JP3871381B2 - 可変出力インピーダンスを有するバッファ回路 - Google Patents

可変出力インピーダンスを有するバッファ回路 Download PDF

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Publication number
JP3871381B2
JP3871381B2 JP25381596A JP25381596A JP3871381B2 JP 3871381 B2 JP3871381 B2 JP 3871381B2 JP 25381596 A JP25381596 A JP 25381596A JP 25381596 A JP25381596 A JP 25381596A JP 3871381 B2 JP3871381 B2 JP 3871381B2
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Japan
Prior art keywords
pull
voltage
output
terminal
transistor
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Expired - Fee Related
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JP25381596A
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Japanese (ja)
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JPH09130229A (ja
JPH09130229A5 (enExample
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アリ・レザ・ファーハン
スコット・ジョージ・ノグル
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NXP USA Inc
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NXP USA Inc
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Application filed by NXP USA Inc filed Critical NXP USA Inc
Publication of JPH09130229A publication Critical patent/JPH09130229A/ja
Publication of JPH09130229A5 publication Critical patent/JPH09130229A5/ja
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/0005—Modifications of input or output impedance

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Power Engineering (AREA)
  • Logic Circuits (AREA)
  • Networks Using Active Elements (AREA)
  • Dram (AREA)
  • Analogue/Digital Conversion (AREA)
  • Amplifiers (AREA)
JP25381596A 1995-09-05 1996-09-04 可変出力インピーダンスを有するバッファ回路 Expired - Fee Related JP3871381B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/523,165 1995-09-05
US08/523,165 US5606275A (en) 1995-09-05 1995-09-05 Buffer circuit having variable output impedance

Publications (3)

Publication Number Publication Date
JPH09130229A JPH09130229A (ja) 1997-05-16
JPH09130229A5 JPH09130229A5 (enExample) 2004-09-09
JP3871381B2 true JP3871381B2 (ja) 2007-01-24

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Family Applications (1)

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JP25381596A Expired - Fee Related JP3871381B2 (ja) 1995-09-05 1996-09-04 可変出力インピーダンスを有するバッファ回路

Country Status (3)

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US (1) US5606275A (enExample)
JP (1) JP3871381B2 (enExample)
KR (1) KR100498789B1 (enExample)

Families Citing this family (62)

* Cited by examiner, † Cited by third party
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JP3640800B2 (ja) 1998-05-25 2005-04-20 株式会社東芝 半導体装置
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US6157206A (en) * 1998-12-31 2000-12-05 Intel Corporation On-chip termination
US6674304B1 (en) 1999-02-26 2004-01-06 Motorola Inc. Output buffer circuit and method of operation
US6836151B1 (en) * 1999-03-24 2004-12-28 Altera Corporation I/O cell configuration for multiple I/O standards
US6218863B1 (en) 1999-04-12 2001-04-17 Intel Corporation Dual mode input/output interface circuit
US6194924B1 (en) 1999-04-22 2001-02-27 Agilent Technologies Inc. Multi-function controlled impedance output driver
US6317069B1 (en) 1999-05-06 2001-11-13 Texas Instruments Incorporated Digital-to-analog converter employing binary-weighted transistor array
US6275119B1 (en) 1999-08-25 2001-08-14 Micron Technology, Inc. Method to find a value within a range using weighted subranges
US6292407B1 (en) 1999-10-12 2001-09-18 Micron Technolgy, Inc. Method and apparatus for circuit variable updates
KR100382718B1 (ko) * 2000-08-21 2003-05-09 삼성전자주식회사 출력전류 보상회로를 구비하는 출력드라이버
JP3670563B2 (ja) * 2000-09-18 2005-07-13 株式会社東芝 半導体装置
KR100391150B1 (ko) * 2000-11-15 2003-07-16 삼성전자주식회사 다단의 상위 코드 선택기를 갖는 반도체 장치의 임피던스콘트롤 출력회로 및 그의 동작방법
US6384621B1 (en) 2001-02-22 2002-05-07 Cypress Semiconductor Corp. Programmable transmission line impedance matching circuit
US6657906B2 (en) * 2001-11-28 2003-12-02 Micron Technology, Inc. Active termination circuit and method for controlling the impedance of external integrated circuit terminals
JP3966016B2 (ja) * 2002-02-26 2007-08-29 株式会社デンソー クランプ回路
US6690211B1 (en) * 2002-11-28 2004-02-10 Jmicron Technology Corp. Impedance matching circuit
JP3885773B2 (ja) * 2003-06-30 2007-02-28 日本電気株式会社 インピーダンス調整回路及び調整方法、インピーダンス調整回路を備える半導体装置
US6924660B2 (en) * 2003-09-08 2005-08-02 Rambus Inc. Calibration methods and circuits for optimized on-die termination
US7019553B2 (en) * 2003-12-01 2006-03-28 Micron Technology, Inc. Method and circuit for off chip driver control, and memory device using same
US7057415B2 (en) * 2003-12-10 2006-06-06 Hewlett-Packard Development Company, L.P. Output buffer compensation control
US6980020B2 (en) * 2003-12-19 2005-12-27 Rambus Inc. Calibration methods and circuits for optimized on-die termination
US7248636B2 (en) * 2004-04-20 2007-07-24 Hewlett-Packard Development Company, L.P. Systems and methods for adjusting an output driver
US7498846B1 (en) 2004-06-08 2009-03-03 Transmeta Corporation Power efficient multiplexer
KR100610007B1 (ko) * 2004-06-14 2006-08-08 삼성전자주식회사 임피던스 랜지 시프팅 기능을 갖는 반도체 장치의프로그래머블 임피던스 콘트롤 회로 및 그에 따른임피던스 랜지 시프팅 방법
US7888962B1 (en) 2004-07-07 2011-02-15 Cypress Semiconductor Corporation Impedance matching circuit
JP4562175B2 (ja) * 2004-08-31 2010-10-13 ルネサスエレクトロニクス株式会社 終端抵抗調整回路
KR100598017B1 (ko) * 2004-09-20 2006-07-06 삼성전자주식회사 기준 전압 변화에 따른 출력 특성 보정이 가능한 입력버퍼 및 출력 특성 보정이 가능한 입력 버퍼링 방법
KR100699828B1 (ko) * 2004-10-11 2007-03-27 삼성전자주식회사 임피던스 교정 회로와 이를 포함하는 집적 회로 및 이를이용한 출력 드라이버의 임피던스 조절 방법
US7196567B2 (en) * 2004-12-20 2007-03-27 Rambus Inc. Systems and methods for controlling termination resistance values for a plurality of communication channels
US7285976B2 (en) * 2005-01-31 2007-10-23 Freescale Semiconductor, Inc. Integrated circuit with programmable-impedance output buffer and method therefor
US8096994B2 (en) * 2005-02-17 2012-01-17 Kyphon Sarl Percutaneous spinal implants and methods
US7215579B2 (en) * 2005-02-18 2007-05-08 Micron Technology, Inc. System and method for mode register control of data bus operating mode and impedance
US7583087B2 (en) * 2005-02-22 2009-09-01 Integrated Device Technology, Inc. In-situ monitor of process and device parameters in integrated circuits
US7594149B2 (en) * 2005-02-22 2009-09-22 Integrated Device Technology, Inc. In-situ monitor of process and device parameters in integrated circuits
DE102005009593B4 (de) * 2005-02-28 2016-02-04 Infineon Technologies Ag Verfahren und Vorrichtung zum Einstellen der Ausgangsimpedanz einer Treiberstufe
KR100673897B1 (ko) 2005-03-02 2007-01-25 주식회사 하이닉스반도체 반도체 소자의 출력 드라이버
JP2006270331A (ja) * 2005-03-23 2006-10-05 Nec Corp インピーダンス調整回路及び集積回路装置
US7389194B2 (en) 2005-07-06 2008-06-17 Rambus Inc. Driver calibration methods and circuits
US8036846B1 (en) 2005-10-20 2011-10-11 Cypress Semiconductor Corporation Variable impedance sense architecture and method
JP4916699B2 (ja) * 2005-10-25 2012-04-18 エルピーダメモリ株式会社 Ｚｑキャリブレーション回路及びこれを備えた半導体装置
KR100656470B1 (ko) * 2006-02-07 2006-12-11 주식회사 하이닉스반도체 반도체 메모리의 드라이버 제어장치 및 방법
JP4978094B2 (ja) * 2006-07-31 2012-07-18 富士通セミコンダクター株式会社 出力バッファ回路
WO2008147932A2 (en) * 2007-05-24 2008-12-04 Bitwave Semiconductor, Incorporated Reconfigurable tunable rf power amplifier
US7551020B2 (en) * 2007-05-31 2009-06-23 Agere Systems Inc. Enhanced output impedance compensation
KR100886644B1 (ko) * 2007-08-29 2009-03-04 주식회사 하이닉스반도체 온 다이 터미네이션 장치의 캘리브래이션 회로
US8368455B2 (en) * 2007-12-31 2013-02-05 Korea Institute Of Geoscience & Mineral Resources Apparatus and method for automatic control of current electrodes for electrical resistivity survey
JP2009022029A (ja) * 2008-09-01 2009-01-29 Renesas Technology Corp 半導体集積回路装置
JP5642935B2 (ja) * 2009-02-19 2014-12-17 ピーエスフォー ルクスコ エスエイアールエルＰＳ４ Ｌｕｘｃｏ Ｓ．ａ．ｒ．ｌ． インピーダンス調整回路及びこれを備える半導体装置
US7791367B1 (en) 2009-06-05 2010-09-07 Freescale Semiconductor, Inc. Driver with selectable output impedance
KR101796116B1 (ko) 2010-10-20 2017-11-10 삼성전자 주식회사 반도체 장치, 이를 포함하는 메모리 모듈, 메모리 시스템 및 그 동작방법
US9362912B2 (en) * 2014-03-25 2016-06-07 SK Hynix Inc. Data output circuit of semiconductor apparatus
JP2017216611A (ja) 2016-06-01 2017-12-07 マイクロン テクノロジー， インク． 半導体装置
EP3373526B1 (en) * 2017-03-07 2020-01-08 Nxp B.V. Transmitter with independently adjustable voltage and impedance
CN114646407B (zh) * 2022-05-20 2022-09-02 深圳众城卓越科技有限公司 电抗器热测试电路及热测试方法

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KR19990066370A (ko) * 1998-01-24 1999-08-16 구본준 고속 출력버퍼

Also Published As

Publication number Publication date
JPH09130229A (ja) 1997-05-16
KR100498789B1 (ko) 2005-10-04
KR970017597A (ko) 1997-04-30
US5606275A (en) 1997-02-25

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