JP4470682B2 - トリメチルガリウムの製造方法 - Google Patents
トリメチルガリウムの製造方法 Download PDFInfo
- Publication number
- JP4470682B2 JP4470682B2 JP2004298564A JP2004298564A JP4470682B2 JP 4470682 B2 JP4470682 B2 JP 4470682B2 JP 2004298564 A JP2004298564 A JP 2004298564A JP 2004298564 A JP2004298564 A JP 2004298564A JP 4470682 B2 JP4470682 B2 JP 4470682B2
- Authority
- JP
- Japan
- Prior art keywords
- concentration
- tma
- ppm
- less
- raw material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
- C30B29/406—Gallium nitride
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F5/00—Compounds containing elements of Groups 3 or 13 of the Periodic Table
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01G—COMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F
- C01G15/00—Compounds of gallium, indium or thallium
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Inorganic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Vapour Deposition (AREA)
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004298564A JP4470682B2 (ja) | 2004-10-13 | 2004-10-13 | トリメチルガリウムの製造方法 |
| GB0520663A GB2420118B (en) | 2004-10-13 | 2005-10-11 | A trimethylgallium, a method for producing the same and a gallium nitride thin film grown from the trimethylgallium |
| US11/246,550 US20060075959A1 (en) | 2004-10-13 | 2005-10-11 | Trimethylgallium, a method for producing the same and a gallium nitride thin film grown from the trimethylgallium |
| DE102005048680A DE102005048680A1 (de) | 2004-10-13 | 2005-10-11 | Trimethylgallium, Verfahren zur Herstellung desselben und aus dem Trimethylgallium gezüchteter Galliumnitriddünnfilm |
| KR1020050096398A KR101250153B1 (ko) | 2004-10-13 | 2005-10-13 | 트리메틸갈륨, 이의 제조 방법 및 트리메틸갈륨으로부터형성된 질화갈륨 박막 |
| TW094135671A TWI363059B (en) | 2004-10-13 | 2005-10-13 | A method for producing trimethylgallium |
| CN2005101083835A CN1763049B (zh) | 2004-10-13 | 2005-10-13 | 三甲基镓的制造方法以及氮化镓薄膜的制造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004298564A JP4470682B2 (ja) | 2004-10-13 | 2004-10-13 | トリメチルガリウムの製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2006111546A JP2006111546A (ja) | 2006-04-27 |
| JP2006111546A5 JP2006111546A5 (enExample) | 2006-07-27 |
| JP4470682B2 true JP4470682B2 (ja) | 2010-06-02 |
Family
ID=35430195
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004298564A Expired - Fee Related JP4470682B2 (ja) | 2004-10-13 | 2004-10-13 | トリメチルガリウムの製造方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US20060075959A1 (enExample) |
| JP (1) | JP4470682B2 (enExample) |
| KR (1) | KR101250153B1 (enExample) |
| CN (1) | CN1763049B (enExample) |
| DE (1) | DE102005048680A1 (enExample) |
| GB (1) | GB2420118B (enExample) |
| TW (1) | TWI363059B (enExample) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008024617A (ja) | 2006-07-19 | 2008-02-07 | Ube Ind Ltd | 高純度トリアルキルアルミニウム及びその製法 |
| JP4462251B2 (ja) * | 2006-08-17 | 2010-05-12 | 日立電線株式会社 | Iii−v族窒化物系半導体基板及びiii−v族窒化物系発光素子 |
| JP2008050268A (ja) * | 2006-08-22 | 2008-03-06 | Ube Ind Ltd | 高純度トリアルキルガリウム及びその製法 |
| JP2008081451A (ja) * | 2006-09-28 | 2008-04-10 | Ube Ind Ltd | 高純度トリアルキルガリウム及びその製法 |
| JP2008263023A (ja) * | 2007-04-11 | 2008-10-30 | Sumitomo Electric Ind Ltd | Iii−v族化合物半導体の製造方法、ショットキーバリアダイオード、発光ダイオード、レーザダイオード、およびそれらの製造方法 |
| JP2008266196A (ja) * | 2007-04-19 | 2008-11-06 | Nippon Shokubai Co Ltd | ボラジン化合物の製造方法 |
| JP2009126835A (ja) * | 2007-11-27 | 2009-06-11 | Ube Ind Ltd | 高純度トリアルキルガリウム及びその製法 |
| KR100965270B1 (ko) * | 2008-07-04 | 2010-06-22 | 주식회사 한솔케미칼 | 새로운 전자 주개 리간드를 가지는 갈륨 착화합물 및 이의제조방법 |
| JP5423039B2 (ja) * | 2009-02-23 | 2014-02-19 | 宇部興産株式会社 | 高純度トリアルキルガリウム及びその製造方法 |
| JP5348186B2 (ja) * | 2011-06-16 | 2013-11-20 | 宇部興産株式会社 | 高純度トリアルキルガリウム及びその製法 |
| DE102012013941A1 (de) | 2012-07-16 | 2014-01-16 | Umicore Ag & Co. Kg | Verfahren zur Herstellung von Galliumtrialkylverbindungen |
| TWI632149B (zh) | 2011-11-28 | 2018-08-11 | 烏明克股份有限兩合公司 | 第iii a族金屬的三烷基化合物之製法 |
| KR101326554B1 (ko) * | 2012-06-22 | 2013-11-07 | 한국기초과학지원연구원 | 트리메틸갈륨(TMGa)의 재활용 방법 |
| KR101436590B1 (ko) * | 2013-05-28 | 2014-09-02 | 한국기초과학지원연구원 | 회수 TMIn 재이용방법 |
| JP5761401B2 (ja) * | 2014-02-27 | 2015-08-12 | 宇部興産株式会社 | 高純度トリアルキルガリウム及びその製法 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62132888A (ja) * | 1985-12-03 | 1987-06-16 | Sumitomo Chem Co Ltd | 有機金属化合物の精製方法 |
| US4847399A (en) * | 1987-01-23 | 1989-07-11 | Morton Thiokol, Inc. | Process for preparing or purifying Group III-A organometallic compounds |
| US5043462A (en) * | 1989-04-28 | 1991-08-27 | Messer Greisheim | Process for the production of gallium-alkyl compounds |
| TW217415B (enExample) * | 1991-11-19 | 1993-12-11 | Shell Internat Res Schappej B V | |
| US5455364A (en) * | 1993-12-14 | 1995-10-03 | Sumitomo Chemical Company, Ltd. | Process for removing an impurity in organometallic compound |
| JP3230029B2 (ja) * | 1994-05-30 | 2001-11-19 | 富士通株式会社 | Iii−v族化合物半導体結晶成長方法 |
| JP2927685B2 (ja) * | 1994-08-19 | 1999-07-28 | 信越化学工業株式会社 | 有機金属化合物の精製方法 |
| MY112590A (en) * | 1994-09-02 | 2001-07-31 | Sec Dep For Defence Acting Through His Defence Evaluation And Research Agency United Kingdom | Semi-conductor devices and their production |
| GB2344822A (en) * | 1998-12-19 | 2000-06-21 | Epichem Ltd | Organometallic compound production using distillation |
| WO2000071551A2 (en) * | 1999-05-21 | 2000-11-30 | Akzo Nobel N.V. | Purification of an organometallic compound by recrystallization |
| TW574762B (en) * | 2002-10-16 | 2004-02-01 | Univ Nat Cheng Kung | Method for growing monocrystal GaN on silicon substrate |
| JP4488186B2 (ja) * | 2004-06-18 | 2010-06-23 | 信越化学工業株式会社 | トリメチルアルミニウムの精製方法 |
| JP2006001896A (ja) * | 2004-06-18 | 2006-01-05 | Shin Etsu Chem Co Ltd | 高純度トリメチルアルミニウム及びトリメチルアルミニウムの精製方法 |
-
2004
- 2004-10-13 JP JP2004298564A patent/JP4470682B2/ja not_active Expired - Fee Related
-
2005
- 2005-10-11 DE DE102005048680A patent/DE102005048680A1/de not_active Withdrawn
- 2005-10-11 GB GB0520663A patent/GB2420118B/en not_active Expired - Fee Related
- 2005-10-11 US US11/246,550 patent/US20060075959A1/en not_active Abandoned
- 2005-10-13 TW TW094135671A patent/TWI363059B/zh not_active IP Right Cessation
- 2005-10-13 KR KR1020050096398A patent/KR101250153B1/ko not_active Expired - Fee Related
- 2005-10-13 CN CN2005101083835A patent/CN1763049B/zh not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| GB0520663D0 (en) | 2005-11-16 |
| US20060075959A1 (en) | 2006-04-13 |
| DE102005048680A1 (de) | 2006-04-20 |
| TWI363059B (en) | 2012-05-01 |
| TW200611908A (en) | 2006-04-16 |
| GB2420118B (en) | 2006-12-13 |
| CN1763049A (zh) | 2006-04-26 |
| KR101250153B1 (ko) | 2013-04-04 |
| KR20060053239A (ko) | 2006-05-19 |
| GB2420118A (en) | 2006-05-17 |
| CN1763049B (zh) | 2011-12-14 |
| JP2006111546A (ja) | 2006-04-27 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP4470682B2 (ja) | トリメチルガリウムの製造方法 | |
| KR101753936B1 (ko) | GaN 결정 자립 기판 및 그 제조 방법 | |
| EP1903618B1 (en) | Method for producing trialkyl gallium | |
| JP2007534580A (ja) | 半絶縁性GaNおよびその製造方法 | |
| CN1896344A (zh) | 往氮化镓结晶掺杂氧的方法和掺杂氧的n型氮化镓单晶基板 | |
| JP4733882B2 (ja) | 炭化珪素単結晶及びその製造方法並びに炭化珪素単結晶育成用炭化珪素結晶原料 | |
| KR20030063174A (ko) | 유기 인듐 화합물 | |
| US7843040B2 (en) | Gallium nitride baseplate and epitaxial substrate | |
| EP1001049A1 (en) | Process for purification of organometallic compounds | |
| CN112028920B (zh) | 一种非极性溶剂合成高纯度三甲基铝的方法 | |
| KR102826740B1 (ko) | GaN 기판 웨이퍼 및 그 제조 방법 | |
| CN113461717B (zh) | 有机镁化合物及电子器件 | |
| TWI333954B (enExample) | ||
| JP2002234721A (ja) | トリクロロシランの精製方法 | |
| US20080203409A1 (en) | PROCESS FOR PRODUCING (Al, Ga)N CRYSTALS | |
| JP3912436B2 (ja) | 高純度モノアルキルホスフィンおよびその製造方法 | |
| KR100821360B1 (ko) | 탄화규소 단결정, 탄화규소 단결정 웨이퍼 및 그것의 제조 방법 | |
| Shenai et al. | Correlation of film properties and reduced impurity concentrations in sources for III/V-MOVPE using high-purity trimethylindium and tertiarybutylphosphine | |
| EP2051286B1 (en) | Reactor and method for nitride-based semiconductor manufacturing | |
| JP5842687B2 (ja) | コバルト膜形成用原料及び当該原料を用いたコバルト含有薄膜の製造方法 | |
| JP2006265168A (ja) | トリアルキルガリウムの製造方法 | |
| Smith et al. | Low oxygen content trimethylaluminium and trimethylindium for MOVPE of light emitting devices | |
| JP2006265166A (ja) | トリアルキルガリウムの製造方法 | |
| WO1993010124A1 (en) | Process for the preparation of di-alkyl compounds of group 2b metals | |
| JP4774772B2 (ja) | トリアルキルガリウムの製造方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20060612 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20060612 |
|
| RD05 | Notification of revocation of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7425 Effective date: 20080131 |
|
| RD05 | Notification of revocation of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7425 Effective date: 20080514 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20090616 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20090812 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20100209 |
|
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20100222 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130312 Year of fee payment: 3 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130312 Year of fee payment: 3 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130312 Year of fee payment: 3 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20140312 Year of fee payment: 4 |
|
| LAPS | Cancellation because of no payment of annual fees |