JP7622308B2 - 半導体デバイスにおける成形された相互接続バンプ - Google Patents

半導体デバイスにおける成形された相互接続バンプ Download PDF

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JP7622308B2
JP7622308B2 JP2020519726A JP2020519726A JP7622308B2 JP 7622308 B2 JP7622308 B2 JP 7622308B2 JP 2020519726 A JP2020519726 A JP 2020519726A JP 2020519726 A JP2020519726 A JP 2020519726A JP 7622308 B2 JP7622308 B2 JP 7622308B2
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bumps
surface area
semiconductor package
power
tapered
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JP2020537342A (ja
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ケイ コドゥリ スリーニーバサン
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テキサス インスツルメンツ インコーポレイテッド
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    • HELECTRICITY
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    • H10W72/01231Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using blanket deposition
    • H10W72/01233Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using blanket deposition in liquid form, e.g. spin coating, spray coating or immersion coating
    • H10W72/01235Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using blanket deposition in liquid form, e.g. spin coating, spray coating or immersion coating by plating, e.g. electroless plating or electroplating
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    • H10W72/01251Changing the shapes of bumps
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    • H10W72/07251Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting
    • H10W72/07252Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting changes in structures or sizes
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    • H10W72/221Structures or relative sizes
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  • Lead Frames For Integrated Circuits (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Wire Bonding (AREA)
  • Manufacturing & Machinery (AREA)
JP2020519726A 2017-10-05 2018-10-04 半導体デバイスにおける成形された相互接続バンプ Active JP7622308B2 (ja)

Applications Claiming Priority (9)

Application Number Priority Date Filing Date Title
US201762568330P 2017-10-05 2017-10-05
US201762568331P 2017-10-05 2017-10-05
US201762568333P 2017-10-05 2017-10-05
US62/568,331 2017-10-05
US62/568,333 2017-10-05
US62/568,330 2017-10-05
US16/103,839 US11444048B2 (en) 2017-10-05 2018-08-14 Shaped interconnect bumps in semiconductor devices
US16/103,839 2018-08-14
PCT/US2018/054392 WO2019070995A1 (en) 2017-10-05 2018-10-04 INTERCONNECTION BUMPS SHAPED IN SEMICONDUCTOR DEVICES

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JP2020537342A JP2020537342A (ja) 2020-12-17
JP7622308B2 true JP7622308B2 (ja) 2025-01-28

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JP2020519680A Active JP7197849B2 (ja) 2017-10-05 2018-10-05 半導体デバイスにおけるリードフレーム
JP2020519681A Active JP7448754B2 (ja) 2017-10-05 2018-10-05 半導体デバイスにおけるプレモールドリードフレーム

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US (6) US11444048B2 (https=)
EP (3) EP3692574A4 (https=)
JP (3) JP7622308B2 (https=)
CN (3) CN111316433A (https=)
WO (3) WO2019070995A1 (https=)

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US11600590B2 (en) * 2019-03-22 2023-03-07 Advanced Semiconductor Engineering, Inc. Semiconductor device and semiconductor package
US11682609B2 (en) 2019-06-29 2023-06-20 Texas Instruments Incorporated Three-dimensional functional integration
CN110379792B (zh) * 2019-07-23 2021-07-20 中新国际联合研究院 用于温度循环的电子组件焊点
CN110660771B (zh) * 2019-10-09 2021-03-30 中新国际联合研究院 一种半导体封装中焊点形状的优化结构
CN110854029B (zh) * 2019-11-08 2021-04-13 中新国际联合研究院 自然形成的粗短沙漏形焊点的成形工艺
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