KR100941849B1 - 반도체장치 및 그 제조방법, 전자장치 및 그 제조방법 - Google Patents
반도체장치 및 그 제조방법, 전자장치 및 그 제조방법 Download PDFInfo
- Publication number
- KR100941849B1 KR100941849B1 KR1020030021552A KR20030021552A KR100941849B1 KR 100941849 B1 KR100941849 B1 KR 100941849B1 KR 1020030021552 A KR1020030021552 A KR 1020030021552A KR 20030021552 A KR20030021552 A KR 20030021552A KR 100941849 B1 KR100941849 B1 KR 100941849B1
- Authority
- KR
- South Korea
- Prior art keywords
- layer
- solder
- delete delete
- bonding layer
- electrode pad
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/24—Reinforcing of the conductive pattern
- H05K3/244—Finish plating of conductors, especially of copper conductors, e.g. for pads or lands
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistors
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits by soldering
- H05K3/346—Solder materials or compositions specially adapted therefor
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
- H10W70/65—Shapes or dispositions of interconnections
- H10W70/654—Top-view layouts
- H10W70/656—Fan-in layouts
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/019—Manufacture or treatment of bond pads
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/536—Shapes of wire connectors the connected ends being ball-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/5363—Shapes of wire connectors the connected ends being wedge-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/5366—Shapes of wire connectors the bond wires having kinks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5522—Materials of bond wires comprising metals or metalloids, e.g. silver comprising gold [Au]
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/874—On different surfaces
- H10W72/884—Die-attach connectors and bond wires
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/921—Structures or relative sizes of bond pads
- H10W72/922—Bond pads being integral with underlying chip-level interconnections
- H10W72/9223—Bond pads being integral with underlying chip-level interconnections with redistribution layers [RDL]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/921—Structures or relative sizes of bond pads
- H10W72/923—Bond pads having multiple stacked layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/941—Dispositions of bond pads
- H10W72/9415—Dispositions of bond pads relative to the surface, e.g. recessed, protruding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/941—Dispositions of bond pads
- H10W72/942—Dispositions of bond pads relative to underlying supporting features, e.g. bond pads, RDLs or vias
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/15—Encapsulations, e.g. protective coatings characterised by their shape or disposition on active surfaces of flip-chip devices, e.g. underfills
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Wire Bonding (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2002-00114408 | 2002-04-17 | ||
| JP2002114408A JP4034107B2 (ja) | 2002-04-17 | 2002-04-17 | 半導体装置 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020090099729A Division KR100969446B1 (ko) | 2002-04-17 | 2009-10-20 | 반도체장치 및 그 제조방법, 전자장치 및 그 제조방법 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20030082382A KR20030082382A (ko) | 2003-10-22 |
| KR100941849B1 true KR100941849B1 (ko) | 2010-02-11 |
Family
ID=29207657
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020030021552A Expired - Lifetime KR100941849B1 (ko) | 2002-04-17 | 2003-04-07 | 반도체장치 및 그 제조방법, 전자장치 및 그 제조방법 |
| KR1020090099729A Expired - Lifetime KR100969446B1 (ko) | 2002-04-17 | 2009-10-20 | 반도체장치 및 그 제조방법, 전자장치 및 그 제조방법 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020090099729A Expired - Lifetime KR100969446B1 (ko) | 2002-04-17 | 2009-10-20 | 반도체장치 및 그 제조방법, 전자장치 및 그 제조방법 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6879041B2 (enExample) |
| JP (1) | JP4034107B2 (enExample) |
| KR (2) | KR100941849B1 (enExample) |
| TW (1) | TWI275170B (enExample) |
Families Citing this family (51)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005183669A (ja) * | 2003-12-19 | 2005-07-07 | Tdk Corp | 実装基板およびそれを用いた電子部品 |
| US7005745B2 (en) * | 2004-01-22 | 2006-02-28 | Texas Instruments Incorporated | Method and structure to reduce risk of gold embrittlement in solder joints |
| DE102004029584A1 (de) * | 2004-06-18 | 2006-01-12 | Infineon Technologies Ag | Anordnung zur Erhöhung der Zuverlässigkeit von substratbasierten BGA-Packages |
| US20060068218A1 (en) * | 2004-09-28 | 2006-03-30 | Hooghan Kultaransingh N | Whisker-free lead frames |
| JP4817418B2 (ja) | 2005-01-31 | 2011-11-16 | オンセミコンダクター・トレーディング・リミテッド | 回路装置の製造方法 |
| JP2006261569A (ja) * | 2005-03-18 | 2006-09-28 | Dowa Mining Co Ltd | サブマウントおよびその製造方法 |
| TWI462236B (zh) * | 2005-03-18 | 2014-11-21 | 同和電子科技有限公司 | 副載置片及其製造方法 |
| JP2006286944A (ja) * | 2005-03-31 | 2006-10-19 | Dowa Mining Co Ltd | サブマウント及びその製造方法 |
| KR100723497B1 (ko) * | 2005-08-11 | 2007-06-04 | 삼성전자주식회사 | 솔더볼 랜드에 두 종류 이상의 표면처리부를 갖는인쇄회로기판 및 이를 포함하는 반도체 패키지 |
| US7233074B2 (en) * | 2005-08-11 | 2007-06-19 | Texas Instruments Incorporated | Semiconductor device with improved contacts |
| JP4569423B2 (ja) | 2005-08-31 | 2010-10-27 | 株式会社日立製作所 | 半導体装置の製造方法 |
| JP2007165420A (ja) * | 2005-12-12 | 2007-06-28 | Matsushita Electric Ind Co Ltd | 半導体装置 |
| JP2007258292A (ja) * | 2006-03-22 | 2007-10-04 | Nippon Inter Electronics Corp | 縦型半導体装置 |
| JP2007294899A (ja) * | 2006-03-31 | 2007-11-08 | Dowa Electronics Materials Co Ltd | 半田層及びそれを用いた電子デバイス接合用基板並びに電子デバイス接合用サブマウント |
| US7727805B2 (en) * | 2007-06-11 | 2010-06-01 | Intel Corporation | Reducing stress in a flip chip assembly |
| JP5331322B2 (ja) * | 2007-09-20 | 2013-10-30 | 株式会社日立製作所 | 半導体装置 |
| JP2009099589A (ja) * | 2007-10-12 | 2009-05-07 | Elpida Memory Inc | ウエハまたは回路基板およびその接続構造体 |
| US8367244B2 (en) * | 2008-04-17 | 2013-02-05 | Enovix Corporation | Anode material having a uniform metal-semiconductor alloy layer |
| JP4991637B2 (ja) | 2008-06-12 | 2012-08-01 | ルネサスエレクトロニクス株式会社 | 半導体装置およびその製造方法 |
| US20090310320A1 (en) * | 2008-06-16 | 2009-12-17 | Weston Roth | Low profile solder grid array technology for printed circuit board surface mount components |
| US9524945B2 (en) | 2010-05-18 | 2016-12-20 | Taiwan Semiconductor Manufacturing Company, Ltd. | Cu pillar bump with L-shaped non-metal sidewall protection structure |
| EP2340554B1 (en) * | 2008-09-18 | 2017-05-10 | Imec | Methods and systems for material bonding |
| JP2010161136A (ja) | 2009-01-07 | 2010-07-22 | Panasonic Corp | 半導体装置及びその製造方法 |
| US8592995B2 (en) * | 2009-07-02 | 2013-11-26 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method and structure for adhesion of intermetallic compound (IMC) on Cu pillar bump |
| US8841766B2 (en) | 2009-07-30 | 2014-09-23 | Taiwan Semiconductor Manufacturing Company, Ltd. | Cu pillar bump with non-metal sidewall protection structure |
| US8377816B2 (en) * | 2009-07-30 | 2013-02-19 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method of forming electrical connections |
| US8324738B2 (en) | 2009-09-01 | 2012-12-04 | Taiwan Semiconductor Manufacturing Company, Ltd. | Self-aligned protection layer for copper post structure |
| KR101070098B1 (ko) * | 2009-09-15 | 2011-10-04 | 삼성전기주식회사 | 인쇄회로기판 및 그의 제조 방법 |
| US8659155B2 (en) * | 2009-11-05 | 2014-02-25 | Taiwan Semiconductor Manufacturing Company, Ltd. | Mechanisms for forming copper pillar bumps |
| US8610270B2 (en) * | 2010-02-09 | 2013-12-17 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor device and semiconductor assembly with lead-free solder |
| US9385095B2 (en) | 2010-02-26 | 2016-07-05 | Taiwan Semiconductor Manufacturing Company, Ltd. | 3D semiconductor package interposer with die cavity |
| US8519537B2 (en) * | 2010-02-26 | 2013-08-27 | Taiwan Semiconductor Manufacturing Company, Ltd. | 3D semiconductor package interposer with die cavity |
| US8441124B2 (en) | 2010-04-29 | 2013-05-14 | Taiwan Semiconductor Manufacturing Company, Ltd. | Cu pillar bump with non-metal sidewall protection structure |
| US8698306B2 (en) | 2010-05-20 | 2014-04-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Substrate contact opening |
| US9018758B2 (en) | 2010-06-02 | 2015-04-28 | Taiwan Semiconductor Manufacturing Company, Ltd. | Cu pillar bump with non-metal sidewall spacer and metal top cap |
| US8546254B2 (en) | 2010-08-19 | 2013-10-01 | Taiwan Semiconductor Manufacturing Company, Ltd. | Mechanisms for forming copper pillar bumps using patterned anodes |
| JP5557788B2 (ja) * | 2011-04-07 | 2014-07-23 | 株式会社 日立パワーデバイス | 電子装置の製造方法 |
| JP5509295B2 (ja) * | 2012-11-02 | 2014-06-04 | パナソニック株式会社 | 半導体装置 |
| US9355980B2 (en) | 2013-09-03 | 2016-05-31 | Taiwan Semiconductor Manufacturing Company, Ltd. | Three-dimensional chip stack and method of forming the same |
| US9653443B2 (en) | 2014-02-14 | 2017-05-16 | Taiwan Semiconductor Manufacturing Company, Ltd. | Thermal performance structure for semiconductor packages and method of forming same |
| US10056267B2 (en) | 2014-02-14 | 2018-08-21 | Taiwan Semiconductor Manufacturing Company, Ltd. | Substrate design for semiconductor packages and method of forming same |
| US9935090B2 (en) | 2014-02-14 | 2018-04-03 | Taiwan Semiconductor Manufacturing Company, Ltd. | Substrate design for semiconductor packages and method of forming same |
| US10026671B2 (en) | 2014-02-14 | 2018-07-17 | Taiwan Semiconductor Manufacturing Company, Ltd. | Substrate design for semiconductor packages and method of forming same |
| KR102356810B1 (ko) * | 2015-01-22 | 2022-01-28 | 삼성전기주식회사 | 전자부품내장형 인쇄회로기판 및 그 제조방법 |
| US9564416B2 (en) | 2015-02-13 | 2017-02-07 | Taiwan Semiconductor Manufacturing Company, Ltd. | Package structures and methods of forming the same |
| WO2017086324A1 (ja) * | 2015-11-16 | 2017-05-26 | 株式会社豊田中央研究所 | 接合構造体およびその製造方法 |
| JP2017103434A (ja) * | 2015-12-04 | 2017-06-08 | トヨタ自動車株式会社 | 半導体装置 |
| KR102373440B1 (ko) * | 2017-03-17 | 2022-03-14 | 삼성디스플레이 주식회사 | 디스플레이 패널 및 이를 구비하는 디스플레이 장치 |
| KR20190085590A (ko) * | 2018-01-11 | 2019-07-19 | 삼성전자주식회사 | 반도체 장치, 이를 포함하는 반도체 패키지 및 이의 제조 방법 |
| JP2022000676A (ja) * | 2020-06-19 | 2022-01-04 | 株式会社ジャパンディスプレイ | 表示装置の製造方法 |
| KR102837298B1 (ko) * | 2020-12-22 | 2025-07-23 | 삼성전자주식회사 | 반도체 패키지 및 그 제조 방법 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11224887A (ja) | 1998-02-05 | 1999-08-17 | Sumitomo Metal Electronics Devices Inc | セラミック基板 |
| JP2000244084A (ja) * | 1999-02-24 | 2000-09-08 | Kyocera Corp | 配線基板 |
| JP2001298051A (ja) * | 2000-04-17 | 2001-10-26 | Tamura Seisakusho Co Ltd | はんだ接続部 |
| KR100306842B1 (ko) | 1999-09-30 | 2001-11-02 | 윤종용 | 범프 패드에 오목 패턴이 형성된 재배치 웨이퍼 레벨 칩 사이즈 패키지 및 그 제조방법 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0634983A (ja) | 1992-07-17 | 1994-02-10 | Sharp Corp | 貼合わせ装置 |
| US6384344B1 (en) * | 1995-06-19 | 2002-05-07 | Ibiden Co., Ltd | Circuit board for mounting electronic parts |
| JP2001144214A (ja) | 1999-11-17 | 2001-05-25 | Canon Inc | 半導体装置およびその接合構造 |
| JP2002146548A (ja) | 2000-11-08 | 2002-05-22 | Matsushita Electric Ind Co Ltd | 無電解ニッケルめっき皮膜およびそれを用いたプリント配線板 |
| JP3910363B2 (ja) * | 2000-12-28 | 2007-04-25 | 富士通株式会社 | 外部接続端子 |
-
2002
- 2002-04-17 JP JP2002114408A patent/JP4034107B2/ja not_active Expired - Lifetime
-
2003
- 2003-03-26 US US10/396,326 patent/US6879041B2/en not_active Expired - Lifetime
- 2003-04-07 KR KR1020030021552A patent/KR100941849B1/ko not_active Expired - Lifetime
- 2003-04-15 TW TW092108665A patent/TWI275170B/zh not_active IP Right Cessation
-
2009
- 2009-10-20 KR KR1020090099729A patent/KR100969446B1/ko not_active Expired - Lifetime
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11224887A (ja) | 1998-02-05 | 1999-08-17 | Sumitomo Metal Electronics Devices Inc | セラミック基板 |
| JP2000244084A (ja) * | 1999-02-24 | 2000-09-08 | Kyocera Corp | 配線基板 |
| KR100306842B1 (ko) | 1999-09-30 | 2001-11-02 | 윤종용 | 범프 패드에 오목 패턴이 형성된 재배치 웨이퍼 레벨 칩 사이즈 패키지 및 그 제조방법 |
| JP2001298051A (ja) * | 2000-04-17 | 2001-10-26 | Tamura Seisakusho Co Ltd | はんだ接続部 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP4034107B2 (ja) | 2008-01-16 |
| JP2003309223A (ja) | 2003-10-31 |
| TWI275170B (en) | 2007-03-01 |
| KR100969446B1 (ko) | 2010-07-14 |
| US6879041B2 (en) | 2005-04-12 |
| US20030197277A1 (en) | 2003-10-23 |
| TW200402860A (en) | 2004-02-16 |
| KR20030082382A (ko) | 2003-10-22 |
| KR20090119748A (ko) | 2009-11-19 |
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