US7030039B2
(en)
|
1994-10-27 |
2006-04-18 |
Asml Holding N.V. |
Method of uniformly coating a substrate
|
US7018943B2
(en)
*
|
1994-10-27 |
2006-03-28 |
Asml Holding N.V. |
Method of uniformly coating a substrate
|
US6977098B2
(en)
*
|
1994-10-27 |
2005-12-20 |
Asml Holding N.V. |
Method of uniformly coating a substrate
|
KR100370728B1
(ko)
*
|
1994-10-27 |
2003-04-07 |
실리콘 밸리 그룹, 인크. |
기판을균일하게코팅하는방법및장치
|
JP3380663B2
(ja)
*
|
1995-11-27 |
2003-02-24 |
大日本スクリーン製造株式会社 |
基板処理装置
|
US5725663A
(en)
*
|
1996-01-31 |
1998-03-10 |
Solitec Wafer Processing, Inc. |
Apparatus for control of contamination in spin systems
|
US6921467B2
(en)
|
1996-07-15 |
2005-07-26 |
Semitool, Inc. |
Processing tools, components of processing tools, and method of making and using same for electrochemical processing of microelectronic workpieces
|
AT407586B
(de)
*
|
1997-05-23 |
2001-04-25 |
Sez Semiconduct Equip Zubehoer |
Anordnung zum behandeln scheibenförmiger gegenstände, insbesondere von siliziumwafern
|
US5972078A
(en)
*
|
1997-07-31 |
1999-10-26 |
Fsi International, Inc. |
Exhaust rinse manifold for use with a coating apparatus
|
US6001418A
(en)
*
|
1997-12-16 |
1999-12-14 |
The University Of North Carolina At Chapel Hill |
Spin coating method and apparatus for liquid carbon dioxide systems
|
US6383289B2
(en)
|
1997-12-16 |
2002-05-07 |
The University Of North Carolina At Chapel Hill |
Apparatus for liquid carbon dioxide systems
|
US7244677B2
(en)
*
|
1998-02-04 |
2007-07-17 |
Semitool. Inc. |
Method for filling recessed micro-structures with metallization in the production of a microelectronic device
|
US6565729B2
(en)
|
1998-03-20 |
2003-05-20 |
Semitool, Inc. |
Method for electrochemically depositing metal on a semiconductor workpiece
|
TW593731B
(en)
|
1998-03-20 |
2004-06-21 |
Semitool Inc |
Apparatus for applying a metal structure to a workpiece
|
US6197181B1
(en)
*
|
1998-03-20 |
2001-03-06 |
Semitool, Inc. |
Apparatus and method for electrolytically depositing a metal on a microelectronic workpiece
|
US6302960B1
(en)
|
1998-11-23 |
2001-10-16 |
Applied Materials, Inc. |
Photoresist coater
|
KR100707121B1
(ko)
|
1999-04-13 |
2007-04-16 |
세미툴 인코포레이티드 |
마이크로전자 피가공물을 전기화학적으로 처리하기 위한 장치 및 마이크로전자 피가공물 상에 재료를 전기도금하기 위한 방법
|
US6916412B2
(en)
*
|
1999-04-13 |
2005-07-12 |
Semitool, Inc. |
Adaptable electrochemical processing chamber
|
US6287987B1
(en)
|
1999-04-30 |
2001-09-11 |
Lsi Logic Corporation |
Method and apparatus for deposition of porous silica dielectrics
|
US6261635B1
(en)
|
1999-08-27 |
2001-07-17 |
Micron Technology, Inc. |
Method for controlling air over a spinning microelectronic substrate
|
WO2001037329A1
(en)
*
|
1999-11-15 |
2001-05-25 |
Lucent Technologies, Inc. |
System and method for removal of material
|
US6488040B1
(en)
*
|
2000-06-30 |
2002-12-03 |
Lam Research Corporation |
Capillary proximity heads for single wafer cleaning and drying
|
US7234477B2
(en)
*
|
2000-06-30 |
2007-06-26 |
Lam Research Corporation |
Method and apparatus for drying semiconductor wafer surfaces using a plurality of inlets and outlets held in close proximity to the wafer surfaces
|
WO2002004887A1
(en)
|
2000-07-08 |
2002-01-17 |
Semitool, Inc. |
Methods and apparatus for processing microelectronic workpieces using metrology
|
JP4895320B2
(ja)
*
|
2000-07-10 |
2012-03-14 |
日立化成工業株式会社 |
光導波路デバイスの製造方法
|
JP3587776B2
(ja)
|
2000-10-10 |
2004-11-10 |
東京エレクトロン株式会社 |
塗布装置及び塗布方法
|
US6827092B1
(en)
*
|
2000-12-22 |
2004-12-07 |
Lam Research Corporation |
Wafer backside plate for use in a spin, rinse, and dry module and methods for making and implementing the same
|
JP3898906B2
(ja)
*
|
2001-05-22 |
2007-03-28 |
東京エレクトロン株式会社 |
基板の塗布装置
|
JP3726835B2
(ja)
*
|
2001-05-30 |
2005-12-14 |
日立化成工業株式会社 |
光学素子、光学素子の製造方法、塗布装置、および、塗布方法
|
US7171973B2
(en)
*
|
2001-07-16 |
2007-02-06 |
Tokyo Electron Limited |
Substrate processing apparatus
|
JP3909574B2
(ja)
*
|
2002-01-11 |
2007-04-25 |
東京エレクトロン株式会社 |
レジスト塗布装置
|
JP2004000921A
(ja)
*
|
2002-04-26 |
2004-01-08 |
Seiko Epson Corp |
膜体形成装置、レンズの製造方法、カラーフィルタの製造方法および有機el装置の製造方法
|
US6893505B2
(en)
*
|
2002-05-08 |
2005-05-17 |
Semitool, Inc. |
Apparatus and method for regulating fluid flows, such as flows of electrochemical processing fluids
|
US7045018B2
(en)
*
|
2002-09-30 |
2006-05-16 |
Lam Research Corporation |
Substrate brush scrubbing and proximity cleaning-drying sequence using compatible chemistries, and method, apparatus, and system for implementing the same
|
US7389783B2
(en)
*
|
2002-09-30 |
2008-06-24 |
Lam Research Corporation |
Proximity meniscus manifold
|
US8236382B2
(en)
*
|
2002-09-30 |
2012-08-07 |
Lam Research Corporation |
Proximity substrate preparation sequence, and method, apparatus, and system for implementing the same
|
US7153400B2
(en)
*
|
2002-09-30 |
2006-12-26 |
Lam Research Corporation |
Apparatus and method for depositing and planarizing thin films of semiconductor wafers
|
US7632376B1
(en)
|
2002-09-30 |
2009-12-15 |
Lam Research Corporation |
Method and apparatus for atomic layer deposition (ALD) in a proximity system
|
US7293571B2
(en)
|
2002-09-30 |
2007-11-13 |
Lam Research Corporation |
Substrate proximity processing housing and insert for generating a fluid meniscus
|
US7383843B2
(en)
*
|
2002-09-30 |
2008-06-10 |
Lam Research Corporation |
Method and apparatus for processing wafer surfaces using thin, high velocity fluid layer
|
US7997288B2
(en)
*
|
2002-09-30 |
2011-08-16 |
Lam Research Corporation |
Single phase proximity head having a controlled meniscus for treating a substrate
|
US7367345B1
(en)
|
2002-09-30 |
2008-05-06 |
Lam Research Corporation |
Apparatus and method for providing a confined liquid for immersion lithography
|
US7513262B2
(en)
|
2002-09-30 |
2009-04-07 |
Lam Research Corporation |
Substrate meniscus interface and methods for operation
|
US7198055B2
(en)
*
|
2002-09-30 |
2007-04-03 |
Lam Research Corporation |
Meniscus, vacuum, IPA vapor, drying manifold
|
US7614411B2
(en)
*
|
2002-09-30 |
2009-11-10 |
Lam Research Corporation |
Controls of ambient environment during wafer drying using proximity head
|
US6716285B1
(en)
|
2002-10-23 |
2004-04-06 |
The United States Of America As Represented By The Secretary Of The Air Force |
Spin coating of substrate with chemical
|
US7675000B2
(en)
*
|
2003-06-24 |
2010-03-09 |
Lam Research Corporation |
System method and apparatus for dry-in, dry-out, low defect laser dicing using proximity technology
|
US7648584B2
(en)
|
2003-06-27 |
2010-01-19 |
Lam Research Corporation |
Method and apparatus for removing contamination from substrate
|
US7737097B2
(en)
|
2003-06-27 |
2010-06-15 |
Lam Research Corporation |
Method for removing contamination from a substrate and for making a cleaning solution
|
US8316866B2
(en)
|
2003-06-27 |
2012-11-27 |
Lam Research Corporation |
Method and apparatus for cleaning a semiconductor substrate
|
US8522801B2
(en)
|
2003-06-27 |
2013-09-03 |
Lam Research Corporation |
Method and apparatus for cleaning a semiconductor substrate
|
US7799141B2
(en)
|
2003-06-27 |
2010-09-21 |
Lam Research Corporation |
Method and system for using a two-phases substrate cleaning compound
|
US7913703B1
(en)
|
2003-06-27 |
2011-03-29 |
Lam Research Corporation |
Method and apparatus for uniformly applying a multi-phase cleaning solution to a substrate
|
GB0318817D0
(en)
*
|
2003-08-11 |
2003-09-10 |
Univ Cambridge Tech |
Method of making a polymer device
|
US7862662B2
(en)
|
2005-12-30 |
2011-01-04 |
Lam Research Corporation |
Method and material for cleaning a substrate
|
US7416370B2
(en)
|
2005-06-15 |
2008-08-26 |
Lam Research Corporation |
Method and apparatus for transporting a substrate using non-Newtonian fluid
|
US8522799B2
(en)
|
2005-12-30 |
2013-09-03 |
Lam Research Corporation |
Apparatus and system for cleaning a substrate
|
US8043441B2
(en)
|
2005-06-15 |
2011-10-25 |
Lam Research Corporation |
Method and apparatus for cleaning a substrate using non-Newtonian fluids
|
US8323420B2
(en)
|
2005-06-30 |
2012-12-04 |
Lam Research Corporation |
Method for removing material from semiconductor wafer and apparatus for performing the same
|
US7568490B2
(en)
|
2003-12-23 |
2009-08-04 |
Lam Research Corporation |
Method and apparatus for cleaning semiconductor wafers using compressed and/or pressurized foams, bubbles, and/or liquids
|
US7326437B2
(en)
*
|
2003-12-29 |
2008-02-05 |
Asml Holding N.V. |
Method and system for coating polymer solution on a substrate in a solvent saturated chamber
|
US8062471B2
(en)
*
|
2004-03-31 |
2011-11-22 |
Lam Research Corporation |
Proximity head heating method and apparatus
|
JP4446875B2
(ja)
*
|
2004-06-14 |
2010-04-07 |
大日本スクリーン製造株式会社 |
基板処理装置
|
US7740908B2
(en)
*
|
2005-02-28 |
2010-06-22 |
Fujifilm Corporation |
Method for forming a film by spin coating
|
US7681581B2
(en)
*
|
2005-04-01 |
2010-03-23 |
Fsi International, Inc. |
Compact duct system incorporating moveable and nestable baffles for use in tools used to process microelectronic workpieces with one or more treatment fluids
|
EP2428557A1
(en)
|
2005-12-30 |
2012-03-14 |
LAM Research Corporation |
Cleaning solution
|
US7928366B2
(en)
*
|
2006-10-06 |
2011-04-19 |
Lam Research Corporation |
Methods of and apparatus for accessing a process chamber using a dual zone gas injector with improved optical access
|
JP2009543338A
(ja)
*
|
2006-07-07 |
2009-12-03 |
エフエスアイ インターナショナル インコーポレーテッド |
1つ以上の処理流体によりマイクロエレクトロニクス半製品を処理するために用いられる道具において使われる隔壁構造およびノズル装置
|
US8813764B2
(en)
|
2009-05-29 |
2014-08-26 |
Lam Research Corporation |
Method and apparatus for physical confinement of a liquid meniscus over a semiconductor wafer
|
US8146902B2
(en)
|
2006-12-21 |
2012-04-03 |
Lam Research Corporation |
Hybrid composite wafer carrier for wet clean equipment
|
US7897213B2
(en)
|
2007-02-08 |
2011-03-01 |
Lam Research Corporation |
Methods for contained chemical surface treatment
|
US7975708B2
(en)
*
|
2007-03-30 |
2011-07-12 |
Lam Research Corporation |
Proximity head with angled vacuum conduit system, apparatus and method
|
US8464736B1
(en)
|
2007-03-30 |
2013-06-18 |
Lam Research Corporation |
Reclaim chemistry
|
US20080245390A1
(en)
*
|
2007-04-03 |
2008-10-09 |
Lam Research Corporation |
Method for cleaning semiconductor wafer surfaces by applying periodic shear stress to the cleaning solution
|
US20080264774A1
(en)
*
|
2007-04-25 |
2008-10-30 |
Semitool, Inc. |
Method for electrochemically depositing metal onto a microelectronic workpiece
|
US8141566B2
(en)
*
|
2007-06-19 |
2012-03-27 |
Lam Research Corporation |
System, method and apparatus for maintaining separation of liquids in a controlled meniscus
|
KR101060664B1
(ko)
|
2007-08-07 |
2011-08-31 |
에프에스아이 인터내쇼날 인크. |
하나 이상의 처리유체로 전자소자를 처리하는 장비의 배리어 판 및 벤튜리 시스템의 세정방법 및 관련 장치
|
US8226775B2
(en)
|
2007-12-14 |
2012-07-24 |
Lam Research Corporation |
Methods for particle removal by single-phase and two-phase media
|
KR20130083940A
(ko)
|
2008-05-09 |
2013-07-23 |
티이엘 에프에스아이, 인코포레이티드 |
개방 동작 모드와 폐쇄 동작 모드사이를 용이하게 변경하는 처리실 설계를 이용하여 마이크로일렉트로닉 워크피이스를 처리하는 공구 및 방법
|
US8794175B2
(en)
*
|
2008-12-03 |
2014-08-05 |
The Regents Of The University Of Michigan |
Rolling contact layer-by-layer assembly
|
JP2010181536A
(ja)
*
|
2009-02-04 |
2010-08-19 |
Hitachi High-Technologies Corp |
乾燥装置及びそれを用いた乾燥方法
|
JP4748742B2
(ja)
*
|
2009-02-13 |
2011-08-17 |
東京エレクトロン株式会社 |
基板処理装置及び基板処理方法
|
WO2011026104A2
(en)
|
2009-08-31 |
2011-03-03 |
The Regents Of The University Of Michigan |
Preparation of layer-by-layer materials and coatings from ionic liquids
|
US8906452B1
(en)
*
|
2011-06-03 |
2014-12-09 |
Gary Hillman |
Rapid coating of wafers
|
US10269615B2
(en)
*
|
2011-09-09 |
2019-04-23 |
Lam Research Ag |
Apparatus for treating surfaces of wafer-shaped articles
|
US9104107B1
(en)
|
2013-04-03 |
2015-08-11 |
Western Digital (Fremont), Llc |
DUV photoresist process
|
JP6160554B2
(ja)
*
|
2014-05-08 |
2017-07-12 |
東京エレクトロン株式会社 |
塗布膜形成装置、塗布膜形成方法、記憶媒体
|
KR101617220B1
(ko)
*
|
2014-11-20 |
2016-05-03 |
주식회사 우리나노 |
원심력을 이용한 나노섬유 방사기구 및 이를 이용한 나노섬유의 제조방법
|
JP6432644B2
(ja)
*
|
2017-06-12 |
2018-12-05 |
東京エレクトロン株式会社 |
塗布膜形成装置、塗布膜形成方法、記憶媒体
|
JP7166089B2
(ja)
*
|
2018-06-29 |
2022-11-07 |
東京エレクトロン株式会社 |
基板処理装置、基板処理システムおよび基板処理方法
|
JP2023549840A
(ja)
*
|
2020-11-11 |
2023-11-29 |
サービス サポート スペシャルティーズ,インコーポレイテッド |
基材をコーティングするための方法及び/またはシステム
|