JP2011253987A - 半導体受光素子及び光モジュール - Google Patents

半導体受光素子及び光モジュール Download PDF

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Publication number
JP2011253987A
JP2011253987A JP2010127802A JP2010127802A JP2011253987A JP 2011253987 A JP2011253987 A JP 2011253987A JP 2010127802 A JP2010127802 A JP 2010127802A JP 2010127802 A JP2010127802 A JP 2010127802A JP 2011253987 A JP2011253987 A JP 2011253987A
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JP
Japan
Prior art keywords
semiconductor
light receiving
receiving element
main surface
semiconductor light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2010127802A
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English (en)
Japanese (ja)
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JP2011253987A5 (enExample
Inventor
Mototake Kikuchi
真人武 菊地
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP2010127802A priority Critical patent/JP2011253987A/ja
Priority to US13/017,072 priority patent/US8330243B2/en
Priority to TW100103612A priority patent/TW201145502A/zh
Priority to DE102011076887A priority patent/DE102011076887A1/de
Priority to KR1020110052557A priority patent/KR101296192B1/ko
Priority to CN2011101473865A priority patent/CN102270666A/zh
Publication of JP2011253987A publication Critical patent/JP2011253987A/ja
Publication of JP2011253987A5 publication Critical patent/JP2011253987A5/ja
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/30—Coatings
    • H10F77/306—Coatings for devices having potential barriers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/02—Structural details or components not essential to laser action
    • H01S5/022—Mountings; Housings
    • H01S5/023—Mount members, e.g. sub-mount members
    • H01S5/0231—Stems
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068—Stabilisation of laser output parameters
    • H01S5/0683—Stabilisation of laser output parameters by monitoring the optical output parameters
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
    • H10F30/22—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes
    • H10F30/221—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes the potential barrier being a PN homojunction
    • H10F30/2215—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes the potential barrier being a PN homojunction the devices comprising active layers made of only Group III-V materials
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F55/00—Radiation-sensitive semiconductor devices covered by groups H10F10/00, H10F19/00 or H10F30/00 being structurally associated with electric light sources and electrically or optically coupled thereto
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805—Shape
    • H01L2224/4809—Loop shape
    • H01L2224/48091—Arched

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Light Receiving Elements (AREA)
JP2010127802A 2010-06-03 2010-06-03 半導体受光素子及び光モジュール Pending JP2011253987A (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2010127802A JP2011253987A (ja) 2010-06-03 2010-06-03 半導体受光素子及び光モジュール
US13/017,072 US8330243B2 (en) 2010-06-03 2011-01-31 Semiconductor light-receiving element and optical module
TW100103612A TW201145502A (en) 2010-06-03 2011-01-31 Semiconductor light-receiving element and optical module
DE102011076887A DE102011076887A1 (de) 2010-06-03 2011-06-01 Licht empfangendes Halbleiterelement und optisches Modul
KR1020110052557A KR101296192B1 (ko) 2010-06-03 2011-06-01 반도체 수광소자 및 광 모듈
CN2011101473865A CN102270666A (zh) 2010-06-03 2011-06-02 半导体受光元件以及光模块

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010127802A JP2011253987A (ja) 2010-06-03 2010-06-03 半導体受光素子及び光モジュール

Publications (2)

Publication Number Publication Date
JP2011253987A true JP2011253987A (ja) 2011-12-15
JP2011253987A5 JP2011253987A5 (enExample) 2013-05-30

Family

ID=44974027

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010127802A Pending JP2011253987A (ja) 2010-06-03 2010-06-03 半導体受光素子及び光モジュール

Country Status (6)

Country Link
US (1) US8330243B2 (enExample)
JP (1) JP2011253987A (enExample)
KR (1) KR101296192B1 (enExample)
CN (1) CN102270666A (enExample)
DE (1) DE102011076887A1 (enExample)
TW (1) TW201145502A (enExample)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015176904A (ja) * 2014-03-13 2015-10-05 三菱電機株式会社 半導体受光素子
JP2018066888A (ja) * 2016-10-20 2018-04-26 住友電気工業株式会社 光モジュール
US10365448B2 (en) 2017-12-15 2019-07-30 Sumitomo Electric Industries, Ltd. Optical module having two lens system and monitor photodiode between two lenses
WO2022044556A1 (ja) * 2020-08-26 2022-03-03 浜松ホトニクス株式会社 光検出装置
JPWO2022074780A1 (enExample) * 2020-10-08 2022-04-14

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6518076B2 (ja) * 2015-02-16 2019-05-22 エイブリック株式会社 受光素子を有する光検出半導体装置
DE102020117238B4 (de) * 2020-06-30 2025-03-27 First Sensor AG Anordnung für ein optoelektronisches Bauelement, Verfahren zum Herstellen und optoelektronisches Bauelement

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH045870A (ja) * 1990-04-23 1992-01-09 Hitachi Ltd 光半導体装置及びそれを用いた受光器
JPH05152599A (ja) * 1991-11-29 1993-06-18 Nec Corp 半導体受光素子
JPH0653538A (ja) * 1992-07-28 1994-02-25 Toshiba Corp 半導体受光素子
JP2000036615A (ja) * 1998-07-21 2000-02-02 Sumitomo Electric Ind Ltd 受光素子及び受光素子モジュール
WO2002063730A1 (fr) * 2001-02-05 2002-08-15 Sumitomo Electric Industries, Ltd. Emetteur optique
JP2008047580A (ja) * 2006-08-11 2008-02-28 Sumitomo Electric Ind Ltd 半導体受光素子

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Publication number Priority date Publication date Assignee Title
EP0452801B1 (en) 1990-04-16 1996-11-27 Fujitsu Limited Semiconductor device having light receiving element and method of producing the same
JP2847561B2 (ja) 1990-04-16 1999-01-20 富士通株式会社 半導体受光素子
US5345074A (en) * 1990-11-13 1994-09-06 Sumitomo Electric Industries, Ltd. Semiconductor light source
JP3115148B2 (ja) 1993-03-31 2000-12-04 株式会社東芝 半導体装置の製造方法
JPH1117211A (ja) 1997-06-26 1999-01-22 Hitachi Ltd 半導体面型受光素子及び装置
US6043550A (en) 1997-09-03 2000-03-28 Sumitomo Electric Industries, Ltd. Photodiode and photodiode module
JP3221402B2 (ja) 1998-06-22 2001-10-22 住友電気工業株式会社 受光素子と受光装置
JP3931545B2 (ja) * 2000-03-22 2007-06-20 住友電気工業株式会社 発光モジュール
JP2002289904A (ja) * 2001-03-23 2002-10-04 Sumitomo Electric Ind Ltd 半導体受光素子とその製造方法
US6888857B2 (en) * 2001-09-21 2005-05-03 Sumitomo Electric Industries, Ltd. Optical module
EP1396913A1 (en) * 2002-09-03 2004-03-10 Agilent Technologies, Inc. - a Delaware corporation - Single mode distributed feedback lasers
JP2005072130A (ja) 2003-08-21 2005-03-17 Mitsubishi Electric Corp 半導体レーザ装置
WO2005053124A1 (ja) * 2003-11-28 2005-06-09 Nec Corporation 分布帰還型半導体レーザ、分布帰還型半導体レーザアレイ及び光モジュール
JP2006147991A (ja) 2004-11-24 2006-06-08 Canon Inc 固体撮像素子及びそれを有する光学機器
JP2007013015A (ja) * 2005-07-04 2007-01-18 Sumitomo Electric Ind Ltd 半導体受光素子
JP2008010710A (ja) * 2006-06-30 2008-01-17 Oki Electric Ind Co Ltd 半導体レーザ装置
US7670638B2 (en) 2007-05-17 2010-03-02 Sunpower Corporation Protection layer for fabricating a solar cell
KR101444709B1 (ko) 2007-11-16 2014-09-30 주성엔지니어링(주) 기판형 태양전지 및 그 제조방법
JP5303962B2 (ja) * 2008-02-28 2013-10-02 三菱電機株式会社 半導体受光素子
US8476681B2 (en) * 2009-09-17 2013-07-02 Sionyx, Inc. Photosensitive imaging devices and associated methods

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH045870A (ja) * 1990-04-23 1992-01-09 Hitachi Ltd 光半導体装置及びそれを用いた受光器
JPH05152599A (ja) * 1991-11-29 1993-06-18 Nec Corp 半導体受光素子
JPH0653538A (ja) * 1992-07-28 1994-02-25 Toshiba Corp 半導体受光素子
JP2000036615A (ja) * 1998-07-21 2000-02-02 Sumitomo Electric Ind Ltd 受光素子及び受光素子モジュール
WO2002063730A1 (fr) * 2001-02-05 2002-08-15 Sumitomo Electric Industries, Ltd. Emetteur optique
JP2008047580A (ja) * 2006-08-11 2008-02-28 Sumitomo Electric Ind Ltd 半導体受光素子

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015176904A (ja) * 2014-03-13 2015-10-05 三菱電機株式会社 半導体受光素子
JP2018066888A (ja) * 2016-10-20 2018-04-26 住友電気工業株式会社 光モジュール
US10365448B2 (en) 2017-12-15 2019-07-30 Sumitomo Electric Industries, Ltd. Optical module having two lens system and monitor photodiode between two lenses
WO2022044556A1 (ja) * 2020-08-26 2022-03-03 浜松ホトニクス株式会社 光検出装置
JP2022038202A (ja) * 2020-08-26 2022-03-10 浜松ホトニクス株式会社 光検出装置
JP7674083B2 (ja) 2020-08-26 2025-05-09 浜松ホトニクス株式会社 光検出装置
JPWO2022074780A1 (enExample) * 2020-10-08 2022-04-14

Also Published As

Publication number Publication date
KR101296192B1 (ko) 2013-08-13
US20110297967A1 (en) 2011-12-08
DE102011076887A1 (de) 2011-12-08
TW201145502A (en) 2011-12-16
KR20110132990A (ko) 2011-12-09
US8330243B2 (en) 2012-12-11
CN102270666A (zh) 2011-12-07

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