KR20130007602A - 오프셋 다이 스태킹의 멀티-칩 패키지 및 그 제조 방법 - Google Patents
오프셋 다이 스태킹의 멀티-칩 패키지 및 그 제조 방법 Download PDFInfo
- Publication number
- KR20130007602A KR20130007602A KR1020127026510A KR20127026510A KR20130007602A KR 20130007602 A KR20130007602 A KR 20130007602A KR 1020127026510 A KR1020127026510 A KR 1020127026510A KR 20127026510 A KR20127026510 A KR 20127026510A KR 20130007602 A KR20130007602 A KR 20130007602A
- Authority
- KR
- South Korea
- Prior art keywords
- dice
- die
- group
- substrate
- bonding
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07541—Controlling the environment, e.g. atmosphere composition or temperature
- H10W72/07554—Controlling the environment, e.g. atmosphere composition or temperature changes in dispositions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/541—Dispositions of bond wires
- H10W72/5445—Dispositions of bond wires being orthogonal to a side surface of the chip, e.g. parallel arrangements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/541—Dispositions of bond wires
- H10W72/547—Dispositions of multiple bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/59—Bond pads specially adapted therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/874—On different surfaces
- H10W72/884—Die-attach connectors and bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/931—Shapes of bond pads
- H10W72/932—Plan-view shape, i.e. in top view
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/941—Dispositions of bond pads
- H10W72/944—Dispositions of multiple bond pads
- H10W72/9445—Top-view layouts, e.g. mirror arrays
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/951—Materials of bond pads
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/111—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
- H10W74/114—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by a substrate and the encapsulations
- H10W74/117—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by a substrate and the encapsulations the substrate having spherical bumps for external connection
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/20—Configurations of stacked chips
- H10W90/24—Configurations of stacked chips at least one of the stacked chips being laterally offset from a neighbouring stacked chip, e.g. chip stacks having a staircase shape
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/732—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Wire Bonding (AREA)
- Semiconductor Memories (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US31511110P | 2010-03-18 | 2010-03-18 | |
| US61/315,111 | 2010-03-18 | ||
| PCT/CA2011/000253 WO2011113136A1 (en) | 2010-03-18 | 2011-03-08 | Multi-chip package with offset die stacking and method of making same |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20130007602A true KR20130007602A (ko) | 2013-01-18 |
Family
ID=44648377
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020127026510A Withdrawn KR20130007602A (ko) | 2010-03-18 | 2011-03-08 | 오프셋 다이 스태킹의 멀티-칩 패키지 및 그 제조 방법 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US8502368B2 (https=) |
| EP (1) | EP2548226A4 (https=) |
| JP (1) | JP5579879B2 (https=) |
| KR (1) | KR20130007602A (https=) |
| CN (1) | CN103098206A (https=) |
| WO (1) | WO2011113136A1 (https=) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20140144486A (ko) * | 2013-06-11 | 2014-12-19 | 에스케이하이닉스 주식회사 | 적층 패키지 및 제조 방법 |
| KR20180057427A (ko) * | 2016-11-22 | 2018-05-30 | 삼성전자주식회사 | 반도체 패키지 및 그 제조 방법 |
| KR20220014553A (ko) * | 2020-07-29 | 2022-02-07 | 에스케이하이닉스 주식회사 | 다이 위치 검사부들을 포함하는 반도체 패키지 |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101909203B1 (ko) * | 2011-07-21 | 2018-10-17 | 삼성전자 주식회사 | 멀티-채널 패키지 및 그 패키지를 포함한 전자 시스템 |
| US20150333041A1 (en) * | 2012-12-25 | 2015-11-19 | Ps5 Luxco S.A.R.L. | Semiconductor device and manufacturing method therefor |
| JP2014138035A (ja) * | 2013-01-15 | 2014-07-28 | Toshiba Corp | 半導体装置 |
| KR102110984B1 (ko) | 2013-03-04 | 2020-05-14 | 삼성전자주식회사 | 적층형 반도체 패키지 |
| GB2518476B (en) | 2013-09-20 | 2015-11-04 | Silicon Lab Inc | Multi-chip modules having stacked television demodulators |
| WO2017095401A1 (en) | 2015-12-02 | 2017-06-08 | Intel Corporation | Die stack with cascade and vertical connections |
| JP6761180B2 (ja) * | 2016-12-28 | 2020-09-23 | 株式会社バッファロー | 半導体装置 |
| CN108389849A (zh) * | 2018-02-05 | 2018-08-10 | 奥肯思(北京)科技有限公司 | 一种交错堆叠存储器封装 |
| KR20200028562A (ko) * | 2018-09-06 | 2020-03-17 | 에스케이하이닉스 주식회사 | 반도체패키지 |
| US11139283B2 (en) * | 2018-12-22 | 2021-10-05 | Xcelsis Corporation | Abstracted NAND logic in stacks |
| JP2021064780A (ja) * | 2019-10-11 | 2021-04-22 | メレキシス テクノロジーズ エス エーMelexis Technologies SA | 積層ダイアセンブリ |
| JP2021145084A (ja) * | 2020-03-13 | 2021-09-24 | キオクシア株式会社 | 半導体装置 |
| CN112038280B (zh) * | 2020-07-24 | 2022-07-29 | 华为技术有限公司 | 一种芯片转移方法、电子设备 |
| US12136607B2 (en) * | 2021-09-01 | 2024-11-05 | Micron Technology, Inc. | Semiconductor devices including stacked dies with interleaved wire bonds and associated systems and methods |
| KR20230106410A (ko) * | 2022-01-06 | 2023-07-13 | 삼성전자주식회사 | 반도체 패키지 |
| KR20230143497A (ko) * | 2022-04-05 | 2023-10-12 | 삼성전자주식회사 | 반도체 패키지 및 그의 제조 방법 |
| CN119208284A (zh) * | 2023-06-14 | 2024-12-27 | 长鑫存储技术有限公司 | 一种半导体封装结构 |
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| US5886412A (en) * | 1995-08-16 | 1999-03-23 | Micron Technology, Inc. | Angularly offset and recessed stacked die multichip device |
| US7166495B2 (en) * | 1996-02-20 | 2007-01-23 | Micron Technology, Inc. | Method of fabricating a multi-die semiconductor package assembly |
| US6369448B1 (en) | 2000-01-21 | 2002-04-09 | Lsi Logic Corporation | Vertically integrated flip chip semiconductor package |
| JP3768761B2 (ja) | 2000-01-31 | 2006-04-19 | 株式会社日立製作所 | 半導体装置およびその製造方法 |
| US6900528B2 (en) * | 2001-06-21 | 2005-05-31 | Micron Technology, Inc. | Stacked mass storage flash memory package |
| JP4387076B2 (ja) * | 2001-10-18 | 2009-12-16 | 株式会社ルネサステクノロジ | 半導体装置 |
| TW523890B (en) * | 2002-02-07 | 2003-03-11 | Macronix Int Co Ltd | Stacked semiconductor packaging device |
| US20040021230A1 (en) * | 2002-08-05 | 2004-02-05 | Macronix International Co., Ltd. | Ultra thin stacking packaging device |
| JP3908146B2 (ja) * | 2002-10-28 | 2007-04-25 | シャープ株式会社 | 半導体装置及び積層型半導体装置 |
| JP2004158536A (ja) * | 2002-11-05 | 2004-06-03 | Fujitsu Ltd | 半導体装置及び半導体装置の製造方法 |
| US6930378B1 (en) * | 2003-11-10 | 2005-08-16 | Amkor Technology, Inc. | Stacked semiconductor die assembly having at least one support |
| DE102004049356B4 (de) * | 2004-10-08 | 2006-06-29 | Infineon Technologies Ag | Halbleitermodul mit einem internen Halbleiterchipstapel und Verfahren zur Herstellung desselben |
| US20060087013A1 (en) * | 2004-10-21 | 2006-04-27 | Etron Technology, Inc. | Stacked multiple integrated circuit die package assembly |
| US8710675B2 (en) * | 2006-02-21 | 2014-04-29 | Stats Chippac Ltd. | Integrated circuit package system with bonding lands |
| US7498667B2 (en) * | 2006-04-18 | 2009-03-03 | Stats Chippac Ltd. | Stacked integrated circuit package-in-package system |
| US7420269B2 (en) * | 2006-04-18 | 2008-09-02 | Stats Chippac Ltd. | Stacked integrated circuit package-in-package system |
| JP5207336B2 (ja) * | 2006-06-05 | 2013-06-12 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| US8138591B2 (en) * | 2006-09-23 | 2012-03-20 | Stats Chippac Ltd | Integrated circuit package system with stacked die |
| JP4921937B2 (ja) | 2006-11-24 | 2012-04-25 | 株式会社東芝 | 半導体集積回路 |
| US8242607B2 (en) * | 2006-12-20 | 2012-08-14 | Stats Chippac Ltd. | Integrated circuit package system with offset stacked die and method of manufacture thereof |
| US8847413B2 (en) * | 2007-01-15 | 2014-09-30 | Stats Chippac Ltd. | Integrated circuit package system with leads having multiple sides exposed |
| JP4913640B2 (ja) * | 2007-03-19 | 2012-04-11 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| CN101364593B (zh) * | 2007-08-09 | 2011-03-23 | 南茂科技股份有限公司 | 导线架中具有多段式汇流条的交错偏移堆叠封装结构 |
| US8299626B2 (en) * | 2007-08-16 | 2012-10-30 | Tessera, Inc. | Microelectronic package |
| US7906853B2 (en) | 2007-09-06 | 2011-03-15 | Micron Technology, Inc. | Package structure for multiple die stack |
| KR100886717B1 (ko) * | 2007-10-16 | 2009-03-04 | 주식회사 하이닉스반도체 | 적층 반도체 패키지 및 이의 제조 방법 |
| JP5529371B2 (ja) * | 2007-10-16 | 2014-06-25 | ピーエスフォー ルクスコ エスエイアールエル | 半導体装置及びその製造方法 |
| US7952183B2 (en) * | 2007-10-29 | 2011-05-31 | Kabushiki Kaisha Toshiba | High capacity memory with stacked layers |
| JP5150242B2 (ja) * | 2007-12-27 | 2013-02-20 | 株式会社東芝 | 半導体記憶装置 |
| JP5150243B2 (ja) * | 2007-12-27 | 2013-02-20 | 株式会社東芝 | 半導体記憶装置 |
| US8004071B2 (en) | 2007-12-27 | 2011-08-23 | Kabushiki Kaisha Toshiba | Semiconductor memory device |
| KR20100049283A (ko) * | 2008-11-03 | 2010-05-12 | 삼성전자주식회사 | 반도체 패키지 및 그 제조 방법 |
| JP5126002B2 (ja) * | 2008-11-11 | 2013-01-23 | セイコーエプソン株式会社 | 半導体装置及び半導体装置の製造方法 |
| KR101013563B1 (ko) * | 2009-02-25 | 2011-02-14 | 주식회사 하이닉스반도체 | 스택 패키지 |
| US8106498B2 (en) * | 2009-03-05 | 2012-01-31 | Stats Chippac Ltd. | Integrated circuit packaging system with a dual board-on-chip structure and method of manufacture thereof |
| JP2010245412A (ja) * | 2009-04-09 | 2010-10-28 | Renesas Electronics Corp | 半導体集積回路装置の製造方法 |
| KR20100121231A (ko) * | 2009-05-08 | 2010-11-17 | 삼성전자주식회사 | 회로패턴 들뜸 현상을 억제하는 패키지 온 패키지 및 그 제조방법 |
| JP5426966B2 (ja) * | 2009-08-28 | 2014-02-26 | 学校法人慶應義塾 | 半導体集積回路装置 |
| JP5635759B2 (ja) * | 2009-10-15 | 2014-12-03 | 学校法人慶應義塾 | 積層半導体集積回路装置 |
-
2011
- 2011-03-08 CN CN2011800143724A patent/CN103098206A/zh active Pending
- 2011-03-08 WO PCT/CA2011/000253 patent/WO2011113136A1/en not_active Ceased
- 2011-03-08 JP JP2012557360A patent/JP5579879B2/ja not_active Expired - Fee Related
- 2011-03-08 KR KR1020127026510A patent/KR20130007602A/ko not_active Withdrawn
- 2011-03-08 EP EP11755583.9A patent/EP2548226A4/en not_active Withdrawn
- 2011-03-08 US US13/042,571 patent/US8502368B2/en active Active
-
2013
- 2013-07-25 US US13/951,132 patent/US9177863B2/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20140144486A (ko) * | 2013-06-11 | 2014-12-19 | 에스케이하이닉스 주식회사 | 적층 패키지 및 제조 방법 |
| KR20180057427A (ko) * | 2016-11-22 | 2018-05-30 | 삼성전자주식회사 | 반도체 패키지 및 그 제조 방법 |
| KR20220014553A (ko) * | 2020-07-29 | 2022-02-07 | 에스케이하이닉스 주식회사 | 다이 위치 검사부들을 포함하는 반도체 패키지 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP5579879B2 (ja) | 2014-08-27 |
| US8502368B2 (en) | 2013-08-06 |
| US20120056335A1 (en) | 2012-03-08 |
| JP2013522887A (ja) | 2013-06-13 |
| WO2011113136A1 (en) | 2011-09-22 |
| EP2548226A1 (en) | 2013-01-23 |
| US9177863B2 (en) | 2015-11-03 |
| EP2548226A4 (en) | 2013-11-20 |
| US20130309810A1 (en) | 2013-11-21 |
| CN103098206A (zh) | 2013-05-08 |
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