KR910013490A - 전자 빔 리소그래피 공정 - Google Patents
전자 빔 리소그래피 공정 Download PDFInfo
- Publication number
- KR910013490A KR910013490A KR1019890020708A KR890020708A KR910013490A KR 910013490 A KR910013490 A KR 910013490A KR 1019890020708 A KR1019890020708 A KR 1019890020708A KR 890020708 A KR890020708 A KR 890020708A KR 910013490 A KR910013490 A KR 910013490A
- Authority
- KR
- South Korea
- Prior art keywords
- electron beam
- lithography process
- beam lithography
- photoresist
- multilayer resist
- Prior art date
Links
- 238000000609 electron-beam lithography Methods 0.000 title claims description 4
- 238000000034 method Methods 0.000 title claims 4
- 239000010408 film Substances 0.000 claims 3
- 229920002120 photoresistant polymer Polymers 0.000 claims 3
- 238000010894 electron beam technology Methods 0.000 claims 1
- 238000005530 etching Methods 0.000 claims 1
- 239000010410 layer Substances 0.000 claims 1
- 239000002184 metal Substances 0.000 claims 1
- 239000011241 protective layer Substances 0.000 claims 1
- 239000010409 thin film Substances 0.000 claims 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/34—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies not provided for in groups H01L21/0405, H01L21/0445, H01L21/06, H01L21/16 and H01L21/18 with or without impurities, e.g. doping materials
- H01L21/42—Bombardment with radiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Electron Beam Exposure (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
Abstract
내용 없음.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제2도는 본 발명에 의한 전자 빔 리소그래피를 위한 다층 레지스트막의 구성을 도시한 단면도.
Claims (1)
- 다층 레지스트막을 사용하는 전자 빔 리소그래피 공정에 있어서, 상기 다층 레지스트막은 평탄화층인 제1포토레지스트와, 보호층인 절연막, 전자 빔 조사시 손실되는 전자를 채우기 위한 금속박막, 그리고 식각공정을 위한 포토레지스트 패턴이 형성되는 제2포토레지스트가 차례로 적층되어 형성됨을 특징으로 하는 전자 빔 리소그래피 공정.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019890020708A KR920007188B1 (ko) | 1989-12-30 | 1989-12-30 | 전자 빔 리소그래피 공정 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019890020708A KR920007188B1 (ko) | 1989-12-30 | 1989-12-30 | 전자 빔 리소그래피 공정 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR910013490A true KR910013490A (ko) | 1991-08-08 |
KR920007188B1 KR920007188B1 (ko) | 1992-08-27 |
Family
ID=19294761
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019890020708A KR920007188B1 (ko) | 1989-12-30 | 1989-12-30 | 전자 빔 리소그래피 공정 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR920007188B1 (ko) |
-
1989
- 1989-12-30 KR KR1019890020708A patent/KR920007188B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR920007188B1 (ko) | 1992-08-27 |
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