DE3852623T2 - Verfahren zur Herstellung von Schottky-Verbundhalbleiterbauelement. - Google Patents

Verfahren zur Herstellung von Schottky-Verbundhalbleiterbauelement.

Info

Publication number
DE3852623T2
DE3852623T2 DE3852623T DE3852623T DE3852623T2 DE 3852623 T2 DE3852623 T2 DE 3852623T2 DE 3852623 T DE3852623 T DE 3852623T DE 3852623 T DE3852623 T DE 3852623T DE 3852623 T2 DE3852623 T2 DE 3852623T2
Authority
DE
Germany
Prior art keywords
semiconductor device
compound semiconductor
manufacturing schottky
schottky compound
manufacturing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE3852623T
Other languages
English (en)
Other versions
DE3852623D1 (de
Inventor
Yoshinori Central Lab Imamura
Masaru Central Lab Miyazaki
Akihisa Central Lab Terano
Nobutoshi Central La Matsunaga
Hiroshi Central Lab Yanazawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Application granted granted Critical
Publication of DE3852623D1 publication Critical patent/DE3852623D1/de
Publication of DE3852623T2 publication Critical patent/DE3852623T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • H01L23/532—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
    • H01L23/5329—Insulating materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
    • H01L21/76877—Filling of holes, grooves or trenches, e.g. vias, with conductive material
    • H01L21/7688—Filling of holes, grooves or trenches, e.g. vias, with conductive material by deposition over sacrificial masking layer, e.g. lift-off
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
    • H01L21/8252—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using III-V technology
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40—Electrodes ; Multistep manufacturing processes therefor
    • H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
    • H01L29/417—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions carrying the current to be rectified, amplified or switched
    • H01L29/41725—Source or drain electrodes for field effect devices
    • H01L29/41775—Source or drain electrodes for field effect devices characterised by the proximity or the relative position of the source or drain electrode and the gate electrode, e.g. the source or drain electrode separated from the gate electrode by side-walls or spreading around or above the gate electrode
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40—Electrodes ; Multistep manufacturing processes therefor
    • H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
    • H01L29/423—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
    • H01L29/42312—Gate electrodes for field effect devices
    • H01L29/42316—Gate electrodes for field effect devices for field-effect transistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Junction Field-Effect Transistors (AREA)
DE3852623T 1987-12-18 1988-03-30 Verfahren zur Herstellung von Schottky-Verbundhalbleiterbauelement. Expired - Lifetime DE3852623T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62318541A JPH01161773A (ja) 1987-12-18 1987-12-18 化合物半導体装置の製造方法

Publications (2)

Publication Number Publication Date
DE3852623D1 DE3852623D1 (de) 1995-02-09
DE3852623T2 true DE3852623T2 (de) 1995-07-20

Family

ID=18100275

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3852623T Expired - Lifetime DE3852623T2 (de) 1987-12-18 1988-03-30 Verfahren zur Herstellung von Schottky-Verbundhalbleiterbauelement.

Country Status (5)

Country Link
US (1) US4902635A (de)
EP (1) EP0321065B1 (de)
JP (1) JPH01161773A (de)
CA (1) CA1277779C (de)
DE (1) DE3852623T2 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5254483A (en) * 1987-10-23 1993-10-19 Vitesse Semiconductor Corporation Gate-to-ohmic metal contact scheme for III-V devices
JPH0287532A (ja) * 1988-09-22 1990-03-28 Fujitsu Ltd 電界効果トランジスタ
US5849630A (en) * 1989-03-29 1998-12-15 Vitesse Semiconductor Corporation Process for forming ohmic contact for III-V semiconductor devices
US5252843A (en) * 1989-09-01 1993-10-12 Fujitsu Limited Semiconductor device having overlapping conductor layers
US4981810A (en) * 1990-02-16 1991-01-01 Micron Technology, Inc. Process for creating field effect transistors having reduced-slope, staircase-profile sidewall spacers
EP0501275A3 (en) * 1991-03-01 1992-11-19 Motorola, Inc. Method of making symmetrical and asymmetrical mesfets
US5217567A (en) * 1992-02-27 1993-06-08 International Business Machines Corporation Selective etching process for boron nitride films
US5387548A (en) * 1992-06-22 1995-02-07 Motorola, Inc. Method of forming an etched ohmic contact
US5384269A (en) * 1992-12-09 1995-01-24 Motorola, Inc. Methods for making and using a shallow semiconductor junction
DE29501992U1 (de) * 1995-02-08 1996-06-05 Muellenberg Ralph Spannsatz
US6090300A (en) * 1998-05-26 2000-07-18 Xerox Corporation Ion-implantation assisted wet chemical etching of III-V nitrides and alloys
CN110556284B (zh) * 2018-06-04 2022-08-19 厦门乾照光电股份有限公司 发光二极管的芯片的制造方法和溅射方法
CN111755524B (zh) * 2020-07-20 2022-06-07 西安电子科技大学 一种肖特基积累层碳化硅横向场效应晶体管及其制作方法

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7412383A (nl) * 1974-09-19 1976-03-23 Philips Nv Werkwijze voor het vervaardigen van een in- richting met een geleiderpatroon.
US4149307A (en) * 1977-12-28 1979-04-17 Hughes Aircraft Company Process for fabricating insulated-gate field-effect transistors with self-aligned contacts
US4201997A (en) * 1978-04-21 1980-05-06 Texas Instruments Incorporated MESFET semiconductor device and method of making
US4253229A (en) * 1978-04-27 1981-03-03 Xerox Corporation Self-aligned narrow gate MESFET process
JPS5681955A (en) * 1979-12-08 1981-07-04 Toshiba Corp Manufacture of semiconductor integrated circuit
JPS5760854A (en) * 1980-09-30 1982-04-13 Toshiba Corp Wiring of semiconductor device
JPS5874084A (ja) * 1981-10-29 1983-05-04 Fujitsu Ltd 半導体装置
JPS5950567A (ja) * 1982-09-16 1984-03-23 Hitachi Ltd 電界効果トランジスタの製造方法
JPS6032364A (ja) * 1983-08-01 1985-02-19 Toshiba Corp 半導体装置の製造方法
JPS6048509A (ja) * 1983-08-24 1985-03-16 Sanyo Electric Co Ltd 誘導式電動車
JPS6054480A (ja) * 1983-09-05 1985-03-28 Nec Corp ガリウムヒ素ショットキ−障壁接合ゲ−ト型電界効果トランジスタの製造方法
JPS6057980A (ja) * 1983-09-09 1985-04-03 Fujitsu Ltd 半導体装置の製造方法
JPS6156462A (ja) * 1984-08-28 1986-03-22 Fujitsu Ltd 電界効果型半導体装置及びその製造方法
US4777517A (en) * 1984-11-29 1988-10-11 Fujitsu Limited Compound semiconductor integrated circuit device
DE3516222A1 (de) * 1985-05-06 1986-11-06 Siemens AG, 1000 Berlin und 8000 München Halbleiterbauelement mit erhoehter oberflaechen-durchbruchsspannung
US4631806A (en) * 1985-05-22 1986-12-30 Gte Laboratories Incorporated Method of producing integrated circuit structures
EP0208795A1 (de) * 1985-07-12 1987-01-21 International Business Machines Corporation Verfahren zum Herstellen eines selbstausrichtenden Feldeffekttransistors mit einem Metallhalbleiterkontakt
DE3689971T2 (de) * 1986-03-05 1994-12-08 Sumitomo Electric Industries Herstellung einer halbleiteranordnung.
US4701646A (en) * 1986-11-18 1987-10-20 Northern Telecom Limited Direct coupled FET logic using a photodiode for biasing or level-shifting

Also Published As

Publication number Publication date
EP0321065A2 (de) 1989-06-21
CA1277779C (en) 1990-12-11
US4902635A (en) 1990-02-20
EP0321065B1 (de) 1994-12-28
JPH0332218B2 (de) 1991-05-10
DE3852623D1 (de) 1995-02-09
JPH01161773A (ja) 1989-06-26
EP0321065A3 (de) 1991-02-13

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Legal Events

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