EP2325887A3 - Photoelektrische Umwandlungsvorrichtung und deren Herstellungsverfahren - Google Patents
Photoelektrische Umwandlungsvorrichtung und deren Herstellungsverfahren Download PDFInfo
- Publication number
- EP2325887A3 EP2325887A3 EP10183830A EP10183830A EP2325887A3 EP 2325887 A3 EP2325887 A3 EP 2325887A3 EP 10183830 A EP10183830 A EP 10183830A EP 10183830 A EP10183830 A EP 10183830A EP 2325887 A3 EP2325887 A3 EP 2325887A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- photoelectric
- photoelectric conversion
- conversion device
- section
- fabrication
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000006243 chemical reaction Methods 0.000 title abstract 5
- 238000004519 manufacturing process Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
- 239000004065 semiconductor Substances 0.000 abstract 3
- 230000002093 peripheral effect Effects 0.000 abstract 2
- 150000001875 compounds Chemical class 0.000 abstract 1
- 238000009792 diffusion process Methods 0.000 abstract 1
- 238000002844 melting Methods 0.000 abstract 1
- 239000002184 metal Substances 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
- H01L27/14689—MOS based technologies
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
- H01L27/14612—Pixel-elements with integrated switching, control, storage or amplification elements involving a transistor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Electrodes Of Semiconductors (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22307899 | 1999-08-05 | ||
JP2000232108A JP3624140B2 (ja) | 1999-08-05 | 2000-07-31 | 光電変換装置およびその製造方法、デジタルスチルカメラ又はデジタルビデオカメラ |
EP00306637A EP1075028B1 (de) | 1999-08-05 | 2000-08-04 | Photoelektrische Umwandlungsvorrichtung und deren Herstellungsverfahren |
Related Parent Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP00306637A Division EP1075028B1 (de) | 1999-08-05 | 2000-08-04 | Photoelektrische Umwandlungsvorrichtung und deren Herstellungsverfahren |
EP00306637.0 Division | 2000-08-04 |
Publications (3)
Publication Number | Publication Date |
---|---|
EP2325887A2 EP2325887A2 (de) | 2011-05-25 |
EP2325887A3 true EP2325887A3 (de) | 2011-08-03 |
EP2325887B1 EP2325887B1 (de) | 2016-07-27 |
Family
ID=26525259
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP10183830.8A Expired - Lifetime EP2325887B1 (de) | 1999-08-05 | 2000-08-04 | Photoelektrische Umwandlungsvorrichtung und deren Herstellungsverfahren |
EP00306637A Expired - Lifetime EP1075028B1 (de) | 1999-08-05 | 2000-08-04 | Photoelektrische Umwandlungsvorrichtung und deren Herstellungsverfahren |
EP10183833A Withdrawn EP2270861A3 (de) | 1999-08-05 | 2000-08-04 | Photoelektrische Umwandlungsvorrichtung und deren Herstellungsverfahren |
Family Applications After (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP00306637A Expired - Lifetime EP1075028B1 (de) | 1999-08-05 | 2000-08-04 | Photoelektrische Umwandlungsvorrichtung und deren Herstellungsverfahren |
EP10183833A Withdrawn EP2270861A3 (de) | 1999-08-05 | 2000-08-04 | Photoelektrische Umwandlungsvorrichtung und deren Herstellungsverfahren |
Country Status (4)
Country | Link |
---|---|
US (2) | US7342269B1 (de) |
EP (3) | EP2325887B1 (de) |
JP (1) | JP3624140B2 (de) |
TW (1) | TW513783B (de) |
Families Citing this family (49)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4831892B2 (ja) | 2001-07-30 | 2011-12-07 | 株式会社半導体エネルギー研究所 | 半導体装置 |
JP3722367B2 (ja) | 2002-03-19 | 2005-11-30 | ソニー株式会社 | 固体撮像素子の製造方法 |
CN100392858C (zh) | 2002-05-14 | 2008-06-04 | 索尼株式会社 | 半导体装置、半导体装置的制造方法及其电子设备 |
WO2004025732A1 (ja) * | 2002-09-12 | 2004-03-25 | Matsushita Electric Industrial Co., Ltd. | 固体撮像装置およびその製造方法 |
JP3641260B2 (ja) | 2002-09-26 | 2005-04-20 | 株式会社東芝 | 固体撮像装置 |
JP3840214B2 (ja) | 2003-01-06 | 2006-11-01 | キヤノン株式会社 | 光電変換装置及び光電変換装置の製造方法及び同光電変換装置を用いたカメラ |
JP2004304012A (ja) | 2003-03-31 | 2004-10-28 | Matsushita Electric Ind Co Ltd | 固体撮像装置およびその製造方法 |
JP4794821B2 (ja) * | 2004-02-19 | 2011-10-19 | キヤノン株式会社 | 固体撮像装置および撮像システム |
JP2005340475A (ja) * | 2004-05-26 | 2005-12-08 | Sony Corp | 固体撮像装置 |
WO2006025079A1 (ja) * | 2004-07-20 | 2006-03-09 | Fujitsu Limited | Cmos撮像素子 |
JP4750391B2 (ja) * | 2004-08-31 | 2011-08-17 | キヤノン株式会社 | 固体撮像装置の製造方法 |
JP2006134951A (ja) | 2004-11-02 | 2006-05-25 | Matsushita Electric Ind Co Ltd | 固体撮像装置 |
US7663167B2 (en) * | 2004-12-23 | 2010-02-16 | Aptina Imaging Corp. | Split transfer gate for dark current suppression in an imager pixel |
JP4810831B2 (ja) * | 2005-01-14 | 2011-11-09 | ソニー株式会社 | 半導体装置及びその製造方法 |
JP4729933B2 (ja) * | 2005-02-01 | 2011-07-20 | ソニー株式会社 | 固体撮像装置の製造方法 |
TWI302754B (en) * | 2005-02-28 | 2008-11-01 | Magnachip Semiconductor Ltd | Complementary metal-oxide-semiconductor image sensor and method for fabricating the same |
JP4340248B2 (ja) | 2005-03-17 | 2009-10-07 | 富士通マイクロエレクトロニクス株式会社 | 半導体撮像装置を製造する方法 |
JP2006310826A (ja) * | 2005-03-30 | 2006-11-09 | Fuji Photo Film Co Ltd | 固体撮像素子およびその製造方法 |
JP4822249B2 (ja) * | 2005-05-25 | 2011-11-24 | 株式会社日立超エル・エス・アイ・システムズ | 固体撮像素子とその識別情報付与方法 |
KR100660549B1 (ko) * | 2005-07-13 | 2006-12-22 | 삼성전자주식회사 | 이미지 센서 및 그 제조 방법 |
KR100695517B1 (ko) * | 2005-07-26 | 2007-03-14 | 삼성전자주식회사 | 씨모스 이미지 센서 및 그 제조방법 |
JP2008004696A (ja) * | 2006-06-21 | 2008-01-10 | Sharp Corp | 接続用配線構造、接続用配線構造の製造方法、固体撮像装置の製造方法、固体撮像装置および電子情報機器 |
JP5110820B2 (ja) * | 2006-08-02 | 2012-12-26 | キヤノン株式会社 | 光電変換装置、光電変換装置の製造方法及び撮像システム |
JP4345794B2 (ja) | 2006-09-28 | 2009-10-14 | ソニー株式会社 | 固体撮像素子の製造方法 |
KR100860466B1 (ko) * | 2006-12-27 | 2008-09-25 | 동부일렉트로닉스 주식회사 | 씨모스 이미지센서 및 그 제조방법 |
US7696546B2 (en) | 2007-01-19 | 2010-04-13 | Panasonic Corporation | Solid-state imaging device having wiring layer which includes lamination of silicide layer in order to reduce wiring resistance, and manufacturing method for the same |
JP4693183B2 (ja) * | 2007-03-07 | 2011-06-01 | パナソニック株式会社 | 固体撮像装置の製造方法 |
KR100898908B1 (ko) * | 2007-08-07 | 2009-05-27 | 한국과학기술원 | 능동 픽셀 센서 |
KR20090128902A (ko) * | 2008-06-11 | 2009-12-16 | 크로스텍 캐피탈, 엘엘씨 | 이중 하드마스크막을 이용한 씨모스이미지센서 제조 방법 |
JP5280121B2 (ja) * | 2008-07-07 | 2013-09-04 | ルネサスエレクトロニクス株式会社 | 半導体装置およびその製造方法 |
US9041841B2 (en) * | 2008-10-10 | 2015-05-26 | Taiwan Semiconductor Manufacturing Company, Ltd. | Image sensor having enhanced backside illumination quantum efficiency |
JP2010118411A (ja) * | 2008-11-11 | 2010-05-27 | Sharp Corp | 固体撮像素子およびその製造方法、電子情報機器 |
US8247262B2 (en) * | 2009-05-04 | 2012-08-21 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method for reducing contact resistance of CMOS image sensor |
JP5500876B2 (ja) * | 2009-06-08 | 2014-05-21 | キヤノン株式会社 | 光電変換装置の製造方法 |
JP5558916B2 (ja) * | 2009-06-26 | 2014-07-23 | キヤノン株式会社 | 光電変換装置の製造方法 |
JP5890863B2 (ja) * | 2009-06-26 | 2016-03-22 | キヤノン株式会社 | 光電変換装置の製造方法 |
JP2011077072A (ja) * | 2009-09-29 | 2011-04-14 | Panasonic Corp | 固体撮像素子及びその製造方法 |
EP2518768B1 (de) | 2009-12-26 | 2019-03-20 | Canon Kabushiki Kaisha | Festkörperabbildungsvorrichtung und abbildundssystem |
CN105023930B (zh) * | 2009-12-26 | 2018-04-06 | 佳能株式会社 | 固态图像拾取装置和图像拾取系统 |
JP5651982B2 (ja) * | 2010-03-31 | 2015-01-14 | ソニー株式会社 | 固体撮像装置、固体撮像装置の製造方法、及び電子機器 |
JP5852363B2 (ja) * | 2011-08-26 | 2016-02-03 | 日本放送協会 | 空間光変調器 |
JP5943577B2 (ja) | 2011-10-07 | 2016-07-05 | キヤノン株式会社 | 光電変換装置および撮像システム |
JP2012146989A (ja) * | 2012-02-20 | 2012-08-02 | Canon Inc | 光電変換装置及び撮像システム |
JP6193695B2 (ja) * | 2013-09-13 | 2017-09-06 | ルネサスエレクトロニクス株式会社 | 半導体装置およびその製造方法 |
JP2014171244A (ja) * | 2014-05-02 | 2014-09-18 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
JP6650719B2 (ja) | 2015-09-30 | 2020-02-19 | キヤノン株式会社 | 撮像装置、撮像システムおよび半導体装置の製造方法 |
US20190103501A1 (en) * | 2016-03-30 | 2019-04-04 | Sony Corporation | Light-receiving device, imaging unit, and electronic apparatus |
JP2018006551A (ja) | 2016-06-30 | 2018-01-11 | キヤノン株式会社 | 固体撮像装置の製造方法 |
JP6808481B2 (ja) | 2016-12-27 | 2021-01-06 | キヤノン株式会社 | 半導体装置、システム、および、半導体装置の製造方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1217573A (zh) * | 1997-11-14 | 1999-05-26 | 摩托罗拉公司 | 半导体图象传感器及其制造方法 |
WO1999054938A1 (en) * | 1998-04-21 | 1999-10-28 | Foveonics, Inc. | Cmos image sensor employing a silicide exclusion mask |
DE19929733A1 (de) * | 1998-06-29 | 2000-01-05 | Hyundai Electronics Ind | Bildsensor mit Selbstausrichtungs-Silizidschicht |
EP1139428A2 (de) * | 2000-03-28 | 2001-10-04 | Kabushiki Kaisha Toshiba | Festkörper-Bildaufnahmevorrichtung mit einer Photodiode und MOSFET und ihr Herstellungsverfahren |
Family Cites Families (25)
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JPS601980A (ja) | 1983-06-20 | 1985-01-08 | Hitachi Ltd | 固体撮像素子 |
JPH01205462A (ja) | 1988-02-10 | 1989-08-17 | Matsushita Electron Corp | 半導体素子 |
JPH06125069A (ja) | 1992-10-09 | 1994-05-06 | Sony Corp | 固体撮像素子及びその作製方法 |
JPH06326289A (ja) | 1993-05-10 | 1994-11-25 | Olympus Optical Co Ltd | 固体撮像装置 |
JPH07335890A (ja) | 1994-06-03 | 1995-12-22 | Seiko Epson Corp | 薄膜半導体装置の製造方法 |
JP2878137B2 (ja) * | 1994-06-29 | 1999-04-05 | シャープ株式会社 | 増幅型光電変換素子、それを用いた増幅型固体撮像装置、及び増幅型光電変換素子の製造方法 |
JP2586345B2 (ja) * | 1994-10-14 | 1997-02-26 | 日本電気株式会社 | コバルトシリサイド膜より成る半導体装置及び該装置の製造方法 |
JP3424360B2 (ja) | 1994-12-08 | 2003-07-07 | 株式会社日立製作所 | 固体撮像装置 |
JP3031606B2 (ja) | 1995-08-02 | 2000-04-10 | キヤノン株式会社 | 固体撮像装置と画像撮像装置 |
ES2211937T3 (es) | 1995-08-02 | 2004-07-16 | Canon Kabushiki Kaisha | Dispositivo sensor de imagenes de estado solido con linea de salida comun. |
JP3408045B2 (ja) | 1996-01-19 | 2003-05-19 | キヤノン株式会社 | 光電変換装置 |
US5986297A (en) * | 1996-05-22 | 1999-11-16 | Eastman Kodak Company | Color active pixel sensor with electronic shuttering, anti-blooming and low cross-talk |
US6137127A (en) * | 1997-08-07 | 2000-10-24 | Foveonics, Inc. | Low leakage active pixel using spacer protective mask compatible with CMOS process |
JP3814379B2 (ja) | 1997-09-01 | 2006-08-30 | キヤノン株式会社 | 光電変換装置 |
JPH11111974A (ja) | 1997-09-30 | 1999-04-23 | Matsushita Electron Corp | 半導体装置およびその製造方法 |
JPH11187307A (ja) | 1997-12-17 | 1999-07-09 | Canon Inc | 撮像装置及び撮像方法 |
JP3554483B2 (ja) * | 1998-04-22 | 2004-08-18 | シャープ株式会社 | Cmos型固体撮像装置 |
KR100464955B1 (ko) * | 1998-06-29 | 2005-04-06 | 매그나칩 반도체 유한회사 | 메모리소자와 함께 집적화된 씨모스 이미지센서 |
US6025267A (en) * | 1998-07-15 | 2000-02-15 | Chartered Semiconductor Manufacturing, Ltd. | Silicon nitride--TEOS oxide, salicide blocking layer for deep sub-micron devices |
US6348389B1 (en) * | 1999-03-11 | 2002-02-19 | Taiwan Semiconductor Manufacturing Company | Method of forming and etching a resist protect oxide layer including end-point etch |
JP3307372B2 (ja) | 1999-07-28 | 2002-07-24 | 日本電気株式会社 | 半導体装置およびその製造方法 |
JP3884600B2 (ja) | 1999-11-29 | 2007-02-21 | 富士通株式会社 | 光電変換装置及びその製造方法 |
US6194258B1 (en) * | 2000-01-18 | 2001-02-27 | Taiwan Semiconductor Manufacturing Company | Method of forming an image sensor cell and a CMOS logic circuit device |
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JP3919476B2 (ja) | 2000-08-07 | 2007-05-23 | キヤノン株式会社 | 撮像装置 |
-
2000
- 2000-07-31 JP JP2000232108A patent/JP3624140B2/ja not_active Expired - Lifetime
- 2000-08-04 EP EP10183830.8A patent/EP2325887B1/de not_active Expired - Lifetime
- 2000-08-04 EP EP00306637A patent/EP1075028B1/de not_active Expired - Lifetime
- 2000-08-04 EP EP10183833A patent/EP2270861A3/de not_active Withdrawn
- 2000-08-04 US US09/633,175 patent/US7342269B1/en not_active Expired - Lifetime
- 2000-08-05 TW TW089115813A patent/TW513783B/zh not_active IP Right Cessation
-
2007
- 2007-11-16 US US11/941,614 patent/US7476560B2/en not_active Expired - Lifetime
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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CN1217573A (zh) * | 1997-11-14 | 1999-05-26 | 摩托罗拉公司 | 半导体图象传感器及其制造方法 |
US6023081A (en) * | 1997-11-14 | 2000-02-08 | Motorola, Inc. | Semiconductor image sensor |
WO1999054938A1 (en) * | 1998-04-21 | 1999-10-28 | Foveonics, Inc. | Cmos image sensor employing a silicide exclusion mask |
DE19929733A1 (de) * | 1998-06-29 | 2000-01-05 | Hyundai Electronics Ind | Bildsensor mit Selbstausrichtungs-Silizidschicht |
EP1139428A2 (de) * | 2000-03-28 | 2001-10-04 | Kabushiki Kaisha Toshiba | Festkörper-Bildaufnahmevorrichtung mit einer Photodiode und MOSFET und ihr Herstellungsverfahren |
Non-Patent Citations (2)
Title |
---|
WUU S-G ET AL: "HIGH PERFORMANCE 0.25-UM CMOS COLOR IMAGER TECHNOLOGY WITH NON-SILICIDE SOURCE/DRAIN PIXEL", INTERNATIONAL ELECTRON DEVICES MEETING 2000. IEDM. TECHNICAL DIGEST. SAN FRANCISCO, CA, DEC. 10 - 13, 2000, NEW YORK, NY : IEEE, US, 10 December 2000 (2000-12-10), pages 705 - 708, XP000988925, ISBN: 0-7803-6439-2 * |
YANG D X D ET AL: "TEST STRUCTURES FOR CHARACTERIZATION AND COMPARATIVE ANALYSIS OF CMOS IMAGE SENSORS", PROCEEDINGS OF THE SPIE, SPIE, BELLINGHAM, VA, US, vol. 2950, 1996, pages 8 - 17, XP000933506, ISSN: 0277-786X * |
Also Published As
Publication number | Publication date |
---|---|
EP2325887A2 (de) | 2011-05-25 |
JP3624140B2 (ja) | 2005-03-02 |
EP2325887B1 (de) | 2016-07-27 |
EP1075028B1 (de) | 2012-07-18 |
US7476560B2 (en) | 2009-01-13 |
EP2270861A3 (de) | 2011-02-09 |
US7342269B1 (en) | 2008-03-11 |
JP2001111022A (ja) | 2001-04-20 |
EP1075028A3 (de) | 2008-06-04 |
US20080070341A1 (en) | 2008-03-20 |
TW513783B (en) | 2002-12-11 |
EP1075028A2 (de) | 2001-02-07 |
EP2270861A2 (de) | 2011-01-05 |
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