JP5011611B2 - 半導体装置 - Google Patents

半導体装置 Download PDF

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Publication number
JP5011611B2
JP5011611B2 JP2001176499A JP2001176499A JP5011611B2 JP 5011611 B2 JP5011611 B2 JP 5011611B2 JP 2001176499 A JP2001176499 A JP 2001176499A JP 2001176499 A JP2001176499 A JP 2001176499A JP 5011611 B2 JP5011611 B2 JP 5011611B2
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Japan
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conductivity type
semiconductor device
guard ring
well region
type guard
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Expired - Lifetime
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JP2001176499A
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English (en)
Japanese (ja)
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JP2002368215A (ja
Inventor
龍彦 藤平
小林　　孝
和 阿部
康 新村
正範 井上
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Fuji Electric Co Ltd
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Fuji Electric Co Ltd
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Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP2001176499A priority Critical patent/JP5011611B2/ja
Priority to TW091112558A priority patent/TW556347B/zh
Priority to DE10225864A priority patent/DE10225864B4/de
Priority to CNB021243328A priority patent/CN1299365C/zh
Priority to US10/170,216 priority patent/US6943410B2/en
Publication of JP2002368215A publication Critical patent/JP2002368215A/ja
Application granted granted Critical
Publication of JP5011611B2 publication Critical patent/JP5011611B2/ja
Anticipated expiration legal-status Critical
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/78—Field effect transistors with field effect produced by an insulated gate
    • H01L29/7801—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
    • H01L29/7802—Vertical DMOS transistors, i.e. VDMOS transistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/0603—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions
    • H01L29/0607—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions for preventing surface leakage or controlling electric field concentration
    • H01L29/0611—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse biased devices
    • H01L29/0615—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse biased devices by the doping profile or the shape or the arrangement of the PN junction, or with supplementary regions, e.g. junction termination extension [JTE]
    • H01L29/063—Reduced surface field [RESURF] pn-junction structures
    • H01L29/0634—Multiple reduced surface field (multi-RESURF) structures, e.g. double RESURF, charge compensation, cool, superjunction (SJ), 3D-RESURF, composite buffer (CB) structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/0684—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape, relative sizes or dispositions of the semiconductor regions or junctions between the regions
    • H01L29/0692—Surface layout
    • H01L29/0696—Surface layout of cellular field-effect devices, e.g. multicellular DMOS transistors or IGBTs
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/0603—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions
    • H01L29/0607—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions for preventing surface leakage or controlling electric field concentration
    • H01L29/0611—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse biased devices
    • H01L29/0615—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse biased devices by the doping profile or the shape or the arrangement of the PN junction, or with supplementary regions, e.g. junction termination extension [JTE]
    • H01L29/0619—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse biased devices by the doping profile or the shape or the arrangement of the PN junction, or with supplementary regions, e.g. junction termination extension [JTE] with a supplementary region doped oppositely to or in rectifying contact with the semiconductor containing or contacting region, e.g. guard rings with PN or Schottky junction
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/08—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/0843—Source or drain regions of field-effect devices
    • H01L29/0847—Source or drain regions of field-effect devices of field-effect transistors with insulated gate
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40—Electrodes ; Multistep manufacturing processes therefor
    • H01L29/402—Field plates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40—Electrodes ; Multistep manufacturing processes therefor
    • H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
    • H01L29/423—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
    • H01L29/42312—Gate electrodes for field effect devices
    • H01L29/42316—Gate electrodes for field effect devices for field-effect transistors
    • H01L29/4232—Gate electrodes for field effect devices for field-effect transistors with insulated gate
    • H01L29/42372—Gate electrodes for field effect devices for field-effect transistors with insulated gate characterised by the conducting layer, e.g. the length, the sectional shape or the lay-out
    • H01L29/4238—Gate electrodes for field effect devices for field-effect transistors with insulated gate characterised by the conducting layer, e.g. the length, the sectional shape or the lay-out characterised by the surface lay-out
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

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  • Microelectronics & Electronic Packaging (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Chemical & Material Sciences (AREA)
  • Composite Materials (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
JP2001176499A 2001-06-12 2001-06-12 半導体装置 Expired - Lifetime JP5011611B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2001176499A JP5011611B2 (ja) 2001-06-12 2001-06-12 半導体装置
TW091112558A TW556347B (en) 2001-06-12 2002-06-10 Semiconductor device
DE10225864A DE10225864B4 (de) 2001-06-12 2002-06-11 Halbleiterbauteil
CNB021243328A CN1299365C (zh) 2001-06-12 2002-06-12 半导体器件
US10/170,216 US6943410B2 (en) 2001-06-12 2002-06-12 High power vertical semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001176499A JP5011611B2 (ja) 2001-06-12 2001-06-12 半導体装置

Publications (2)

Publication Number Publication Date
JP2002368215A JP2002368215A (ja) 2002-12-20
JP5011611B2 true JP5011611B2 (ja) 2012-08-29

Family

ID=19017478

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001176499A Expired - Lifetime JP5011611B2 (ja) 2001-06-12 2001-06-12 半導体装置

Country Status (5)

Country Link
US (1) US6943410B2 (zh)
JP (1) JP5011611B2 (zh)
CN (1) CN1299365C (zh)
DE (1) DE10225864B4 (zh)
TW (1) TW556347B (zh)

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US6980695B2 (en) * 2002-06-28 2005-12-27 Microsoft Corporation Rate allocation for mixed content video
US7026204B2 (en) * 2004-03-24 2006-04-11 Freescale Semiconductor, Inc. Transistor with reduced gate-to-source capacitance and method therefor
JP5114832B2 (ja) * 2004-09-02 2013-01-09 富士電機株式会社 半導体装置およびその製造方法
DE102005023668B3 (de) * 2005-05-23 2006-11-09 Infineon Technologies Ag Halbleiterbauelement mit einer Randstruktur mit Spannungsdurchbruch im linearen Bereich
RU2407107C2 (ru) * 2005-05-24 2010-12-20 Абб Швайц Аг Полупроводниковый прибор с изолированным затвором
WO2007012490A2 (de) * 2005-07-27 2007-02-01 Infineon Technologies Austria Ag Halbleiterbauelement mit einer driftzone und einer driftsteuerzone
JP4412335B2 (ja) 2007-02-23 2010-02-10 株式会社デンソー 炭化珪素半導体装置の製造方法
JP4620075B2 (ja) 2007-04-03 2011-01-26 株式会社東芝 電力用半導体素子
JP2008277353A (ja) * 2007-04-25 2008-11-13 Matsushita Electric Ind Co Ltd 半導体装置
SG183740A1 (en) * 2009-02-20 2012-09-27 Semiconductor Energy Lab Semiconductor device and manufacturing method of the same
TWI398951B (zh) * 2009-03-13 2013-06-11 Univ Feng Chia 具分離式閘極垂直型金氧半電晶體元件結構及其製造方法
DE102010063728B4 (de) * 2009-12-28 2016-04-14 Fuji Electric Co., Ltd. Halbleitervorrichtung mit verbesserter Sperrspannungsfestigkeit
JP5616665B2 (ja) 2010-03-30 2014-10-29 ローム株式会社 半導体装置
JP5218474B2 (ja) * 2010-05-27 2013-06-26 富士電機株式会社 半導体装置
CN102064094B (zh) * 2010-11-10 2012-07-18 嘉兴斯达半导体股份有限公司 大厚度氧化层场板结构及其制造方法
US8659104B2 (en) * 2010-12-21 2014-02-25 Nxp B.V. Field-effect magnetic sensor
CN102244100B (zh) * 2011-06-28 2016-01-06 上海华虹宏力半导体制造有限公司 Mos功率半导体器件
US8836029B2 (en) * 2012-02-29 2014-09-16 Smsc Holdings S.A.R.L. Transistor with minimized resistance
JP6070526B2 (ja) * 2013-12-11 2017-02-01 豊田合成株式会社 半導体装置の製造方法
JP2015146368A (ja) * 2014-02-03 2015-08-13 株式会社東芝 半導体装置
JP5878216B2 (ja) * 2014-09-12 2016-03-08 ローム株式会社 半導体装置
WO2016185544A1 (ja) * 2015-05-18 2016-11-24 株式会社日立製作所 半導体装置および電力変換装置
DE102015108440B3 (de) * 2015-05-28 2016-10-06 Infineon Technologies Ag Streifenförmige elektrodenstruktur einschliesslich eines hauptteiles mit einer feldelektrode und eines die elektrodenstruktur abschliessenden endteiles
TWI620302B (zh) * 2017-06-06 2018-04-01 旺宏電子股份有限公司 半導體結構及其操作方法
US10833151B2 (en) 2017-06-07 2020-11-10 Macronix International Co., Ltd. Semiconductor structure and operation method thereof
JP7492415B2 (ja) * 2020-09-18 2024-05-29 株式会社東芝 半導体装置
CN115117151B (zh) * 2022-08-25 2023-01-10 深圳芯能半导体技术有限公司 一种具复合元胞结构的igbt芯片及其制作方法

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Also Published As

Publication number Publication date
JP2002368215A (ja) 2002-12-20
US6943410B2 (en) 2005-09-13
DE10225864B4 (de) 2011-06-16
US20030042549A1 (en) 2003-03-06
DE10225864A1 (de) 2002-12-19
CN1391289A (zh) 2003-01-15
CN1299365C (zh) 2007-02-07
TW556347B (en) 2003-10-01

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