JPS57122544A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPS57122544A JPS57122544A JP56007945A JP794581A JPS57122544A JP S57122544 A JPS57122544 A JP S57122544A JP 56007945 A JP56007945 A JP 56007945A JP 794581 A JP794581 A JP 794581A JP S57122544 A JPS57122544 A JP S57122544A
- Authority
- JP
- Japan
- Prior art keywords
- bar code
- type
- identifying
- automatically
- thoroughly
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/544—Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54413—Marks applied to semiconductor devices or parts comprising digital information, e.g. bar codes, data matrix
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54473—Marks applied to semiconductor devices or parts for use after dicing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54473—Marks applied to semiconductor devices or parts for use after dicing
- H01L2223/54486—Located on package parts, e.g. encapsulation, leads, package substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE:To thoroughly automate with a testing step by providing an identifying mark made of a bar code at a part (side face) of a package, and optically discriminating the type of a semiconductor device, thereby automatically and accurately identifying the devices of small quantity and many kinds. CONSTITUTION:An element type identification bar code 16 is printed on the side face of a package 10 mounted with and sealed from a pellet. A photosensor 18 is mounted as an identifying unit at the side faced with the side formed with the bar code 16 to detect the reflecting light of the light projected to the bar code 16, thereby automatically optically identifying the type to discriminate it. Subsequently, a controller is driven by the identification information, an optimum test program is, for example, automatically loaded, and the step is then performed. In this manner, the devices of small quantity and many kinds can be recognized, and discriminated for each type, and can be automated thoroughly with the other steps.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56007945A JPS57122544A (en) | 1981-01-23 | 1981-01-23 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56007945A JPS57122544A (en) | 1981-01-23 | 1981-01-23 | Semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57122544A true JPS57122544A (en) | 1982-07-30 |
Family
ID=11679625
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56007945A Pending JPS57122544A (en) | 1981-01-23 | 1981-01-23 | Semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57122544A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS632888A (en) * | 1986-06-23 | 1988-01-07 | Mitsubishi Metal Corp | Group management system for single crystal pulling-up device |
JPS639138U (en) * | 1986-07-03 | 1988-01-21 | ||
WO2004055894A1 (en) * | 2002-12-17 | 2004-07-01 | Infineon Technologies Ag | Integrated semiconductor module comprising an identification region |
KR100839003B1 (en) * | 1997-05-15 | 2008-06-18 | 마이크론 테크놀로지 인코포레이티드 | Method and apparatus for identifying integrated circuits |
US9430685B2 (en) | 2006-12-29 | 2016-08-30 | Intel Corporation | Substrate markings |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5210772B2 (en) * | 1974-08-16 | 1977-03-26 | ||
JPS5771151A (en) * | 1980-10-22 | 1982-05-01 | Nec Corp | Pakage for semiconductor device |
-
1981
- 1981-01-23 JP JP56007945A patent/JPS57122544A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5210772B2 (en) * | 1974-08-16 | 1977-03-26 | ||
JPS5771151A (en) * | 1980-10-22 | 1982-05-01 | Nec Corp | Pakage for semiconductor device |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS632888A (en) * | 1986-06-23 | 1988-01-07 | Mitsubishi Metal Corp | Group management system for single crystal pulling-up device |
JPH0751476B2 (en) * | 1986-06-23 | 1995-06-05 | 三菱マテリアル株式会社 | Group control system for single crystal pulling equipment |
JPS639138U (en) * | 1986-07-03 | 1988-01-21 | ||
KR100839003B1 (en) * | 1997-05-15 | 2008-06-18 | 마이크론 테크놀로지 인코포레이티드 | Method and apparatus for identifying integrated circuits |
USRE40623E1 (en) | 1997-05-15 | 2009-01-20 | Micron Technology, Inc. | Method and apparatus for identifying integrated circuits |
WO2004055894A1 (en) * | 2002-12-17 | 2004-07-01 | Infineon Technologies Ag | Integrated semiconductor module comprising an identification region |
US9430685B2 (en) | 2006-12-29 | 2016-08-30 | Intel Corporation | Substrate markings |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
ATE77891T1 (en) | PIN CHECK TIME DETERMINATION MEANS COMPREHENSIVE SMART CARD IDENTIFICATION SYSTEM. | |
FR2492101B1 (en) | DEVICE FOR INSPECTING AN OBJECT, SUCH AS A BOTTLE | |
ATE41827T1 (en) | METHOD AND APPARATUS FOR DISPLAYING AND DETECTING THE PIPETTING POSITION IN A PIPETTING SEQUENCE PERFORMED MANUALLY ON A TEST PLATE FILLED WITH A MATRIX OF WELLS. | |
DE3584042D1 (en) | DEVICE FOR MEASURING THE SPREADING REFLECTION LIGHT ON A NON-UNIFORM TEST. | |
CN206649125U (en) | Measuring instrument circuit board intelligent test system | |
JPS6440260A (en) | Workpiece positioning method in operation line | |
JPS57122544A (en) | Semiconductor device | |
DE3480746D1 (en) | DEVICE FOR DISPENSING CONSUMABLES LIKE ELECTRICITY, WATER ETC. | |
DE59006468D1 (en) | Device for testing electronic components with a charging station, a test station and an unloading station for the components. | |
JPS574134A (en) | Recognizing device | |
ATE45216T1 (en) | DEVICE WITH MEASUREMENT CIRCUIT. | |
JPS61196512A (en) | Manufacture of semiconductor device | |
JPS56144184A (en) | Ink detecting device | |
JPS57122545A (en) | Semiconductor device | |
DE68913902D1 (en) | Integrated circuit with a signal discrimination circuit and method for testing it. | |
FR2578328B1 (en) | ELECTRONIC DEVICE FOR DETECTING SMALL CONDUCTIVE SURFACES, IN PARTICULAR PEDAGOGICAL OR LEADING ASSEMBLY FOR TESTING KNOWLEDGE COMPRISING SUCH A DEVICE. | |
JPS55150368A (en) | Stamping method of body number in automobile assembly | |
JPH07334643A (en) | Method/device for inspecting printed circuit board | |
JPS5484496A (en) | Check system of luminous display unit | |
JPS5717873A (en) | Inspection method of semiconductor element | |
JPS54151899A (en) | Automatic dealing apparatus | |
JPS57178336A (en) | Automatic die-mounting device | |
JPS5717872A (en) | Defect indication method of semiconductor chip | |
JPS577547A (en) | Inspection of bottle | |
DE2965907D1 (en) | Method for detecting aerosols in air of a control zone and apparatus for its performing |