EP1469701B1 - Microstructures en relief - Google Patents
Microstructures en relief Download PDFInfo
- Publication number
- EP1469701B1 EP1469701B1 EP04076015A EP04076015A EP1469701B1 EP 1469701 B1 EP1469701 B1 EP 1469701B1 EP 04076015 A EP04076015 A EP 04076015A EP 04076015 A EP04076015 A EP 04076015A EP 1469701 B1 EP1469701 B1 EP 1469701B1
- Authority
- EP
- European Patent Office
- Prior art keywords
- sidewall
- diaphragm
- transducer
- raised microstructure
- raised
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R19/00—Electrostatic transducers
- H04R19/04—Microphones
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R19/00—Electrostatic transducers
- H04R19/005—Electrostatic transducers using semiconductor materials
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R31/00—Apparatus or processes specially adapted for the manufacture of transducers or diaphragms therefor
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R31/00—Apparatus or processes specially adapted for the manufacture of transducers or diaphragms therefor
- H04R31/006—Interconnection of transducer parts
Definitions
- the goal is to create a stiff element at a precise position relative to the diaphragm.
- One method to achieve this is to form the backplate using a silicon nitride thin film deposited over a shaped silicon oxide sacrificial layer which serves to establish the desired separation. This sacrificial layer is later removed through well known etch processes, leaving the raised backplate. Intrinsic tensile stress in the silicon nitride backplate will cause it to deflect out of position. Compressive stress is always avoided as it causes the structure to buckle.
- the object of the present invention is to solve these and other problems.
- the conducting diaphragm 12 is electrically insulated from the substrate 30 by a dielectric layer 31.
- a conducting electrode 42 is attached to the non-conductive perforated member 40.
- the perforated member contains a number of openings 21 through which a sacrificial layer (not shown) between the diaphragm and perforated member is etched during fabrication to form the air gap 20 and which later serve to reduce the acoustic damping of the air in the air gap to provide sufficient bandwidth of the transducer.
- a number of openings are also made in the diaphragm 12 and the perforated member 40 to form a leakage path 14 which together with the compliance of the back chamber (not shown), on which the transducer will be mounted, forms a high-pass filter resulting in a roll-off frequency low enough not to impede the acoustic function of the transducer and high enough to remove the influence of barometric pressure variations.
- the openings 14 are defined by photo lithographic methods and can therefore be tightly controlled, leading to a well defined low frequency behavior of the transducer.
- the attachment of the perforated member 40 along the perimeter 43 can be varied to reduce the curvature of the perforated member due to intrinsic internal bending moments.
- the perimeter can be a continuous curved surface ( FIGS. 1-3 ) or discontinuous, such as corrugated ( FIG. 4 ).
- a discontinuous perimeter 43 provides additional rigidity of the perforated member 40 thereby reducing the curvature due to intrinsic bending moments in the perforated member 40 .
- the transducer 50 includes a conductive diaphragm 12 and a perforated member 40 supported by a substrate 30 and separated by an air gap 20 .
- the diaphragm 12 is attached to the substrate through a number of springs 11 , which serve to mechanically decouple the diaphragm from the substrate, thereby relieving any intrinsic stress in the diaphragm. Moreover, the diaphragm is released for stress in the substrate and device package.
- the conducting diaphragm 12 is electrically insulated from the substrate 30 by a dielectric layer 31 .
- a conducting electrode 42 is attached to the non-conductive perforated member 40 .
- the perforated member contains a number of openings 21 through which a sacrificial layer (not shown) between the diaphragm 12 and the perforated member is etched during fabrication to form the air gap 20 and which later serves to reduce the acoustic damping of the air in the air gap to provide sufficient bandwidth of the transducer.
- a number of openings are made in the support structure 41 to form a leakage path 14 ( FIG.
- an electrical potential is applied between the conductive diaphragm 12 and the electrode 42 on the perforated member.
- the electrical potential and associated charging of the conductors produces an electrostatic attraction force between the diaphragm and the perforated member.
- the free diaphragm 12 moves toward the perforated member 40 until it rests upon the support structure 41 , which sets the initial operating point of the transducer with a well defined air gap 20 and acoustic leakage through path 14 .
- a pressure difference appears across the diaphragm 12 causing it to deflect towards or away from the perforated member 40 .
- the deflection of the diaphragm 12 causes a change of the electrical field, and consequently capacitance, between the diaphragm 12 and the perforated member 40 .
- the electrical capacitance of the transducer is modulated by the acoustical energy.
- the amplifier supplies a mirror charge on output side of the feedback capacitor to remove the offset, resulting in a change of output voltage "Vout.”
- the charge gain in this circuit is set by the ratio between the initial transducer capacitance and the capacitance of the feedback capacitor.
- the raised microstructure 110 comprises a generally circular thin-film plate or backplate 112 supported by a sidewall 114 .
- FIG. 15 shows a plan view of the assembly of FIG. 13 with a surface of the sidewall 114 of the present invention shown in phantom. It can be seen that the sidewall 114 of the present invention as shown in FIGS. 13-15 is ribbed, forming a plurality of periodic ridges 120 and grooves 122. In the preferred embodiment, the ridges 120 and grooves 122 are parallel and equally spaced, forming a corrugated structure. Furthermore, the preferred embodiment utilizes ridges 120 and grooves 122 of a squared cross section. The effect of corrugating the side wall in this manner is to create segments 124 of the sidewall 114 that are radial, as is the intrinsic tension T of the plate 112.
- the sidewall 114 By making portions of the sidewall 114 radial, as is the tension T , the sidewall 114 is stiffened. It has been found that the sidewall 114 of the prior art, which is tangential to plate 112 , is easily bent as compared to the radial segments 124 of the present invention.
- FIGS. 13-15 Other geometries than that shown in FIGS. 13-15 of the corrugations or ridges 120 and grooves 122 can be imagined and used effectively to increase the sidewall's 114 ability to resist moment M and the geometry depicted in the FIGS. 13-15 is not intended to limit the scope of the present invention.
- a generally annular geometry, generally triangular geometry or any combination or variation of these geometries or others could be utilized for the ridges 122 and grooves 124 .
- the corrugations are radial and hence the sidewalls 114 are parallel to the tension in the backplate 112 .
- the sacrificial material is etched in such a way that the sidewalls 114 are sloped with respect to the substrate to allow good step coverage as the thin film backplate 112 is deposited.
Claims (8)
- - Microstructure en relief (110) destinée à être utilisée dans un dispositif à base de silicium, la microstructure en relief (110) comprenant : une plaque en feuille mince (112), généralement plane, ayant une périphérie ; et une paroi latérale (114), caractérisée par le fait que la paroi latérale (114) est à nervures et comprend une pluralité de crêtes (120) et rainures (122), les crêtes et rainures (120, 122) s'étendant sensiblement sur toute la périphérie et étant en outre disposées sensiblement perpendiculairement à une bordure de la plaque en feuille mince (112) définie par la périphérie, la paroi latérale à nervures (114) étant disposée pour supporter la plaque en feuille mince (112), généralement plane, le long de la périphérie ; et par le fait que les différentes crêtes et rainures (120, 122) de la paroi latérale à nervures (114) forment au moins une nervure, et dans laquelle au moins une nervure renforce la paroi latérale à nervures (114).
- - Microstructure en relief selon la revendication 1, dans laquelle les crêtes et rainures (120, 122) de la paroi latérale à nervures (114) sont parallèles et espacées de manière égale pour former une paroi latérale cannelée.
- - Microstructure en relief selon la revendication 1, dans laquelle la nervure (120) a une section transversale généralement arquée.
- - Microstructure en relief selon la revendication 1, dans laquelle la nervure (120) a une section transversale généralement triangulaire.
- - Microstructure en relief selon la revendication 1, dans laquelle la nervure (120) a une section transversale généralement rectangulaire.
- - Microstructure en relief selon la revendication 1, dans laquelle la plaque en feuille mince (112) comprend une plaque d'un transducteur capacitif à base de silicium.
- - Microstructure en relief selon la revendication 1, dans laquelle la plaque en feuille mince (112) comprend une plaque arrière rigide d'un microphone à base de silicium.
- - Microstructure en relief selon la revendication 1, dans laquelle la paroi latérale (114) enferme sensiblement complètement la zone au-dessous de la plaque en feuille mince (112).
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US910110 | 1978-05-30 | ||
US63740100A | 2000-08-11 | 2000-08-11 | |
US637401 | 2000-08-11 | ||
US09/910,110 US6987859B2 (en) | 2001-07-20 | 2001-07-20 | Raised microstructure of silicon based device |
EP01959715A EP1310136B1 (fr) | 2000-08-11 | 2001-08-10 | Transducteur a bande large miniature |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP01959715A Division EP1310136B1 (fr) | 2000-08-11 | 2001-08-10 | Transducteur a bande large miniature |
Publications (3)
Publication Number | Publication Date |
---|---|
EP1469701A2 EP1469701A2 (fr) | 2004-10-20 |
EP1469701A3 EP1469701A3 (fr) | 2005-11-16 |
EP1469701B1 true EP1469701B1 (fr) | 2008-04-16 |
Family
ID=27092826
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP04076015A Expired - Lifetime EP1469701B1 (fr) | 2000-08-11 | 2001-08-10 | Microstructures en relief |
EP01959715A Expired - Lifetime EP1310136B1 (fr) | 2000-08-11 | 2001-08-10 | Transducteur a bande large miniature |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP01959715A Expired - Lifetime EP1310136B1 (fr) | 2000-08-11 | 2001-08-10 | Transducteur a bande large miniature |
Country Status (9)
Country | Link |
---|---|
EP (2) | EP1469701B1 (fr) |
JP (3) | JP4338395B2 (fr) |
KR (1) | KR100571967B1 (fr) |
CN (2) | CN1498513B (fr) |
AT (2) | ATE321429T1 (fr) |
AU (1) | AU2001281241A1 (fr) |
DE (2) | DE60118208T2 (fr) |
DK (2) | DK1469701T3 (fr) |
WO (1) | WO2002015636A2 (fr) |
Cited By (4)
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US9779716B2 (en) | 2015-12-30 | 2017-10-03 | Knowles Electronics, Llc | Occlusion reduction and active noise reduction based on seal quality |
US9812149B2 (en) | 2016-01-28 | 2017-11-07 | Knowles Electronics, Llc | Methods and systems for providing consistency in noise reduction during speech and non-speech periods |
US9830930B2 (en) | 2015-12-30 | 2017-11-28 | Knowles Electronics, Llc | Voice-enhanced awareness mode |
US9961443B2 (en) | 2015-09-14 | 2018-05-01 | Knowles Electronics, Llc | Microphone signal fusion |
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US7434305B2 (en) | 2000-11-28 | 2008-10-14 | Knowles Electronics, Llc. | Method of manufacturing a microphone |
US7166910B2 (en) | 2000-11-28 | 2007-01-23 | Knowles Electronics Llc | Miniature silicon condenser microphone |
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2001
- 2001-08-10 DK DK04076015T patent/DK1469701T3/da active
- 2001-08-10 EP EP04076015A patent/EP1469701B1/fr not_active Expired - Lifetime
- 2001-08-10 DK DK01959715T patent/DK1310136T3/da active
- 2001-08-10 WO PCT/US2001/025184 patent/WO2002015636A2/fr active IP Right Grant
- 2001-08-10 EP EP01959715A patent/EP1310136B1/fr not_active Expired - Lifetime
- 2001-08-10 DE DE60118208T patent/DE60118208T2/de not_active Expired - Lifetime
- 2001-08-10 KR KR1020037002017A patent/KR100571967B1/ko not_active IP Right Cessation
- 2001-08-10 AT AT01959715T patent/ATE321429T1/de not_active IP Right Cessation
- 2001-08-10 DE DE60133679T patent/DE60133679T2/de not_active Expired - Lifetime
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- 2001-08-10 AT AT04076015T patent/ATE392790T1/de not_active IP Right Cessation
- 2001-08-10 CN CN2010102062254A patent/CN101867858B/zh not_active Expired - Lifetime
- 2001-08-10 AU AU2001281241A patent/AU2001281241A1/en not_active Abandoned
- 2001-08-10 JP JP2002519372A patent/JP4338395B2/ja not_active Expired - Fee Related
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
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US9961443B2 (en) | 2015-09-14 | 2018-05-01 | Knowles Electronics, Llc | Microphone signal fusion |
US9779716B2 (en) | 2015-12-30 | 2017-10-03 | Knowles Electronics, Llc | Occlusion reduction and active noise reduction based on seal quality |
US9830930B2 (en) | 2015-12-30 | 2017-11-28 | Knowles Electronics, Llc | Voice-enhanced awareness mode |
US9812149B2 (en) | 2016-01-28 | 2017-11-07 | Knowles Electronics, Llc | Methods and systems for providing consistency in noise reduction during speech and non-speech periods |
Also Published As
Publication number | Publication date |
---|---|
ATE392790T1 (de) | 2008-05-15 |
JP2004506394A (ja) | 2004-02-26 |
KR100571967B1 (ko) | 2006-04-18 |
DE60118208T2 (de) | 2007-04-12 |
DE60118208D1 (de) | 2006-05-11 |
CN101867858B (zh) | 2012-02-22 |
JP2007116721A (ja) | 2007-05-10 |
JP2009153203A (ja) | 2009-07-09 |
WO2002015636A3 (fr) | 2002-10-24 |
EP1310136B1 (fr) | 2006-03-22 |
CN101867858A (zh) | 2010-10-20 |
CN1498513B (zh) | 2010-07-14 |
DK1469701T3 (da) | 2008-08-18 |
WO2002015636A2 (fr) | 2002-02-21 |
EP1469701A3 (fr) | 2005-11-16 |
DE60133679D1 (de) | 2008-05-29 |
EP1310136A2 (fr) | 2003-05-14 |
AU2001281241A1 (en) | 2002-02-25 |
JP5049312B2 (ja) | 2012-10-17 |
DE60133679T2 (de) | 2009-06-10 |
CN1498513A (zh) | 2004-05-19 |
EP1469701A2 (fr) | 2004-10-20 |
KR20030033026A (ko) | 2003-04-26 |
ATE321429T1 (de) | 2006-04-15 |
DK1310136T3 (da) | 2006-07-31 |
JP4338395B2 (ja) | 2009-10-07 |
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