JP2005092963A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2005092963A5 JP2005092963A5 JP2003323358A JP2003323358A JP2005092963A5 JP 2005092963 A5 JP2005092963 A5 JP 2005092963A5 JP 2003323358 A JP2003323358 A JP 2003323358A JP 2003323358 A JP2003323358 A JP 2003323358A JP 2005092963 A5 JP2005092963 A5 JP 2005092963A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003323358A JP2005092963A (ja) | 2003-09-16 | 2003-09-16 | 不揮発性記憶装置 |
KR1020040073800A KR100635417B1 (ko) | 2003-09-16 | 2004-09-15 | 박막 트랜지스터로 구성되는 회로를 포함하는 불휘발성기억 장치 |
US10/941,102 US7149115B2 (en) | 2003-09-16 | 2004-09-15 | Nonvolatile memory device including circuit formed of thin film transistors |
US11/482,019 US7307886B2 (en) | 2003-09-16 | 2006-07-07 | Nonvolatile memory device including circuit formed of thin film transistors |
US11/979,767 US7436712B2 (en) | 2003-09-16 | 2007-11-08 | Nonvolatile memory device including circuit formed of thin film transistors |
US12/211,380 US20090021981A1 (en) | 2003-09-16 | 2008-09-16 | Nonvolatile memory device including circuit formed of thin film transistors |
US12/483,710 US7821829B2 (en) | 2003-09-16 | 2009-06-12 | Nonvolatile memory device including circuit formed of thin film transistors |
US12/888,974 US8000143B2 (en) | 2003-09-16 | 2010-09-23 | Nonvolatile memory device including circuit formed of thin film transistors |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003323358A JP2005092963A (ja) | 2003-09-16 | 2003-09-16 | 不揮発性記憶装置 |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009098330A Division JP2009158094A (ja) | 2009-04-14 | 2009-04-14 | 不揮発性記憶装置 |
JP2009204781A Division JP2009283136A (ja) | 2009-09-04 | 2009-09-04 | 不揮発性記憶装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2005092963A JP2005092963A (ja) | 2005-04-07 |
JP2005092963A5 true JP2005092963A5 (ja) | 2006-09-14 |
Family
ID=34270026
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003323358A Pending JP2005092963A (ja) | 2003-09-16 | 2003-09-16 | 不揮発性記憶装置 |
Country Status (3)
Country | Link |
---|---|
US (6) | US7149115B2 (ja) |
JP (1) | JP2005092963A (ja) |
KR (1) | KR100635417B1 (ja) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100560801B1 (ko) * | 2003-11-24 | 2006-03-13 | 삼성전자주식회사 | 플래시 메모리 장치 |
US7009887B1 (en) * | 2004-06-03 | 2006-03-07 | Fasl Llc | Method of determining voltage compensation for flash memory devices |
KR100699848B1 (ko) * | 2005-06-21 | 2007-03-27 | 삼성전자주식회사 | 코어 구조가 개선된 상 변화 메모리 장치 |
US7224630B2 (en) * | 2005-06-24 | 2007-05-29 | Freescale Semiconductor, Inc. | Antifuse circuit |
JP4904780B2 (ja) * | 2005-11-07 | 2012-03-28 | 富士通セミコンダクター株式会社 | 不揮発性半導体記憶装置 |
ITRM20060139A1 (it) * | 2006-03-13 | 2007-09-14 | Micron Technology Inc | Sistema ad unita di controllo distribuito di dispositivo di memoria |
JP5064816B2 (ja) * | 2006-03-28 | 2012-10-31 | オンセミコンダクター・トレーディング・リミテッド | メモリ |
DE102006023934B3 (de) * | 2006-05-19 | 2007-11-15 | Atmel Germany Gmbh | Speichervorrichtung mit einer nicht-flüchtigen Speichermatrix |
KR100801059B1 (ko) * | 2006-08-02 | 2008-02-04 | 삼성전자주식회사 | 누설 전류를 감소시키기 위한 반도체 메모리 장치의드라이버 회로 |
US8189396B2 (en) * | 2006-12-14 | 2012-05-29 | Mosaid Technologies Incorporated | Word line driver in a hierarchical NOR flash memory |
US7518921B2 (en) * | 2007-03-20 | 2009-04-14 | Kabushiki Kaish Toshiba | Semiconductor memory device which includes memory cell having charge accumulation layer and control gate |
US8125829B2 (en) | 2008-05-02 | 2012-02-28 | Micron Technology, Inc. | Biasing system and method |
JP5193701B2 (ja) * | 2008-06-30 | 2013-05-08 | 株式会社東芝 | 半導体記憶装置 |
US9901244B2 (en) | 2009-06-18 | 2018-02-27 | Endochoice, Inc. | Circuit board assembly of a multiple viewing elements endoscope |
KR20110108125A (ko) * | 2010-03-26 | 2011-10-05 | 삼성전자주식회사 | 집적 회로 장치, 그리고 그것을 포함하는 컴퓨팅 시스템 |
JP5782853B2 (ja) * | 2011-06-16 | 2015-09-24 | 富士通セミコンダクター株式会社 | 半導体記憶装置 |
US9496015B1 (en) * | 2015-08-11 | 2016-11-15 | Macronix International Co., Ltd. | Array structure having local decoders in an electronic device |
TWI594264B (zh) * | 2015-08-13 | 2017-08-01 | 旺宏電子股份有限公司 | 具有區域解碼器之陣列架構 |
US9972397B2 (en) * | 2016-06-24 | 2018-05-15 | SK Hynix Inc. | Semiconductor memory device and operating method thereof |
US11004484B2 (en) | 2018-06-15 | 2021-05-11 | Samsung Electronics Co., Ltd. | Page buffer and memory device including the same |
KR102509640B1 (ko) | 2018-06-15 | 2023-03-16 | 삼성전자주식회사 | 페이지 버퍼 및 이를 포함하는 메모리 장치 |
JP6618587B2 (ja) * | 2018-08-21 | 2019-12-11 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
IT201900001947A1 (it) * | 2019-02-11 | 2020-08-11 | Sk Hynix Inc | Struttura di decodificatore per una architettura di memoria |
Family Cites Families (57)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4837747A (en) * | 1986-11-29 | 1989-06-06 | Mitsubishi Denki Kabushiki Kaisha | Redundary circuit with a spare main decoder responsive to an address of a defective cell in a selected cell block |
JPH073754B2 (ja) * | 1988-03-08 | 1995-01-18 | 三菱電機株式会社 | 半導体記憶装置 |
US5255228A (en) * | 1989-01-10 | 1993-10-19 | Matsushita Electronics Corporation | Semiconductor memory device with redundancy circuits |
JPH0492293A (ja) | 1990-08-06 | 1992-03-25 | Hitachi Ltd | 不揮発性記憶装置 |
JP2977296B2 (ja) * | 1991-02-19 | 1999-11-15 | 沖電気工業株式会社 | 半導体メモリ装置 |
JP3112047B2 (ja) | 1991-11-08 | 2000-11-27 | 株式会社日立製作所 | 半導体集積回路 |
US5343429A (en) * | 1991-12-06 | 1994-08-30 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor memory device having redundant circuit and method of testing to see whether or not redundant circuit is used therein |
TW231343B (ja) | 1992-03-17 | 1994-10-01 | Hitachi Seisakusyo Kk | |
US5343437A (en) * | 1993-02-19 | 1994-08-30 | Motorola Inc. | Memory having nonvolatile and volatile memory banks |
ATE200939T1 (de) * | 1993-02-19 | 2001-05-15 | Infineon Technologies Ag | Spalten-redundanz-schaltungsanordnung für einen speicher |
JP4037470B2 (ja) * | 1994-06-28 | 2008-01-23 | エルピーダメモリ株式会社 | 半導体装置 |
JP2742220B2 (ja) * | 1994-09-09 | 1998-04-22 | 松下電器産業株式会社 | 半導体記憶装置 |
KR0142367B1 (ko) * | 1995-02-04 | 1998-07-15 | 김광호 | 열 리던던씨를 가지는 불휘발성 반도체 메모리의 소거 검증회로 |
JP3162264B2 (ja) | 1995-05-30 | 2001-04-25 | シャープ株式会社 | フラッシュメモリの書換え方法 |
KR0172393B1 (ko) * | 1995-11-22 | 1999-03-30 | 김광호 | 탄력적인 컬럼구제 기능을 가지는 반도체 메모리 장치 |
US5798974A (en) * | 1996-05-15 | 1998-08-25 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor memory device realizing high speed access and low power consumption with redundant circuit |
JPH103790A (ja) * | 1996-06-18 | 1998-01-06 | Mitsubishi Electric Corp | 半導体記憶装置 |
JPH10334681A (ja) | 1997-03-31 | 1998-12-18 | Hitachi Ltd | 半導体記憶装置および不揮発性半導体記憶装置ならびにそのデータ読出し方法 |
JPH10284705A (ja) * | 1997-04-10 | 1998-10-23 | Hitachi Ltd | ダイナミック型ram |
WO1998056002A1 (en) | 1997-06-05 | 1998-12-10 | Peter Wung Lee | Novel flash memory array and decoding architecture |
KR100256819B1 (ko) * | 1997-06-30 | 2000-05-15 | 김영환 | 리던던트 동작을 안정시킨 싱크로노스 디램 |
US5917772A (en) * | 1997-09-16 | 1999-06-29 | Micron Technology, Inc. | Data input circuit for eliminating idle cycles in a memory device |
JPH11176180A (ja) | 1997-12-09 | 1999-07-02 | Hitachi Ltd | 半導体記憶装置 |
TW420806B (en) * | 1998-03-06 | 2001-02-01 | Sanyo Electric Co | Non-volatile semiconductor memory device |
JP4017248B2 (ja) * | 1998-04-10 | 2007-12-05 | 株式会社日立製作所 | 半導体装置 |
US6188618B1 (en) * | 1998-04-23 | 2001-02-13 | Kabushiki Kaisha Toshiba | Semiconductor device with flexible redundancy system |
US6222779B1 (en) * | 1998-04-24 | 2001-04-24 | Kabushiki Kaisha Toshiba | Semiconductor storage device with automatic write/erase function |
JPH11330426A (ja) * | 1998-05-12 | 1999-11-30 | Mitsubishi Electric Corp | 不揮発性半導体記憶装置およびその製造方法 |
JP2000067595A (ja) * | 1998-06-09 | 2000-03-03 | Mitsubishi Electric Corp | 半導体記憶装置 |
JP3779480B2 (ja) * | 1999-02-10 | 2006-05-31 | Necエレクトロニクス株式会社 | 半導体記憶装置 |
US6069824A (en) * | 1999-03-03 | 2000-05-30 | Matsushita Electric Industrial Co., Ltd. | Semiconductor memory device |
US6377502B1 (en) * | 1999-05-10 | 2002-04-23 | Kabushiki Kaisha Toshiba | Semiconductor device that enables simultaneous read and write/erase operation |
TW466692B (en) | 1999-05-27 | 2001-12-01 | Koninkl Philips Electronics Nv | A method of manufacturing a semiconductor device |
KR100311042B1 (ko) * | 1999-06-26 | 2001-11-02 | 윤종용 | 기입 주기의 프로그래밍이 가능한 동기식 메모리 장치 및 이를 이용한 데이터 기입 방법 |
KR20010080651A (ko) * | 1999-10-04 | 2001-08-22 | 구사마 사부로 | 반도체 집적회로, 이 반도체 집적회로를 갖는 잉크카트리지, 및, 이 잉크 카트리지를 장착한 잉크젯 기록장치 |
JP4131902B2 (ja) | 1999-12-27 | 2008-08-13 | 株式会社東芝 | 不揮発性半導体メモリおよびそのスレシホールド電圧制御方法 |
JP4141656B2 (ja) * | 2000-06-07 | 2008-08-27 | 株式会社東芝 | 半導体メモリ集積回路および半導体メモリ装置をテストする方法 |
JP4326127B2 (ja) * | 2000-07-07 | 2009-09-02 | 株式会社ルネサステクノロジ | 半導体記憶装置 |
JP2002042459A (ja) * | 2000-07-26 | 2002-02-08 | Mitsubishi Electric Corp | 半導体集積回路装置 |
US6355531B1 (en) * | 2000-08-09 | 2002-03-12 | International Business Machines Corporation | Method for fabricating semiconductor devices with different properties using maskless process |
JP2002184188A (ja) * | 2000-12-18 | 2002-06-28 | Mitsubishi Electric Corp | 半導体記憶装置 |
KR20020089587A (ko) * | 2001-05-23 | 2002-11-30 | 삼성전자 주식회사 | 공유벌크로 형성된 섹터구조를 갖는 불휘발성 반도체메모리 장치 |
DE60107578T2 (de) * | 2001-07-18 | 2005-12-22 | Nec Schott Components Corp., Koka | Thermische sicherung |
JP4157285B2 (ja) | 2001-08-31 | 2008-10-01 | 株式会社東芝 | 不揮発性半導体メモリ |
JP4127605B2 (ja) * | 2001-09-07 | 2008-07-30 | 株式会社東芝 | 半導体記憶装置 |
JP2003109398A (ja) * | 2001-09-28 | 2003-04-11 | Mitsubishi Electric Corp | 半導体記憶装置 |
US6614691B2 (en) * | 2001-12-12 | 2003-09-02 | Micron Technology, Inc. | Flash memory having separate read and write paths |
KR100452322B1 (ko) * | 2002-06-26 | 2004-10-12 | 삼성전자주식회사 | 반도체 메모리 장치의 전원전압 공급 방법 및 셀 어레이전원전압 공급회로 |
JP2004079033A (ja) * | 2002-08-12 | 2004-03-11 | Renesas Technology Corp | 不揮発性半導体記憶装置 |
JP2004110961A (ja) * | 2002-09-19 | 2004-04-08 | Renesas Technology Corp | 電流駆動回路および半導体記憶装置 |
KR100519793B1 (ko) * | 2003-01-06 | 2005-10-10 | 삼성전자주식회사 | 플래쉬 메모리 장치 및 이 장치의 프로그램 방법 |
JP4184104B2 (ja) * | 2003-01-30 | 2008-11-19 | 株式会社ルネサステクノロジ | 半導体装置 |
KR100512178B1 (ko) * | 2003-05-28 | 2005-09-02 | 삼성전자주식회사 | 플렉서블한 열 리던던시 스킴을 갖는 반도체 메모리 장치 |
JP4217242B2 (ja) * | 2003-08-18 | 2009-01-28 | 富士通マイクロエレクトロニクス株式会社 | 不揮発性半導体メモリ |
JP2005092962A (ja) * | 2003-09-16 | 2005-04-07 | Renesas Technology Corp | 不揮発性半導体記憶装置 |
JP2005101466A (ja) * | 2003-09-26 | 2005-04-14 | Renesas Technology Corp | 半導体記憶装置 |
KR100699872B1 (ko) * | 2005-11-02 | 2007-03-28 | 삼성전자주식회사 | 전압 펌프의 수를 조절할 수 있는 상 변화 메모리 장치 및기입 구동 전압 발생 방법 |
-
2003
- 2003-09-16 JP JP2003323358A patent/JP2005092963A/ja active Pending
-
2004
- 2004-09-15 US US10/941,102 patent/US7149115B2/en active Active
- 2004-09-15 KR KR1020040073800A patent/KR100635417B1/ko active IP Right Grant
-
2006
- 2006-07-07 US US11/482,019 patent/US7307886B2/en active Active
-
2007
- 2007-11-08 US US11/979,767 patent/US7436712B2/en active Active
-
2008
- 2008-09-16 US US12/211,380 patent/US20090021981A1/en not_active Abandoned
-
2009
- 2009-06-12 US US12/483,710 patent/US7821829B2/en active Active
-
2010
- 2010-09-23 US US12/888,974 patent/US8000143B2/en active Active