KR20030055318A - 전계 효과 트랜지스터 및 전계 효과 물질 및 이들의 제조방법 - Google Patents
전계 효과 트랜지스터 및 전계 효과 물질 및 이들의 제조방법 Download PDFInfo
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- KR20030055318A KR20030055318A KR10-2003-7006957A KR20037006957A KR20030055318A KR 20030055318 A KR20030055318 A KR 20030055318A KR 20037006957 A KR20037006957 A KR 20037006957A KR 20030055318 A KR20030055318 A KR 20030055318A
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- semiconductor
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/10—Organic polymers or oligomers
- H10K85/111—Organic polymers or oligomers comprising aromatic, heteroaromatic, or aryl chains, e.g. polyaniline, polyphenylene or polyphenylene vinylene
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/08—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
-
- H—ELECTRICITY
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Abstract
Description
결합제 | 통상적인 저주파수 유전율( ε) |
폴리스티렌 | 2.5 |
플리(α-메틸스티렌) | 2.6 |
폴리(α-비닐나프탈렌) | 2.6 |
폴리(비닐톨루엔) | 2.6 |
폴리에틸렌 | 2.2 - 2.3 |
cis-폴리부타디엔 | 2.0 |
폴리프로필렌 | 2.2 |
폴리이소프렌 | 2.3 |
폴리(4-메틸-1-펜텐) | 2.1 |
폴리(테트라플루오로에틸렌) | 2.1 |
폴리(클로로트리플루오로에틸렌) | 2.3 - 2.8 |
폴리(2-메틸-1,3-부타디엔) | 2.4 |
폴리(p-크실렌) | 2.6 |
폴리(α- α- α'- α'테트라플루오로-p-크실렌) | 2.4 |
폴리[1,1-(2-메틸 프로판)비스(4-페닐)카보네이트] | 2.3 |
폴리(사이클로헥실 메타크릴레이트) | 2.5 |
폴리(클로로스티렌) | 2.6 |
폴리(2,6-디메틸-1,4-페닐렌 에테르) | 2.6 |
폴리이소부틸렌 | 2.2 |
폴리(비닐 사이클로헥산) | 2.2 |
결합제 | 통상적인 저주파수 유전율( ε) |
폴리(에틸렌/테트라플루오로에틸렌) | 2.6 |
폴리(에틸렌/클로로트리플루오로에틸렌) | 2.3 |
플루오르화된 에틸렌/프로필렌 공중합체 | 2 - 2.5 |
폴리스티렌-공-α-메틸스티렌 | 2.5 - 2.6 |
에틸렌/에틸 아크릴레이트 공중합체 | 2.8 |
폴리(스티렌/10%부타디엔) | 2.6 |
폴리(스티렌/15%부타디엔) | 2.6 |
폴리(스티렌/2,4 디메틸스티렌) | 2.5 |
Claims (7)
- a) 유기 반도체; 및,b) 고유 전도성이 10-6Scm-1미만이고 1,000 Hz 에서의 유전율이 3.3 미만인 유기 결합제를 포함하는 연속적인 반도체층을 구비한 전계 효과 트랜지스터.
- 제 1 항에 있어서, 상기 유기 반도체의 고유 전도성이 10-6Scm-1미만인 것을 특징으로 하는 전계 효과 트랜지스터.
- 제 1 항 또는 제 2 항에 있어서, 상기 유기 결합제가 스티렌의 단독중합체인 경우 분자량이 20,000 달톤 미만인 것을 특징으로 하는 전계 효과 트랜지스터.
- 제 3 항에 있어서, 상기 유기 결합제의 유전율이 3.0 미만인 것을 특징으로 하는 전계 효과 트랜지스터.
- 제 4 항에 있어서, 상기 유기 결합제의 유전율이 2.8 미만인 것을 특징으로 하는 전계 효과 트랜지스터.
- 제 1 항 내지 제 5 항 중 어느 한 항의 전계 효과 트랜지스터를 제조하는 방법에 있어서:ㆍ상기 유기 반도체, 상기 결합제 및 용매를 포함하는 액체층 또는 상기 유기 반도체 및 반응을 통하여 상기 결합제를 형성할 수 있는 물질을 포함하는 액체층으로 기판을 코팅하는 단계; 및ㆍ상기 용매를 증발시키거나 또는 반응을 통하여 결합제를 형성할 수 있는 물질이 존재하는 경우 상기 물질을 반응시킴으로써, 상기 액체층을 상기 반도체 및 결합제를 포함하는 고체층으로 전환시키는 단계를 포함하는 전계 효과 트랜지스터 제조 방법.
- 제 1 항 내지 제 5 항 중 어느 한 항의 전계 효과 트랜지스터를 제조하는 방법에 있어서:ㆍ상기 유기 반도체 및 반응을 통하여 결합제를 형성할 수 있는 물질을 포함하는 액체층으로 기판을 코팅하는 단계; 및ㆍ상기 반응을 통하여 결합제를 형성할 수 있는 물질을 반응시킴으로써, 상기 액체층을 반도체 및 결합제를 포함하는 고체층으로 전환시키는 단계를 포함하는 전계 효과 트랜지스터 제조 방법.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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GB0028867.0 | 2000-11-28 | ||
GBGB0028867.0A GB0028867D0 (en) | 2000-11-28 | 2000-11-28 | Field effect translators,methods for the manufacture thereof and materials therefor |
PCT/GB2001/005145 WO2002045184A1 (en) | 2000-11-28 | 2001-11-21 | Field effect transistors and materials and methods for their manufacture |
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KR20030055318A true KR20030055318A (ko) | 2003-07-02 |
KR100824026B1 KR100824026B1 (ko) | 2008-04-21 |
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KR1020037006957A KR100824026B1 (ko) | 2000-11-28 | 2001-11-21 | 전계 효과 트랜지스터 및 전계 효과 물질 및 이들의 제조방법 |
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US (1) | US7095044B2 (ko) |
EP (1) | EP1340270B1 (ko) |
JP (2) | JP4429603B2 (ko) |
KR (1) | KR100824026B1 (ko) |
CN (1) | CN100416882C (ko) |
AT (1) | ATE350769T1 (ko) |
AU (2) | AU2002220818B2 (ko) |
CA (1) | CA2427222C (ko) |
DE (1) | DE60125819T2 (ko) |
GB (1) | GB0028867D0 (ko) |
WO (1) | WO2002045184A1 (ko) |
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- 2001-11-21 WO PCT/GB2001/005145 patent/WO2002045184A1/en active IP Right Grant
- 2001-11-21 AU AU2081802A patent/AU2081802A/xx active Pending
- 2001-11-21 EP EP01999012A patent/EP1340270B1/en not_active Expired - Lifetime
- 2001-11-21 US US10/416,005 patent/US7095044B2/en not_active Expired - Lifetime
- 2001-11-21 CN CNB018195636A patent/CN100416882C/zh not_active Expired - Lifetime
- 2001-11-21 DE DE60125819T patent/DE60125819T2/de not_active Expired - Lifetime
- 2001-11-21 KR KR1020037006957A patent/KR100824026B1/ko active IP Right Grant
- 2001-11-21 AT AT01999012T patent/ATE350769T1/de not_active IP Right Cessation
- 2001-11-21 CA CA2427222A patent/CA2427222C/en not_active Expired - Lifetime
- 2001-11-21 JP JP2002547243A patent/JP4429603B2/ja not_active Expired - Lifetime
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2009
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100668763B1 (ko) * | 2004-04-27 | 2007-01-12 | 경상대학교산학협력단 | 액정성을 가지는 새로운 고분자 반도체 화합물 및 그 화합물을 사용한 유기 박막 트랜지스터 |
KR101102222B1 (ko) * | 2005-02-04 | 2012-01-05 | 삼성전자주식회사 | 전기장 처리를 이용한 유기 박막 트랜지스터의 제조방법 |
Also Published As
Publication number | Publication date |
---|---|
EP1340270A1 (en) | 2003-09-03 |
CA2427222C (en) | 2014-08-12 |
CA2427222A1 (en) | 2002-06-06 |
ATE350769T1 (de) | 2007-01-15 |
JP4429603B2 (ja) | 2010-03-10 |
CN1478309A (zh) | 2004-02-25 |
US20040038459A1 (en) | 2004-02-26 |
DE60125819D1 (de) | 2007-02-15 |
EP1340270B1 (en) | 2007-01-03 |
CN100416882C (zh) | 2008-09-03 |
DE60125819T2 (de) | 2007-10-11 |
WO2002045184A1 (en) | 2002-06-06 |
AU2002220818B2 (en) | 2006-09-28 |
KR100824026B1 (ko) | 2008-04-21 |
JP2004525501A (ja) | 2004-08-19 |
US7095044B2 (en) | 2006-08-22 |
AU2081802A (en) | 2002-06-11 |
GB0028867D0 (en) | 2001-01-10 |
JP2010028123A (ja) | 2010-02-04 |
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