JPS5643756A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS5643756A
JPS5643756A JP11980879A JP11980879A JPS5643756A JP S5643756 A JPS5643756 A JP S5643756A JP 11980879 A JP11980879 A JP 11980879A JP 11980879 A JP11980879 A JP 11980879A JP S5643756 A JPS5643756 A JP S5643756A
Authority
JP
Japan
Prior art keywords
oxide film
well
film
type well
photo
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11980879A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0116018B2 (enrdf_load_stackoverflow
Inventor
Toshihiko Mano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Suwa Seikosha KK
Original Assignee
Seiko Epson Corp
Suwa Seikosha KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp, Suwa Seikosha KK filed Critical Seiko Epson Corp
Priority to JP11980879A priority Critical patent/JPS5643756A/ja
Publication of JPS5643756A publication Critical patent/JPS5643756A/ja
Publication of JPH0116018B2 publication Critical patent/JPH0116018B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/033Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/0123Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
    • H10D84/0126Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
    • H10D84/0165Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs the components including complementary IGFETs, e.g. CMOS devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/02Manufacture or treatment characterised by using material-based technologies
    • H10D84/03Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
    • H10D84/038Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/80Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
    • H10D84/82Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
    • H10D84/83Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
    • H10D84/85Complementary IGFETs, e.g. CMOS
    • H10D84/859Complementary IGFETs, e.g. CMOS comprising both N-type and P-type wells, e.g. twin-tub

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Inorganic Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Local Oxidation Of Silicon (AREA)
  • Element Separation (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
JP11980879A 1979-09-18 1979-09-18 Manufacture of semiconductor device Granted JPS5643756A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11980879A JPS5643756A (en) 1979-09-18 1979-09-18 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11980879A JPS5643756A (en) 1979-09-18 1979-09-18 Manufacture of semiconductor device

Related Child Applications (4)

Application Number Title Priority Date Filing Date
JP62146384A Division JPS63146A (ja) 1987-06-12 1987-06-12 半導体装置
JP62146385A Division JPS63147A (ja) 1987-06-12 1987-06-12 半導体装置
JP1341850A Division JPH02224269A (ja) 1989-12-29 1989-12-29 半導体装置
JP1341849A Division JP2572653B2 (ja) 1989-12-29 1989-12-29 半導体装置の製造方法

Publications (2)

Publication Number Publication Date
JPS5643756A true JPS5643756A (en) 1981-04-22
JPH0116018B2 JPH0116018B2 (enrdf_load_stackoverflow) 1989-03-22

Family

ID=14770733

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11980879A Granted JPS5643756A (en) 1979-09-18 1979-09-18 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5643756A (enrdf_load_stackoverflow)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5843562A (ja) * 1981-08-25 1983-03-14 シ−メンス・アクチエンゲゼルシヤフト 高度集積cmos回路の製造方法
JPS58107663A (ja) * 1981-12-11 1983-06-27 シ−メンス・アクチエンゲゼルシヤフト 近接して設けられるド−パントイオン注入盆状区域の製造方法
JPS6031276A (ja) * 1983-07-29 1985-02-18 Toshiba Corp 半導体装置及びその製造方法
JPS6144456A (ja) * 1984-08-09 1986-03-04 Fujitsu Ltd 半導体装置の製造方法
JPS63119250A (ja) * 1987-10-23 1988-05-23 Hitachi Ltd 半導体装置の製法
JPH02338A (ja) * 1988-12-16 1990-01-05 Hitachi Ltd 半導体集積回路装置の製造法
JPH02337A (ja) * 1988-12-16 1990-01-05 Hitachi Ltd 半導体集積回路装置の製造法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5286083A (en) * 1976-01-12 1977-07-16 Hitachi Ltd Production of complimentary isolation gate field effect transistor
JPS5375781A (en) * 1976-12-14 1978-07-05 Standard Microsyst Smc Method of producing mos semiconductor circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5286083A (en) * 1976-01-12 1977-07-16 Hitachi Ltd Production of complimentary isolation gate field effect transistor
JPS5375781A (en) * 1976-12-14 1978-07-05 Standard Microsyst Smc Method of producing mos semiconductor circuit

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5843562A (ja) * 1981-08-25 1983-03-14 シ−メンス・アクチエンゲゼルシヤフト 高度集積cmos回路の製造方法
JPS58107663A (ja) * 1981-12-11 1983-06-27 シ−メンス・アクチエンゲゼルシヤフト 近接して設けられるド−パントイオン注入盆状区域の製造方法
JPS6031276A (ja) * 1983-07-29 1985-02-18 Toshiba Corp 半導体装置及びその製造方法
JPS6144456A (ja) * 1984-08-09 1986-03-04 Fujitsu Ltd 半導体装置の製造方法
JPS63119250A (ja) * 1987-10-23 1988-05-23 Hitachi Ltd 半導体装置の製法
JPH02338A (ja) * 1988-12-16 1990-01-05 Hitachi Ltd 半導体集積回路装置の製造法
JPH02337A (ja) * 1988-12-16 1990-01-05 Hitachi Ltd 半導体集積回路装置の製造法

Also Published As

Publication number Publication date
JPH0116018B2 (enrdf_load_stackoverflow) 1989-03-22

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