JPH09130229A5 - - Google Patents

Info

Publication number
JPH09130229A5
JPH09130229A5 JP1996253815A JP25381596A JPH09130229A5 JP H09130229 A5 JPH09130229 A5 JP H09130229A5 JP 1996253815 A JP1996253815 A JP 1996253815A JP 25381596 A JP25381596 A JP 25381596A JP H09130229 A5 JPH09130229 A5 JP H09130229A5
Authority
JP
Japan
Prior art keywords
output
terminal
coupled
current electrode
buffer circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1996253815A
Other languages
English (en)
Japanese (ja)
Other versions
JPH09130229A (ja
JP3871381B2 (ja
Filing date
Publication date
Priority claimed from US08/523,165 external-priority patent/US5606275A/en
Application filed filed Critical
Publication of JPH09130229A publication Critical patent/JPH09130229A/ja
Publication of JPH09130229A5 publication Critical patent/JPH09130229A5/ja
Application granted granted Critical
Publication of JP3871381B2 publication Critical patent/JP3871381B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP25381596A 1995-09-05 1996-09-04 可変出力インピーダンスを有するバッファ回路 Expired - Fee Related JP3871381B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/523,165 1995-09-05
US08/523,165 US5606275A (en) 1995-09-05 1995-09-05 Buffer circuit having variable output impedance

Publications (3)

Publication Number Publication Date
JPH09130229A JPH09130229A (ja) 1997-05-16
JPH09130229A5 true JPH09130229A5 (enExample) 2004-09-09
JP3871381B2 JP3871381B2 (ja) 2007-01-24

Family

ID=24083917

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25381596A Expired - Fee Related JP3871381B2 (ja) 1995-09-05 1996-09-04 可変出力インピーダンスを有するバッファ回路

Country Status (3)

Country Link
US (1) US5606275A (enExample)
JP (1) JP3871381B2 (enExample)
KR (1) KR100498789B1 (enExample)

Families Citing this family (62)

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JP3640800B2 (ja) 1998-05-25 2005-04-20 株式会社東芝 半導体装置
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US6674304B1 (en) 1999-02-26 2004-01-06 Motorola Inc. Output buffer circuit and method of operation
US6836151B1 (en) * 1999-03-24 2004-12-28 Altera Corporation I/O cell configuration for multiple I/O standards
US6218863B1 (en) 1999-04-12 2001-04-17 Intel Corporation Dual mode input/output interface circuit
US6194924B1 (en) 1999-04-22 2001-02-27 Agilent Technologies Inc. Multi-function controlled impedance output driver
US6317069B1 (en) 1999-05-06 2001-11-13 Texas Instruments Incorporated Digital-to-analog converter employing binary-weighted transistor array
US6275119B1 (en) 1999-08-25 2001-08-14 Micron Technology, Inc. Method to find a value within a range using weighted subranges
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KR100382718B1 (ko) * 2000-08-21 2003-05-09 삼성전자주식회사 출력전류 보상회로를 구비하는 출력드라이버
JP3670563B2 (ja) * 2000-09-18 2005-07-13 株式会社東芝 半導体装置
KR100391150B1 (ko) * 2000-11-15 2003-07-16 삼성전자주식회사 다단의 상위 코드 선택기를 갖는 반도체 장치의 임피던스콘트롤 출력회로 및 그의 동작방법
US6384621B1 (en) 2001-02-22 2002-05-07 Cypress Semiconductor Corp. Programmable transmission line impedance matching circuit
US6657906B2 (en) * 2001-11-28 2003-12-02 Micron Technology, Inc. Active termination circuit and method for controlling the impedance of external integrated circuit terminals
JP3966016B2 (ja) * 2002-02-26 2007-08-29 株式会社デンソー クランプ回路
US6690211B1 (en) * 2002-11-28 2004-02-10 Jmicron Technology Corp. Impedance matching circuit
JP3885773B2 (ja) * 2003-06-30 2007-02-28 日本電気株式会社 インピーダンス調整回路及び調整方法、インピーダンス調整回路を備える半導体装置
US6924660B2 (en) * 2003-09-08 2005-08-02 Rambus Inc. Calibration methods and circuits for optimized on-die termination
US7019553B2 (en) * 2003-12-01 2006-03-28 Micron Technology, Inc. Method and circuit for off chip driver control, and memory device using same
US7057415B2 (en) * 2003-12-10 2006-06-06 Hewlett-Packard Development Company, L.P. Output buffer compensation control
US6980020B2 (en) * 2003-12-19 2005-12-27 Rambus Inc. Calibration methods and circuits for optimized on-die termination
US7248636B2 (en) * 2004-04-20 2007-07-24 Hewlett-Packard Development Company, L.P. Systems and methods for adjusting an output driver
US7498846B1 (en) 2004-06-08 2009-03-03 Transmeta Corporation Power efficient multiplexer
KR100610007B1 (ko) * 2004-06-14 2006-08-08 삼성전자주식회사 임피던스 랜지 시프팅 기능을 갖는 반도체 장치의프로그래머블 임피던스 콘트롤 회로 및 그에 따른임피던스 랜지 시프팅 방법
US7888962B1 (en) 2004-07-07 2011-02-15 Cypress Semiconductor Corporation Impedance matching circuit
JP4562175B2 (ja) * 2004-08-31 2010-10-13 ルネサスエレクトロニクス株式会社 終端抵抗調整回路
KR100598017B1 (ko) * 2004-09-20 2006-07-06 삼성전자주식회사 기준 전압 변화에 따른 출력 특성 보정이 가능한 입력버퍼 및 출력 특성 보정이 가능한 입력 버퍼링 방법
KR100699828B1 (ko) * 2004-10-11 2007-03-27 삼성전자주식회사 임피던스 교정 회로와 이를 포함하는 집적 회로 및 이를이용한 출력 드라이버의 임피던스 조절 방법
US7196567B2 (en) * 2004-12-20 2007-03-27 Rambus Inc. Systems and methods for controlling termination resistance values for a plurality of communication channels
US7285976B2 (en) * 2005-01-31 2007-10-23 Freescale Semiconductor, Inc. Integrated circuit with programmable-impedance output buffer and method therefor
US8096994B2 (en) * 2005-02-17 2012-01-17 Kyphon Sarl Percutaneous spinal implants and methods
US7215579B2 (en) * 2005-02-18 2007-05-08 Micron Technology, Inc. System and method for mode register control of data bus operating mode and impedance
US7583087B2 (en) * 2005-02-22 2009-09-01 Integrated Device Technology, Inc. In-situ monitor of process and device parameters in integrated circuits
US7594149B2 (en) * 2005-02-22 2009-09-22 Integrated Device Technology, Inc. In-situ monitor of process and device parameters in integrated circuits
DE102005009593B4 (de) * 2005-02-28 2016-02-04 Infineon Technologies Ag Verfahren und Vorrichtung zum Einstellen der Ausgangsimpedanz einer Treiberstufe
KR100673897B1 (ko) 2005-03-02 2007-01-25 주식회사 하이닉스반도체 반도체 소자의 출력 드라이버
JP2006270331A (ja) * 2005-03-23 2006-10-05 Nec Corp インピーダンス調整回路及び集積回路装置
US7389194B2 (en) 2005-07-06 2008-06-17 Rambus Inc. Driver calibration methods and circuits
US8036846B1 (en) 2005-10-20 2011-10-11 Cypress Semiconductor Corporation Variable impedance sense architecture and method
JP4916699B2 (ja) * 2005-10-25 2012-04-18 エルピーダメモリ株式会社 Ｚｑキャリブレーション回路及びこれを備えた半導体装置
KR100656470B1 (ko) * 2006-02-07 2006-12-11 주식회사 하이닉스반도체 반도체 메모리의 드라이버 제어장치 및 방법
JP4978094B2 (ja) * 2006-07-31 2012-07-18 富士通セミコンダクター株式会社 出力バッファ回路
WO2008147932A2 (en) * 2007-05-24 2008-12-04 Bitwave Semiconductor, Incorporated Reconfigurable tunable rf power amplifier
US7551020B2 (en) * 2007-05-31 2009-06-23 Agere Systems Inc. Enhanced output impedance compensation
KR100886644B1 (ko) * 2007-08-29 2009-03-04 주식회사 하이닉스반도체 온 다이 터미네이션 장치의 캘리브래이션 회로
US8368455B2 (en) * 2007-12-31 2013-02-05 Korea Institute Of Geoscience & Mineral Resources Apparatus and method for automatic control of current electrodes for electrical resistivity survey
JP2009022029A (ja) * 2008-09-01 2009-01-29 Renesas Technology Corp 半導体集積回路装置
JP5642935B2 (ja) * 2009-02-19 2014-12-17 ピーエスフォー ルクスコ エスエイアールエルＰＳ４ Ｌｕｘｃｏ Ｓ．ａ．ｒ．ｌ． インピーダンス調整回路及びこれを備える半導体装置
US7791367B1 (en) 2009-06-05 2010-09-07 Freescale Semiconductor, Inc. Driver with selectable output impedance
KR101796116B1 (ko) 2010-10-20 2017-11-10 삼성전자 주식회사 반도체 장치, 이를 포함하는 메모리 모듈, 메모리 시스템 및 그 동작방법
US9362912B2 (en) * 2014-03-25 2016-06-07 SK Hynix Inc. Data output circuit of semiconductor apparatus
JP2017216611A (ja) 2016-06-01 2017-12-07 マイクロン テクノロジー， インク． 半導体装置
EP3373526B1 (en) * 2017-03-07 2020-01-08 Nxp B.V. Transmitter with independently adjustable voltage and impedance
CN114646407B (zh) * 2022-05-20 2022-09-02 深圳众城卓越科技有限公司 电抗器热测试电路及热测试方法

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JPS56153832A (en) * 1980-04-30 1981-11-28 Nec Corp Digital to analog converter
US5134311A (en) * 1990-06-07 1992-07-28 International Business Machines Corporation Self-adjusting impedance matching driver
JPH04169915A (ja) * 1990-11-02 1992-06-17 Hitachi Ltd 半導体集積回路
US5055847A (en) * 1991-02-19 1991-10-08 Motorola, Inc. Differential sensing current-steering analog-to-digital converter
US5311084A (en) * 1992-06-23 1994-05-10 At&T Bell Laboratories Integrated circuit buffer with controlled rise/fall time
JPH06216751A (ja) * 1993-01-20 1994-08-05 Hitachi Ltd Ｃｍｏｓ集積回路装置とそれを用いた情報処理システム
US5457407A (en) * 1994-07-06 1995-10-10 Sony Electronics Inc. Binary weighted reference circuit for a variable impedance output buffer
KR970005570B1 (ko) * 1994-07-14 1997-04-17 현대전자산업 주식회사 데이타 출력버퍼
KR0124141B1 (ko) * 1994-12-29 1998-10-01 김광호 반도체 메모리장치의 데이타 출력 버퍼회로
KR19990066370A (ko) * 1998-01-24 1999-08-16 구본준 고속 출력버퍼

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