DE60227651D1 - Offsetspannungskompensation mit hohem tastverhältnis für operationsverstärker - Google Patents

Offsetspannungskompensation mit hohem tastverhältnis für operationsverstärker

Info

Publication number
DE60227651D1
DE60227651D1 DE60227651T DE60227651T DE60227651D1 DE 60227651 D1 DE60227651 D1 DE 60227651D1 DE 60227651 T DE60227651 T DE 60227651T DE 60227651 T DE60227651 T DE 60227651T DE 60227651 D1 DE60227651 D1 DE 60227651D1
Authority
DE
Germany
Prior art keywords
input
output
amplifier stage
comparator
high efficiency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60227651T
Other languages
English (en)
Inventor
Andrea Milanesi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Entropic Communications LLC
Original Assignee
NXP BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NXP BV filed Critical NXP BV
Application granted granted Critical
Publication of DE60227651D1 publication Critical patent/DE60227651D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/181—Low-frequency amplifiers, e.g. audio preamplifiers
    • H03F3/183—Low-frequency amplifiers, e.g. audio preamplifiers with semiconductor devices only
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
    • H03F3/45928—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit
    • H03F3/45968—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit by offset reduction
    • H03F3/45973—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit by offset reduction by using a feedback circuit
    • H03F3/45977—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit by offset reduction by using a feedback circuit using switching means, e.g. sample and hold
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/45179—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using MOSFET transistors as the active amplifying circuit
    • H03F3/45183—Long tailed pairs
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
    • H03F3/45632—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit
    • H03F3/45744—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit by offset reduction
    • H03F3/45748—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit by offset reduction by using a feedback circuit
    • H03F3/45753—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit by offset reduction by using a feedback circuit using switching means, e.g. sample and hold

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Multimedia (AREA)
  • Amplifiers (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
DE60227651T 2001-04-11 2002-04-08 Offsetspannungskompensation mit hohem tastverhältnis für operationsverstärker Expired - Lifetime DE60227651D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP01109017 2001-04-11
PCT/IB2002/001251 WO2002084862A1 (en) 2001-04-11 2002-04-08 High duty cycle offset compensation for operational amplifiers

Publications (1)

Publication Number Publication Date
DE60227651D1 true DE60227651D1 (de) 2008-08-28

Family

ID=8177114

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60227651T Expired - Lifetime DE60227651D1 (de) 2001-04-11 2002-04-08 Offsetspannungskompensation mit hohem tastverhältnis für operationsverstärker

Country Status (8)

Country Link
US (1) US6762643B2 (de)
EP (1) EP1380102B1 (de)
JP (1) JP4319413B2 (de)
KR (1) KR100867079B1 (de)
CN (1) CN100353662C (de)
AT (1) ATE401694T1 (de)
DE (1) DE60227651D1 (de)
WO (1) WO2002084862A1 (de)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE526651C2 (sv) * 2003-12-18 2005-10-18 Pergo Europ Ab Fog för panel innefattande på ovansidan anordnad fogprofil med snäpptungor
US6967515B2 (en) * 2004-03-24 2005-11-22 Intel Corporation Single-ended to differential conversion circuit with duty cycle correction
US7508228B2 (en) * 2004-12-21 2009-03-24 Teradyne, Inc. Method and system for monitoring test signals for semiconductor devices
JP4246177B2 (ja) 2005-04-28 2009-04-02 シャープ株式会社 オフセット補正回路およびオペアンプ回路
KR100614661B1 (ko) * 2005-06-07 2006-08-22 삼성전자주식회사 액정 표시 장치의 소스 드라이버 출력 회로 및 데이터 라인구동방법
JP2007116493A (ja) * 2005-10-21 2007-05-10 Oki Electric Ind Co Ltd オフセットキャンセル装置
KR100681879B1 (ko) 2006-01-16 2007-02-15 주식회사 하이닉스반도체 온-다이 터미네이션 제어 장치
CN103065686B (zh) * 2006-03-21 2016-09-14 剑桥模拟技术有限公司 采样数据电路的偏移消除
US8305131B2 (en) 2006-03-21 2012-11-06 Maxim Integrated, Inc. Passive offset and overshoot cancellation for sampled-data circuits
KR101243814B1 (ko) * 2006-06-30 2013-03-18 엘지디스플레이 주식회사 출력 버퍼 및 그 구동 방법과 그를 이용한 표시장치
JP4234159B2 (ja) 2006-08-04 2009-03-04 シャープ株式会社 オフセット補正装置、半導体装置および表示装置ならびにオフセット補正方法
US8655052B2 (en) * 2007-01-26 2014-02-18 Intellectual Discovery Co., Ltd. Methodology for 3D scene reconstruction from 2D image sequences
KR100856126B1 (ko) * 2007-05-22 2008-09-03 삼성전자주식회사 퓨즈 메탈을 이용한 연산 증폭기의 오프셋 보상 방법 및 그장치
ES2345697B1 (es) 2007-12-31 2011-09-28 Jose Luis Gonzalez Palacio Fenech Dispositivo para el desmoldeo de negativos en inyeccion de plastico.
JP5172434B2 (ja) * 2008-04-01 2013-03-27 ラピスセミコンダクタ株式会社 表示用駆動装置、及び駆動回路のレイアウト方法
US8350597B2 (en) * 2008-10-15 2013-01-08 Nxp B.V. Low voltage self calibrated CMOS peak detector
US7880514B2 (en) * 2009-01-08 2011-02-01 Himax Technologies Limited Output buffer with high driving ability
US8476935B2 (en) 2009-07-02 2013-07-02 Robert Bosch Gmbh Comparator with self-limiting positive feedback
US7965139B1 (en) * 2010-03-05 2011-06-21 Texas Instruments Incorporated Amplifier offset and noise reduction in a multistage system
TWI456892B (zh) * 2011-06-02 2014-10-11 Fitipower Integrated Tech Inc 負回授電路及其可靠度提高方法以及應用該負回授電路的源極驅動器及其控制方法
US9088256B2 (en) * 2012-08-08 2015-07-21 Analog Devices, Inc. Apparatus and methods for amplifier fault protection
KR102066604B1 (ko) 2012-12-26 2020-02-11 에스케이하이닉스 주식회사 비교기 회로 및 신호 비교 방법
KR101506579B1 (ko) 2013-05-09 2015-03-27 (주)비엔씨넷 안정된 바이어스를 유지하는 클래스 ab 앰프
US9602104B2 (en) * 2015-03-10 2017-03-21 Sitronix Technology Corp. Output buffer with offset cancellation structure and offset cancellation method using the same
US10938353B2 (en) 2019-03-26 2021-03-02 Analog Devices International Unlimited Company Coulomb counter with offset calibration
US10796665B1 (en) * 2019-05-07 2020-10-06 Novatek Microelectronics Corp. Control apparatus for driving display panel and method thereof
US11747371B2 (en) * 2020-08-28 2023-09-05 Intel Corporation Self-calibrated input voltage-agnostic replica-biased current sensing apparatus

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4322687A (en) * 1980-05-19 1982-03-30 Bell Telephone Laboratories, Incorporated Operational amplifier with improved offset correction
US4781437A (en) 1987-12-21 1988-11-01 Hughes Aircraft Company Display line driver with automatic uniformity compensation
US4883987A (en) * 1988-05-04 1989-11-28 Texas Instruments Incorporated Comparator circuit having a fast recovery time
US5397944A (en) * 1993-04-09 1995-03-14 Crystal Semiconductor Corporation Dense offset calibration circuitry and method
US5392000A (en) * 1993-11-09 1995-02-21 Motorola, Inc. Apparatus and method for frequency compensating an operational amplifier
US5600275A (en) * 1994-04-29 1997-02-04 Analog Devices, Inc. Low-voltage CMOS comparator with offset cancellation
FI97655C (fi) * 1995-04-05 1997-01-27 Nokia Telecommunications Oy Offset-kompensoitu lineaarinen RF-ilmaisin
JP3209690B2 (ja) * 1996-11-15 2001-09-17 株式会社東芝 ビーム光走査装置および画像形成装置
US5793230A (en) * 1997-02-26 1998-08-11 Sandia Corporation Sensor readout detector circuit
WO1999019983A1 (en) 1997-10-15 1999-04-22 Maxim Integrated Products, Inc. Single supply voltage to frequency converter optimized for low voltage sensing above and below ground
US6429697B1 (en) * 1999-10-05 2002-08-06 Analog Devices, Inc. Multi-stage, low-offset, fast-recovery, comparator system and method
US6507241B1 (en) * 2000-10-03 2003-01-14 International Business Machines Corporation Method and circuit for automatically correcting offset voltage

Also Published As

Publication number Publication date
KR20030014701A (ko) 2003-02-19
US20030164730A1 (en) 2003-09-04
US6762643B2 (en) 2004-07-13
CN100353662C (zh) 2007-12-05
EP1380102B1 (de) 2008-07-16
EP1380102A1 (de) 2004-01-14
CN1461521A (zh) 2003-12-10
KR100867079B1 (ko) 2008-11-04
ATE401694T1 (de) 2008-08-15
JP2004519969A (ja) 2004-07-02
JP4319413B2 (ja) 2009-08-26
WO2002084862A1 (en) 2002-10-24

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