DE69526534T2 - Bipolartransistor mit isoliertem Gate - Google Patents
Bipolartransistor mit isoliertem GateInfo
- Publication number
- DE69526534T2 DE69526534T2 DE69526534T DE69526534T DE69526534T2 DE 69526534 T2 DE69526534 T2 DE 69526534T2 DE 69526534 T DE69526534 T DE 69526534T DE 69526534 T DE69526534 T DE 69526534T DE 69526534 T2 DE69526534 T2 DE 69526534T2
- Authority
- DE
- Germany
- Prior art keywords
- bipolar transistor
- insulated gate
- gate bipolar
- insulated
- transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
- H01L29/739—Transistor-type devices, i.e. able to continuously respond to applied control signals controlled by field-effect, e.g. bipolar static induction transistors [BSIT]
- H01L29/7393—Insulated gate bipolar mode transistors, i.e. IGBT; IGT; COMFET
- H01L29/7395—Vertical transistors, e.g. vertical IGBT
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/0684—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape, relative sizes or dispositions of the semiconductor regions or junctions between the regions
- H01L29/0692—Surface layout
- H01L29/0696—Surface layout of cellular field-effect devices, e.g. multicellular DMOS transistors or IGBTs
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP03398594A JP3156487B2 (ja) | 1994-03-04 | 1994-03-04 | 絶縁ゲート型バイポーラトランジスタ |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69526534D1 DE69526534D1 (de) | 2002-06-06 |
DE69526534T2 true DE69526534T2 (de) | 2002-11-28 |
Family
ID=12401779
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69526534T Expired - Lifetime DE69526534T2 (de) | 1994-03-04 | 1995-03-02 | Bipolartransistor mit isoliertem Gate |
Country Status (4)
Country | Link |
---|---|
US (1) | US5557128A (de) |
EP (1) | EP0670601B1 (de) |
JP (1) | JP3156487B2 (de) |
DE (1) | DE69526534T2 (de) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5883402A (en) * | 1995-11-06 | 1999-03-16 | Kabushiki Kaisha Toshiba | Semiconductor device and protection method |
US5798538A (en) * | 1995-11-17 | 1998-08-25 | International Rectifier Corporation | IGBT with integrated control |
DE19640307C2 (de) * | 1996-09-30 | 2000-10-12 | Siemens Ag | Durch Feldeffekt steuerbares Halbleiterbauelement |
JPH10116917A (ja) * | 1996-10-14 | 1998-05-06 | Sharp Corp | パワートランジスタ |
DE19727676A1 (de) * | 1997-06-30 | 1999-01-07 | Asea Brown Boveri | MOS gesteuertes Leistungshalbleiterbauelement |
JP4431761B2 (ja) * | 1998-01-27 | 2010-03-17 | 富士電機システムズ株式会社 | Mos型半導体装置 |
US6011280A (en) * | 1998-06-26 | 2000-01-04 | Delco Electronics Corporation | IGBT power device with improved resistance to reverse power pulses |
JP4023035B2 (ja) * | 1999-07-02 | 2007-12-19 | 松下電器産業株式会社 | 半導体装置及びその製造方法 |
US6486034B1 (en) * | 2001-07-20 | 2002-11-26 | Taiwan Semiconductor Manufacturing Company | Method of forming LDMOS device with double N-layering |
JP2004319861A (ja) * | 2003-04-18 | 2004-11-11 | Renesas Technology Corp | 半導体装置 |
US7157785B2 (en) * | 2003-08-29 | 2007-01-02 | Fuji Electric Device Technology Co., Ltd. | Semiconductor device, the method of manufacturing the same, and two-way switching device using the semiconductor devices |
US20060197153A1 (en) * | 2005-02-23 | 2006-09-07 | Chih-Feng Huang | Vertical transistor with field region structure |
JP5147203B2 (ja) * | 2006-06-30 | 2013-02-20 | オンセミコンダクター・トレーディング・リミテッド | 絶縁ゲート型半導体装置 |
JP5298521B2 (ja) * | 2007-10-15 | 2013-09-25 | 富士電機株式会社 | 半導体装置 |
JP4905559B2 (ja) | 2009-01-27 | 2012-03-28 | 株式会社デンソー | 半導体装置 |
JP4877337B2 (ja) | 2009-02-17 | 2012-02-15 | トヨタ自動車株式会社 | 半導体装置 |
WO2010109596A1 (ja) | 2009-03-24 | 2010-09-30 | トヨタ自動車株式会社 | 半導体装置 |
JP5453903B2 (ja) * | 2009-04-28 | 2014-03-26 | 富士電機株式会社 | ワイドバンドギャップ半導体装置 |
WO2011138832A1 (ja) * | 2010-05-07 | 2011-11-10 | トヨタ自動車株式会社 | 半導体装置 |
JP5668499B2 (ja) * | 2011-01-27 | 2015-02-12 | 株式会社デンソー | 半導体装置 |
JP5720775B2 (ja) | 2011-04-04 | 2015-05-20 | 富士電機株式会社 | パワースイッチのウェハ試験方法 |
CN104350275B (zh) | 2012-08-30 | 2017-09-22 | 富士电机株式会社 | 点火器、点火器的控制方法以及内燃机用点火装置 |
JP2015122442A (ja) * | 2013-12-24 | 2015-07-02 | 本田技研工業株式会社 | 半導体装置 |
JP6320808B2 (ja) * | 2014-03-19 | 2018-05-09 | 富士電機株式会社 | トレンチmos型半導体装置 |
CN110444589B (zh) * | 2019-08-29 | 2021-03-16 | 电子科技大学 | 一种具有过流保护功能的igbt |
CN110649093A (zh) * | 2019-10-31 | 2020-01-03 | 吉林华微电子股份有限公司 | 一种igbt芯片及半导体功率模块 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4136354A (en) * | 1977-09-15 | 1979-01-23 | National Semiconductor Corporation | Power transistor including a sense emitter and a reference emitter for enabling power dissipation to be limited to less than a destructive level |
JPH061833B2 (ja) * | 1982-11-11 | 1994-01-05 | 株式会社東芝 | Mos形半導体装置 |
US4783690A (en) * | 1983-09-06 | 1988-11-08 | General Electric Company | Power semiconductor device with main current section and emulation current section |
DE3856174T2 (de) * | 1987-10-27 | 1998-09-03 | Nec Corp | Halbleiteranordnung mit einem isolierten vertikalen Leistungs-MOSFET. |
JP2876694B2 (ja) * | 1990-03-20 | 1999-03-31 | 富士電機株式会社 | 電流検出端子を備えたmos型半導体装置 |
JPH045864A (ja) * | 1990-04-23 | 1992-01-09 | Toshiba Corp | 半導体装置 |
JP3180831B2 (ja) * | 1991-03-22 | 2001-06-25 | 富士電機株式会社 | 絶縁ゲート制御半導体装置 |
JP2973588B2 (ja) * | 1991-06-10 | 1999-11-08 | 富士電機株式会社 | Mos型半導体装置 |
JP2833610B2 (ja) * | 1991-10-01 | 1998-12-09 | 株式会社デンソー | 絶縁ゲート型バイポーラトランジスタ |
JP3182848B2 (ja) * | 1992-03-24 | 2001-07-03 | 富士電機株式会社 | 半導体装置 |
-
1994
- 1994-03-04 JP JP03398594A patent/JP3156487B2/ja not_active Expired - Lifetime
-
1995
- 1995-03-01 US US08/397,417 patent/US5557128A/en not_active Expired - Lifetime
- 1995-03-02 EP EP95301349A patent/EP0670601B1/de not_active Expired - Lifetime
- 1995-03-02 DE DE69526534T patent/DE69526534T2/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH07245394A (ja) | 1995-09-19 |
JP3156487B2 (ja) | 2001-04-16 |
DE69526534D1 (de) | 2002-06-06 |
US5557128A (en) | 1996-09-17 |
EP0670601B1 (de) | 2002-05-02 |
EP0670601A2 (de) | 1995-09-06 |
EP0670601A3 (de) | 1995-10-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: FUJI ELECTRIC SYSTEMS CO., LTD., TOKYO/TOKIO, JP |
|
8320 | Willingness to grant licences declared (paragraph 23) |