ATE401694T1 - Offsetspannungskompensation mit hohem tastverhältnis für operationsverstärker - Google Patents
Offsetspannungskompensation mit hohem tastverhältnis für operationsverstärkerInfo
- Publication number
- ATE401694T1 ATE401694T1 AT02718475T AT02718475T ATE401694T1 AT E401694 T1 ATE401694 T1 AT E401694T1 AT 02718475 T AT02718475 T AT 02718475T AT 02718475 T AT02718475 T AT 02718475T AT E401694 T1 ATE401694 T1 AT E401694T1
- Authority
- AT
- Austria
- Prior art keywords
- input
- output
- amplifier stage
- comparator
- operational amplifier
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/181—Low frequency amplifiers, e.g. audio preamplifiers
- H03F3/183—Low frequency amplifiers, e.g. audio preamplifiers with semiconductor devices only
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
- H03F3/45928—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit
- H03F3/45968—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit by offset reduction
- H03F3/45973—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit by offset reduction by using a feedback circuit
- H03F3/45977—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit by offset reduction by using a feedback circuit using switching means, e.g. sample and hold
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/45179—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using MOSFET transistors as the active amplifying circuit
- H03F3/45183—Long tailed pairs
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
- H03F3/45632—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit
- H03F3/45744—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit by offset reduction
- H03F3/45748—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit by offset reduction by using a feedback circuit
- H03F3/45753—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit by offset reduction by using a feedback circuit using switching means, e.g. sample and hold
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP01109017 | 2001-04-11 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE401694T1 true ATE401694T1 (de) | 2008-08-15 |
Family
ID=8177114
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT02718475T ATE401694T1 (de) | 2001-04-11 | 2002-04-08 | Offsetspannungskompensation mit hohem tastverhältnis für operationsverstärker |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US6762643B2 (de) |
| EP (1) | EP1380102B1 (de) |
| JP (1) | JP4319413B2 (de) |
| KR (1) | KR100867079B1 (de) |
| CN (1) | CN100353662C (de) |
| AT (1) | ATE401694T1 (de) |
| DE (1) | DE60227651D1 (de) |
| WO (1) | WO2002084862A1 (de) |
Families Citing this family (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SE526651C2 (sv) * | 2003-12-18 | 2005-10-18 | Pergo Europ Ab | Fog för panel innefattande på ovansidan anordnad fogprofil med snäpptungor |
| US6967515B2 (en) * | 2004-03-24 | 2005-11-22 | Intel Corporation | Single-ended to differential conversion circuit with duty cycle correction |
| US7508228B2 (en) * | 2004-12-21 | 2009-03-24 | Teradyne, Inc. | Method and system for monitoring test signals for semiconductor devices |
| JP4246177B2 (ja) | 2005-04-28 | 2009-04-02 | シャープ株式会社 | オフセット補正回路およびオペアンプ回路 |
| KR100614661B1 (ko) * | 2005-06-07 | 2006-08-22 | 삼성전자주식회사 | 액정 표시 장치의 소스 드라이버 출력 회로 및 데이터 라인구동방법 |
| JP2007116493A (ja) * | 2005-10-21 | 2007-05-10 | Oki Electric Ind Co Ltd | オフセットキャンセル装置 |
| KR100681879B1 (ko) | 2006-01-16 | 2007-02-15 | 주식회사 하이닉스반도체 | 온-다이 터미네이션 제어 장치 |
| US8305131B2 (en) | 2006-03-21 | 2012-11-06 | Maxim Integrated, Inc. | Passive offset and overshoot cancellation for sampled-data circuits |
| US7843233B2 (en) * | 2006-03-21 | 2010-11-30 | Cambridge Analog Technologies, Inc. | Offset cancellation for sampled-data circuits |
| KR101243814B1 (ko) * | 2006-06-30 | 2013-03-18 | 엘지디스플레이 주식회사 | 출력 버퍼 및 그 구동 방법과 그를 이용한 표시장치 |
| JP4234159B2 (ja) | 2006-08-04 | 2009-03-04 | シャープ株式会社 | オフセット補正装置、半導体装置および表示装置ならびにオフセット補正方法 |
| US8655052B2 (en) * | 2007-01-26 | 2014-02-18 | Intellectual Discovery Co., Ltd. | Methodology for 3D scene reconstruction from 2D image sequences |
| KR100856126B1 (ko) * | 2007-05-22 | 2008-09-03 | 삼성전자주식회사 | 퓨즈 메탈을 이용한 연산 증폭기의 오프셋 보상 방법 및 그장치 |
| ES2345697B1 (es) | 2007-12-31 | 2011-09-28 | Jose Luis Gonzalez Palacio Fenech | Dispositivo para el desmoldeo de negativos en inyeccion de plastico. |
| JP5172434B2 (ja) * | 2008-04-01 | 2013-03-27 | ラピスセミコンダクタ株式会社 | 表示用駆動装置、及び駆動回路のレイアウト方法 |
| EP2338226B1 (de) * | 2008-10-15 | 2015-01-21 | Nxp B.V. | Selbstkalibrierter niederspannungs-cmos-spitzendetektor |
| US7880514B2 (en) * | 2009-01-08 | 2011-02-01 | Himax Technologies Limited | Output buffer with high driving ability |
| US8476935B2 (en) | 2009-07-02 | 2013-07-02 | Robert Bosch Gmbh | Comparator with self-limiting positive feedback |
| US7965139B1 (en) * | 2010-03-05 | 2011-06-21 | Texas Instruments Incorporated | Amplifier offset and noise reduction in a multistage system |
| TWI456892B (zh) * | 2011-06-02 | 2014-10-11 | Fitipower Integrated Tech Inc | 負回授電路及其可靠度提高方法以及應用該負回授電路的源極驅動器及其控制方法 |
| US9088256B2 (en) * | 2012-08-08 | 2015-07-21 | Analog Devices, Inc. | Apparatus and methods for amplifier fault protection |
| KR102066604B1 (ko) * | 2012-12-26 | 2020-02-11 | 에스케이하이닉스 주식회사 | 비교기 회로 및 신호 비교 방법 |
| KR101506579B1 (ko) | 2013-05-09 | 2015-03-27 | (주)비엔씨넷 | 안정된 바이어스를 유지하는 클래스 ab 앰프 |
| US9602104B2 (en) * | 2015-03-10 | 2017-03-21 | Sitronix Technology Corp. | Output buffer with offset cancellation structure and offset cancellation method using the same |
| US10938353B2 (en) | 2019-03-26 | 2021-03-02 | Analog Devices International Unlimited Company | Coulomb counter with offset calibration |
| US10796665B1 (en) * | 2019-05-07 | 2020-10-06 | Novatek Microelectronics Corp. | Control apparatus for driving display panel and method thereof |
| US11747371B2 (en) * | 2020-08-28 | 2023-09-05 | Intel Corporation | Self-calibrated input voltage-agnostic replica-biased current sensing apparatus |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4322687A (en) * | 1980-05-19 | 1982-03-30 | Bell Telephone Laboratories, Incorporated | Operational amplifier with improved offset correction |
| US4781437A (en) | 1987-12-21 | 1988-11-01 | Hughes Aircraft Company | Display line driver with automatic uniformity compensation |
| US4883987A (en) | 1988-05-04 | 1989-11-28 | Texas Instruments Incorporated | Comparator circuit having a fast recovery time |
| US5397944A (en) * | 1993-04-09 | 1995-03-14 | Crystal Semiconductor Corporation | Dense offset calibration circuitry and method |
| US5392000A (en) * | 1993-11-09 | 1995-02-21 | Motorola, Inc. | Apparatus and method for frequency compensating an operational amplifier |
| US5600275A (en) * | 1994-04-29 | 1997-02-04 | Analog Devices, Inc. | Low-voltage CMOS comparator with offset cancellation |
| FI97655C (fi) * | 1995-04-05 | 1997-01-27 | Nokia Telecommunications Oy | Offset-kompensoitu lineaarinen RF-ilmaisin |
| JP3209690B2 (ja) * | 1996-11-15 | 2001-09-17 | 株式会社東芝 | ビーム光走査装置および画像形成装置 |
| US5793230A (en) * | 1997-02-26 | 1998-08-11 | Sandia Corporation | Sensor readout detector circuit |
| JP2001520391A (ja) | 1997-10-15 | 2001-10-30 | マキシム・インテグレーテッド・プロダクツ・インコーポレーテッド | 接地の上と下における低電圧感知用に最適化された単一電源電圧−周波数変換器 |
| US6429697B1 (en) * | 1999-10-05 | 2002-08-06 | Analog Devices, Inc. | Multi-stage, low-offset, fast-recovery, comparator system and method |
| US6507241B1 (en) * | 2000-10-03 | 2003-01-14 | International Business Machines Corporation | Method and circuit for automatically correcting offset voltage |
-
2002
- 2002-04-08 JP JP2002581683A patent/JP4319413B2/ja not_active Expired - Fee Related
- 2002-04-08 AT AT02718475T patent/ATE401694T1/de not_active IP Right Cessation
- 2002-04-08 DE DE60227651T patent/DE60227651D1/de not_active Expired - Lifetime
- 2002-04-08 CN CNB02801166XA patent/CN100353662C/zh not_active Expired - Fee Related
- 2002-04-08 WO PCT/IB2002/001251 patent/WO2002084862A1/en active IP Right Grant
- 2002-04-08 US US10/297,730 patent/US6762643B2/en not_active Expired - Lifetime
- 2002-04-08 KR KR1020027016815A patent/KR100867079B1/ko not_active IP Right Cessation
- 2002-04-08 EP EP02718475A patent/EP1380102B1/de not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JP2004519969A (ja) | 2004-07-02 |
| KR100867079B1 (ko) | 2008-11-04 |
| DE60227651D1 (de) | 2008-08-28 |
| JP4319413B2 (ja) | 2009-08-26 |
| US6762643B2 (en) | 2004-07-13 |
| KR20030014701A (ko) | 2003-02-19 |
| WO2002084862A1 (en) | 2002-10-24 |
| CN100353662C (zh) | 2007-12-05 |
| EP1380102A1 (de) | 2004-01-14 |
| CN1461521A (zh) | 2003-12-10 |
| EP1380102B1 (de) | 2008-07-16 |
| US20030164730A1 (en) | 2003-09-04 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |