CN100364072C - 具有功率半导体模块寿命检测功能的马达驱动装置 - Google Patents

具有功率半导体模块寿命检测功能的马达驱动装置 Download PDF

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CN100364072C
CN100364072C CNB2005100588103A CN200510058810A CN100364072C CN 100364072 C CN100364072 C CN 100364072C CN B2005100588103 A CNB2005100588103 A CN B2005100588103A CN 200510058810 A CN200510058810 A CN 200510058810A CN 100364072 C CN100364072 C CN 100364072C
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松原俊介
堀越真一
牧田肇
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Abstract

在马达驱动装置中,通过在功率半导体模块的内部内置预测布线的脱落的装置,从而能够在布线脱落之前,预知布线脱落的时期将近。通过这样,来明确马达驱动装置等电力机器中所使用的功率半导体模块的更换时期,预防马达驱动装置的动作中发生不良。功率半导体模块(1)是安装有功率半导体芯片(2)的模块,功率半导体芯片(2)在功率半导体的电极(3)中具有主电路布线(4)与虚设布线(5),且将虚设布线的连接强度设定为较弱。

Description

具有功率半导体模块寿命检测功能的马达驱动装置
技术领域
本发明涉及一种使用对功率半导体芯片进行布线所形成的功率半导体模块,进行马达驱动的马达驱动装置。
背景技术
驱动马达等电力机器的驱动电路中,为了控制驱动电流,而使用具有功率半导体芯片的功率半导体模块。该具有功率半导体芯片的功率半导体模块,通过进行间歇通电来进行驱动电流的控制。人们发现如果长期进行这样的间歇通电,由于电极与引线之间的线膨胀率差等原因,同时伴随着运行时的急剧温度变化的反复进行,接合界面中产生线膨胀率差等所引起的热应力,尤其是如果引线的线径较粗,引线自身的刚性也会增加。从而表现出显著的接合界面的热应力,很容易发生接合面中的引线脱落等损害,存在对功率循环、热循环的耐性降低这一问题(例如,特开2003-303845号公报)。
因此,在功率半导体模块的内部进行连接的主电路布线与半导体芯片的接合面(电极面)恶化,主电路布线从半导体芯片的电极上脱落,在向电力机器供电时产生障碍。
该布线从电极上的脱落,依赖于半导体芯片的温度变化量以及温度变化次数,另外,因为这些还依赖于通电的间歇状态以及使用环境,所以由于使用方法不同而存在差别,很难确定其发生时期。
因此,历来,将加载给功率半导体芯片的最大负荷,假设为在某个一定的周期中使用,计算出寿命。
如上所述,在根据加载给功率半导体芯片的最大负荷,来计算出功率半导体模块的寿命的情况下,存在以下问题:如果实际上所加载的负荷比设想的负荷或功率周期小,那么功率半导体芯片在还没有充分使用的状态下就会被更换,另外,如果在实际上所加载的负荷相反,比设想的负荷或功率周期要大的使用状态下,功率半导体芯片在根据计算寿命来进行更换之前就会损坏。
因此,人们希望通过正确地判断功率半导体芯片的功率周期寿命,在到达半导体寿命末期之前,有效地使用功率半导体模块,且能够在发生意外的情况下之前,更换功率半导体模块进行预防保全。
发明内容
因此,本发明的目的在于,以预知主电路布线的脱落为目的,根据主电路布线的脱落,对功率半导体模块以及使用功率半导体模块的马达驱动装置的动作不良进行预防。
本发明通过在功率半导体模块的内部内置预测主电路布线的脱落的装置,从而能够在主电路布线脱落之前,预知主电路布线的脱落时期将近。通过这样,来明确马达驱动装置等电力机器中所使用的功率半导体模块的更换时期,预防马达驱动装置的动作中发生不良。
本发明的马达驱动装置,是具有安装有功率半导体芯片的模块的马达驱动装置,功率半导体芯片,具有与该功率半导体芯片的电极相连接的主电路布线以及虚设布线,由功率半导体芯片模块来进行用来驱动马达的整流动作及/或开关动作。
主电路布线与功率半导体芯片的电极相连接,在功率半导体芯片与外部之间进行通电。另一方面,虚设布线是用来预知主电路布线的脱落而设置的布线,不对主电路布线的通电带来影响,即使将该虚设布线从电极上剥离,也不会对主电路布线的通电带来障碍。
虚设布线除了与主电路布线连接在同一个电极上之外,在看作是呈同样的温度变化的环境下,也可以连接在与主电路布线所连接的电极不同的电极上。
在温度变化等使用环境相同的主电路布线与虚设布线中,假设这些布线与电极之间的连接中的恶化在同样的状况下发展。此时,根据虚设布线的脱落就可以预知主电路布线的脱落。
本发明的虚设布线与电极之间的连接强度,比主电路布线与电极之间的连接强度低。由于连接强度较低的布线先脱落,因此,通过将虚设布线的连接强度设定为较低,使得虚设布线比主电路布线先脱落,通过这样,能够在主电路布线脱落之前,可靠地预知主电路布线的脱落。
另外,还可以连接多根虚设布线,这些虚设布线的连接强度相同或不同。
在连接有连接强度相同的多根虚设布线的情况下,即使在由于实际的连接强度或脱落现象的偏差引起各个虚设布线的脱落发生变化的情况下,也能够通过检测出任一个虚设布线的脱落,来可靠地预知主电路布线的脱落。
另外,在连接有连接强度不同的多个虚设布线的情况下,通过顺次检测出虚设布线的脱落,能够得知恶化状态。
布线与电极之间的连接,可以通过引线接合法或软钎焊来进行。
在通过引线接合法来进行布线与电极之间的连接的情况下的状态是,将主电路布线以及虚设布线通过引线接合来与电极连接起来,通过让主电路布线的接合条件与虚设布线的接合条件不同,来使得虚设布线的连接强度与主电路布线的连接强度不同。
另外,该接合条件,是加载给主电路布线与虚设布线的加压力,及/或加载给主电路布线与虚设布线的的超声波功率。通过调整接合条件,能够将虚设布线的连接强度设定为比主电路布线的连接强度低。
另外,作为调整连接强度的方法,将主电路布线以及虚设布线通过引线接合来与电极连接起来,让主电路布线的线径与虚设布线的线径不同。
在同样的接合条件下引线接合不同的线径的布线的情况下,由该线径引起连接强度中产生差异。通过将虚设布线的线径设置为比主电路布线的线径大,能够使得虚设布线的连接强度较弱。
另外,在通过软钎焊进行布线与电极之间的连接的情况下的状态是,将主电路布线以及虚设布线通过软钎焊来与电极连接起来,通过让主电路布线的软钎焊条件与虚设布线的软钎焊条件不同,来使得虚设布线的连接强度与主电路布线的连接强度不同。
另外,软钎焊条件可以是软钎焊面积或软钎焊长度。通过将虚设布线的软钎焊面积设定为较狭窄,将软钎焊长度设定为较短,能够将虚设布线的连接强度设定为较弱。
本发明的马达驱动装置,具有检测出虚设布线与电极之间的连接状态的检测装置。检测装置经光电耦合器输出检测信号。通过该检测信号,能够检测出设置在功率半导体模块中的虚设布线从电极上脱落,通过这样来预知主电路布线从电极上的脱落。能够由该预知来把握、管理功率半导体模块更换时期。
另外,本发明的马达驱动装置,根据检测信号来通知消息,能够对寿命将近或功率半导体模块的更换时期进行通知。
由于马达驱动装置能够通过检测出虚设布线的脱落,来预知主电路布线的脱落,因此,能够在发生马达驱动的动作不良之前,更换半导体模块,对动作不良进行预防。
通过本发明,能够预知主电路布线的脱落。另外,根据主电路布线的脱落,还能够预防功率半导体模块以及使用功率半导体模块的马达驱动装置的动作不良。
通过附图中所示的本发明的典型实施方式的详细说明,能够进一步明确本发明的上述目的、特征及优点,以及其他目的、特征及优点。
附图说明
图1为说明本发明的功率半导体模块的概要的示意图;
图2a为说明本发明的主电路布线与虚设布线的连接状态的示意图;
图2b为说明本发明的主电路布线与虚设布线的连接状态的示意图;
图3a为说明本发明的设有多根虚设布线的例子;
图3b为说明本发明的设有多根虚设布线的例子;
图3c为说明本发明的设有多根虚设布线的例子;
图4a为说明使布线的线径不同的虚设布线的例子的示意图;
图4b为说明使布线的线径不同的虚设布线的例子的示意图;
图5为说明本发明的检测电路的构成例的示意图;
图6为说明本发明的检测电路的另一个构成例的示意图;
图7为说明本发明的检测电路的另一个构成例的示意图;
图8为详细说明本发明的检测电路的电路图。
具体实施方式
下面对照附图,对本发明的实施方式进行详细说明。
图1为说明本发明的马达驱动装置的功率半导体模块的概要的示意图。图1中,功率半导体芯片2具有用来连接布线的电极3。该电极3连接有在功率半导体芯片2与外部之间进行通电的主电路布线4,以及用来预知主电路布线4的脱落而设置的虚设布线5。虚设布线5不对主电路布线4的通电带来影响,即使将该虚设布线5从电极3上剥离,也不会对主电路布线4的通电带来障碍。
这里,虚设布线5与电极3之间的连接部的连接强度,被设置为比主电路布线4与电极3之间的连接部的连接强度弱。功率半导体模块1中,对功率半导体芯片2进行间歇通电的功率周期所产生的温度变化,使得连接部中产生热应力,降低连接部的连接强度。由于该连接强度的降低,依赖于功率半导体芯片的温度变换量与温度变化数,因此,以较弱的连接强度所安装的虚设布线5,要比主电路布线4先从电极3上脱落。
本发明的马达驱动装置,通过检测出功率半导体模块1的虚设布线5从电极3上脱落这一事件,在主电路布线4从电极3上脱落之前,对主电路布线4的脱落进行预知,预测出功率半导体模块的寿命。
图2a、图2b为说明主电路布线与虚设布线的连接状态的示意图。图2a中显示了电极3与主电路布线4以及虚设布线5相连接的状态。主电路布线4通过将其连接部4a接合在电极3上来进行连接,另外,虚设布线5通过将其连接部5a接合在电极3上来进行连接。由于虚设布线5的连接部5a的连接强度比主电路布线4的连接部4a的连接强度低,因此,如果因功率半导体芯片2的间歇通电的功率周期所引起的温度变化反复进行,则虚设布线5比主电路布线4先从电极3上脱落(图2b)。
图3a~图3c中显示了设置多根虚设布线的例子。这里,通过使得多根虚设布线的连接强度不同,从而能够阶段性预知主电路布线的连接寿命。
图3a为电极3与主电路布线4以及2根虚设布线5A、5B相连接的构成例,分别通过连接部4a、5a、5b与电极3相连接。
这里,将各个连接部4a、5a、5b的连接强度顺次设定为较弱,主电路布线4的连接强度最强,按照虚设布线5B、5A的顺序,连接强度渐弱。如果由功率半导体芯片2的间歇通电的功率周期所引起的温度变化反复进行,则首先是连接强度最弱的虚设布线5A的连接部5a从电极3上脱落(图3b),之后,由于温度的变化,连接强度次弱的虚设布线5B的连接部5b从电极3上脱落(图3c)。进一步,如果由功率半导体芯片2的间歇通电的功率周期所引起的温度变化反复进行,主电路布线4也从电极3上脱落。
由于布线按照连接强度的顺序顺次脱落,因此,通过检测出虚设布线5A、5B的脱落,就能够阶段性预测主电路布线4的连接的寿命。
另外,还能够让多根虚设布线的连接强度相同。实际中连接强度以及脱落现象中存在偏差,虚设布线不一定就在设想的恶化状态时脱落。这样,即使虚设布线的脱落产生变动,通过检测出任一个虚设布线的脱落,就能够可靠地预测出主电路布线的脱落。
作为将布线连接到电极上的方法,例如有引线接合法或软钎焊等方法。另外,引线接合法中,具有通过将引线的前端熔化所得到的球来进行接合的球形接合法(使用热以及超声波的热声波接合法),以及使用接合工具直接接合引线的楔形接合法(超声波接合法)等。
球形接合法是指,将通过毛细管中的引导所送出的引线的前端,通过火花熔化成球形,将该球接合在半导体芯片侧的部分上,通过来自超声波能与阶段的加热来完成接合。
另外,楔形接合法是指,在通过超声波振荡器所振荡的喇叭的前端安装楔形工具,将从引线进料器中所抽出的引线通过楔形工具的前端插入到接合处,在该状态下,经楔形工具给引线加压,同时加载超声波振动,通过这样,通过引线与接合处之间的摩擦所产生的接合面的发热,使得引线塑性变形,与接合处连接起来。
本发明中,虚设布线的连接强度的调整,能够根据将布线连接到电极上时的连接方法,通过各种形式来进行。
例如,在通过引线接合法来进行布线连接的情况下,可以根据该接合条件来调整虚设布线的连接强度。
在通过球形接合法来进行布线接合的情况下,作为接合条件,有电极以及布线的加热温度、所加载的超声波的加载时间、使引线塑性变形的超声波加载功率,下压引线的来自毛细管的荷重等。
在加热温度较高的情况下,例如,金属引线与电极互相之间的金属扩散接合变得活泼,接合情况变佳。另外,在树脂基板的情况下,由于基板的软化,使得接合性恶化。另外,接合是并用热与超声波能量的扩散现象,如果超声波的加载时间较短,接合就不充分。另外,超声波加载功率与超声波加载时间的相乘就是用于引线的塑性变形的超声波能量,具有很大作用,如果功率过大,就会使引线的变形超出必要限度,导致强度降低。另外,如果荷重不足,则在加载超声波能量时对引线的下压就会不足,从而使得接合不良(例如,特开2000-183117号公报)。另外,作为超声波接合的接合条件,有超声波加载时间、超声波加载输出、荷重(例如,特开平5-74876号公报)。
通过这样,在通过引线接合来进行布线连接的情况下,能够通过作为接合条件的加压力或超声波功率来设定虚设布线的连接强度,能够通过接合装置的电流及/或加载时间来调整上述加压力或超声波的功率。
另外,还可以通过使主电路布线的线径与虚设布线的线径不同,来使连接强度不同。图4a、图4b为说明布线线径不同的虚设布线的例子的示意图。图4a、图4b是电极3中连接有主电路布线4与虚设布线5的构成例,分别通过连接部4a、5a与电极3相连接。这里,能够通过让虚设布线5的线径与主电路布线4的线径不同,来使得连接强度不同。在通过相同的接合条件来连接线径不同的布线的情况下,由于线径的不同,例如线材的塑性变形的程度也不同,与电极之间的连接强度中产生差别。通过这样,能够将虚设布线5的连接强度设定为比主电路布线4的连接强度低。例如,如图4a所示,在将比主电路布线4的线径大的虚设布线5在与主电路布线4相同结合条件下连接到电极3上的情况下,由于虚设布线5的连接强度比主电路布线4的连接强度低,因此,虚设布线5比主电路布线4先脱落(图4b)。
另外,在图2a中所示的连接部4a、5a的长度4L、5L相等,但是也可以通过使连接部4a、5a的长度4L、5L不同来调整连接强度。即,在图2a中的虚设布线5的连接部5a的长度5L比主电路布线4的连接部4a的长度4L短的情况下,由于虚设布线5的连接强度比主电路布线4的连接强度弱,所以就形成虚设布线5比主电路布线4先剥离。
另外,主电路布线4以及虚设布线5能够通过软钎焊连接在电极3上,同样,还能够通过让软钎焊条件不同来使得连接强度不同。作为软钎焊条件,例如有软钎焊面积或软钎焊长度。
另外,功率半导体模块1中,主电路布线4与虚设布线5所连接的电极3既可以是同一个电极,又可以是不同的电极。在是不同的电极的情况下,最好让虚设布线5在功率半导体模块1内,与温度变化和主电路布线4相同的环境下的电极相连接。
接下来,对照图5~图7,对检测出虚设布线的连接状态,对虚设布线从电极上脱落进行检测的电路构成例进行说明。
图5为用来说明检测电路的一个构成例的示意图。图5中,功率半导体模块1中,功率半导体芯片2的电极3与主电路布线4以及虚设布线5相连接。
检测出该虚设布线5的连接状态的检测电路6,可以由阻抗6a以及光电耦合器6b构成。电阻6a的一端与电源Vcc相连接,另一端与虚设布线5的一端相连接。通过这样,在虚设布线5与电极3相连接的情况下,电阻6a的两端产生给定电压。另外,在虚设布线5从电极3上脱落的情况下,电阻6a的两端不产生电压。光电耦合器6b通过检测出该电阻6a的两端电压,来输出寿命检测信号。
本发明的马达驱动装置,可以根据检测电路6所输出的寿命检测信号来进行通知。通知可以是表示功率半导体模块1的寿命将至的信息,或敦促进行功率半导体模块1的更换的信息,可以通过声音、文字、图像、灯显示等来进行。
另外,通过图5的构成,即使在虚设布线5脱落之前主电路布线4就从电极3上脱落了的情况下,也能够检测出主电路布线4发生了脱落。
图6~图8为说明检测电路的另一个构成例的示意图,为具有多个虚设布线的构成例。
图6中,功率半导体模块1中,功率半导体芯片2的电极3中连接有主电路布线4以及2根虚设布线5A、5B。
检测出该虚设布线5A、5B的连接状态的检测电路6,可以由电阻6a以及光电耦合器6b构成。电阻6a的一端与电源Vcc相连接,另一端与虚设布线5B的一端相连接,另外,虚设布线5A的一端与光电耦合器6b相连接。
通过这样,在虚设布线5A、5B与电极3相连接的情况下,电阻6a的两端产生给定电压。另一方面,在虚设布线5A从电极3上脱落的情况下,光电耦合器6b无法检测出电压。另外,在虚设布线5B从电极3上脱落的情况下,电阻6a的两端不产生电压。光电耦合器6b通过检测出该电阻6a的两端电压或通电,来输出寿命检测信号。
另外,图7中,功率半导体模块1中,功率半导体芯片2的电极3中连接有主电路布线4以及2根虚设布线5A、5B。
检测出该虚设布线5A、5B的连接状态的检测电路6,可以由电阻6A、6B以及光电耦合器6b构成。电阻6A的一端与电源Vcc相连接,另一端与虚设布线5A的一端相连接。另外,电阻6B的一端与电源Vcc相连接,另一端与虚设布线5B的一端相连接。在虚设布线5A、5B与电极3相连接的情况下,电阻6A、6B的两端产生给定电压。另外,在虚设布线5A从电极3上脱落的情况下,电阻6A的两端不产生电压,在虚设布线5B从电极3上脱落的情况下,电阻6B的两端不产生电压。光电耦合器6b通过检测出该电阻6A、6B的两端电压,来输出寿命检测信号。
另外,图8为用来详细说明图7中的检测电路6的电路图。光电耦合器6b具有2组光电耦合部。分别通过电阻6A、6B的两端电压驱动,各个输出OUT1、OUT2经OR电路输出寿命检测信号。
通过检测电路6所检测出的寿命检测信号被发送给马达驱动装置,能够预知功率半导体模块1的主电路布线4的脱落,进行报警显示等。通过该报警显示,能够在功率半导体模块1的主电路布线4的脱落引起动作不良的产生之前,更换或修理功率半导体模块1。
本发明的技术并不仅限于马达驱动装置,还能够适用于使用功率半导体模块1接收供电的电力机器。
以上通过典型的实施方式对本发明进行了说明,本领域技术人员能够不脱离本发明的范围以及构思,而进行上述的变更以及各种其他变更、省略、追加。

Claims (6)

1.一种马达驱动装置,具有安装有功率半导体芯片(2)的模块(1),其特征在于:
功率半导体芯片(2),具有与该功率半导体芯片(2)的电极(3)相连接的主电路布线(4)以及虚设布线(5);
由上述功率半导体芯片模块(1),来进行用来驱动马达的整流动作及/或开关动作;
上述主电路布线(4)以及上述虚设布线(5)通过软钎焊连接在电极(3)上;
通过使上述主电路布线(4)的软钎焊条件与上述虚设布线(5)的软钎焊条件不同,来使得虚设布线(5)的连接强度与主电路布线(4)的连接强度不同;
上述软钎焊条件是软钎焊面积或软钎焊长度;
上述虚设布线(5)的连接强度,比上述主电路布线(4)的连接强度低。
2.如权利要求1所述的马达驱动装置,其特征在于:
具有检测出上述虚设布线(5)与上述电极(3)之间的连接状态的检测装置(6)。
3.如权利要求2所述的马达驱动装置,其特征在于:
上述检测装置(6),经光电耦合器(6b)输出检测信号。
4.如权利要求2所述的马达驱动装置,其特征在于:
根据上述检测装置的检测信号来输出通知信息。
5.一种马达驱动装置,具有安装有功率半导体芯片(2)的模块(1),其特征在于:
功率半导体芯片(2),具有与该功率半导体芯片(2)的电极(3)相连接的主电路布线(4)以及虚设布线(5);
由上述功率半导体芯片模块(1),来进行用来驱动马达的整流动作及/或开关动作;
上述主电路布线(4)以及上述虚设布线(5)通过引线结合法连接在电极(3)上;
通过让上述主电路布线(4)的接合条件与上述虚设布线(5)的接合条件不同,来使得虚设布线(5)的连接强度与主电路布线(4)的连接强度不同;
上述接合条件,是加载给主电路布线(4)与虚设布线(5)的压力及/或加载给主电路布线(4)与虚设布线(5)的超声波功率;
上述虚设布线(5)的连接强度,比上述主电路布线(4)的连接强度低。
6.如权利要求1或权利要求5所述的马达驱动装置,其特征在于:
具有相同的连接强度或不同的连接强度的多根虚设布线(5A、5B)。
CNB2005100588103A 2004-03-29 2005-03-28 具有功率半导体模块寿命检测功能的马达驱动装置 Expired - Fee Related CN100364072C (zh)

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