JP4200545B2 - 固体撮像素子およびその駆動方法、並びにカメラシステム - Google Patents
固体撮像素子およびその駆動方法、並びにカメラシステム Download PDFInfo
- Publication number
- JP4200545B2 JP4200545B2 JP15905098A JP15905098A JP4200545B2 JP 4200545 B2 JP4200545 B2 JP 4200545B2 JP 15905098 A JP15905098 A JP 15905098A JP 15905098 A JP15905098 A JP 15905098A JP 4200545 B2 JP4200545 B2 JP 4200545B2
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- imaging device
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Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/803—Pixels having integrated switching, control, storage or amplification elements
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
- H04N25/44—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
- H04N25/44—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array
- H04N25/441—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array by reading contiguous pixels from selected rows or columns of the array, e.g. interlaced scanning
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/65—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to reset noise, e.g. KTC noise related to CMOS structures by techniques other than CDS
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/767—Horizontal readout lines, multiplexers or registers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N25/778—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising amplifiers shared between a plurality of pixels, i.e. at least one part of the amplifier must be on the sensor array itself
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/803—Pixels having integrated switching, control, storage or amplification elements
- H10F39/8037—Pixels having integrated switching, control, storage or amplification elements the integrated elements comprising a transistor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/812—Arrangements for transferring the charges in the image sensor perpendicular to the imaging plane, e.g. buried regions used to transfer generated charges to circuitry under the photosensitive region
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Computer Vision & Pattern Recognition (AREA)
Priority Applications (20)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15905098A JP4200545B2 (ja) | 1998-06-08 | 1998-06-08 | 固体撮像素子およびその駆動方法、並びにカメラシステム |
| TW088109159A TW416235B (en) | 1998-06-08 | 1999-06-02 | Solid-state imaging element, method for driving the same, and camera system |
| KR1019990020893A KR100690477B1 (ko) | 1998-06-08 | 1999-06-07 | 고체 촬상 소자, 그 소자의 구동 방법, 및 카메라 시스템 |
| EP07022774.9A EP1892950B1 (en) | 1998-06-08 | 1999-06-07 | Solid-state imaging element, method for driving the same, and camera system |
| EP99110878A EP0964570B1 (en) | 1998-06-08 | 1999-06-07 | Solid-state imaging element |
| DE69942941T DE69942941D1 (de) | 1998-06-08 | 1999-06-07 | Festkörper-Bildaufnahmeelement |
| US09/327,523 US7116365B1 (en) | 1998-06-08 | 1999-06-08 | Solid-state imaging element, method for driving the same, and camera system |
| US10/747,741 US8284284B2 (en) | 1998-06-08 | 2003-12-29 | Solid-state imaging element, method for driving the same, and camera system |
| US10/944,977 US8031248B2 (en) | 1998-06-08 | 2004-09-20 | Solid state imaging element having horizontal scanning circuit for providing reset signals |
| US10/945,519 US8023024B2 (en) | 1998-06-08 | 2004-09-20 | Solid-state imaging element having image signal overflow path |
| US10/945,503 US7944491B2 (en) | 1998-06-08 | 2004-09-20 | Solid-state image-pickup device including unit pixels having a 3-transistor design and wherein a vertical selection pulse provides a reset potential |
| US11/409,613 US7352401B2 (en) | 1998-06-08 | 2006-04-24 | Solid-state imaging element, method for driving the same, and camera system |
| KR1020060043369A KR100654878B1 (ko) | 1998-06-08 | 2006-05-15 | 고체 촬상 소자 및 카메라 시스템 |
| US13/067,112 US8743257B2 (en) | 1998-06-08 | 2011-05-10 | Solid-state imaging element having image signal overflow path |
| US13/565,383 US8922689B2 (en) | 1998-06-08 | 2012-08-02 | Solid-state imaging element having image signal overflow path |
| US14/218,485 US9179081B2 (en) | 1998-06-08 | 2014-03-18 | Solid-state imaging element having image signal overflow path |
| US14/630,320 US9313430B2 (en) | 1998-06-08 | 2015-02-24 | Solid-state imaging element having image signal overflow path |
| US14/732,293 US9253422B2 (en) | 1998-06-08 | 2015-06-05 | Solid-state imaging element having image signal overflow path |
| US14/994,935 US9445020B2 (en) | 1998-06-08 | 2016-01-13 | Solid-state imaging element having image signal overflow path |
| US15/236,555 US20170034462A1 (en) | 1998-06-08 | 2016-08-15 | Solid-state imaging element having image signal overflow path |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15905098A JP4200545B2 (ja) | 1998-06-08 | 1998-06-08 | 固体撮像素子およびその駆動方法、並びにカメラシステム |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPH11355668A JPH11355668A (ja) | 1999-12-24 |
| JPH11355668A5 JPH11355668A5 (enExample) | 2005-09-08 |
| JP4200545B2 true JP4200545B2 (ja) | 2008-12-24 |
Family
ID=15685142
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15905098A Expired - Lifetime JP4200545B2 (ja) | 1998-06-08 | 1998-06-08 | 固体撮像素子およびその駆動方法、並びにカメラシステム |
Country Status (6)
| Country | Link |
|---|---|
| US (13) | US7116365B1 (enExample) |
| EP (2) | EP0964570B1 (enExample) |
| JP (1) | JP4200545B2 (enExample) |
| KR (2) | KR100690477B1 (enExample) |
| DE (1) | DE69942941D1 (enExample) |
| TW (1) | TW416235B (enExample) |
Families Citing this family (48)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4200545B2 (ja) * | 1998-06-08 | 2008-12-24 | ソニー株式会社 | 固体撮像素子およびその駆動方法、並びにカメラシステム |
| US7116366B1 (en) * | 1999-08-31 | 2006-10-03 | Micron Technology, Inc. | CMOS aps pixel sensor dynamic range increase |
| JP3467013B2 (ja) | 1999-12-06 | 2003-11-17 | キヤノン株式会社 | 固体撮像装置 |
| JP3856283B2 (ja) * | 2000-02-14 | 2006-12-13 | シャープ株式会社 | 固体撮像装置および撮像装置の駆動方法 |
| US6965408B2 (en) | 2000-02-28 | 2005-11-15 | Canon Kabushiki Kaisha | Solid-state image pickup device having a photoelectric conversion unit and a punch-through current suppression circuit |
| KR100364605B1 (ko) * | 2000-07-19 | 2002-12-16 | (주) 픽셀플러스 | 넓은 동작 범위를 가지는 이미지 센서 픽셀 |
| FR2824664A1 (fr) * | 2001-05-09 | 2002-11-15 | St Microelectronics Sa | Photodetecteur cmos comportant une photodiode en silicium amorphe |
| JP3880345B2 (ja) * | 2001-08-27 | 2007-02-14 | キヤノン株式会社 | 差動増幅回路及びそれを用いた固体撮像装置並びに撮像システム |
| JP2003143480A (ja) * | 2001-11-06 | 2003-05-16 | Sony Corp | 固体撮像装置およびその駆動方法 |
| JP4404241B2 (ja) | 2002-02-12 | 2010-01-27 | ソニー株式会社 | 固体撮像装置およびその出力方法 |
| JP4208559B2 (ja) | 2002-12-03 | 2009-01-14 | キヤノン株式会社 | 光電変換装置 |
| JP4355148B2 (ja) * | 2003-02-28 | 2009-10-28 | パナソニック株式会社 | 固体撮像装置の駆動方法 |
| JP3794637B2 (ja) | 2003-03-07 | 2006-07-05 | 松下電器産業株式会社 | 固体撮像装置 |
| JP4297416B2 (ja) | 2003-06-10 | 2009-07-15 | シャープ株式会社 | 固体撮像素子、その駆動方法およびカメラ |
| JP2005167588A (ja) * | 2003-12-02 | 2005-06-23 | Sony Corp | 固体撮像素子の駆動方法、固体撮像装置 |
| JP4311181B2 (ja) * | 2003-12-05 | 2009-08-12 | ソニー株式会社 | 半導体装置の制御方法および信号処理方法並びに半導体装置および電子機器 |
| EP2249389B1 (en) | 2004-02-25 | 2019-02-20 | Sony Semiconductor Solutions Corporation | Method of manufacturing a photodetecting device |
| CN1922732B (zh) | 2004-02-25 | 2010-06-09 | S.O.I.Tec绝缘体上硅技术公司 | 光电检测装置 |
| KR100621561B1 (ko) | 2004-11-05 | 2006-09-19 | 삼성전자주식회사 | Cmos 이미지 센서 및 그 구동 방법 |
| KR100657863B1 (ko) | 2005-02-07 | 2006-12-14 | 삼성전자주식회사 | 핑거드 타입 소스 폴로워 트랜지스터를 이용한 상보성금속 산화막 반도체 액티브 픽셀 센서 |
| US7608549B2 (en) * | 2005-03-15 | 2009-10-27 | Asm America, Inc. | Method of forming non-conformal layers |
| JP2006270890A (ja) * | 2005-03-25 | 2006-10-05 | Matsushita Electric Ind Co Ltd | 撮像装置、及びデジタルカメラ |
| JP2007036861A (ja) * | 2005-07-28 | 2007-02-08 | Sanyo Electric Co Ltd | 固体撮像素子の駆動装置及び駆動方法 |
| GB0517742D0 (en) * | 2005-08-31 | 2005-10-12 | E2V Tech Uk Ltd | Radiation sensor |
| JP4807014B2 (ja) * | 2005-09-02 | 2011-11-02 | ソニー株式会社 | 固体撮像装置、固体撮像装置の駆動方法および撮像装置 |
| US7700471B2 (en) * | 2005-12-13 | 2010-04-20 | Versatilis | Methods of making semiconductor-based electronic devices on a wire and articles that can be made thereby |
| US7619671B2 (en) * | 2006-07-18 | 2009-11-17 | Aptina Imaging Corporation | Method, apparatus and system for charge injection suppression in active pixel sensors |
| JP4956084B2 (ja) | 2006-08-01 | 2012-06-20 | キヤノン株式会社 | 光電変換装置及びそれを用いた撮像システム |
| JP4818018B2 (ja) | 2006-08-01 | 2011-11-16 | キヤノン株式会社 | 光電変換装置及びそれを用いた撮像システム |
| US7692130B2 (en) | 2006-11-01 | 2010-04-06 | International Business Machines Corporation | CMOS imaging sensor having a third FET device with a gate terminal coupled to a second diffusion region of a first FET device and a first terminal coupled to a row select signal |
| US7791010B2 (en) * | 2006-11-01 | 2010-09-07 | International Business Machines Corporation | CMOS image sensor having a third FET device with the gate terminal coupled to the diffusion region of a first FET device, the second terminal coupled to a column signal line, and the first terminal coupled to a row select signal |
| KR100890152B1 (ko) * | 2006-12-22 | 2009-03-20 | 매그나칩 반도체 유한회사 | Cmos 이미지 센서를 위한, 작은 크기, 높은 이득 및낮은 노이즈의 픽셀 |
| JP4979375B2 (ja) | 2006-12-28 | 2012-07-18 | キヤノン株式会社 | 固体撮像装置及び撮像システム |
| JP5016941B2 (ja) * | 2007-02-08 | 2012-09-05 | 株式会社東芝 | 固体撮像装置 |
| US7978243B2 (en) | 2007-02-28 | 2011-07-12 | Canon Kabushiki Kaisha | Imaging apparatus, driving method thereof, and imaging system |
| KR100880528B1 (ko) * | 2007-06-01 | 2009-01-28 | 매그나칩 반도체 유한회사 | Cmos 이미지 센서 |
| JP4900190B2 (ja) * | 2007-10-19 | 2012-03-21 | ソニー株式会社 | 固体撮像装置 |
| US8625010B2 (en) * | 2008-05-02 | 2014-01-07 | Canon Kabushiki Kaisha | Solid-state imaging apparatus with each pixel including a photoelectric converter portion and plural holding portions |
| JP4788742B2 (ja) * | 2008-06-27 | 2011-10-05 | ソニー株式会社 | 固体撮像装置及び電子機器 |
| JP5458869B2 (ja) * | 2009-12-21 | 2014-04-02 | ソニー株式会社 | 固体撮像装置およびその駆動方法、カメラ |
| CN102725637B (zh) | 2010-01-25 | 2015-02-25 | 松下健康医疗控股株式会社 | 在自组装单层上固定a蛋白的方法 |
| JP5267503B2 (ja) * | 2010-05-17 | 2013-08-21 | ソニー株式会社 | 固体撮像装置 |
| CN102918064B (zh) | 2010-08-30 | 2015-03-11 | 松下健康医疗控股株式会社 | 在自组装单层上固定链霉亲和素的方法 |
| JP5108166B2 (ja) | 2010-10-19 | 2012-12-26 | パナソニック株式会社 | グルコースオキシダーゼを自己組織化膜上に固定する方法 |
| KR102460175B1 (ko) * | 2015-08-21 | 2022-10-28 | 삼성전자주식회사 | 쉐어드 픽셀 및 이를 포함하는 이미지 센서 |
| US10433019B2 (en) * | 2017-12-19 | 2019-10-01 | Rovi Guides, Inc. | Systems and methods for adaptive storage and scheduling of media assets |
| US20200137336A1 (en) * | 2018-10-30 | 2020-04-30 | Bae Systems Information And Electronic Systems Integration Inc. | Interlace image sensor for low-light-level imaging |
| TWI861029B (zh) * | 2018-12-21 | 2024-11-11 | 日商索尼半導體解決方案公司 | 攝像元件及攝像裝置 |
Family Cites Families (89)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1551935A (en) * | 1976-08-19 | 1979-09-05 | Philips Nv | Imaging devices |
| JPS6017196B2 (ja) * | 1978-01-23 | 1985-05-01 | 株式会社日立製作所 | 固体撮像素子 |
| DE2939518A1 (de) * | 1979-09-28 | 1981-04-16 | Siemens AG, 1000 Berlin und 8000 München | Monolithisch integrierte schaltung zur zeilenweisen bildabtastung |
| JPS59215180A (ja) * | 1983-05-20 | 1984-12-05 | Sanyo Electric Co Ltd | 固体撮像素子 |
| US4811371A (en) * | 1986-05-16 | 1989-03-07 | Rca Corporation | Floating-diffusion electrometer with adjustable sensitivity |
| JPS63100879A (ja) * | 1986-10-17 | 1988-05-02 | Hitachi Ltd | 固体撮像装置 |
| JP2708455B2 (ja) | 1988-03-25 | 1998-02-04 | 株式会社日立製作所 | 固体撮像装置 |
| JPH084137B2 (ja) * | 1988-01-12 | 1996-01-17 | 日本電気株式会社 | 電荷転送装置の出力回路 |
| US4985774A (en) * | 1988-01-20 | 1991-01-15 | Minolta Camera Kabushiki Kaisha | Image sensing device having direct drainage of unwanted charges |
| US5144447A (en) * | 1988-03-31 | 1992-09-01 | Hitachi, Ltd. | Solid-state image array with simultaneously activated line drivers |
| US5306932A (en) * | 1989-07-21 | 1994-04-26 | Nec Corporation | Charge transfer device provided with improved output structure |
| US5262871A (en) * | 1989-11-13 | 1993-11-16 | Rutgers, The State University | Multiple resolution image sensor |
| CA2021052C (en) * | 1990-07-12 | 1995-08-29 | Clifford D. Anger | Pushbroom spectrographic imager |
| JP3050583B2 (ja) * | 1990-10-17 | 2000-06-12 | ソニー株式会社 | 固体撮像装置 |
| JP3064380B2 (ja) | 1990-10-17 | 2000-07-12 | ソニー株式会社 | 固体撮像装置及びその駆動方法 |
| US5134488A (en) * | 1990-12-28 | 1992-07-28 | David Sarnoff Research Center, Inc. | X-Y addressable imager with variable integration |
| JP2701546B2 (ja) * | 1991-01-18 | 1998-01-21 | 日本電気株式会社 | 信号電荷検出回路を有する電荷転送装置 |
| JP2913876B2 (ja) * | 1991-03-08 | 1999-06-28 | ソニー株式会社 | 固体撮像装置 |
| JP3018546B2 (ja) | 1991-03-18 | 2000-03-13 | ソニー株式会社 | 固体撮像装置 |
| US5844760A (en) * | 1991-03-22 | 1998-12-01 | Fuji Electric Co., Ltd. | Insulated-gate controlled semiconductor device |
| JP3021971B2 (ja) * | 1992-05-22 | 2000-03-15 | 富士ゼロックス株式会社 | イメージセンサ |
| US5872596A (en) * | 1992-09-28 | 1999-02-16 | Canon Kabushiki Kaisha | Device for widening the dynamic range of solid-state image pickup elements |
| JPH06334920A (ja) * | 1993-03-23 | 1994-12-02 | Nippon Hoso Kyokai <Nhk> | 固体撮像素子とその駆動方法 |
| US5452004A (en) * | 1993-06-17 | 1995-09-19 | Litton Systems, Inc. | Focal plane array imaging device with random access architecture |
| US5949483A (en) * | 1994-01-28 | 1999-09-07 | California Institute Of Technology | Active pixel sensor array with multiresolution readout |
| US5841126A (en) * | 1994-01-28 | 1998-11-24 | California Institute Of Technology | CMOS active pixel sensor type imaging system on a chip |
| JPH07284024A (ja) | 1994-04-07 | 1995-10-27 | Nippon Hoso Kyokai <Nhk> | 固体撮像素子 |
| JP3243932B2 (ja) * | 1994-04-22 | 2002-01-07 | ソニー株式会社 | アクティブマトリクス表示装置 |
| US5933188A (en) * | 1994-10-19 | 1999-08-03 | Canon Kabushiki Kaisha | Photoelectric conversion apparatus and method with reset |
| US6288744B1 (en) * | 1994-11-11 | 2001-09-11 | Sanyo Electric Co., Ltd. | Solid-state image pickup device with a shared shift register and method of driving the same |
| US5576763A (en) * | 1994-11-22 | 1996-11-19 | Lucent Technologies Inc. | Single-polysilicon CMOS active pixel |
| US5719626A (en) | 1994-12-16 | 1998-02-17 | Nikon Corporation | Solid-state image pickup device |
| JP3697769B2 (ja) * | 1995-02-24 | 2005-09-21 | 株式会社ニコン | 光電変換素子及び光電変換装置 |
| US5933189A (en) * | 1995-03-09 | 1999-08-03 | Nikon Corporation | Solid state image pickup apparatus |
| JP3259573B2 (ja) * | 1995-03-17 | 2002-02-25 | ソニー株式会社 | 電荷転送装置及びその駆動方法 |
| JPH0955473A (ja) * | 1995-06-08 | 1997-02-25 | Matsushita Electron Corp | 半導体装置とその検査方法 |
| JP3031606B2 (ja) * | 1995-08-02 | 2000-04-10 | キヤノン株式会社 | 固体撮像装置と画像撮像装置 |
| ES2211937T3 (es) * | 1995-08-02 | 2004-07-16 | Canon Kabushiki Kaisha | Dispositivo sensor de imagenes de estado solido con linea de salida comun. |
| JP3845449B2 (ja) * | 1995-08-11 | 2006-11-15 | 株式会社東芝 | Mos型固体撮像装置 |
| JP3966557B2 (ja) * | 1995-08-11 | 2007-08-29 | 株式会社東芝 | 画像システム並びにそこで用いられる固体撮像装置半導体集積回路および差分出力方法 |
| WO1997008647A1 (en) * | 1995-08-25 | 1997-03-06 | Psc, Inc. | Optical reader with condensed cmos circuitry |
| US5608243A (en) * | 1995-10-19 | 1997-03-04 | National Semiconductor Corporation | Single split-gate MOS transistor active pixel sensor cell with automatic anti-blooming and wide dynamic range |
| JPH09139486A (ja) * | 1995-11-16 | 1997-05-27 | Sony Corp | 固体撮像素子及び固体撮像素子の駆動方法 |
| JP3559640B2 (ja) * | 1996-02-27 | 2004-09-02 | キヤノン株式会社 | 光電変換装置 |
| JP3522953B2 (ja) | 1996-03-14 | 2004-04-26 | 株式会社東芝 | 固体撮像装置 |
| US5719676A (en) * | 1996-04-12 | 1998-02-17 | Tropel Corporation | Diffraction management for grazing incidence interferometer |
| JP3608293B2 (ja) | 1996-05-27 | 2005-01-05 | ソニー株式会社 | 半導体装置の製造方法 |
| JP3310164B2 (ja) * | 1996-05-30 | 2002-07-29 | 株式会社東芝 | 固体撮像装置 |
| US6287900B1 (en) * | 1996-08-13 | 2001-09-11 | Semiconductor Energy Laboratory Co., Ltd | Semiconductor device with catalyst addition and removal |
| US5932902A (en) * | 1996-08-19 | 1999-08-03 | Sony Corporation | Solid-state imaging device with element-separating electrodes |
| US5886659A (en) * | 1996-08-21 | 1999-03-23 | California Institute Of Technology | On-focal-plane analog-to-digital conversion for current-mode imaging devices |
| JP3579194B2 (ja) | 1996-09-17 | 2004-10-20 | 株式会社東芝 | 固体撮像装置の駆動方法 |
| US6674470B1 (en) * | 1996-09-19 | 2004-01-06 | Kabushiki Kaisha Toshiba | MOS-type solid state imaging device with high sensitivity |
| GB2318473B (en) * | 1996-10-17 | 2000-11-29 | Sony Corp | Solid state imaging device,signal processing method and camera |
| JPH10233964A (ja) | 1997-02-20 | 1998-09-02 | Nikon Corp | 2値化信号形成用固体撮像装置 |
| JPH10248034A (ja) * | 1997-03-03 | 1998-09-14 | Nissan Motor Co Ltd | イメージセンサ |
| JP3915161B2 (ja) * | 1997-03-04 | 2007-05-16 | ソニー株式会社 | ブルーミング防止構造を備えた固体撮像素子のダイナミックレンジ拡大方法とその固体撮像素子 |
| JP3911788B2 (ja) * | 1997-03-10 | 2007-05-09 | ソニー株式会社 | 固体撮像素子およびその駆動方法 |
| JPH10257392A (ja) * | 1997-03-14 | 1998-09-25 | Matsushita Electron Corp | 物理量分布検知半導体装置およびその駆動方法ならびにその製造方法 |
| US6201270B1 (en) * | 1997-04-07 | 2001-03-13 | Pao-Jung Chen | High speed CMOS photodetectors with wide range operating region and fixed pattern noise reduction |
| US5920345A (en) * | 1997-06-02 | 1999-07-06 | Sarnoff Corporation | CMOS image sensor with improved fill factor |
| US5969758A (en) * | 1997-06-02 | 1999-10-19 | Sarnoff Corporation | DC offset and gain correction for CMOS image sensor |
| US6115066A (en) * | 1997-06-12 | 2000-09-05 | International Business Machines Corporation | Image sensor with direct digital correlated sampling |
| US5898168A (en) * | 1997-06-12 | 1999-04-27 | International Business Machines Corporation | Image sensor pixel circuit |
| US5900623A (en) * | 1997-08-11 | 1999-05-04 | Chrontel, Inc. | Active pixel sensor using CMOS technology with reverse biased photodiodes |
| EP0898419B1 (en) * | 1997-08-15 | 2010-10-27 | Sony Corporation | Solid-state image sensor and method of driving same |
| TW421962B (en) * | 1997-09-29 | 2001-02-11 | Canon Kk | Image sensing device using mos type image sensing elements |
| US6522357B2 (en) * | 1997-09-30 | 2003-02-18 | Intel Corporation | Method and apparatus for increasing retention time in image sensors having an electronic shutter |
| JP3466886B2 (ja) * | 1997-10-06 | 2003-11-17 | キヤノン株式会社 | 固体撮像装置 |
| US5965871A (en) * | 1997-11-05 | 1999-10-12 | Pixart Technology, Inc. | Column readout multiplexer for CMOS image sensors with multiple readout and fixed pattern noise cancellation |
| US6747695B1 (en) * | 1997-12-05 | 2004-06-08 | Intel Corporation | Integrated CMOS imager |
| JP3496918B2 (ja) * | 1997-12-26 | 2004-02-16 | キヤノン株式会社 | 固体撮像装置 |
| US6008486A (en) * | 1997-12-31 | 1999-12-28 | Gentex Corporation | Wide dynamic range optical sensor |
| US6025935A (en) * | 1997-12-31 | 2000-02-15 | Peripheral Imaging Corporation | Charge storage image scanner having equalizing pre-charge and reset improvements |
| US6667768B1 (en) * | 1998-02-17 | 2003-12-23 | Micron Technology, Inc. | Photodiode-type pixel for global electronic shutter and reduced lag |
| KR100278285B1 (ko) * | 1998-02-28 | 2001-01-15 | 김영환 | 씨모스 이미지센서 및 그 제조방법 |
| JP3571909B2 (ja) * | 1998-03-19 | 2004-09-29 | キヤノン株式会社 | 固体撮像装置及びその製造方法 |
| JPH11274454A (ja) * | 1998-03-19 | 1999-10-08 | Canon Inc | 固体撮像装置及びその形成方法 |
| US6069376A (en) * | 1998-03-26 | 2000-05-30 | Foveonics, Inc. | Intra-pixel frame storage element, array, and electronic shutter method including speed switch suitable for electronic still camera applications |
| JP2921567B1 (ja) * | 1998-04-22 | 1999-07-19 | 松下電子工業株式会社 | 固体撮像装置およびその製造方法 |
| US6606120B1 (en) * | 1998-04-24 | 2003-08-12 | Foveon, Inc. | Multiple storage node full color active pixel sensors |
| TW425563B (en) * | 1998-06-03 | 2001-03-11 | Nippon Electric Co | Solid state image pickup device and driving method therefore |
| JP4200545B2 (ja) * | 1998-06-08 | 2008-12-24 | ソニー株式会社 | 固体撮像素子およびその駆動方法、並びにカメラシステム |
| US6043478A (en) * | 1998-06-25 | 2000-03-28 | Industrial Technology Research Institute | Active pixel sensor with shared readout structure |
| US6259124B1 (en) * | 1998-08-07 | 2001-07-10 | Eastman Kodak Company | Active pixel sensor with high fill factor blooming protection |
| US7791116B1 (en) * | 1998-10-14 | 2010-09-07 | Micron Technology, Inc. | CMOS imager having a nitride dielectric |
| US6825878B1 (en) * | 1998-12-08 | 2004-11-30 | Micron Technology, Inc. | Twin P-well CMOS imager |
| US6603513B1 (en) * | 1999-02-16 | 2003-08-05 | Micron Technology, Inc. | Using a single control line to provide select and reset signals to image sensors in two rows of a digital imaging device |
| US6731397B1 (en) * | 1999-05-21 | 2004-05-04 | Foveon, Inc. | Method for storing and retrieving digital image data from an imaging array |
-
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- 1998-06-08 JP JP15905098A patent/JP4200545B2/ja not_active Expired - Lifetime
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- 2012-08-02 US US13/565,383 patent/US8922689B2/en not_active Expired - Fee Related
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- 2014-03-18 US US14/218,485 patent/US9179081B2/en not_active Expired - Fee Related
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- 2015-02-24 US US14/630,320 patent/US9313430B2/en not_active Expired - Fee Related
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