1993-05-25 | Nec Corp | レジスト材料 |
JP2976414B2 (ja) * | 1992-04-10 | 1999-11-10 | ジェイエスアール株式会社 | 感放射線性樹脂組成物 |
JP3010607B2 (ja) * | 1992-02-25 | 2000-02-21 | ジェイエスアール株式会社 | 感放射線性樹脂組成物 |
US5580695A (en) * | 1992-02-25 | 1996-12-03 | Japan Synthetic Rubber Co., Ltd. | Chemically amplified resist |
JPH05257283A (ja) * | 1992-03-12 | 1993-10-08 | Toray Ind Inc | 放射線感応性高分子化合物 |
JPH05265213A (ja) * | 1992-03-18 | 1993-10-15 | Japan Synthetic Rubber Co Ltd | 感放射線性樹脂組成物 |
JPH06230574A (ja) * | 1993-02-05 | 1994-08-19 | Fuji Photo Film Co Ltd | ポジ型感光性組成物 |
JPH06242605A (ja) * | 1993-02-15 | 1994-09-02 | Hoechst Japan Ltd | ポジ型放射感応性混合物 |
JP3293940B2 (ja) * | 1993-03-12 | 2002-06-17 | 株式会社東芝 | 感光性組成物及びそれを用いたパターン形成方法 |
JPH06266110A (ja) * | 1993-03-12 | 1994-09-22 | Nippon Telegr & Teleph Corp <Ntt> | ポジ型レジスト材料 |
JPH0792680A (ja) * | 1993-06-29 | 1995-04-07 | Nippon Zeon Co Ltd | レジスト組成物 |
JPH0792678A (ja) * | 1993-06-29 | 1995-04-07 | Nippon Zeon Co Ltd | レジスト組成物 |
JPH0792681A (ja) * | 1993-06-29 | 1995-04-07 | Nippon Zeon Co Ltd | レジスト組成物 |
JPH07120929A (ja) * | 1993-09-01 | 1995-05-12 | Toshiba Corp | 感光性組成物 |
JP3297199B2 (ja) * | 1993-09-14 | 2002-07-02 | 株式会社東芝 | レジスト組成物 |
JPH07118651A (ja) * | 1993-10-20 | 1995-05-09 | Nippon Steel Corp | コークス炉の窯口集塵装置及び集塵方法 |
JPH07128859A (ja) * | 1993-11-04 | 1995-05-19 | Wako Pure Chem Ind Ltd | レジスト組成物 |
JP3116751B2 (ja) * | 1993-12-03 | 2000-12-11 | ジェイエスアール株式会社 | 感放射線性樹脂組成物 |
JP3203995B2 (ja) * | 1993-12-24 | 2001-09-04 | ジェイエスアール株式会社 | 感放射線性樹脂組成物 |
US5736296A (en) * | 1994-04-25 | 1998-04-07 | Tokyo Ohka Kogyo Co., Ltd. | Positive resist composition comprising a mixture of two polyhydroxystyrenes having different acid cleavable groups and an acid generating compound |
JP3317576B2 (ja) * | 1994-05-12 | 2002-08-26 | 富士写真フイルム株式会社 | ポジ型感光性樹脂組成物 |
JP3340864B2 (ja) * | 1994-10-26 | 2002-11-05 | 富士写真フイルム株式会社 | ポジ型化学増幅レジスト組成物 |
TW460753B (en) * | 1995-07-20 | 2001-10-21 | Shinetsu Chemical Co | Chemically amplified positive resist material |
-
1996
- 1996-04-08 JP JP08111309A patent/JP3125678B2/ja not_active Expired - Fee Related
- 1996-12-23 TW TW085116031A patent/TW565749B/zh not_active IP Right Cessation
-
1997
- 1997-04-01 US US08/831,750 patent/US5985512A/en not_active Expired - Lifetime
- 1997-04-07 KR KR1019970012721A patent/KR100255833B1/ko active IP Right Review Request
Also Published As
Publication number | Publication date |
---|---|
JP3125678B2 (ja) | 2001-01-22 |
JPH09274312A (ja) | 1997-10-21 |
US5985512A (en) | 1999-11-16 |
TW565749B (en) | 2003-12-11 |
KR100255833B1 (ko) | 2000-06-01 |
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