JP5086452B2 - インジウムターゲット及びその製造方法 - Google Patents
インジウムターゲット及びその製造方法 Download PDFInfo
- Publication number
- JP5086452B2 JP5086452B2 JP2011026090A JP2011026090A JP5086452B2 JP 5086452 B2 JP5086452 B2 JP 5086452B2 JP 2011026090 A JP2011026090 A JP 2011026090A JP 2011026090 A JP2011026090 A JP 2011026090A JP 5086452 B2 JP5086452 B2 JP 5086452B2
- Authority
- JP
- Japan
- Prior art keywords
- target
- indium
- crystal structure
- sputtering
- indium target
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 229910052738 indium Inorganic materials 0.000 title claims description 95
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 title claims description 95
- 238000004519 manufacturing process Methods 0.000 title description 7
- 239000013078 crystal Substances 0.000 claims description 46
- 239000002994 raw material Substances 0.000 claims description 18
- 238000000034 method Methods 0.000 claims description 16
- 230000008859 change Effects 0.000 claims description 14
- 238000001816 cooling Methods 0.000 claims description 13
- 239000003507 refrigerant Substances 0.000 claims description 10
- 239000007787 solid Substances 0.000 claims description 8
- 229910052742 iron Inorganic materials 0.000 claims description 5
- 229910052759 nickel Inorganic materials 0.000 claims description 5
- 239000002245 particle Substances 0.000 claims description 5
- 230000008569 process Effects 0.000 claims description 2
- 229910052797 bismuth Inorganic materials 0.000 claims 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 claims 1
- 238000004544 sputter deposition Methods 0.000 description 33
- 238000005266 casting Methods 0.000 description 10
- 230000000052 comparative effect Effects 0.000 description 9
- 239000010408 film Substances 0.000 description 9
- 230000015572 biosynthetic process Effects 0.000 description 6
- 229910052802 copper Inorganic materials 0.000 description 6
- 239000010949 copper Substances 0.000 description 6
- 239000012535 impurity Substances 0.000 description 5
- 230000008018 melting Effects 0.000 description 5
- 238000002844 melting Methods 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 239000002826 coolant Substances 0.000 description 4
- 238000011156 evaluation Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 230000003628 erosive effect Effects 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 238000005477 sputtering target Methods 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 230000031700 light absorption Effects 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 241001391944 Commicarpus scandens Species 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000005238 degreasing Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000007710 freezing Methods 0.000 description 1
- 230000008014 freezing Effects 0.000 description 1
- 239000005457 ice water Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 238000003801 milling Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000008520 organization Effects 0.000 description 1
- 238000005554 pickling Methods 0.000 description 1
- 238000010791 quenching Methods 0.000 description 1
- 230000000171 quenching effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
- 230000008023 solidification Effects 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011026090A JP5086452B2 (ja) | 2011-02-09 | 2011-02-09 | インジウムターゲット及びその製造方法 |
KR1020127015985A KR101261202B1 (ko) | 2011-02-09 | 2011-09-07 | 인듐 타깃 및 그 제조 방법 |
CN201180004828.9A CN102782181B (zh) | 2011-02-09 | 2011-09-07 | 铟靶材及其制造方法 |
PCT/JP2011/070388 WO2012108074A1 (ja) | 2011-02-09 | 2011-09-07 | インジウムターゲット及びその製造方法 |
TW100133128A TWI398409B (zh) | 2011-02-09 | 2011-09-15 | Indium target and its manufacturing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011026090A JP5086452B2 (ja) | 2011-02-09 | 2011-02-09 | インジウムターゲット及びその製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2012162792A JP2012162792A (ja) | 2012-08-30 |
JP5086452B2 true JP5086452B2 (ja) | 2012-11-28 |
Family
ID=46638308
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011026090A Active JP5086452B2 (ja) | 2011-02-09 | 2011-02-09 | インジウムターゲット及びその製造方法 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP5086452B2 (zh) |
KR (1) | KR101261202B1 (zh) |
CN (1) | CN102782181B (zh) |
TW (1) | TWI398409B (zh) |
WO (1) | WO2012108074A1 (zh) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4948634B2 (ja) | 2010-09-01 | 2012-06-06 | Jx日鉱日石金属株式会社 | インジウムターゲット及びその製造方法 |
JP5074628B1 (ja) | 2012-01-05 | 2012-11-14 | Jx日鉱日石金属株式会社 | インジウム製スパッタリングターゲット及びその製造方法 |
US9761421B2 (en) | 2012-08-22 | 2017-09-12 | Jx Nippon Mining & Metals Corporation | Indium cylindrical sputtering target and manufacturing method thereof |
CN102925868B (zh) * | 2012-11-29 | 2014-12-10 | 研创应用材料(赣州)有限公司 | 一种制备铟靶材金属薄膜的方法 |
JP5746252B2 (ja) * | 2013-03-28 | 2015-07-08 | 光洋應用材料科技股▲分▼有限公司 | 正方晶系結晶構造を有するインジウムターゲット |
CN104919080B (zh) | 2013-07-08 | 2018-10-16 | Jx日矿日石金属株式会社 | 溅射靶及其制造方法 |
CN108165936A (zh) * | 2017-12-21 | 2018-06-15 | 清远先导材料有限公司 | 制备铟靶材的方法 |
CN113652652B (zh) * | 2021-07-20 | 2023-04-07 | 先导薄膜材料(广东)有限公司 | 一种铟靶材及其制备方法 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63241167A (ja) * | 1987-03-30 | 1988-10-06 | Seiko Epson Corp | スパツタリング用タ−ゲツト |
JPS63262461A (ja) * | 1987-04-21 | 1988-10-28 | Mitsubishi Kasei Corp | スパツタリングタ−ゲツト |
JPS6411968A (en) * | 1987-07-06 | 1989-01-17 | Seiko Epson Corp | Manufacture of sputtering target |
JP2952853B2 (ja) * | 1988-05-17 | 1999-09-27 | 株式会社日立製作所 | スパツタリング用ターゲットの製造方法 |
JP3250241B2 (ja) * | 1991-11-06 | 2002-01-28 | 大同特殊鋼株式会社 | ターゲット材とその製造方法 |
JPH11158612A (ja) * | 1997-12-01 | 1999-06-15 | Mitsubishi Materials Corp | 溶解ルテニウムスパッタリングターゲット |
GB2343684B (en) * | 1998-06-17 | 2003-04-23 | Tanaka Precious Metal Ind | Sputtering target material |
DE10063383C1 (de) * | 2000-12-19 | 2002-03-14 | Heraeus Gmbh W C | Verfahren zur Herstellung eines Rohrtargets und Verwendung |
JP4170003B2 (ja) * | 2002-03-27 | 2008-10-22 | 三菱マテリアル株式会社 | スパッタリング用ターゲットの製造方法 |
JP4204823B2 (ja) * | 2002-08-29 | 2009-01-07 | 三菱マテリアル株式会社 | スパッタリング用ターゲット、その製造方法及びターゲット部材 |
JP2005113174A (ja) * | 2003-10-03 | 2005-04-28 | Tanaka Kikinzoku Kogyo Kk | スパッタリング用ルテニウムターゲット及びスパッタリング用ルテニウムターゲットの製造方法 |
JP4528995B2 (ja) * | 2007-08-02 | 2010-08-25 | 国立大学法人東北大学 | Siバルク多結晶インゴットの製造方法 |
JP5201446B2 (ja) * | 2008-02-26 | 2013-06-05 | 三菱マテリアル株式会社 | ターゲット材およびその製造方法 |
JP4992843B2 (ja) * | 2008-07-16 | 2012-08-08 | 住友金属鉱山株式会社 | インジウムターゲットの製造方法 |
-
2011
- 2011-02-09 JP JP2011026090A patent/JP5086452B2/ja active Active
- 2011-09-07 KR KR1020127015985A patent/KR101261202B1/ko active IP Right Grant
- 2011-09-07 CN CN201180004828.9A patent/CN102782181B/zh active Active
- 2011-09-07 WO PCT/JP2011/070388 patent/WO2012108074A1/ja active Application Filing
- 2011-09-15 TW TW100133128A patent/TWI398409B/zh active
Also Published As
Publication number | Publication date |
---|---|
KR20120115971A (ko) | 2012-10-19 |
CN102782181A (zh) | 2012-11-14 |
WO2012108074A1 (ja) | 2012-08-16 |
TWI398409B (zh) | 2013-06-11 |
CN102782181B (zh) | 2015-11-25 |
TW201233632A (en) | 2012-08-16 |
JP2012162792A (ja) | 2012-08-30 |
KR101261202B1 (ko) | 2013-05-10 |
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