JP3554186B2 - 露光装置、デバイス製造方法および反力受け方法 - Google Patents
露光装置、デバイス製造方法および反力受け方法 Download PDFInfo
- Publication number
- JP3554186B2 JP3554186B2 JP09589598A JP9589598A JP3554186B2 JP 3554186 B2 JP3554186 B2 JP 3554186B2 JP 09589598 A JP09589598 A JP 09589598A JP 9589598 A JP9589598 A JP 9589598A JP 3554186 B2 JP3554186 B2 JP 3554186B2
- Authority
- JP
- Japan
- Prior art keywords
- stage
- reaction force
- exposure apparatus
- floor
- support member
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16F—SPRINGS; SHOCK-ABSORBERS; MEANS FOR DAMPING VIBRATION
- F16F15/00—Suppression of vibrations in systems; Means or arrangements for avoiding or reducing out-of-balance forces, e.g. due to motion
- F16F15/02—Suppression of vibrations of non-rotating, e.g. reciprocating systems; Suppression of vibrations of rotating systems by use of members not moving with the rotating systems
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B27/00—Photographic printing apparatus
- G03B27/32—Projection printing apparatus, e.g. enlarger, copying camera
- G03B27/42—Projection printing apparatus, e.g. enlarger, copying camera for automatic sequential copying of the same original
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
- G03F7/70725—Stages control
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/709—Vibration, e.g. vibration detection, compensation, suppression or isolation
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Engineering & Computer Science (AREA)
- Toxicology (AREA)
- Mechanical Engineering (AREA)
- Aviation & Aerospace Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Atmospheric Sciences (AREA)
- Acoustics & Sound (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Vibration Prevention Devices (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP09589598A JP3554186B2 (ja) | 1998-04-08 | 1998-04-08 | 露光装置、デバイス製造方法および反力受け方法 |
| US09/286,447 US6493062B2 (en) | 1998-04-08 | 1999-04-06 | Driving apparatus and exposure apparatus |
| KR1019990012420A KR19990083062A (ko) | 1998-04-08 | 1999-04-08 | 구동장치 및 노광장치 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP09589598A JP3554186B2 (ja) | 1998-04-08 | 1998-04-08 | 露光装置、デバイス製造方法および反力受け方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPH11297587A JPH11297587A (ja) | 1999-10-29 |
| JP3554186B2 true JP3554186B2 (ja) | 2004-08-18 |
| JPH11297587A5 JPH11297587A5 (enExample) | 2004-12-16 |
Family
ID=14150053
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP09589598A Expired - Fee Related JP3554186B2 (ja) | 1998-04-08 | 1998-04-08 | 露光装置、デバイス製造方法および反力受け方法 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US6493062B2 (enExample) |
| JP (1) | JP3554186B2 (enExample) |
| KR (1) | KR19990083062A (enExample) |
Families Citing this family (54)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6999162B1 (en) | 1998-10-28 | 2006-02-14 | Nikon Corporation | Stage device, exposure system, method of device manufacture, and device |
| US6686991B1 (en) | 2000-11-06 | 2004-02-03 | Nikon Corporation | Wafer stage assembly, servo control system, and method for operating the same |
| US6885430B2 (en) * | 2000-11-16 | 2005-04-26 | Nikon Corporation | System and method for resetting a reaction mass assembly of a stage assembly |
| US6958808B2 (en) * | 2000-11-16 | 2005-10-25 | Nikon Corporation | System and method for resetting a reaction mass assembly of a stage assembly |
| US6987558B2 (en) * | 2001-01-16 | 2006-01-17 | Nikon Corporation | Reaction mass for a stage device |
| US6538720B2 (en) | 2001-02-28 | 2003-03-25 | Silicon Valley Group, Inc. | Lithographic tool with dual isolation system and method for configuring the same |
| US6784978B2 (en) * | 2002-03-12 | 2004-08-31 | Asml Holding N.V. | Method, system, and apparatus for management of reaction loads in a lithography system |
| US6724466B2 (en) * | 2002-03-26 | 2004-04-20 | Nikon Corporation | Stage assembly including a damping assembly |
| US7061577B2 (en) | 2002-03-26 | 2006-06-13 | Nikon Corporation | Image adjustor including damping assembly |
| US6844635B2 (en) * | 2002-05-24 | 2005-01-18 | Dover Instrument Corporation | Reaction force transfer system |
| US6757110B2 (en) * | 2002-05-29 | 2004-06-29 | Asml Holding N.V. | Catadioptric lithography system and method with reticle stage orthogonal to wafer stage |
| JP3977214B2 (ja) * | 2002-09-17 | 2007-09-19 | キヤノン株式会社 | 露光装置 |
| JP3984898B2 (ja) * | 2002-09-18 | 2007-10-03 | キヤノン株式会社 | 露光装置 |
| JP4378938B2 (ja) * | 2002-11-25 | 2009-12-09 | 株式会社ニコン | 露光装置、及びデバイス製造方法 |
| US20040119964A1 (en) * | 2002-12-18 | 2004-06-24 | Nikon Corporation | Double isolation fine stage |
| JP4458322B2 (ja) * | 2003-01-14 | 2010-04-28 | キヤノン株式会社 | 露光装置およびデバイス製造方法 |
| JP4517367B2 (ja) * | 2003-09-03 | 2010-08-04 | 株式会社ニコン | 露光装置及びデバイス製造方法 |
| US7119884B2 (en) * | 2003-12-24 | 2006-10-10 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| JP2005224532A (ja) * | 2004-02-16 | 2005-08-25 | Fuji Photo Film Co Ltd | 画像形成装置の防振構造 |
| JP2005227717A (ja) * | 2004-02-16 | 2005-08-25 | Fuji Photo Film Co Ltd | 画像形成装置の固定構造 |
| US7224432B2 (en) * | 2004-05-14 | 2007-05-29 | Canon Kabushiki Kaisha | Stage device, exposure apparatus, and device manufacturing method |
| US7126674B2 (en) * | 2004-06-14 | 2006-10-24 | Asml Netherlands B.V. | Positioning device and device manufacturing method |
| JP4440031B2 (ja) * | 2004-07-29 | 2010-03-24 | キヤノン株式会社 | 露光装置及びデバイス製造方法 |
| US7256866B2 (en) * | 2004-10-12 | 2007-08-14 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| WO2006046101A1 (en) * | 2004-10-27 | 2006-05-04 | Carl Zeiss Smt Ag | A six degree of freedom (dof) actuator reaction mass |
| US7227614B2 (en) * | 2004-11-12 | 2007-06-05 | Asml Netherlands B.V. | Measurement method, device manufacturing method and lithographic apparatus |
| US7180571B2 (en) * | 2004-12-08 | 2007-02-20 | Asml Netherlands B.V. | Lithographic projection apparatus and actuator |
| JP2006344685A (ja) * | 2005-06-07 | 2006-12-21 | Canon Inc | 露光装置 |
| WO2006133800A1 (en) | 2005-06-14 | 2006-12-21 | Carl Zeiss Smt Ag | Lithography projection objective, and a method for correcting image defects of the same |
| JP4130837B2 (ja) * | 2006-06-16 | 2008-08-06 | 住友重機械工業株式会社 | ステージ用反力処理装置 |
| KR100876912B1 (ko) * | 2006-07-13 | 2009-01-08 | 부산대학교 산학협력단 | 변위증폭측정 메카니즘을 구비한 스테이지 |
| US7587946B2 (en) * | 2006-08-31 | 2009-09-15 | Tunney Timothy T | Method and apparatus for testing roof edge components |
| JP2008098311A (ja) | 2006-10-10 | 2008-04-24 | Canon Inc | 露光装置及びデバイス製造方法 |
| JP2008256155A (ja) * | 2007-04-06 | 2008-10-23 | Canon Inc | 除振装置、演算装置、露光装置及びデバイス製造方法 |
| SG10201502625RA (en) * | 2007-07-18 | 2015-05-28 | Nikon Corp | Measuring Method, Stage Apparatus, And Exposure Apparatus |
| JP4485550B2 (ja) * | 2007-07-30 | 2010-06-23 | 住友重機械工業株式会社 | 反力処理装置 |
| JP5188135B2 (ja) | 2007-10-05 | 2013-04-24 | キヤノン株式会社 | 露光装置及びデバイス製造方法 |
| JP2009164307A (ja) | 2007-12-28 | 2009-07-23 | Canon Inc | 支持構造、露光装置、支持構造の形成方法、及び、デバイス製造方法 |
| NL2002902A1 (nl) * | 2008-06-18 | 2009-12-22 | Asml Netherlands Bv | Lithographic apparatus having a feed forward pressure pulse compensation for the metrology frame. |
| JP5350139B2 (ja) * | 2008-10-01 | 2013-11-27 | キヤノン株式会社 | 露光装置、及びデバイスの製造方法 |
| US8235351B1 (en) * | 2009-08-27 | 2012-08-07 | Lockheed Martin Corporation | Shock load isolation mounting |
| JP5641878B2 (ja) * | 2010-10-29 | 2014-12-17 | キヤノン株式会社 | 振動制御装置、リソグラフィー装置、および、物品の製造方法 |
| JP5773761B2 (ja) * | 2010-12-17 | 2015-09-02 | キヤノン株式会社 | リソグラフィーシステム、及びそれを用いた物品の製造方法 |
| CN103472678B (zh) * | 2012-06-08 | 2015-07-22 | 上海微电子装备有限公司 | 光刻机及应用于光刻机中的工件台系统 |
| US8899393B2 (en) * | 2012-06-08 | 2014-12-02 | Technical Manufacturing Corporation | Active vibration isolation system |
| CN103809384B (zh) * | 2012-11-12 | 2016-03-09 | 上海微电子装备有限公司 | 工件台与掩模台公用的平衡质量系统及光刻机 |
| US10184539B2 (en) | 2014-09-30 | 2019-01-22 | Technical Manufacturing Corporation | Vibration isolation system |
| CN105807575B (zh) * | 2014-12-30 | 2017-08-25 | 上海微电子装备有限公司 | 一种硅片边缘保护装置 |
| EP3363085B1 (en) * | 2015-10-16 | 2023-05-10 | Thorlabs, Inc. | Linear motor for fast tuning of a laser cavity |
| DE102017201598B4 (de) | 2017-02-01 | 2019-02-14 | Hiwin Mikrosystem Corp. | Reaktionskraftentgegenwirkungsvorrichtung für ein metrologisches Werkzeug |
| JP7052197B2 (ja) * | 2017-02-02 | 2022-04-12 | ウシオ電機株式会社 | 露光装置 |
| DE112018004189T5 (de) | 2017-08-15 | 2020-04-30 | Technical Manufacturing Corporation | Präzisions-Schwingungsisolationssystem mit Boden-Feed-Forward-Unterstützung |
| US11094499B1 (en) * | 2020-10-04 | 2021-08-17 | Borries Pte. Ltd. | Apparatus of charged-particle beam such as electron microscope comprising sliding specimen table within objective lens |
| IL295833B2 (en) * | 2022-08-22 | 2023-09-01 | Elbit Systems Electro Optics Elop Ltd | A passive stabilization system with a linear copy subsystem to maintain cargo orientation |
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| US4473292A (en) * | 1982-02-09 | 1984-09-25 | Censor Patent-Und Versuchsanstalt | Dampening system |
| US4927119A (en) * | 1986-02-24 | 1990-05-22 | Kimball Industries, Inc. | Reversible flow valve for air isolated bases |
| JPH01188241A (ja) | 1988-01-22 | 1989-07-27 | Canon Inc | 移動案内装置 |
| JPH01284793A (ja) | 1988-05-11 | 1989-11-16 | Canon Inc | 基板支持装置 |
| DE3917408A1 (de) * | 1988-06-06 | 1989-12-07 | Takenaka Corp | Daempfungssockel |
| JP2728898B2 (ja) | 1988-10-05 | 1998-03-18 | キヤノン株式会社 | 露光装置 |
| JP3031940B2 (ja) | 1990-02-21 | 2000-04-10 | キヤノン株式会社 | 移動案内装置 |
| GB2249189B (en) | 1990-10-05 | 1994-07-27 | Canon Kk | Exposure apparatus |
| NL9100407A (nl) | 1991-03-07 | 1992-10-01 | Philips Nv | Optisch lithografische inrichting met een krachtgecompenseerd machinegestel. |
| JP2714502B2 (ja) | 1991-09-18 | 1998-02-16 | キヤノン株式会社 | 移動ステージ装置 |
| JP3245932B2 (ja) | 1992-02-06 | 2002-01-15 | キヤノン株式会社 | 光半導体装置、その駆動方法及びそれを用いた光伝送方式 |
| US5549269A (en) * | 1992-03-27 | 1996-08-27 | Gertel; Maurice | Gas spring assembly |
| JPH06188181A (ja) * | 1992-12-21 | 1994-07-08 | Jeol Ltd | 荷電粒子ビーム描画方法 |
| JP3277581B2 (ja) * | 1993-02-01 | 2002-04-22 | 株式会社ニコン | ステージ装置および露光装置 |
| JP2974535B2 (ja) | 1993-03-11 | 1999-11-10 | キヤノン株式会社 | 位置決め装置 |
| US5356110A (en) * | 1993-06-08 | 1994-10-18 | Newport Corporation | Pneumatic isolation systems for damping vertical, horizontal and rotational vibrations |
| JP3226704B2 (ja) * | 1994-03-15 | 2001-11-05 | キヤノン株式会社 | 露光装置 |
| US5874820A (en) * | 1995-04-04 | 1999-02-23 | Nikon Corporation | Window frame-guided stage mechanism |
| JPH08111371A (ja) | 1994-10-06 | 1996-04-30 | Canon Inc | 投影露光装置 |
| KR100399812B1 (ko) * | 1994-10-11 | 2003-12-01 | 가부시키가이샤 니콘 | 스테이지용진동방지장치 |
| JP3500737B2 (ja) * | 1994-10-21 | 2004-02-23 | 株式会社ニコン | 走査型露光装置 |
| JP3193586B2 (ja) * | 1995-04-21 | 2001-07-30 | キヤノン株式会社 | 半導体露光装置 |
| DE69631362T2 (de) * | 1995-10-04 | 2004-11-04 | Ebara Corp. | Vorrichtung zur Schwingungsdämpfung |
| US5931441A (en) * | 1996-02-29 | 1999-08-03 | Nikon Corporation | Method of isolating vibration in exposure apparatus |
| US6002987A (en) * | 1996-03-26 | 1999-12-14 | Nikon Corporation | Methods to control the environment and exposure apparatus |
| JP3337906B2 (ja) * | 1996-04-02 | 2002-10-28 | キヤノン株式会社 | 空圧式振動絶縁除去装置、投影露光装置及びこれを用いたデバイス製造方法 |
| JPH09289155A (ja) * | 1996-04-19 | 1997-11-04 | Nikon Corp | 走査型露光装置 |
| JP3659529B2 (ja) * | 1996-06-06 | 2005-06-15 | キヤノン株式会社 | 露光装置およびデバイス製造方法 |
| KR100483982B1 (ko) * | 1996-06-07 | 2005-08-10 | 가부시키가이샤 니콘 | 진동절연장치및노광장치 |
| KR980006398A (ko) * | 1996-06-21 | 1998-03-30 | 마에다 시게루 | 진동 감쇄장치 |
| JP3266515B2 (ja) * | 1996-08-02 | 2002-03-18 | キヤノン株式会社 | 露光装置、デバイス製造方法およびステージ装置 |
| JPH1089403A (ja) * | 1996-09-10 | 1998-04-07 | Nikon Corp | 防振装置 |
| US6222614B1 (en) * | 1996-12-06 | 2001-04-24 | Nikon Corporation | Exposure elements with a cable-relaying support |
| JP3825869B2 (ja) * | 1997-03-19 | 2006-09-27 | キヤノン株式会社 | 能動除振装置 |
| US5959427A (en) * | 1998-03-04 | 1999-09-28 | Nikon Corporation | Method and apparatus for compensating for reaction forces in a stage assembly |
-
1998
- 1998-04-08 JP JP09589598A patent/JP3554186B2/ja not_active Expired - Fee Related
-
1999
- 1999-04-06 US US09/286,447 patent/US6493062B2/en not_active Expired - Lifetime
- 1999-04-08 KR KR1019990012420A patent/KR19990083062A/ko not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| KR19990083062A (ko) | 1999-11-25 |
| JPH11297587A (ja) | 1999-10-29 |
| US20020054280A1 (en) | 2002-05-09 |
| US6493062B2 (en) | 2002-12-10 |
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