JP2001525993A - 集積回路識別のための方法および装置 - Google Patents
集積回路識別のための方法および装置Info
- Publication number
- JP2001525993A JP2001525993A JP54967698A JP54967698A JP2001525993A JP 2001525993 A JP2001525993 A JP 2001525993A JP 54967698 A JP54967698 A JP 54967698A JP 54967698 A JP54967698 A JP 54967698A JP 2001525993 A JP2001525993 A JP 2001525993A
- Authority
- JP
- Japan
- Prior art keywords
- integrated circuit
- identification
- optical
- identification code
- identification information
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67282—Marking devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/544—Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54413—Marks applied to semiconductor devices or parts comprising digital information, e.g. bar codes, data matrix
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54473—Marks applied to semiconductor devices or parts for use after dicing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54473—Marks applied to semiconductor devices or parts for use after dicing
- H01L2223/5448—Located on chip prior to dicing and remaining on chip after dicing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54473—Marks applied to semiconductor devices or parts for use after dicing
- H01L2223/54486—Located on package parts, e.g. encapsulation, leads, package substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Semiconductor Integrated Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1.集積回路を識別する方法であって、該方法は、 該集積回路を、電子的識別情報でプログラムするステップと、 該集積回路を、該電子的識別情報に対応する光学的識別コードでマーキングす るステップと、 を含む方法。 2.前記光学的識別コードを読み出すステップと、 該光学的識別コードを、対応する電子的識別情報と関連づけるステップと、 をさらに含む請求項1に記載の方法。 3.前記光学的識別コードを前記対応する電子的識別情報と関連付けるステップ が、ルックアップテーブルにアクセスするステップを含む、請求項2に記載の方 法。 4.前記集積回路を電子的識別情報でプログラムするステップが、複数のプログ ラム可能リンクの1つをプログラムするステップを含む、請求項1に記載の方法 。 5.前記集積回路を光学的識別コードでマーキングするステップが、該集積回路 上に接着性ラベルを配置するステップを含む、請求項1に記載の方法。 6.前記集積回路を光学的識別コードでマーキングするステップが、該集積回路 上にシンボルを記入するステップを含む、請求項1に記載の方法。 7.集積回路を識別する電子的読み出し可能識別コードを格納するためのプログ ラム可能回路を含む集積回路において、該集積回路を識別する方法は、 該集積回路を光学的識別コードでマーキングするステップと、 該光学的識別コードを該電子的読み出し可能識別コードに関連付けるステップ と、 を含む方法。 8.前記光学的識別コードを前記電子的読み出し可能識別コードに関連付けるス テップが、 該電子的読み出し可能識別コードを読み出すステップと、 該光学的識別コードを読み出すステップと、 該読み出された電子的読み出し可能識別コードを、該読み出された光学的識別 コードに相関させるステップと、 を含む請求項7に記載の方法。 9.前記読み出された電子的読み出し可能識別コードを、前記読み出された光学 的識別コードに相関させるステップが、ルックアップデーブルを形成するステッ プを含む、請求項8に記載の方法。 10.前記光学的識別コードを前記電子的読み出し可能識別コードと関連付けるス テップが、前記光学的および電子的読み出し可能識別コード内の同一のデータを エンコードするステップを含む、請求項7に記載の方法。 11.集積回路であって、該集積回路は、 識別データを格納するために動作可能なプログラム可能識別回路と、 該識別データに対応する情報をエンコードする光学的識別マークと、 を含む集積回路。 12.前記プログラム可能識別回路が、複数のプログラム可能リンクを含む、請求 項11に記載の集積回路。 13.前記光学的識別マークが、前記識別データと同一の情報をエンコードする、 請求項11に記載の集積回路。 14.集積回路チップであって、該集積回路チップは、 ハウジングと、 該ハウジング内に取り囲まれ、かつ、識別データを格納するために動作可能な 識別回路を含む、集積回路と、 該ハウジングの外表面上に配置され、かつ、該識別データに対応する識別情報 をエンコードする、光学的マークと、 を含む集積回路チップ。 15.前記ハウジングに連結され、かつ、前記集積回路と該ハウジングの外部の回 路との間の電気的接続を提供するように適合された電気的コンタクトをさらに含 む、請求項14に記載の集積回路チップ。 16.前記光学的マークが、第1の識別情報をエンコードする第1の光学的マーク であって、前記ハウジングで取り囲まれた集積回路上に配置され、かつ、前記識 別データに対応する第2の識別情報をエンコードする、第2の光学的マークをさ らに含む、請求項14に記載の集積回路チップ。 17.前記第1の識別情報が前記第2の識別情報と同一である、請求項16に記載の 集積回路チップ。 18.前記識別情報が前記識別データと同じである、請求項14に記載の集積回路チ ップ。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/857,100 US5984190A (en) | 1997-05-15 | 1997-05-15 | Method and apparatus for identifying integrated circuits |
US08/857,100 | 1997-05-15 | ||
PCT/US1998/010226 WO1998052226A1 (en) | 1997-05-15 | 1998-05-15 | Method and apparatus for identifying integrated circuits |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2001525993A true JP2001525993A (ja) | 2001-12-11 |
Family
ID=25325182
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP54967698A Pending JP2001525993A (ja) | 1997-05-15 | 1998-05-15 | 集積回路識別のための方法および装置 |
Country Status (7)
Country | Link |
---|---|
US (2) | US5984190A (ja) |
EP (1) | EP1004142A1 (ja) |
JP (1) | JP2001525993A (ja) |
KR (1) | KR100839003B1 (ja) |
AU (1) | AU7497898A (ja) |
TW (1) | TW392232B (ja) |
WO (1) | WO1998052226A1 (ja) |
Cited By (2)
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WO2016035117A1 (ja) * | 2014-09-01 | 2016-03-10 | 三菱電機株式会社 | 半導体装置、半導体チップおよび半導体チップの特性情報管理方法 |
CN109417041A (zh) * | 2016-02-01 | 2019-03-01 | 欧克特沃系统有限责任公司 | 用于制造电子器件的系统和方法 |
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1997
- 1997-05-15 US US08/857,100 patent/US5984190A/en not_active Ceased
-
1998
- 1998-05-15 EP EP98922427A patent/EP1004142A1/en not_active Ceased
- 1998-05-15 WO PCT/US1998/010226 patent/WO1998052226A1/en not_active Application Discontinuation
- 1998-05-15 KR KR1019997010556A patent/KR100839003B1/ko not_active IP Right Cessation
- 1998-05-15 TW TW087107534A patent/TW392232B/zh not_active IP Right Cessation
- 1998-05-15 JP JP54967698A patent/JP2001525993A/ja active Pending
- 1998-05-15 AU AU74978/98A patent/AU7497898A/en not_active Abandoned
-
2001
- 2001-11-16 US US09/998,594 patent/USRE40623E1/en not_active Expired - Fee Related
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2016035117A1 (ja) * | 2014-09-01 | 2016-03-10 | 三菱電機株式会社 | 半導体装置、半導体チップおよび半導体チップの特性情報管理方法 |
JPWO2016035117A1 (ja) * | 2014-09-01 | 2017-04-27 | 三菱電機株式会社 | 半導体装置、半導体チップおよび半導体チップの特性情報管理方法 |
US10062650B2 (en) | 2014-09-01 | 2018-08-28 | Mitsubishi Electric Corporation | Semiconductor device, and semiconductor chip having chip identification information |
CN109417041A (zh) * | 2016-02-01 | 2019-03-01 | 欧克特沃系统有限责任公司 | 用于制造电子器件的系统和方法 |
Also Published As
Publication number | Publication date |
---|---|
TW392232B (en) | 2000-06-01 |
US5984190A (en) | 1999-11-16 |
WO1998052226A1 (en) | 1998-11-19 |
AU7497898A (en) | 1998-12-08 |
KR100839003B1 (ko) | 2008-06-18 |
USRE40623E1 (en) | 2009-01-20 |
KR20010012597A (ko) | 2001-02-15 |
EP1004142A1 (en) | 2000-05-31 |
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