KR940009363B1 - 반도체 집적회로장치 - Google Patents

반도체 집적회로장치 Download PDF

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Publication number
KR940009363B1
KR940009363B1 KR1019910002227A KR910002227A KR940009363B1 KR 940009363 B1 KR940009363 B1 KR 940009363B1 KR 1019910002227 A KR1019910002227 A KR 1019910002227A KR 910002227 A KR910002227 A KR 910002227A KR 940009363 B1 KR940009363 B1 KR 940009363B1
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KR
South Korea
Prior art keywords
type
field effect
gate length
integrated circuit
semiconductor integrated
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Expired - Lifetime
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KR1019910002227A
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English (en)
Korean (ko)
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KR910016147A (ko
Inventor
히로시 이와사키
Original Assignee
가부시키가이샤 도시바
아오이 죠이치
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Application filed by 가부시키가이샤 도시바, 아오이 죠이치 filed Critical 가부시키가이샤 도시바
Publication of KR910016147A publication Critical patent/KR910016147A/ko
Application granted granted Critical
Publication of KR940009363B1 publication Critical patent/KR940009363B1/ko
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
    • H10D84/86—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of Schottky-barrier gate FETs
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
    • H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
    • H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]

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  • Junction Field-Effect Transistors (AREA)
  • Logic Circuits (AREA)
  • Shift Register Type Memory (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
KR1019910002227A 1990-02-14 1991-02-09 반도체 집적회로장치 Expired - Lifetime KR940009363B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP02-032698 1990-02-14
JP2032698A JP2513887B2 (ja) 1990-02-14 1990-02-14 半導体集積回路装置

Publications (2)

Publication Number Publication Date
KR910016147A KR910016147A (ko) 1991-09-30
KR940009363B1 true KR940009363B1 (ko) 1994-10-07

Family

ID=12366074

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019910002227A Expired - Lifetime KR940009363B1 (ko) 1990-02-14 1991-02-09 반도체 집적회로장치

Country Status (5)

Country Link
US (1) US5148244A (https=)
EP (1) EP0442413B1 (https=)
JP (1) JP2513887B2 (https=)
KR (1) KR940009363B1 (https=)
DE (1) DE69132263T2 (https=)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05160717A (ja) * 1991-12-03 1993-06-25 Nec Corp Ｎａｎｄ回路
JP3367776B2 (ja) * 1993-12-27 2003-01-20 株式会社東芝 半導体装置
US5616935A (en) 1994-02-08 1997-04-01 Semiconductor Energy Laboratory Co., Ltd. Semiconductor integrated circuit having N-channel and P-channel transistors
JP2757848B2 (ja) * 1996-01-23 1998-05-25 日本電気株式会社 電界効果型半導体装置
US5959336A (en) * 1996-08-26 1999-09-28 Advanced Micro Devices, Inc. Decoder circuit with short channel depletion transistors
JP3527034B2 (ja) * 1996-09-20 2004-05-17 株式会社半導体エネルギー研究所 半導体装置
JPH11214528A (ja) * 1998-01-29 1999-08-06 Mitsubishi Electric Corp 半導体装置
EP1003222A1 (en) * 1998-11-19 2000-05-24 STMicroelectronics S.r.l. Improved field-effect transistor and corresponding manufacturing method
US6864131B2 (en) * 1999-06-02 2005-03-08 Arizona State University Complementary Schottky junction transistors and methods of forming the same
US7589007B2 (en) * 1999-06-02 2009-09-15 Arizona Board Of Regents For And On Behalf Of Arizona State University MESFETs integrated with MOSFETs on common substrate and methods of forming the same
JP2003007727A (ja) * 2001-06-22 2003-01-10 Sanyo Electric Co Ltd 化合物半導体装置
KR100654053B1 (ko) * 2005-12-29 2006-12-05 동부일렉트로닉스 주식회사 부가 게이트 도체 패턴을 갖는 협채널 금속 산화물 반도체트랜지스터
GB2438677B (en) 2006-05-31 2011-08-10 Filtronic Compound Semiconductors Ltd A field effect transistor having multiple pinch off voltages
JP5322169B2 (ja) * 2009-08-28 2013-10-23 独立行政法人産業技術総合研究所 炭化珪素絶縁ゲート電界効果トランジスタを用いたインバータ回路および論理ゲート回路
JP5525249B2 (ja) * 2009-12-08 2014-06-18 ラピスセミコンダクタ株式会社 半導体装置及びその製造方法
US8999791B2 (en) 2013-05-03 2015-04-07 International Business Machines Corporation Formation of semiconductor structures with variable gate lengths
US11018134B2 (en) 2017-09-26 2021-05-25 Taiwan Semiconductor Manufacturing Co., Ltd. Semiconductor device and method for manufacturing the same
EP3766102B1 (en) 2018-03-14 2022-08-31 Emberion Oy Surface mesfet
JP7395256B2 (ja) * 2019-03-14 2023-12-11 株式会社東芝 増幅装置および送信装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0810751B2 (ja) * 1983-12-23 1996-01-31 株式会社日立製作所 半導体装置
JPS60176277A (ja) * 1984-02-22 1985-09-10 Nec Corp ガリウム砒素集積回路
JPS60183764A (ja) * 1984-03-02 1985-09-19 Oki Electric Ind Co Ltd ＧａＡｓ論理回路装置
US4777517A (en) * 1984-11-29 1988-10-11 Fujitsu Limited Compound semiconductor integrated circuit device
JPS62206887A (ja) * 1986-03-07 1987-09-11 Toshiba Corp ＧａＡｓ集積回路
FR2603146B1 (fr) * 1986-08-19 1988-11-10 Thomson Csf Source de courant de type charge active et son procede de realisation
JPS6346779A (ja) * 1986-08-15 1988-02-27 Nec Corp 半導体装置
US4701646A (en) * 1986-11-18 1987-10-20 Northern Telecom Limited Direct coupled FET logic using a photodiode for biasing or level-shifting
JPS63156367A (ja) * 1986-12-20 1988-06-29 Fujitsu Ltd レベル・シフト・ダイオ−ド
JPS6411363A (en) * 1987-07-03 1989-01-13 Matsushita Electric Industrial Co Ltd Read storage element
JPH01227478A (ja) * 1988-03-08 1989-09-11 Fujitsu Ltd 半導体装置
JPH01241180A (ja) * 1988-03-23 1989-09-26 Toshiba Corp 半導体装置及びその製造方法
JPH02148740A (ja) * 1988-11-29 1990-06-07 Fujitsu Ltd 半導体装置及びその製造方法

Also Published As

Publication number Publication date
DE69132263T2 (de) 2000-11-30
DE69132263D1 (de) 2000-08-03
US5148244A (en) 1992-09-15
EP0442413A3 (https=) 1994-02-02
KR910016147A (ko) 1991-09-30
EP0442413B1 (en) 2000-06-28
JP2513887B2 (ja) 1996-07-03
JPH03236274A (ja) 1991-10-22
EP0442413A2 (en) 1991-08-21

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