JP4246177B2 - オフセット補正回路およびオペアンプ回路 - Google Patents
オフセット補正回路およびオペアンプ回路 Download PDFInfo
- Publication number
- JP4246177B2 JP4246177B2 JP2005133212A JP2005133212A JP4246177B2 JP 4246177 B2 JP4246177 B2 JP 4246177B2 JP 2005133212 A JP2005133212 A JP 2005133212A JP 2005133212 A JP2005133212 A JP 2005133212A JP 4246177 B2 JP4246177 B2 JP 4246177B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- operational amplifier
- offset
- input terminal
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012937 correction Methods 0.000 title claims description 165
- 238000006243 chemical reaction Methods 0.000 claims description 23
- 230000003068 static effect Effects 0.000 claims description 6
- 239000003990 capacitor Substances 0.000 description 25
- 229920006395 saturated elastomer Polymers 0.000 description 15
- 239000004973 liquid crystal related substance Substances 0.000 description 14
- 238000000034 method Methods 0.000 description 12
- 238000010586 diagram Methods 0.000 description 10
- 230000000694 effects Effects 0.000 description 10
- 101150093547 AUX1 gene Proteins 0.000 description 6
- 101100125299 Agrobacterium rhizogenes aux2 gene Proteins 0.000 description 6
- 101100367246 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) SWA2 gene Proteins 0.000 description 6
- 238000005070 sampling Methods 0.000 description 6
- 101100317273 Caenorhabditis elegans ddl-1 gene Proteins 0.000 description 5
- 101100540711 Caenorhabditis elegans ddl-2 gene Proteins 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 4
- 230000004044 response Effects 0.000 description 3
- 101100041125 Arabidopsis thaliana RST1 gene Proteins 0.000 description 2
- 101100443250 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) DIG1 gene Proteins 0.000 description 2
- 101100443251 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) DIG2 gene Proteins 0.000 description 2
- 101100041128 Schizosaccharomyces pombe (strain 972 / ATCC 24843) rst2 gene Proteins 0.000 description 2
- 238000013459 approach Methods 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 230000003071 parasitic effect Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 101100218322 Arabidopsis thaliana ATXR3 gene Proteins 0.000 description 1
- 101100043929 Arabidopsis thaliana SUVH2 gene Proteins 0.000 description 1
- 101100043931 Chlamydomonas reinhardtii SUVH3 gene Proteins 0.000 description 1
- 102100033553 Delta-like protein 4 Human genes 0.000 description 1
- 102100029768 Histone-lysine N-methyltransferase SETD1A Human genes 0.000 description 1
- 102100032742 Histone-lysine N-methyltransferase SETD2 Human genes 0.000 description 1
- 101000872077 Homo sapiens Delta-like protein 4 Proteins 0.000 description 1
- 101000865038 Homo sapiens Histone-lysine N-methyltransferase SETD1A Proteins 0.000 description 1
- 101100149326 Homo sapiens SETD2 gene Proteins 0.000 description 1
- LZHSWRWIMQRTOP-UHFFFAOYSA-N N-(furan-2-ylmethyl)-3-[4-[methyl(propyl)amino]-6-(trifluoromethyl)pyrimidin-2-yl]sulfanylpropanamide Chemical group CCCN(C)C1=NC(=NC(=C1)C(F)(F)F)SCCC(=O)NCC2=CC=CO2 LZHSWRWIMQRTOP-UHFFFAOYSA-N 0.000 description 1
- 101100533304 Plasmodium falciparum (isolate 3D7) SETVS gene Proteins 0.000 description 1
- 101150057295 SET3 gene Proteins 0.000 description 1
- 101150117538 Set2 gene Proteins 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000006386 memory function Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/34—DC amplifiers in which all stages are DC-coupled
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/45179—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using MOSFET transistors as the active amplifying circuit
- H03F3/45183—Long tailed pairs
- H03F3/45192—Folded cascode stages
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
- H03F3/45928—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45058—Indexing scheme relating to differential amplifiers the cascode stage of the differential amplifier comprising a reactive element
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45101—Control of the DC level being present
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45588—Indexing scheme relating to differential amplifiers the IC comprising offset compensating means
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45616—Indexing scheme relating to differential amplifiers the IC comprising more than one switch, which are not cross coupled
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45634—Indexing scheme relating to differential amplifiers the LC comprising one or more switched capacitors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45681—Indexing scheme relating to differential amplifiers the LC comprising offset compensating means
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45726—Indexing scheme relating to differential amplifiers the LC comprising more than one switch, which are not cross coupled
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Amplifiers (AREA)
- Analogue/Digital Conversion (AREA)
- Manipulation Of Pulses (AREA)
Description
1a オペアンプ
2、12、22 オフセット補正回路
2a 制御回路
12a、22a DA変換回路(制御回路)
S1、S2 スイッチ素子
DL、DL(n−1)〜DL0、DDL3〜DDL0
ラッチ回路
Claims (9)
- 出力から入力へのフィードバックをかけない状態で非反転入力端子と反転入力端子とを短絡した時のオペアンプの出力電圧を、2値の論理信号に変換して記憶し、記憶された前記論理信号は、DA変換回路によりデジタル−アナログ変換され、前記論理信号を用いて前記出力電圧のオフセットを補正することを特徴とするオフセット補正回路。
- 前記論理信号は、重み付けされたオフセット補正量で量子化された論理値からなることを特徴とする請求項1に記載のオフセット補正回路。
- オフセット調整入力端子を備えたオペアンプと、
前記オペアンプの非反転入力端子と反転入力端子とを短絡するための第1のスイッチ素子と、
逆相入力信号から前記オペアンプの前記反転入力端子を開放するための第2のスイッチ素子と、
前記オペアンプの出力電圧を、重み付けされたオフセット補正量で量子化された論理値からなる2値の論理信号とみなしてラッチする1つ以上のラッチ回路と、
前記ラッチ回路でラッチされた前記論理信号を記憶する記憶回路と、
前記記憶回路に記憶された前記論理信号に対応して前記オペアンプのオフセット補正用信号を生成して前記オフセット調整入力端子に入力する制御回路とを備え、
前記出力電圧のオフセットを補正し、
前記ラッチ回路を複数備え、
前記論理信号は前記ラッチ回路の数に等しいビット数で表されるとともに各ビットが前記論理値のいずれかを示し、
前記制御回路は、前記論理信号をデジタル−アナログ変換するDA変換回路であることを特徴とするオペアンプ回路。 - 前記ラッチ回路はスタティックな論理回路で構成されることを特徴とする請求項3に記載のオペアンプ回路。
- 前記ラッチ回路でラッチされる前記論理信号が、前記出力電圧とは独立に設定可能であることを特徴とする請求項3に記載のオペアンプ回路。
- 前記記憶回路は、前記ラッチ回路と前記制御回路との全体で構成される回路の一部であることを特徴とする請求項3に記載のオペアンプ回路。
- 前記論理信号は、上位ビットから下位ビットへとバイナリに重み付けされていることを特徴とする請求項3に記載のオペアンプ回路。
- 最上位ビットに対応する前記ラッチ回路から最下位ビットに対応する前記ラッチ回路まで順番に前記出力電圧をラッチし、
最上位より下位のビットにおける各ラッチにおいては、より上位のビットに対して確定した前記論理値で前記出力電圧のオフセットを補正した状態で、前記論理値を決定することを特徴とする請求項7に記載のオペアンプ回路。 - 前記オペアンプは位相補償用の回路素子を備え、前記回路素子を前記オペアンプを含む前記回路から開放するためのスイッチ素子を備えていることを特徴とする請求項1または8に記載のオペアンプ回路。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005133212A JP4246177B2 (ja) | 2005-04-28 | 2005-04-28 | オフセット補正回路およびオペアンプ回路 |
TW095114712A TWI325683B (en) | 2005-04-28 | 2006-04-25 | Offset adjusting circuit and operational amplifier circuit |
US11/411,106 US7459966B2 (en) | 2005-04-28 | 2006-04-26 | Offset adjusting circuit and operational amplifier circuit |
KR1020060038048A KR100842972B1 (ko) | 2005-04-28 | 2006-04-27 | 오프셋 보정 회로, 오피 앰프 회로 및 오프셋 보정 방법 |
CN200610077220A CN100576726C (zh) | 2005-04-28 | 2006-04-28 | 失调校正电路和运算放大器电路 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005133212A JP4246177B2 (ja) | 2005-04-28 | 2005-04-28 | オフセット補正回路およびオペアンプ回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006311350A JP2006311350A (ja) | 2006-11-09 |
JP4246177B2 true JP4246177B2 (ja) | 2009-04-02 |
Family
ID=37195614
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005133212A Expired - Fee Related JP4246177B2 (ja) | 2005-04-28 | 2005-04-28 | オフセット補正回路およびオペアンプ回路 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7459966B2 (ja) |
JP (1) | JP4246177B2 (ja) |
KR (1) | KR100842972B1 (ja) |
CN (1) | CN100576726C (ja) |
TW (1) | TWI325683B (ja) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100698332B1 (ko) * | 2005-02-04 | 2007-03-23 | 삼성전자주식회사 | 이득제어 증폭기 |
FR2895599B1 (fr) * | 2005-12-27 | 2008-06-06 | Univ Joseph Fourier Grenoble I | Procede et dispositif de reglage ou de calage d'un dispositif electronique |
JP4234159B2 (ja) * | 2006-08-04 | 2009-03-04 | シャープ株式会社 | オフセット補正装置、半導体装置および表示装置ならびにオフセット補正方法 |
JP5508662B2 (ja) | 2007-01-12 | 2014-06-04 | 株式会社半導体エネルギー研究所 | 表示装置 |
JP4580950B2 (ja) * | 2007-03-14 | 2010-11-17 | 株式会社東芝 | 半導体集積回路 |
JP4941894B2 (ja) * | 2007-03-30 | 2012-05-30 | 日本電気株式会社 | オフセットキャンセル回路、及びオフセットキャンセル方法 |
US7624310B2 (en) | 2007-07-11 | 2009-11-24 | Micron Technology, Inc. | System and method for initializing a memory system, and memory device and processor-based system using same |
US20090146722A1 (en) * | 2007-12-10 | 2009-06-11 | International Business Machines Corporation | Systems and Arrangements to Provide Input Offset Voltage Compensation |
US7965139B1 (en) * | 2010-03-05 | 2011-06-21 | Texas Instruments Incorporated | Amplifier offset and noise reduction in a multistage system |
TWI425861B (zh) * | 2010-04-13 | 2014-02-01 | Leadtrend Tech Corp | 校準裝置、方法及其多通道驅動電路及電流平衡方法 |
CN101951244B (zh) * | 2010-09-30 | 2012-04-25 | 上海贝岭股份有限公司 | 一种失调消除的采样保持电路 |
CA2820113C (en) | 2010-12-10 | 2019-12-03 | Cargill, Incorporated | Improved starch composition for use in paper manufacture |
JP5624493B2 (ja) | 2011-02-16 | 2014-11-12 | キヤノン株式会社 | 差動増幅装置 |
CN102645943B (zh) * | 2012-04-24 | 2015-09-09 | 华为技术有限公司 | 随机误差电压处理电路和运放器件 |
CN104467761B (zh) * | 2014-11-10 | 2017-02-15 | 西安交通大学 | 双沿超前校正增强比较器及其有源全桥整流器 |
CN104539245A (zh) * | 2014-11-11 | 2015-04-22 | 深圳市华星光电技术有限公司 | 一种运算放大器的自调零电路 |
JP2017123534A (ja) | 2016-01-06 | 2017-07-13 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
US10033331B1 (en) * | 2016-12-29 | 2018-07-24 | Texas Instruments Incorporated | Op-amp IC chip |
KR20180090731A (ko) * | 2017-02-03 | 2018-08-13 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치, 표시 패널, 표시 장치, 입출력 장치, 정보 처리 장치 |
CN106953601B (zh) * | 2017-03-22 | 2020-07-10 | 湘潭大学 | 可变带宽低失调运算放大器 |
CN107342740B (zh) * | 2017-06-15 | 2020-07-07 | 西安华泰半导体科技有限公司 | 一种通过逐次逼近方式校正运放失调的电路 |
CN113849032B (zh) * | 2021-08-20 | 2023-03-14 | 芯海科技(深圳)股份有限公司 | 失调电压校正电路、集成电路、系统及方法 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5676613A (en) * | 1979-11-29 | 1981-06-24 | Toshiba Corp | Automatic offset calibrating circuit for operational amplifier |
JPS60142613A (ja) | 1983-12-28 | 1985-07-27 | Fujitsu Ltd | 波形整形回路 |
JPS62247611A (ja) | 1986-04-20 | 1987-10-28 | Asahi Kasei Micro Syst Kk | オフセツト補償演算増幅回路 |
JPH04274605A (ja) | 1991-02-28 | 1992-09-30 | Nec Corp | オペアンプ回路 |
JP2857949B2 (ja) | 1991-11-01 | 1999-02-17 | 株式会社デンソー | 差動増幅器のオフセット電圧補償回路 |
JPH06232706A (ja) | 1993-02-05 | 1994-08-19 | Nec Corp | 比較器 |
US5397944A (en) * | 1993-04-09 | 1995-03-14 | Crystal Semiconductor Corporation | Dense offset calibration circuitry and method |
JP2666677B2 (ja) | 1993-05-06 | 1997-10-22 | 日本電気株式会社 | 半導体icチップ内蔵用のデータアンプ |
JPH09148930A (ja) | 1995-11-28 | 1997-06-06 | Matsushita Electric Ind Co Ltd | オペアンプのオフセット電圧補正回路 |
JPH10145194A (ja) * | 1996-11-13 | 1998-05-29 | Sharp Corp | 電圧比較器 |
KR19990017139A (ko) | 1997-08-21 | 1999-03-15 | 윤종용 | 차동 증폭기의 직류 오프셋 조정장치 및 방법 |
KR20010048965A (ko) | 1999-11-30 | 2001-06-15 | 윤종용 | 오프셋 전압 제거 기능을 갖는 연산 증폭기 |
KR100357319B1 (ko) | 2000-05-17 | 2002-10-19 | 주식회사 실리콘웍스 | 버퍼 증폭기 및 그 구동방법 |
US6459335B1 (en) * | 2000-09-29 | 2002-10-01 | Microchip Technology Incorporated | Auto-calibration circuit to minimize input offset voltage in an integrated circuit analog input device |
US6762643B2 (en) | 2001-04-11 | 2004-07-13 | Koninklijke Philips Electronics N.V. | High duty cycle offset compensation for operational amplifiers |
SE521575C2 (sv) * | 2002-03-25 | 2003-11-11 | Ericsson Telefon Ab L M | Kalibrering av A/D omvandlare |
JP4290466B2 (ja) * | 2003-04-24 | 2009-07-08 | パナソニック株式会社 | オフセット補償装置 |
-
2005
- 2005-04-28 JP JP2005133212A patent/JP4246177B2/ja not_active Expired - Fee Related
-
2006
- 2006-04-25 TW TW095114712A patent/TWI325683B/zh not_active IP Right Cessation
- 2006-04-26 US US11/411,106 patent/US7459966B2/en not_active Expired - Fee Related
- 2006-04-27 KR KR1020060038048A patent/KR100842972B1/ko not_active IP Right Cessation
- 2006-04-28 CN CN200610077220A patent/CN100576726C/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
TW200711291A (en) | 2007-03-16 |
KR20060113489A (ko) | 2006-11-02 |
CN100576726C (zh) | 2009-12-30 |
CN1855702A (zh) | 2006-11-01 |
KR100842972B1 (ko) | 2008-07-01 |
US7459966B2 (en) | 2008-12-02 |
TWI325683B (en) | 2010-06-01 |
US20060255855A1 (en) | 2006-11-16 |
JP2006311350A (ja) | 2006-11-09 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4246177B2 (ja) | オフセット補正回路およびオペアンプ回路 | |
JP4234159B2 (ja) | オフセット補正装置、半導体装置および表示装置ならびにオフセット補正方法 | |
US6480178B1 (en) | Amplifier circuit and liquid-crystal display unit using the same | |
US7443234B2 (en) | Differential amplifier, digital-to-analog converter and display device | |
JP4556824B2 (ja) | 差動増幅器とデジタル・アナログ変換器、並びに表示装置 | |
JP4821364B2 (ja) | オフセットキャンセルアンプ及びそれを用いた表示装置、並びにオフセットキャンセルアンプの制御方法 | |
JP4291100B2 (ja) | 差動増幅回路及びそれを用いた液晶表示装置の駆動回路 | |
US7551111B2 (en) | Decoder circuit, driving circuit for display apparatus and display apparatus | |
US6897726B2 (en) | Differential circuit, amplifier circuit, and display device using the amplifier circuit | |
US7482845B2 (en) | Output buffer circuit | |
US11538432B2 (en) | Output buffer increasing slew rate of output signal voltage without increasing current consumption | |
KR102702998B1 (ko) | 오프셋 교정을 제공하는 비교기 및 이를 포함하는 집적 회로 | |
WO2016203525A1 (ja) | 半導体装置 | |
Lu | A rail-to-rail class-AB amplifier with an offset cancellation for LCD drivers | |
Yan et al. | Constant-g/sub m/techniques for rail-to-rail CMOS amplifier input stages: a comparative study | |
US7898337B2 (en) | High slew rate amplifier, analog-to-digital converter using same, CMOS imager using the analog-to-digital converter and related methods | |
JP2014171114A (ja) | レベル変換回路、多値出力型差動増幅器及び表示装置 | |
JP2004180268A (ja) | 増幅回路及びこれを用いた液晶ディスプレイ装置 | |
JP3803649B2 (ja) | D/a変換器 | |
JP2006121307A (ja) | サンプルホールド回路又はそれを用いたad変換器 | |
CN115953988A (zh) | 液晶显示装置、显示驱动放大电路及显示驱动放大方法 | |
Woo et al. | 58.4: 10‐Bit Column Driver with Split‐DAC Architecture |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20080604 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20080708 |
|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20080908 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20090106 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20090107 |
|
R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120116 Year of fee payment: 3 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130116 Year of fee payment: 4 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130116 Year of fee payment: 4 |
|
LAPS | Cancellation because of no payment of annual fees |