JPS5674668A - Logical device - Google Patents
Logical deviceInfo
- Publication number
- JPS5674668A JPS5674668A JP15153379A JP15153379A JPS5674668A JP S5674668 A JPS5674668 A JP S5674668A JP 15153379 A JP15153379 A JP 15153379A JP 15153379 A JP15153379 A JP 15153379A JP S5674668 A JPS5674668 A JP S5674668A
- Authority
- JP
- Japan
- Prior art keywords
- scanning
- state
- sequential circuit
- asynchronous sequential
- keep
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Test And Diagnosis Of Digital Computers (AREA)
- Logic Circuits (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE: To test the titled device easily by maintaining a state of the asynchronous sequential circuit having no scanning state, in the course of scanning operation.
CONSTITUTION: The scanning lock is made to proceed in order by providing a scanning mode signal from the scanning control terminal 1 and scanning in a data from the scanning-in terminal 2. The scanning-in data is shifted in order by the next FF's 9W16. On the other hand, the output values of the FF's 8, 9 and 10 are held in the course of scanning-in, by operation of the control gates 20W22, and the output value of the merging circuit 17 becomes a through state. As a result, the contents of the inside of the asynchronous sequential circuit 18 are able to keep the state before scanning-in, in spite of the scanning operation. In case of scanning-out, too, the processing is performed in the same way, and the inside of the asynchronous sequential circuit 18 is able to keep the state before scanning-out, by operation of the control gates 20W22.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15153379A JPS5674668A (en) | 1979-11-22 | 1979-11-22 | Logical device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15153379A JPS5674668A (en) | 1979-11-22 | 1979-11-22 | Logical device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5674668A true JPS5674668A (en) | 1981-06-20 |
Family
ID=15520588
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15153379A Pending JPS5674668A (en) | 1979-11-22 | 1979-11-22 | Logical device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5674668A (en) |
Cited By (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6162878A (en) * | 1984-09-04 | 1986-03-31 | Hitachi Ltd | Semiconductor integrated circuit device |
JPS61251229A (en) * | 1985-04-27 | 1986-11-08 | Nec Corp | Scan system logic integrated circuit |
JPS6291871A (en) * | 1985-10-18 | 1987-04-27 | Fujitsu Ltd | Diagnostic system for synchronizing and asynchronizing circuits |
JPS62110173A (en) * | 1985-11-07 | 1987-05-21 | Nec Corp | Semiconductive integrated circuit |
JPS62126367A (en) * | 1985-11-26 | 1987-06-08 | Nec Corp | Logical integrated circuit |
DE3722615A1 (en) * | 1986-08-04 | 1988-02-18 | Mitsubishi Electric Corp | INTEGRATED SEMICONDUCTOR CIRCUIT ARRANGEMENT |
DE3725821A1 (en) * | 1986-08-04 | 1988-02-18 | Mitsubishi Electric Corp | INTEGRATED SEMICONDUCTOR SWITCHING DEVICE WITH TEST FUNCTION |
DE3725823A1 (en) * | 1986-08-04 | 1988-02-18 | Mitsubishi Electric Corp | INTEGRATED SEMICONDUCTOR SWITCHING DEVICE |
JPS63153482A (en) * | 1986-12-17 | 1988-06-25 | Pfu Ltd | Test system for integrated circuit |
JPS63182585A (en) * | 1987-01-26 | 1988-07-27 | Toshiba Corp | Logic circuit equipped with test facilitating function |
JPS6483169A (en) * | 1987-09-25 | 1989-03-28 | Mitsubishi Electric Corp | Integrated circuit device |
JPS6491074A (en) * | 1987-10-02 | 1989-04-10 | Hitachi Ltd | Memory-contained logic lsi and testing thereof |
DE3838940A1 (en) * | 1987-11-17 | 1989-06-01 | Mitsubishi Electric Corp | CIRCUIT WITH TEST FUNCTION CIRCUIT |
US4864579A (en) * | 1986-08-04 | 1989-09-05 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor integrated circuit device |
JPH0290075A (en) * | 1987-10-07 | 1990-03-29 | Xilinx Inc | System for scanning test of logical circuit |
DE4100671A1 (en) * | 1990-01-23 | 1991-08-01 | Mitsubishi Electric Corp | SCANNING AND USE OF THE SCANNING CIRCUIT IN AN INTEGRATED SEMICONDUCTOR CIRCUIT |
-
1979
- 1979-11-22 JP JP15153379A patent/JPS5674668A/en active Pending
Cited By (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6162878A (en) * | 1984-09-04 | 1986-03-31 | Hitachi Ltd | Semiconductor integrated circuit device |
JPH0433167B2 (en) * | 1985-04-27 | 1992-06-02 | Nippon Electric Co | |
JPS61251229A (en) * | 1985-04-27 | 1986-11-08 | Nec Corp | Scan system logic integrated circuit |
JPS6291871A (en) * | 1985-10-18 | 1987-04-27 | Fujitsu Ltd | Diagnostic system for synchronizing and asynchronizing circuits |
JPS62110173A (en) * | 1985-11-07 | 1987-05-21 | Nec Corp | Semiconductive integrated circuit |
JPS62126367A (en) * | 1985-11-26 | 1987-06-08 | Nec Corp | Logical integrated circuit |
DE3725821A1 (en) * | 1986-08-04 | 1988-02-18 | Mitsubishi Electric Corp | INTEGRATED SEMICONDUCTOR SWITCHING DEVICE WITH TEST FUNCTION |
DE3725823A1 (en) * | 1986-08-04 | 1988-02-18 | Mitsubishi Electric Corp | INTEGRATED SEMICONDUCTOR SWITCHING DEVICE |
US4864579A (en) * | 1986-08-04 | 1989-09-05 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor integrated circuit device |
DE3722615A1 (en) * | 1986-08-04 | 1988-02-18 | Mitsubishi Electric Corp | INTEGRATED SEMICONDUCTOR CIRCUIT ARRANGEMENT |
US4870345A (en) * | 1986-08-04 | 1989-09-26 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor intergrated circuit device |
JPS63153482A (en) * | 1986-12-17 | 1988-06-25 | Pfu Ltd | Test system for integrated circuit |
JPH0693004B2 (en) * | 1986-12-17 | 1994-11-16 | 株式会社ピーエフユー | Integrated circuit test method |
JPS63182585A (en) * | 1987-01-26 | 1988-07-27 | Toshiba Corp | Logic circuit equipped with test facilitating function |
DE3832113A1 (en) * | 1987-09-25 | 1989-04-13 | Mitsubishi Electric Corp | CIRCUIT TO TEST INTEGRATED CIRCUIT DEVICES |
US4995039A (en) * | 1987-09-25 | 1991-02-19 | Mitsubishi Denki Kabushiki Kaisha | Circuit for transparent scan path testing of integrated circuit devices |
JPS6483169A (en) * | 1987-09-25 | 1989-03-28 | Mitsubishi Electric Corp | Integrated circuit device |
JPS6491074A (en) * | 1987-10-02 | 1989-04-10 | Hitachi Ltd | Memory-contained logic lsi and testing thereof |
JP2521774B2 (en) * | 1987-10-02 | 1996-08-07 | 株式会社日立製作所 | Memory-embedded logic LSI and method for testing the LSI |
JPH0290075A (en) * | 1987-10-07 | 1990-03-29 | Xilinx Inc | System for scanning test of logical circuit |
DE3838940A1 (en) * | 1987-11-17 | 1989-06-01 | Mitsubishi Electric Corp | CIRCUIT WITH TEST FUNCTION CIRCUIT |
US4913557A (en) * | 1987-11-17 | 1990-04-03 | Mitsubishi Denki Kabushiki Kaisha | Intergrated logic circuit having testing function circuit formed integrally therewith |
DE4100671A1 (en) * | 1990-01-23 | 1991-08-01 | Mitsubishi Electric Corp | SCANNING AND USE OF THE SCANNING CIRCUIT IN AN INTEGRATED SEMICONDUCTOR CIRCUIT |
US5130647A (en) * | 1990-01-23 | 1992-07-14 | Mitsubishi Denki Kabushiki Kaisha | Scan test circuit and semiconductor integrated circuit device using the same |
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