KR860002870A - 집적회로 장치 - Google Patents

집적회로 장치 Download PDF

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Publication number
KR860002870A
KR860002870A KR1019850006156A KR850006156A KR860002870A KR 860002870 A KR860002870 A KR 860002870A KR 1019850006156 A KR1019850006156 A KR 1019850006156A KR 850006156 A KR850006156 A KR 850006156A KR 860002870 A KR860002870 A KR 860002870A
Authority
KR
South Korea
Prior art keywords
circuit
group
integrated circuit
sequential
sequential circuit
Prior art date
Application number
KR1019850006156A
Other languages
English (en)
Other versions
KR900004888B1 (ko
Inventor
시게오( 외 3) 구보끼
Original Assignee
미다 가쓰시게
가부시기가이샤 히다찌 세이사꾸쇼(외 1)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 미다 가쓰시게, 가부시기가이샤 히다찌 세이사꾸쇼(외 1) filed Critical 미다 가쓰시게
Publication of KR860002870A publication Critical patent/KR860002870A/ko
Application granted granted Critical
Publication of KR900004888B1 publication Critical patent/KR900004888B1/ko

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318558—Addressing or selecting of subparts of the device under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

내용 없음

Description

집적회로 장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제 1도는 본원 발명의 원리를 나타낸 회로구성도.
제 2도는 제1도에 설명하는 회로도.
제 3도는 본원 발명을 설명하는 타임차아트.

Claims (1)

  1. 조합회로와 순차회로로 된 집적회로장치에 있어서, 상기 순차회로에 주입력단자신호의 입력의 가(可), 불가(不可)를 제어하는 입력제어 신호단자와, 진단용 데이터입출력단자와, 진단용 데이터의 전송을 제어하는 리이드·라이드신호단자와 래치기능을 형성하고 전체회로를 순차회로군과 이 순차회로군에 주입출력단자군이 배선층으로 접속된 조합회로군의 진단용 분할 단위로 분할하고, 진단 전용의 버스라인을 통해서 상기 순차회로군에 진단데이터를 라이드·리이드할 수 있도록 한 것을 특징으로 하는 집적회로장치.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019850006156A 1984-09-04 1985-08-26 집적회로장치 KR900004888B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP84-185242 1984-09-04
JP59185242A JPH0772744B2 (ja) 1984-09-04 1984-09-04 半導体集積回路装置

Publications (2)

Publication Number Publication Date
KR860002870A true KR860002870A (ko) 1986-04-30
KR900004888B1 KR900004888B1 (ko) 1990-07-09

Family

ID=16167372

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019850006156A KR900004888B1 (ko) 1984-09-04 1985-08-26 집적회로장치

Country Status (5)

Country Link
US (1) US4701922A (ko)
EP (1) EP0173945B1 (ko)
JP (1) JPH0772744B2 (ko)
KR (1) KR900004888B1 (ko)
DE (1) DE3587715T2 (ko)

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US4931722A (en) * 1985-11-07 1990-06-05 Control Data Corporation Flexible imbedded test system for VLSI circuits
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JPH0785099B2 (ja) * 1986-08-04 1995-09-13 三菱電機株式会社 半導体集積回路装置
KR900002770B1 (ko) * 1986-08-04 1990-04-30 미쓰비시 뎅끼 가부시끼가이샤 반도체 집적회로장치
KR910002236B1 (ko) * 1986-08-04 1991-04-08 미쓰비시 뎅기 가부시끼가이샤 반도체집적회로장치
US5477165A (en) * 1986-09-19 1995-12-19 Actel Corporation Programmable logic module and architecture for field programmable gate array device
US5365165A (en) * 1986-09-19 1994-11-15 Actel Corporation Testability architecture and techniques for programmable interconnect architecture
US5367208A (en) 1986-09-19 1994-11-22 Actel Corporation Reconfigurable programmable interconnect architecture
US5451887A (en) * 1986-09-19 1995-09-19 Actel Corporation Programmable logic module and architecture for field programmable gate array device
DE3750926T2 (de) * 1986-10-16 1995-08-03 Fairchild Semiconductor Synchrone Array-Logikschaltung.
JPS63256877A (ja) * 1987-04-14 1988-10-24 Mitsubishi Electric Corp テスト回路
DE3719497A1 (de) * 1987-06-11 1988-12-29 Bosch Gmbh Robert System zur pruefung von digitalen schaltungen
US4862399A (en) * 1987-08-31 1989-08-29 General Electric Company Method for generating efficient testsets for a class of digital circuits
JPH01132980A (ja) * 1987-11-17 1989-05-25 Mitsubishi Electric Corp テスト機能付電子回路装置
JPH01132979A (ja) * 1987-11-17 1989-05-25 Mitsubishi Electric Corp テスト機能付電子回路
NL8800374A (nl) * 1988-02-16 1989-09-18 Philips Nv Geintegreerde monolithische schakeling met een testbus.
JPH0769396B2 (ja) * 1988-04-01 1995-07-31 日本電気株式会社 半導体集積回路装置
US4973904A (en) * 1988-12-12 1990-11-27 Ncr Corporation Test circuit and method
JP2612618B2 (ja) * 1989-10-13 1997-05-21 富士通株式会社 半導体集積回路装置
US5198705A (en) * 1990-05-11 1993-03-30 Actel Corporation Logic module with configurable combinational and sequential blocks
IT1246301B (it) * 1990-10-22 1994-11-17 St Microelectronics Srl Dispositivo di analisi operativa di tipo scan path a singolo clock di scansione e singola fase di uscita per circuito integrato.
USRE36292E (en) * 1990-10-22 1999-09-07 Stmicroelectronics, Inc. Operational analysis device of the scan path type having a single scanning clock and a single output phase for an integrated circuit
US5528600A (en) * 1991-01-28 1996-06-18 Actel Corporation Testability circuits for logic arrays
JP2817486B2 (ja) * 1991-11-29 1998-10-30 日本電気株式会社 論理集積回路
JPH05282890A (ja) * 1992-02-04 1993-10-29 Mitsubishi Electric Corp シフトレジスタ回路
JP3377225B2 (ja) * 1992-04-07 2003-02-17 富士写真フイルム株式会社 チェック回路を含む集積回路
JP2748069B2 (ja) * 1992-05-19 1998-05-06 三菱電機株式会社 フリップフロップ回路
US5495486A (en) * 1992-08-11 1996-02-27 Crosscheck Technology, Inc. Method and apparatus for testing integrated circuits
US5744980A (en) * 1996-02-16 1998-04-28 Actel Corporation Flexible, high-performance static RAM architecture for field-programmable gate arrays
US5936426A (en) * 1997-02-03 1999-08-10 Actel Corporation Logic function module for field programmable array
US6519724B1 (en) * 1999-03-22 2003-02-11 Koninklijke Philips Electronics N.V. Communication systems, circuits, circuit systems and methods of operating a circuit
KR100594257B1 (ko) * 2004-02-26 2006-06-30 삼성전자주식회사 내장형 셀프 테스트 회로를 가지는 ｓｏｃ 및 그 셀프테스트 방법
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CN106874177A (zh) * 2015-12-14 2017-06-20 中国航空工业第六八研究所 一种基于场景的锁存器测试方法
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Also Published As

Publication number Publication date
DE3587715D1 (de) 1994-02-17
EP0173945A2 (en) 1986-03-12
KR900004888B1 (ko) 1990-07-09
US4701922A (en) 1987-10-20
DE3587715T2 (de) 1994-08-04
JPS6162878A (ja) 1986-03-31
JPH0772744B2 (ja) 1995-08-02
EP0173945B1 (en) 1994-01-05
EP0173945A3 (en) 1988-07-20

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