KR900010465A - 양성 레지스트 조성물의 제조방법 - Google Patents
양성 레지스트 조성물의 제조방법 Download PDFInfo
- Publication number
- KR900010465A KR900010465A KR1019890018045A KR890018045A KR900010465A KR 900010465 A KR900010465 A KR 900010465A KR 1019890018045 A KR1019890018045 A KR 1019890018045A KR 890018045 A KR890018045 A KR 890018045A KR 900010465 A KR900010465 A KR 900010465A
- Authority
- KR
- South Korea
- Prior art keywords
- producing
- resist composition
- positive resist
- alkali
- soluble resin
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03C—PHOTOSENSITIVE MATERIALS FOR PHOTOGRAPHIC PURPOSES; PHOTOGRAPHIC PROCESSES, e.g. CINE, X-RAY, COLOUR, STEREO-PHOTOGRAPHIC PROCESSES; AUXILIARY PROCESSES IN PHOTOGRAPHY
- G03C1/00—Photosensitive materials
- G03C1/72—Photosensitive compositions not covered by the groups G03C1/005 - G03C1/705
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
- G03F7/023—Macromolecular quinonediazides; Macromolecular additives, e.g. binders
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Phenolic Resins Or Amino Resins (AREA)
- Materials For Photolithography (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
- Paints Or Removers (AREA)
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
Claims (2)
- 퀴는 디아지드 술포닐 할로겐화물을 페놀 화합물과 축합반응시키고, 축합반응 혼합물을 레지스트 용매 내의 알칼리-가용성 수지 용액과 혼합하고, 그 혼합물로 부터 불순물을 제거하는 단계로 이루어진, 양성 레지스트 조성물의 제조방법.
- 제1항에 있어서, 알칼리-가용성 수지가 노볼락 수지인, 양성 레지스트 조성물의 제조방법.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP308559/1988 | 1988-12-06 | ||
JP88-308559 | 1988-12-06 | ||
JP63308559A JP2697039B2 (ja) | 1988-12-06 | 1988-12-06 | ポジ型レジスト組成物の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR900010465A true KR900010465A (ko) | 1990-07-07 |
KR0137764B1 KR0137764B1 (ko) | 1998-04-27 |
Family
ID=17982489
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019890018045A KR0137764B1 (ko) | 1988-12-06 | 1989-12-06 | 양성 레지스트 조성물의 제조방법 |
Country Status (7)
Country | Link |
---|---|
US (1) | US5080997A (ko) |
EP (1) | EP0372504B1 (ko) |
JP (1) | JP2697039B2 (ko) |
KR (1) | KR0137764B1 (ko) |
CA (1) | CA2004593A1 (ko) |
DE (1) | DE68926151T2 (ko) |
MX (1) | MX171835B (ko) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5300396A (en) * | 1990-11-28 | 1994-04-05 | Hoechst Celanese Corporation | Process of making naphthoquinone diazide esters using lactone solvents |
JP2976597B2 (ja) * | 1991-04-17 | 1999-11-10 | 住友化学工業株式会社 | キノンジアジドスルホン酸エステルの製造方法 |
US5618655A (en) * | 1995-07-17 | 1997-04-08 | Olin Corporation | Process of reducing trace levels of metal impurities from resist components |
US5623042A (en) * | 1995-07-19 | 1997-04-22 | Olin Corporation | Process for reducing trace levels of metallic impurities in cyclized polyisoprene resin |
KR100979871B1 (ko) | 2002-04-01 | 2010-09-02 | 다이셀 가가꾸 고교 가부시끼가이샤 | ArF 엑시머 레이저 레지스트용 중합체 용액의 제조 방법 |
US20060172231A1 (en) * | 2002-08-08 | 2006-08-03 | Fujifilm Electronic Materials U.S.A., Inc | Use of an oxidizer to improve trace metals removal from photoresist and photoresist components |
AU2004249284A1 (en) * | 2003-06-18 | 2004-12-29 | The Board Of Trustees Of The Leland Stanford Junior University | Electro-adhesive tissue manipulator |
JP4699482B2 (ja) * | 2005-02-02 | 2011-06-08 | コーロン インダストリーズ インク | ポジティブ型ドライフィルムフォトレジストの製造方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
BE795809A (fr) * | 1972-02-22 | 1973-08-22 | Eastman Kodak Co | Nouveaux polymeres photosensibles a groupes o-quinone diazide |
DE3100077A1 (de) * | 1981-01-03 | 1982-08-05 | Hoechst Ag, 6000 Frankfurt | Lichtempfindliches gemisch, das einen naphthochinondiazidsulfonsaeureester enthaelt, und verfahren zur herstellung des naphthochinondiazidsulfonsaeureesters |
JPS58205147A (ja) * | 1982-05-25 | 1983-11-30 | Sumitomo Chem Co Ltd | ポジ型フオトレジスト組成物 |
US4550069A (en) * | 1984-06-11 | 1985-10-29 | American Hoechst Corporation | Positive photoresist compositions with o-quinone diazide, novolak, and propylene glycol alkyl ether acetate |
JPS61118744A (ja) * | 1984-11-15 | 1986-06-06 | Tokyo Ohka Kogyo Co Ltd | ポジ型ホトレジスト組成物 |
JPS61185741A (ja) * | 1985-02-13 | 1986-08-19 | Mitsubishi Chem Ind Ltd | ポジ型フオトレジスト組成物 |
JPH0654384B2 (ja) * | 1985-08-09 | 1994-07-20 | 東京応化工業株式会社 | ポジ型ホトレジスト組成物 |
US4732836A (en) * | 1986-05-02 | 1988-03-22 | Hoechst Celanese Corporation | Novel mixed ester O-quinone photosensitizers |
JPS63178228A (ja) * | 1987-01-20 | 1988-07-22 | Fuji Photo Film Co Ltd | ポジ型フオトレジスト組成物 |
JP2560266B2 (ja) * | 1987-03-25 | 1996-12-04 | 日本合成ゴム株式会社 | 感放射線性樹脂組成物 |
JPS63305348A (ja) * | 1987-06-05 | 1988-12-13 | Fuji Photo Film Co Ltd | ポジ型フオトレジスト組成物 |
-
1988
- 1988-12-06 JP JP63308559A patent/JP2697039B2/ja not_active Expired - Fee Related
-
1989
- 1989-12-04 MX MX018574A patent/MX171835B/es unknown
- 1989-12-05 CA CA002004593A patent/CA2004593A1/en not_active Abandoned
- 1989-12-05 US US07/446,153 patent/US5080997A/en not_active Expired - Fee Related
- 1989-12-06 KR KR1019890018045A patent/KR0137764B1/ko not_active IP Right Cessation
- 1989-12-06 DE DE68926151T patent/DE68926151T2/de not_active Expired - Fee Related
- 1989-12-06 EP EP89122452A patent/EP0372504B1/en not_active Revoked
Also Published As
Publication number | Publication date |
---|---|
EP0372504A1 (en) | 1990-06-13 |
KR0137764B1 (ko) | 1998-04-27 |
DE68926151T2 (de) | 1996-08-22 |
CA2004593A1 (en) | 1990-06-06 |
EP0372504B1 (en) | 1996-04-03 |
JPH02154259A (ja) | 1990-06-13 |
JP2697039B2 (ja) | 1998-01-14 |
US5080997A (en) | 1992-01-14 |
MX171835B (es) | 1993-11-18 |
DE68926151D1 (de) | 1996-05-09 |
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A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
LAPS | Lapse due to unpaid annual fee |