KR860001367A - 전자기기 제어시스템 - Google Patents

전자기기 제어시스템 Download PDF

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Publication number
KR860001367A
KR860001367A KR1019850002863A KR850002863A KR860001367A KR 860001367 A KR860001367 A KR 860001367A KR 1019850002863 A KR1019850002863 A KR 1019850002863A KR 850002863 A KR850002863 A KR 850002863A KR 860001367 A KR860001367 A KR 860001367A
Authority
KR
South Korea
Prior art keywords
control system
electronic control
electronic device
software
types
Prior art date
Application number
KR1019850002863A
Other languages
English (en)
Inventor
마사히꼬 모리노조 (외 1)
Original Assignee
오오가 노리오
쏘니 가부시기가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 오오가 노리오, 쏘니 가부시기가이샤 filed Critical 오오가 노리오
Publication of KR860001367A publication Critical patent/KR860001367A/ko

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B15/00—Systems controlled by a computer
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00—Diagnosis, testing or measuring for television systems or their details
    • H04N17/04—Diagnosis, testing or measuring for television systems or their details for receivers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits

Abstract

내용 없음

Description

전자기기 제어시스템
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본원 발명을 적용할수 있는 전자기기를 나타낸 블록도.
제2도는 제 1도의 전자기기를 텔레비젼 수상기로 했을 경우의 실시예를 나타낸 블록도.
제6도는 버스콘버어터의 실시예를 나타낸 블록도.
* 도면의 주요 부분에 대한 부호의 설명
6: 인너버스라인, 8:조정용컴퓨터, 45:텔레비전수상기, 46:VTR, 47:테이프레코오더. 48,49,50:카트리지.

Claims (1)

  1. 제어내용을 지시하는 신호등이 기억되어 있는 소프트웨어를 인너버스를 갖는 피제어전자기기의 종류에 따라 복수종류 준비하는동시에, 복수종류의 상기 전자기기에 대해 공통의 제어컴퓨터를 사용토록하고, 이 컴퓨터에 대해 상기 전자기기의 종류에 따른 소프트웨어를 사용하고, 이 소프트웨어의 내용에 따라 상기 컴퓨터에 의해, 상기 전자기기를 상기 인너버스를 통해 제어하도록 한 것을 특징으로하는 전자기기 제어시스템.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019850002863A 1984-07-13 1985-04-27 전자기기 제어시스템 KR860001367A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP14565884A JPS6125263A (ja) 1984-07-13 1984-07-13 電子機器制御システム
JP84-145658 1984-07-13

Publications (1)

Publication Number Publication Date
KR860001367A true KR860001367A (ko) 1986-02-26

Family

ID=15390096

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019850002863A KR860001367A (ko) 1984-07-13 1985-04-27 전자기기 제어시스템

Country Status (5)

Country Link
US (1) US4810958A (ko)
EP (1) EP0172640A1 (ko)
JP (1) JPS6125263A (ko)
KR (1) KR860001367A (ko)
CA (1) CA1268817A (ko)

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KR100490254B1 (ko) * 1996-06-04 2005-09-02 소니 가부시끼 가이샤 통신제어방법,통신시스템및전자기기

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US4821269A (en) * 1986-10-23 1989-04-11 The Grass Valley Group, Inc. Diagnostic system for a digital signal processor
DE3719497A1 (de) * 1987-06-11 1988-12-29 Bosch Gmbh Robert System zur pruefung von digitalen schaltungen
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JPH01122682U (ko) * 1988-02-17 1989-08-21
US4907230A (en) * 1988-02-29 1990-03-06 Rik Heller Apparatus and method for testing printed circuit boards and their components
JPH01237180A (ja) * 1988-03-18 1989-09-21 Seikosha Co Ltd プリンタの検査装置
US5040111A (en) * 1988-04-11 1991-08-13 At&T Bell Laboratories Personal computer based non-interactive monitoring of communication links
US4953165A (en) * 1988-06-06 1990-08-28 Southwestern Computer Technologies, Inc. Diagnostic system for personal computer
US4964124A (en) * 1988-12-27 1990-10-16 World Computer Corporation Computer peripheral tester
US5025205A (en) * 1989-06-22 1991-06-18 Texas Instruments Incorporated Reconfigurable architecture for logic test system
US5416919A (en) * 1989-07-19 1995-05-16 Sharp Kabushiki Kaisha Semiconductor integrated circuit with functional blocks capable of being individually tested externally
IT1233069B (it) * 1989-07-31 1992-03-14 Farina Attilio Televisore perfezionato
DE3933222A1 (de) * 1989-10-05 1991-04-18 Ttw Ind & Medizin Messtechnik Messeinrichtung
DE4113759C1 (en) * 1991-04-26 1992-11-12 Siemens Ag, 8000 Muenchen, De Testing circuit components of processor-controlled modules of communication system - applying single sufficient test program from memory zones of SRAM and DRAM arrangement including start information
US5414712A (en) * 1991-07-23 1995-05-09 Progressive Computing, Inc. Method for transmitting data using a communication interface box
US5223788A (en) * 1991-09-12 1993-06-29 Grumman Aerospace Corporation Functional avionic core tester
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US5423050A (en) * 1991-11-27 1995-06-06 Ncr Corporation Intermodule test across system bus utilizing serial test bus
US5202726A (en) * 1991-12-18 1993-04-13 Xerox Corporation Facilitation of the diagnosis of malfunctions and set-up of a reproduction machine
US5519719A (en) * 1991-12-19 1996-05-21 Adc Telecommunications, Inc. Universal pattern generator
JP3222522B2 (ja) * 1992-02-07 2001-10-29 キヤノン株式会社 検査システムおよびその方法
US5477544A (en) * 1994-02-10 1995-12-19 The United States Of America As Represented By The Secretary Of The Navy Multi-port tester interface
US5821742A (en) 1994-11-30 1998-10-13 Utility Test Equipment Company Computerized solid state energy meter test system and method of testing
KR970009762B1 (ko) * 1994-12-30 1997-06-18 현대전자산업 주식회사 컴퓨터를 이용한 주문형 비디오 단말기 테스트 장치 및 방법
IL112513A (en) 1995-02-01 1999-05-09 Ald Advanced Logistics Dev Ltd System and method for failure reporting and collection
US5778008A (en) * 1995-05-10 1998-07-07 Hitachi Denshi Kabushiki Kaisha Fault diagnosis method of television camera apparatus
JPH09102970A (ja) * 1995-10-05 1997-04-15 Sony Corp 映像音声機器エラー監視システム
US5793218A (en) * 1995-12-15 1998-08-11 Lear Astronics Corporation Generic interface test adapter
US6567878B2 (en) * 1999-05-17 2003-05-20 Maxim Integrated Products, Inc. Two wire mixed signal bi-directional bus interface
US6768960B2 (en) * 2001-05-23 2004-07-27 Ltx Corporation System for and method of performing device-oriented tests
KR100439546B1 (ko) * 2002-07-18 2004-07-12 엘지전자 주식회사 영상신호 처리방법 및 장치
JP2005127765A (ja) * 2003-10-22 2005-05-19 Toshiba Corp 半導体試験モジュールおよび半導体装置の試験方法。
KR20060017238A (ko) * 2004-08-20 2006-02-23 삼성전자주식회사 표시 장치 및 이의 제조 방법
KR20080008168A (ko) 2006-07-19 2008-01-23 삼성전자주식회사 전자장치 및 그 검사방법
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100490254B1 (ko) * 1996-06-04 2005-09-02 소니 가부시끼 가이샤 통신제어방법,통신시스템및전자기기

Also Published As

Publication number Publication date
EP0172640A1 (en) 1986-02-26
US4810958A (en) 1989-03-07
JPS6125263A (ja) 1986-02-04
CA1268817A (en) 1990-05-08

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