CN101499340B - 陶瓷元件 - Google Patents
陶瓷元件 Download PDFInfo
- Publication number
- CN101499340B CN101499340B CN2009100085136A CN200910008513A CN101499340B CN 101499340 B CN101499340 B CN 101499340B CN 2009100085136 A CN2009100085136 A CN 2009100085136A CN 200910008513 A CN200910008513 A CN 200910008513A CN 101499340 B CN101499340 B CN 101499340B
- Authority
- CN
- China
- Prior art keywords
- layer
- ceramic
- plating
- protective layer
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 239000000919 ceramic Substances 0.000 title claims abstract description 85
- 239000010410 layer Substances 0.000 claims abstract description 135
- 239000011241 protective layer Substances 0.000 claims abstract description 45
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 11
- 239000011701 zinc Substances 0.000 claims description 10
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 9
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 8
- 229910052725 zinc Inorganic materials 0.000 claims description 8
- 238000009713 electroplating Methods 0.000 claims description 7
- 229910052710 silicon Inorganic materials 0.000 claims description 7
- 239000010703 silicon Substances 0.000 claims description 7
- 238000007747 plating Methods 0.000 abstract description 65
- 238000005476 soldering Methods 0.000 description 14
- 238000000034 method Methods 0.000 description 12
- 238000011282 treatment Methods 0.000 description 11
- 238000009413 insulation Methods 0.000 description 9
- 238000004544 sputter deposition Methods 0.000 description 9
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 7
- 230000000052 comparative effect Effects 0.000 description 7
- 239000002003 electrode paste Substances 0.000 description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 6
- PXHVJJICTQNCMI-UHFFFAOYSA-N nickel Substances [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 6
- 229910004298 SiO 2 Inorganic materials 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 230000004907 flux Effects 0.000 description 5
- 239000002002 slurry Substances 0.000 description 5
- 229910000679 solder Inorganic materials 0.000 description 5
- 229910001252 Pd alloy Inorganic materials 0.000 description 3
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 3
- 239000011230 binding agent Substances 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000007769 metal material Substances 0.000 description 3
- 238000001552 radio frequency sputter deposition Methods 0.000 description 3
- 230000009467 reduction Effects 0.000 description 3
- 229910052709 silver Inorganic materials 0.000 description 3
- 239000004332 silver Substances 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 239000011787 zinc oxide Substances 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000013507 mapping Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- SWELZOZIOHGSPA-UHFFFAOYSA-N palladium silver Chemical compound [Pd].[Ag] SWELZOZIOHGSPA-UHFFFAOYSA-N 0.000 description 2
- 229920000139 polyethylene terephthalate Polymers 0.000 description 2
- 239000005020 polyethylene terephthalate Substances 0.000 description 2
- YIWGJFPJRAEKMK-UHFFFAOYSA-N 1-(2H-benzotriazol-5-yl)-3-methyl-8-[2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidine-5-carbonyl]-1,3,8-triazaspiro[4.5]decane-2,4-dione Chemical compound CN1C(=O)N(c2ccc3n[nH]nc3c2)C2(CCN(CC2)C(=O)c2cnc(NCc3cccc(OC(F)(F)F)c3)nc2)C1=O YIWGJFPJRAEKMK-UHFFFAOYSA-N 0.000 description 1
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- 229910052777 Praseodymium Inorganic materials 0.000 description 1
- 229910010413 TiO 2 Inorganic materials 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- GEIAQOFPUVMAGM-UHFFFAOYSA-N ZrO Inorganic materials [Zr]=O GEIAQOFPUVMAGM-UHFFFAOYSA-N 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000007606 doctor blade method Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 238000000608 laser ablation Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 239000004014 plasticizer Substances 0.000 description 1
- -1 polyethylene terephthalate Polymers 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- PUDIUYLPXJFUGB-UHFFFAOYSA-N praseodymium atom Chemical compound [Pr] PUDIUYLPXJFUGB-UHFFFAOYSA-N 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 230000001603 reducing effect Effects 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 238000004876 x-ray fluorescence Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/10—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material voltage responsive, i.e. varistors
- H01C7/102—Varistor boundary, e.g. surface layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/10—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material voltage responsive, i.e. varistors
- H01C7/1006—Thick film varistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/18—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material comprising a plurality of layers stacked between terminals
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Thermistors And Varistors (AREA)
- Ceramic Capacitors (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008-016637 | 2008-01-28 | ||
| JP2008016637A JP4683052B2 (ja) | 2008-01-28 | 2008-01-28 | セラミック素子 |
| JP2008016637 | 2008-01-28 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101499340A CN101499340A (zh) | 2009-08-05 |
| CN101499340B true CN101499340B (zh) | 2011-09-21 |
Family
ID=40899551
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2009100085136A Active CN101499340B (zh) | 2008-01-28 | 2009-01-23 | 陶瓷元件 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7813104B2 (https=) |
| JP (1) | JP4683052B2 (https=) |
| KR (1) | KR101055161B1 (https=) |
| CN (1) | CN101499340B (https=) |
| TW (1) | TW200949867A (https=) |
Families Citing this family (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5324390B2 (ja) * | 2009-10-22 | 2013-10-23 | Tdk株式会社 | 積層電子部品 |
| JP5387484B2 (ja) * | 2010-04-02 | 2014-01-15 | Tdk株式会社 | チップ部品の製造方法 |
| JP5770539B2 (ja) | 2011-06-09 | 2015-08-26 | Tdk株式会社 | 電子部品及び電子部品の製造方法 |
| CN102982931A (zh) * | 2011-09-06 | 2013-03-20 | 弗兰克·魏 | 电子陶瓷元件的局部涂层及其制作方法 |
| KR101952845B1 (ko) * | 2011-12-22 | 2019-02-28 | 삼성전기주식회사 | 적층 세라믹 전자부품 및 그 제조 방법 |
| JP5924543B2 (ja) * | 2013-03-19 | 2016-05-25 | 株式会社村田製作所 | 積層セラミックコンデンサ |
| JP6398349B2 (ja) * | 2013-08-23 | 2018-10-03 | Tdk株式会社 | 積層型セラミック電子部品 |
| TWI629696B (zh) * | 2015-06-04 | 2018-07-11 | 日商村田製作所股份有限公司 | Laminated ceramic electronic parts |
| TWI628678B (zh) * | 2016-04-21 | 2018-07-01 | Tdk 股份有限公司 | 電子零件 |
| KR101981466B1 (ko) * | 2016-09-08 | 2019-05-24 | 주식회사 모다이노칩 | 파워 인덕터 |
| KR102789017B1 (ko) * | 2016-12-22 | 2025-04-01 | 삼성전기주식회사 | 적층형 커패시터 및 그 실장 기판 |
| KR102319596B1 (ko) * | 2017-04-11 | 2021-11-02 | 삼성전기주식회사 | 적층형 커패시터 및 그 실장 기판 |
| KR102527062B1 (ko) | 2017-09-21 | 2023-05-02 | 다이요 유덴 가부시키가이샤 | 세라믹 전자 부품 및 그 제조 방법 |
| JP2019067793A (ja) * | 2017-09-28 | 2019-04-25 | Tdk株式会社 | 電子部品 |
| US11037710B2 (en) | 2018-07-18 | 2021-06-15 | Avx Corporation | Varistor passivation layer and method of making the same |
| JP7070840B2 (ja) * | 2019-03-29 | 2022-05-18 | 株式会社村田製作所 | 積層セラミックコンデンサおよび積層セラミックコンデンサの製造方法 |
| JP7279574B2 (ja) * | 2019-08-09 | 2023-05-23 | 株式会社村田製作所 | 電子部品及び電子部品の製造方法 |
| CN111491404B (zh) * | 2019-10-29 | 2022-04-12 | 珠海泓星科技有限公司 | 一种导电片作为电极的石墨烯玻璃烧水壶 |
| JP2021182585A (ja) * | 2020-05-19 | 2021-11-25 | 太陽誘電株式会社 | 積層セラミック電子部品の製造方法、積層セラミック電子部品及び回路基板 |
| KR102946077B1 (ko) | 2020-11-27 | 2026-04-01 | 삼성전기주식회사 | 적층형 커패시터 |
| US12308172B2 (en) * | 2020-12-08 | 2025-05-20 | Samsung Electro-Mechanics Co., Ltd. | Multilayer capacitor and board component having the same |
| JP7802462B2 (ja) * | 2021-04-28 | 2026-01-20 | Tdk株式会社 | 電子部品 |
| CN113265636A (zh) * | 2021-05-27 | 2021-08-17 | 江苏新林芝电子科技股份有限公司 | 一种提高陶瓷ptc热敏元件的抗还原性的方法 |
| KR102895351B1 (ko) * | 2021-08-27 | 2025-12-04 | 삼성전기주식회사 | 커패시터 부품 및 커패시터 부품의 제조 방법 |
| JP7765255B2 (ja) * | 2021-11-15 | 2025-11-06 | Tdk株式会社 | 電子部品 |
| KR20230103058A (ko) * | 2021-12-31 | 2023-07-07 | 삼성전기주식회사 | 적층형 전자 부품 |
| JP2023142120A (ja) * | 2022-03-24 | 2023-10-05 | パナソニックIpマネジメント株式会社 | 積層セラミック部品の製造方法及び積層セラミック部品 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1503278A (zh) * | 2002-10-29 | 2004-06-09 | Tdk��ʽ���� | 芯片状电子部件及其制造方法 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62282410A (ja) * | 1986-05-30 | 1987-12-08 | 松下電器産業株式会社 | 電圧非直線抵抗体素子の製造方法 |
| JP2695639B2 (ja) * | 1988-01-21 | 1998-01-14 | 日本碍子株式会社 | 電圧非直線抵抗体の製造方法 |
| JP2695660B2 (ja) * | 1989-06-05 | 1998-01-14 | 三菱電機株式会社 | 電圧非直線抵抗体 |
| JP2976250B2 (ja) * | 1991-08-08 | 1999-11-10 | 株式会社村田製作所 | 積層型バリスタの製造方法 |
| JP3036567B2 (ja) | 1991-12-20 | 2000-04-24 | 三菱マテリアル株式会社 | 導電性チップ型セラミック素子及びその製造方法 |
| JP3255799B2 (ja) * | 1994-07-05 | 2002-02-12 | 松下電器産業株式会社 | 電子部品の製造方法 |
| JPH09148108A (ja) * | 1995-11-24 | 1997-06-06 | Matsushita Electric Ind Co Ltd | 非直線抵抗体の製造方法 |
| JPH11219804A (ja) * | 1998-01-30 | 1999-08-10 | Mitsubishi Materials Corp | 薄膜サーミスタ |
| JPH11251120A (ja) * | 1998-03-04 | 1999-09-17 | Murata Mfg Co Ltd | 積層チップバリスタの製造方法 |
| JP2000164406A (ja) * | 1998-11-25 | 2000-06-16 | Murata Mfg Co Ltd | チップ型電子部品とその製造方法 |
| JP4637440B2 (ja) | 2002-03-18 | 2011-02-23 | 太陽誘電株式会社 | セラミック素子の製造方法 |
| JP2004088040A (ja) * | 2002-08-26 | 2004-03-18 | Maruwa Co Ltd | チップ状バリスタの製造方法 |
| JP2007242995A (ja) * | 2006-03-10 | 2007-09-20 | Matsushita Electric Ind Co Ltd | 積層セラミック電子部品とその製造方法 |
-
2008
- 2008-01-28 JP JP2008016637A patent/JP4683052B2/ja active Active
-
2009
- 2009-01-23 TW TW098103063A patent/TW200949867A/zh unknown
- 2009-01-23 CN CN2009100085136A patent/CN101499340B/zh active Active
- 2009-01-26 US US12/359,466 patent/US7813104B2/en active Active
- 2009-01-28 KR KR1020090006543A patent/KR101055161B1/ko active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1503278A (zh) * | 2002-10-29 | 2004-06-09 | Tdk��ʽ���� | 芯片状电子部件及其制造方法 |
Non-Patent Citations (2)
| Title |
|---|
| JP特开2007-242995A 2007.09.20 |
| JP特开平11-219804A 1999.08.10 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2009177085A (ja) | 2009-08-06 |
| KR101055161B1 (ko) | 2011-08-08 |
| KR20090082869A (ko) | 2009-07-31 |
| US20090191418A1 (en) | 2009-07-30 |
| CN101499340A (zh) | 2009-08-05 |
| US7813104B2 (en) | 2010-10-12 |
| TWI364043B (https=) | 2012-05-11 |
| TW200949867A (en) | 2009-12-01 |
| JP4683052B2 (ja) | 2011-05-11 |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |