DE69823957T2 - Vorrichtung zum Polieren von Halbleiterscheiben - Google Patents

Vorrichtung zum Polieren von Halbleiterscheiben Download PDF

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Publication number
DE69823957T2
DE69823957T2 DE69823957T DE69823957T DE69823957T2 DE 69823957 T2 DE69823957 T2 DE 69823957T2 DE 69823957 T DE69823957 T DE 69823957T DE 69823957 T DE69823957 T DE 69823957T DE 69823957 T2 DE69823957 T2 DE 69823957T2
Authority
DE
Germany
Prior art keywords
wafer
assembly
polishing
head
roller
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69823957T
Other languages
German (de)
English (en)
Other versions
DE69823957D1 (de
Inventor
Eric H. Livermore Engdahl
Edward T. Jr. Gilroy Ferri
Wilbur C. Palo Alto Krusell
Rahul San Jose Jairath
Randall L. Watsonville Green
Anil Santa Clara Pant
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lam Research Corp
Original Assignee
Lam Research Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lam Research Corp filed Critical Lam Research Corp
Application granted granted Critical
Publication of DE69823957D1 publication Critical patent/DE69823957D1/de
Publication of DE69823957T2 publication Critical patent/DE69823957T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105After-treatment
    • H01L21/31051Planarisation of the insulating layers
    • H01L21/31053Planarisation of the insulating layers involving a dielectric removal step
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/34Accessories
    • B24B37/345Feeding, loading or unloading work specially adapted to lapping
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B21/00Machines or devices using grinding or polishing belts; Accessories therefor
    • B24B21/04Machines or devices using grinding or polishing belts; Accessories therefor for grinding plane surfaces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B21/00Machines or devices using grinding or polishing belts; Accessories therefor
    • B24B21/04Machines or devices using grinding or polishing belts; Accessories therefor for grinding plane surfaces
    • B24B21/10Machines or devices using grinding or polishing belts; Accessories therefor for grinding plane surfaces involving a rigid member, e.g. pressure bar, table, pressing or supporting the belt over substantially its whole span
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/042Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B41/00Component parts such as frames, beds, carriages, headstocks
    • B24B41/005Feeding or manipulating devices specially adapted to grinding machines
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/30625With simultaneous mechanical treatment, e.g. mechanico-chemical polishing

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
DE69823957T 1997-11-12 1998-11-11 Vorrichtung zum Polieren von Halbleiterscheiben Expired - Fee Related DE69823957T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US968333 1997-11-12
US08/968,333 US6336845B1 (en) 1997-11-12 1997-11-12 Method and apparatus for polishing semiconductor wafers

Publications (2)

Publication Number Publication Date
DE69823957D1 DE69823957D1 (de) 2004-06-24
DE69823957T2 true DE69823957T2 (de) 2005-06-23

Family

ID=25514099

Family Applications (2)

Application Number Title Priority Date Filing Date
DE69830374T Expired - Fee Related DE69830374T2 (de) 1997-11-12 1998-11-11 Verfahren und Vorrichtung zum Polieren von Halbleiterscheiben
DE69823957T Expired - Fee Related DE69823957T2 (de) 1997-11-12 1998-11-11 Vorrichtung zum Polieren von Halbleiterscheiben

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE69830374T Expired - Fee Related DE69830374T2 (de) 1997-11-12 1998-11-11 Verfahren und Vorrichtung zum Polieren von Halbleiterscheiben

Country Status (7)

Country Link
US (3) US6336845B1 (ko)
EP (2) EP0916452B1 (ko)
JP (2) JPH11221755A (ko)
KR (2) KR100507432B1 (ko)
AT (1) ATE267070T1 (ko)
DE (2) DE69830374T2 (ko)
TW (2) TW407312B (ko)

Families Citing this family (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5593852A (en) * 1993-12-02 1997-01-14 Heller; Adam Subcutaneous glucose electrode
US6336845B1 (en) * 1997-11-12 2002-01-08 Lam Research Corporation Method and apparatus for polishing semiconductor wafers
US6244121B1 (en) * 1998-03-06 2001-06-12 Applied Materials, Inc. Sensor device for non-intrusive diagnosis of a semiconductor processing system
US6423642B1 (en) * 1998-03-13 2002-07-23 Semitool, Inc. Reactor for processing a semiconductor wafer
US7217325B2 (en) * 1999-01-22 2007-05-15 Semitool, Inc. System for processing a workpiece
US6431959B1 (en) 1999-12-20 2002-08-13 Lam Research Corporation System and method of defect optimization for chemical mechanical planarization of polysilicon
US6705930B2 (en) 2000-01-28 2004-03-16 Lam Research Corporation System and method for polishing and planarizing semiconductor wafers using reduced surface area polishing pads and variable partial pad-wafer overlapping techniques
US6340326B1 (en) 2000-01-28 2002-01-22 Lam Research Corporation System and method for controlled polishing and planarization of semiconductor wafers
US6368968B1 (en) * 2000-04-11 2002-04-09 Vanguard International Semiconductor Corporation Ditch type floating ring for chemical mechanical polishing
US6659116B1 (en) 2000-06-26 2003-12-09 Lam Research Corporation System for wafer carrier in-process clean and rinse
US6505636B1 (en) * 2000-06-26 2003-01-14 Lam Research Corporation Apparatus for wafer carrier in-process clean and rinse
US6486550B1 (en) 2000-06-29 2002-11-26 Lam Research Corporation Locking mechanism for detachably securing a wafer carrier to a conveyor
US6991512B2 (en) * 2001-03-30 2006-01-31 Lam Research Corporation Apparatus for edge polishing uniformity control
US6790768B2 (en) * 2001-07-11 2004-09-14 Applied Materials Inc. Methods and apparatus for polishing substrates comprising conductive and dielectric materials with reduced topographical defects
JP2003077993A (ja) * 2001-08-30 2003-03-14 Nec Yamagata Ltd ウェーハ用ホルダ、及び、ウェーハの吸着解放方法
US6586337B2 (en) 2001-11-09 2003-07-01 Speedfam-Ipec Corporation Method and apparatus for endpoint detection during chemical mechanical polishing
US6808442B1 (en) * 2001-12-20 2004-10-26 Lam Research Corporation Apparatus for removal/remaining thickness profile manipulation
US6758724B2 (en) * 2002-01-09 2004-07-06 Taiwan Semiconductor Manufacturing Co., Ltd Online tension monitor system for robot x-belt of mirra CMP
US6722946B2 (en) * 2002-01-17 2004-04-20 Nutool, Inc. Advanced chemical mechanical polishing system with smart endpoint detection
US6955914B2 (en) * 2002-04-10 2005-10-18 Geneohm Sciences, Inc. Method for making a molecularly smooth surface
US6726545B2 (en) * 2002-04-26 2004-04-27 Chartered Semiconductor Manufacturing Ltd. Linear polishing for improving substrate uniformity
US6887338B1 (en) * 2002-06-28 2005-05-03 Lam Research Corporation 300 mm platen and belt configuration
US6567725B1 (en) * 2002-07-15 2003-05-20 Speedfam-Ipec Corporation Method and apparatus for teaching robot station location
JP2004079587A (ja) * 2002-08-09 2004-03-11 Reitetsukusu:Kk ウエハ回転装置とこれを有する端部傷検査装置
US7111328B2 (en) * 2003-02-13 2006-09-26 Robison's Inc. Hybrid ventilated garment
JP2004288727A (ja) * 2003-03-19 2004-10-14 Seiko Epson Corp Cmp装置、cmp研磨方法、半導体装置及びその製造方法
US7018273B1 (en) 2003-06-27 2006-03-28 Lam Research Corporation Platen with diaphragm and method for optimizing wafer polishing
US7025660B2 (en) * 2003-08-15 2006-04-11 Lam Research Corporation Assembly and method for generating a hydrodynamic air bearing
US7418978B2 (en) * 2004-01-30 2008-09-02 Applied Materials, Inc. Methods and apparatus for providing fluid to a semiconductor device processing apparatus
US6958005B1 (en) * 2004-03-30 2005-10-25 Lam Research Corporation Polishing pad conditioning system
US6969307B2 (en) * 2004-03-30 2005-11-29 Lam Research Corporation Polishing pad conditioning and polishing liquid dispersal system
US7641762B2 (en) * 2005-09-02 2010-01-05 Applied Materials, Inc. Gas sealing skirt for suspended showerhead in process chamber
JP4814677B2 (ja) * 2006-03-31 2011-11-16 株式会社荏原製作所 基板保持装置および研磨装置
US7776178B2 (en) * 2006-10-25 2010-08-17 Applied Materials, Inc. Suspension for showerhead in process chamber
DE102008045534B4 (de) * 2008-09-03 2011-12-01 Siltronic Ag Verfahren zum Polieren einer Halbleiterscheibe
KR100969390B1 (ko) * 2008-10-30 2010-07-09 현대자동차주식회사 가공용 지그장치
DE102010025250A1 (de) * 2009-08-18 2011-02-24 Sms Logistiksysteme Gmbh Verfahren und Vorrichtung zum Handhaben von Brammen zum Schleifen der Brammen-Oberflächen
JP5746553B2 (ja) * 2011-04-28 2015-07-08 株式会社東芝 基板加工システム、および基板加工プログラム
US20140310895A1 (en) * 2013-04-19 2014-10-23 Applied Materials, Inc. Scrubber brush force control assemblies, apparatus and methods for chemical mechanical polishing
CN105397632B (zh) * 2015-12-28 2018-09-11 北京中电科电子装备有限公司 一种气浮式旋转工作台工位切换的控制方法及装置
KR102050975B1 (ko) * 2017-12-27 2020-01-08 주식회사 케이씨텍 기판 지지 유닛 및 이를 포함하는 기판 연마 장치
KR102564114B1 (ko) * 2018-05-16 2023-08-07 주식회사 케이씨텍 기판 처리 장치
KR20200130545A (ko) * 2019-05-08 2020-11-19 삼성디스플레이 주식회사 표시 장치의 제조장치 및 표시 장치의 제조방법
KR20220122363A (ko) * 2021-02-26 2022-09-02 주식회사 케이씨텍 기판 연마 시스템
CN113967874B (zh) * 2021-11-17 2022-10-14 江苏纳沛斯半导体有限公司 一种半导体晶圆制备用硅晶棒研磨加工设备
CN116344348A (zh) * 2023-05-29 2023-06-27 深圳辰达行电子有限公司 屏蔽栅沟槽sgt-mosfet半导体器件的制备方法

Family Cites Families (123)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2606405A (en) 1946-08-17 1952-08-12 Bell Telephone Labor Inc Polishing means and method
US3504457A (en) 1966-07-05 1970-04-07 Geoscience Instr Corp Polishing apparatus
US3615955A (en) 1969-02-28 1971-10-26 Ibm Method for polishing a silicon surface
US3631634A (en) 1970-01-26 1972-01-04 John L Weber Polishing machine
US3708921A (en) 1970-08-17 1973-01-09 Monsanto Co Apparatus and process for polishing semiconductor or similar materials
US3857123A (en) 1970-10-21 1974-12-31 Monsanto Co Apparatus for waxless polishing of thin wafers
US3691694A (en) 1970-11-02 1972-09-19 Ibm Wafer polishing machine
US3731435A (en) 1971-02-09 1973-05-08 Speedfam Corp Polishing machine load plate
US3753269A (en) 1971-05-21 1973-08-21 R Budman Abrasive cloth cleaner
US3747282A (en) 1971-11-29 1973-07-24 E Katzke Apparatus for polishing wafers
DE2306660A1 (de) 1973-02-10 1974-08-15 Wehner Kg Bandschleifmaschine
US3903653A (en) 1973-04-11 1975-09-09 Harold J Imhoff Lapping machine
US3924361A (en) 1973-05-29 1975-12-09 Rca Corp Method of shaping semiconductor workpieces
US3888053A (en) 1973-05-29 1975-06-10 Rca Corp Method of shaping semiconductor workpiece
US3833230A (en) 1973-09-13 1974-09-03 Corning Glass Works Vacuum chuck
US3986433A (en) 1974-10-29 1976-10-19 R. Howard Strasbaugh, Inc. Lap milling machine
DE2451549A1 (de) 1974-10-30 1976-08-12 Mueller Georg Kugellager Belade- und entladevorrichtung fuer plattenfoermige halbleitermaterialien
US4009539A (en) 1975-06-16 1977-03-01 Spitfire Tool & Machine Co., Inc. Lapping machine with vacuum workholder
US4020600A (en) 1976-08-13 1977-05-03 Spitfire Tool & Machine Co., Inc. Polishing fixture
US4098031A (en) 1977-01-26 1978-07-04 Bell Telephone Laboratories, Incorporated Method for lapping semiconductor material
US4104099A (en) 1977-01-27 1978-08-01 International Telephone And Telegraph Corporation Method and apparatus for lapping or polishing materials
US4132037A (en) 1977-02-28 1979-01-02 Siltec Corporation Apparatus for polishing semiconductor wafers
DE2712521A1 (de) 1977-03-22 1978-09-28 Wacker Chemitronic Verfahren zum aufkitten von scheiben
US4193226A (en) 1977-09-21 1980-03-18 Kayex Corporation Polishing apparatus
US4141180A (en) 1977-09-21 1979-02-27 Kayex Corporation Polishing apparatus
US4194324A (en) 1978-01-16 1980-03-25 Siltec Corporation Semiconductor wafer polishing machine and wafer carrier therefor
DE2809274A1 (de) 1978-03-03 1979-09-13 Wacker Chemitronic Verfahren zur vergleichmaessigung des polierabtrages von scheiben beim polieren
US4187645A (en) 1978-07-26 1980-02-12 Timesavers, Inc. Reactive system for accommodating belt stretch and tracking
US4239567A (en) 1978-10-16 1980-12-16 Western Electric Company, Inc. Removably holding planar articles for polishing operations
US4380412A (en) 1979-08-02 1983-04-19 R. Howard Strasbaugh, Inc. Lap shaping machine with oscillatable point cutter and selectively rotatable or oscillatable lap
US4519168A (en) 1979-09-18 1985-05-28 Speedfam Corporation Liquid waxless fixturing of microsize wafers
US4256535A (en) 1979-12-05 1981-03-17 Western Electric Company, Inc. Method of polishing a semiconductor wafer
US4337598A (en) * 1979-12-21 1982-07-06 Minnesota Mining And Manufacturing Company Endless belt with automatic steering control
US4316757A (en) 1980-03-03 1982-02-23 Monsanto Company Method and apparatus for wax mounting of thin wafers for polishing
US4318250A (en) 1980-03-31 1982-03-09 St. Florian Company, Ltd. Wafer grinder
SU975360A1 (ru) 1981-06-02 1982-11-23 Предприятие П/Я Р-6793 Устройство дл нагружени притира доводочного станка
US4450652A (en) 1981-09-04 1984-05-29 Monsanto Company Temperature control for wafer polishing
US4373991A (en) 1982-01-28 1983-02-15 Western Electric Company, Inc. Methods and apparatus for polishing a semiconductor wafer
FR2523892A1 (fr) 1982-03-26 1983-09-30 Procedes Equip Sciences Ind Perfectionnements aux machines de polissage a plateau tournant
JPS58171255A (ja) 1982-03-29 1983-10-07 Toshiba Corp 両面鏡面研摩装置
SU1057258A1 (ru) 1982-07-05 1983-11-30 Московское Ордена Ленина, Ордена Октябрьской Революции И Ордена Трудового Красного Знамени Высшее Техническое Училище Им. Н.Э.Баумана Устройство дл двусторонней доводки деталей
JPS5914469A (ja) 1982-07-08 1984-01-25 Disco Abrasive Sys Ltd ポリツシング装置
EP0100648A3 (en) 1982-07-29 1985-08-07 Yoshiaki Nagaura Holding a workpiece
US4512113A (en) 1982-09-23 1985-04-23 Budinger William D Workpiece holder for polishing operation
JPS59161262A (ja) 1983-03-04 1984-09-12 Masanori Kunieda 磁気吸引式研摩方法
JPS6080555A (ja) * 1983-10-08 1985-05-08 Shinko Kogyo Kk ベルトサンダ−のベルト走行装置
US4593495A (en) 1983-11-25 1986-06-10 Toshiba Machine Co., Ltd. Polishing machine
GB2174936B (en) 1984-04-23 1988-07-13 Timesavers Inc Sanding and polishing machine
JPS6144571A (ja) * 1984-07-31 1986-03-04 Toshio Takegawa 斜行バンド式ベルトサンダ−
JPS61152357A (ja) * 1984-12-24 1986-07-11 Hitachi Ltd 加工装置
US4680893A (en) 1985-09-23 1987-07-21 Motorola, Inc. Apparatus for polishing semiconductor wafers
JPS62162466A (ja) 1986-01-09 1987-07-18 Rohm Co Ltd ウエハ用ラツピング装置
US4627169A (en) 1986-01-27 1986-12-09 Westinghouse Electric Corp. Remote center compliance device
US4711610A (en) 1986-04-04 1987-12-08 Machine Technology, Inc. Balancing chuck
US4918870A (en) 1986-05-16 1990-04-24 Siltec Corporation Floating subcarriers for wafer polishing apparatus
US4720939A (en) 1986-05-23 1988-01-26 Simpson Products, Inc. Wide belt sander cleaning device
JPS63200965A (ja) 1987-02-12 1988-08-19 Fujitsu Ltd ウエ−ハ研磨装置
US4811522A (en) 1987-03-23 1989-03-14 Gill Jr Gerald L Counterbalanced polishing apparatus
JPS63251166A (ja) 1987-04-07 1988-10-18 Hitachi Ltd ウエハチヤツク
JPS63267155A (ja) 1987-04-24 1988-11-04 Babcock Hitachi Kk 研磨装置
DE3802561A1 (de) 1988-01-28 1989-08-10 Josef Kusser Vorrichtung zur lagerung einer schwimmenden kugel
US5095661A (en) 1988-06-20 1992-03-17 Westech Systems, Inc. Apparatus for transporting wafer to and from polishing head
US4934102A (en) 1988-10-04 1990-06-19 International Business Machines Corporation System for mechanical planarization
JPH079896B2 (ja) 1988-10-06 1995-02-01 信越半導体株式会社 研磨装置
US4910155A (en) 1988-10-28 1990-03-20 International Business Machines Corporation Wafer flood polishing
JP2525892B2 (ja) 1989-04-06 1996-08-21 ロデール・ニッタ 株式会社 ポリッシング方法およびポリッシング装置
JPH0811356B2 (ja) 1989-04-06 1996-02-07 ロデール・ニッタ株式会社 ポリッシング方法およびポリッシング装置
US5257478A (en) 1990-03-22 1993-11-02 Rodel, Inc. Apparatus for interlayer planarization of semiconductor material
WO1991019593A1 (en) 1990-06-09 1991-12-26 Bando Kiko Co., Ltd. Surface grinder for glass plate
DE4027628A1 (de) 1990-08-31 1992-03-05 Wolters Peter Fa Vorrichtung zur steuerung oder regelung von laepp-, hon- oder poliermaschinen
US5081051A (en) 1990-09-12 1992-01-14 Intel Corporation Method for conditioning the surface of a polishing pad
FR2677292B1 (fr) 1991-06-04 1995-12-08 Seva Machine de polissage a regulation pneumatique de l'effort de l'outil de la piece a polir.
FR2677276B1 (fr) 1991-06-06 1995-12-01 Commissariat Energie Atomique Machine de polissage a table porte-echantillon perfectionnee.
DE69206685T2 (de) 1991-06-06 1996-07-04 Commissariat Energie Atomique Poliermaschine mit einem gespannten Feinschleifband und einem verbesserten Werkstückträgerkopf
JPH04363022A (ja) 1991-06-06 1992-12-15 Enya Syst:Kk 貼付板洗浄装置
US5148632A (en) 1991-06-14 1992-09-22 Corning Incorporated Cavity forming in plastic body
JP3334139B2 (ja) 1991-07-01 2002-10-15 ソニー株式会社 研磨装置
US5230184A (en) 1991-07-05 1993-07-27 Motorola, Inc. Distributed polishing head
US5212910A (en) 1991-07-09 1993-05-25 Intel Corporation Composite polishing pad for semiconductor process
US5484323A (en) 1991-07-22 1996-01-16 Smith; Robert K. Belt cleaner
US5193316A (en) 1991-10-29 1993-03-16 Texas Instruments Incorporated Semiconductor wafer polishing using a hydrostatic medium
US5205082A (en) 1991-12-20 1993-04-27 Cybeq Systems, Inc. Wafer polisher head having floating retainer ring
EP0911115B1 (en) 1992-09-24 2003-11-26 Ebara Corporation Polishing apparatus
US5658183A (en) 1993-08-25 1997-08-19 Micron Technology, Inc. System for real-time control of semiconductor wafer polishing including optical monitoring
US5885138A (en) * 1993-09-21 1999-03-23 Ebara Corporation Method and apparatus for dry-in, dry-out polishing and washing of a semiconductor device
US5456627A (en) 1993-12-20 1995-10-10 Westech Systems, Inc. Conditioner for a polishing pad and method therefor
US5547417A (en) 1994-03-21 1996-08-20 Intel Corporation Method and apparatus for conditioning a semiconductor polishing pad
US5622526A (en) 1994-03-28 1997-04-22 J. D. Phillips Corporation Apparatus for trueing CBN abrasive belts and grinding wheels
US5649854A (en) 1994-05-04 1997-07-22 Gill, Jr.; Gerald L. Polishing apparatus with indexing wafer processing stations
US5536202A (en) 1994-07-27 1996-07-16 Texas Instruments Incorporated Semiconductor substrate conditioning head having a plurality of geometries formed in a surface thereof for pad conditioning during chemical-mechanical polish
ES2137459T3 (es) * 1994-08-09 1999-12-16 Ontrak Systems Inc Pulido lineal y metodo para la planarizacion de pastillas semiconductoras.
US5593344A (en) 1994-10-11 1997-01-14 Ontrak Systems, Inc. Wafer polishing machine with fluid bearings and drive systems
JPH08195363A (ja) 1994-10-11 1996-07-30 Ontrak Syst Inc 流体軸受を有する半導体ウェーハポリシング装置
US5575707A (en) 1994-10-11 1996-11-19 Ontrak Systems, Inc. Polishing pad cluster for polishing a semiconductor wafer
US5643044A (en) 1994-11-01 1997-07-01 Lund; Douglas E. Automatic chemical and mechanical polishing system for semiconductor wafers
US5655954A (en) 1994-11-29 1997-08-12 Toshiba Kikai Kabushiki Kaisha Polishing apparatus
DE19544328B4 (de) 1994-11-29 2014-03-20 Ebara Corp. Poliervorrichtung
US6069081A (en) 1995-04-28 2000-05-30 International Buiness Machines Corporation Two-step chemical mechanical polish surface planarization technique
US5643064A (en) 1995-09-08 1997-07-01 The Whitaker Corporation Universal polishing fixture for polishing optical fiber connectors
US5624501A (en) 1995-09-26 1997-04-29 Gill, Jr.; Gerald L. Apparatus for cleaning semiconductor wafers
US5611943A (en) 1995-09-29 1997-03-18 Intel Corporation Method and apparatus for conditioning of chemical-mechanical polishing pads
US5655951A (en) 1995-09-29 1997-08-12 Micron Technology, Inc. Method for selectively reconditioning a polishing pad used in chemical-mechanical planarization of semiconductor wafers
JPH09109022A (ja) * 1995-10-23 1997-04-28 Rap Master S F T Kk 半導体ウエハの全自動研磨装置
US5961372A (en) * 1995-12-05 1999-10-05 Applied Materials, Inc. Substrate belt polisher
DE29600447U1 (de) 1996-01-12 1996-02-29 Ernst Maschf Gmbh Paul Breitbandschleifmaschine
US5618447A (en) 1996-02-13 1997-04-08 Micron Technology, Inc. Polishing pad counter meter and method for real-time control of the polishing rate in chemical-mechanical polishing of semiconductor wafers
JP4284707B2 (ja) * 1996-04-16 2009-06-24 ラップマスターエスエフティ株式会社 4軸のスピンドル軸を備えた半導体ウエハの全自動研磨装置
JP3696690B2 (ja) 1996-04-23 2005-09-21 不二越機械工業株式会社 ウェーハの研磨装置システム
US5800248A (en) * 1996-04-26 1998-09-01 Ontrak Systems Inc. Control of chemical-mechanical polishing rate across a substrate surface
US5916012A (en) * 1996-04-26 1999-06-29 Lam Research Corporation Control of chemical-mechanical polishing rate across a substrate surface for a linear polisher
US5871390A (en) * 1997-02-06 1999-02-16 Lam Research Corporation Method and apparatus for aligning and tensioning a pad/belt used in linear planarization for chemical mechanical polishing
US6059643A (en) * 1997-02-21 2000-05-09 Aplex, Inc. Apparatus and method for polishing a flat surface using a belted polishing pad
US5735733A (en) * 1997-04-07 1998-04-07 Drum Workshop, Inc. Drum sanding apparatus
DE29709755U1 (de) 1997-05-07 1997-09-04 Wolters Peter Werkzeugmasch Vorrichtung zum chemisch-mechanischen Polieren einer Oberfläche eines Objektes, insbesondere eines Halbleiterwafers
US6062959A (en) * 1997-11-05 2000-05-16 Aplex Group Polishing system including a hydrostatic fluid bearing support
US6336845B1 (en) * 1997-11-12 2002-01-08 Lam Research Corporation Method and apparatus for polishing semiconductor wafers
US5897426A (en) * 1998-04-24 1999-04-27 Applied Materials, Inc. Chemical mechanical polishing with multiple polishing pads
US6126512A (en) * 1998-07-10 2000-10-03 Aplex Inc. Robust belt tracking and control system for hostile environment
US6143147A (en) 1998-10-30 2000-11-07 Tokyo Electron Limited Wafer holding assembly and wafer processing apparatus having said assembly
US6231428B1 (en) 1999-03-03 2001-05-15 Mitsubishi Materials Corporation Chemical mechanical polishing head assembly having floating wafer carrier and retaining ring
US6135859A (en) * 1999-04-30 2000-10-24 Applied Materials, Inc. Chemical mechanical polishing with a polishing sheet and a support sheet
US6186880B1 (en) 1999-09-29 2001-02-13 Semiconductor Equipment Technology Recyclable retaining ring assembly for a chemical mechanical polishing apparatus
WO2020235186A1 (ja) 2019-05-22 2020-11-26 村田機械株式会社 自動倉庫システム

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US6517418B2 (en) 2003-02-11
US20010039168A1 (en) 2001-11-08
KR19990045176A (ko) 1999-06-25
DE69830374D1 (de) 2005-07-07
TW406328B (en) 2000-09-21
KR19990045177A (ko) 1999-06-25
JP4334642B2 (ja) 2009-09-30
US20010036792A1 (en) 2001-11-01
US6336845B1 (en) 2002-01-08
EP0916451A2 (en) 1999-05-19
JPH11221758A (ja) 1999-08-17
DE69823957D1 (de) 2004-06-24
EP0916452A2 (en) 1999-05-19
ATE267070T1 (de) 2004-06-15
DE69830374T2 (de) 2006-01-26
EP0916451A3 (en) 2000-07-26
EP0916452A3 (en) 2001-01-31
TW407312B (en) 2000-10-01
US6416385B2 (en) 2002-07-09
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JPH11221755A (ja) 1999-08-17
EP0916452B1 (en) 2005-06-01

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