ATE309884T1 - Oberflächenbearbeitungsverfahren und oberflächenbearbeitungsvorrichtung für halbleiterscheiben - Google Patents

Oberflächenbearbeitungsverfahren und oberflächenbearbeitungsvorrichtung für halbleiterscheiben

Info

Publication number
ATE309884T1
ATE309884T1 AT99108151T AT99108151T ATE309884T1 AT E309884 T1 ATE309884 T1 AT E309884T1 AT 99108151 T AT99108151 T AT 99108151T AT 99108151 T AT99108151 T AT 99108151T AT E309884 T1 ATE309884 T1 AT E309884T1
Authority
AT
Austria
Prior art keywords
surface processing
wafer
transfer device
suction
processing device
Prior art date
Application number
AT99108151T
Other languages
English (en)
Inventor
Toshihiko Ishikawa
Yasushi Katagiri
Original Assignee
Tokyo Seimitsu Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP11001318A external-priority patent/JP3117132B2/ja
Priority claimed from JP325199A external-priority patent/JP3259251B2/ja
Application filed by Tokyo Seimitsu Co Ltd filed Critical Tokyo Seimitsu Co Ltd
Application granted granted Critical
Publication of ATE309884T1 publication Critical patent/ATE309884T1/de

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/34Accessories
    • B24B37/345Feeding, loading or unloading work specially adapted to lapping
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B41/00Component parts such as frames, beds, carriages, headstocks
    • B24B41/005Feeding or manipulating devices specially adapted to grinding machines
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6838Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Grinding Of Cylindrical And Plane Surfaces (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
AT99108151T 1998-04-27 1999-04-26 Oberflächenbearbeitungsverfahren und oberflächenbearbeitungsvorrichtung für halbleiterscheiben ATE309884T1 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP11733398 1998-04-27
JP11733798 1998-04-27
JP11001318A JP3117132B2 (ja) 1998-04-27 1999-01-06 ウェーハの平面加工装置
JP325199A JP3259251B2 (ja) 1998-04-27 1999-01-08 ウェーハの平面加工装置及びその平面加工方法

Publications (1)

Publication Number Publication Date
ATE309884T1 true ATE309884T1 (de) 2005-12-15

Family

ID=27453377

Family Applications (1)

Application Number Title Priority Date Filing Date
AT99108151T ATE309884T1 (de) 1998-04-27 1999-04-26 Oberflächenbearbeitungsverfahren und oberflächenbearbeitungsvorrichtung für halbleiterscheiben

Country Status (4)

Country Link
US (2) US6257966B1 (de)
EP (1) EP0953409B1 (de)
AT (1) ATE309884T1 (de)
DE (1) DE69928319T2 (de)

Families Citing this family (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3702668B2 (ja) * 1998-09-28 2005-10-05 株式会社村田製作所 電子部品チップ供給装置
US6406359B1 (en) * 1999-06-01 2002-06-18 Applied Materials, Inc. Apparatus for transferring semiconductor substrates using an input module
EP1080840A3 (de) * 1999-08-30 2004-01-02 Mitsubishi Materials Corporation Polierverfahren und Vorrichtung und Verfahren zum Abrichten eines Polierkissen
JP2001077057A (ja) * 1999-09-06 2001-03-23 Disco Abrasive Syst Ltd Csp基板分割装置
JP2001213367A (ja) * 2000-02-04 2001-08-07 Fukashi Uragami 負圧調整機構を備えた吸い込み装置
US6413145B1 (en) * 2000-04-05 2002-07-02 Applied Materials, Inc. System for polishing and cleaning substrates
US6488565B1 (en) * 2000-08-29 2002-12-03 Applied Materials, Inc. Apparatus for chemical mechanical planarization having nested load cups
JP3433930B2 (ja) * 2001-02-16 2003-08-04 株式会社東京精密 ウェーハの平面加工装置及びその平面加工方法
JP4617028B2 (ja) * 2001-08-17 2011-01-19 株式会社ディスコ 加工歪除去装置
JP2003197581A (ja) * 2001-10-18 2003-07-11 Fujitsu Ltd 板状物支持部材及びその使用方法
JP3892703B2 (ja) * 2001-10-19 2007-03-14 富士通株式会社 半導体基板用治具及びこれを用いた半導体装置の製造方法
FR2831148B1 (fr) * 2001-10-22 2004-01-02 Gemplus Card Int Procede et dispositif de manipulation d'un wafer
US6752703B2 (en) * 2001-12-21 2004-06-22 Lam Research Corporation Chemical mechanical polishing apparatus and methods with porous vacuum chuck and perforated carrier film
US7235139B2 (en) * 2003-10-28 2007-06-26 Veeco Instruments Inc. Wafer carrier for growing GaN wafers
US6953393B2 (en) * 2003-12-19 2005-10-11 Optodisc Technology Corporation Apparatus for removing burrs from a compact disc
US6910956B1 (en) * 2003-12-22 2005-06-28 Powerchip Semiconductor Corp. Wafer grinding apparatus
CN100351040C (zh) * 2004-03-25 2007-11-28 力晶半导体股份有限公司 晶片研磨机台
KR100753302B1 (ko) * 2004-03-25 2007-08-29 이비덴 가부시키가이샤 진공 척, 흡착판, 연마 장치 및 반도체 웨이퍼의 제조 방법
CN101115862A (zh) * 2005-02-16 2008-01-30 维高仪器股份有限公司 用于生长GaN晶片的晶片承载器
US7258599B2 (en) * 2005-09-15 2007-08-21 Fujitsu Limited Polishing machine, workpiece supporting table pad, polishing method and manufacturing method of semiconductor device
JP4580327B2 (ja) * 2005-11-21 2010-11-10 東京エレクトロン株式会社 被処理体の取り出し方法及びプログラム記憶媒体並びに載置機構
DE102007022603A1 (de) * 2007-05-12 2008-11-13 Kapp Gmbh Hartfeinbearbeitungsmaschine
DE102007041332A1 (de) * 2007-08-31 2009-03-05 Siemens Ag Transferchuck zur Übertragung, insbesondere von Wafern
JP4985513B2 (ja) * 2008-03-26 2012-07-25 富士通セミコンダクター株式会社 電子部品の剥離方法及び剥離装置
US8545290B2 (en) * 2010-12-08 2013-10-01 Edmond Arzuman Abrahamians Wafer polishing apparatus and method
US8535118B2 (en) * 2011-09-20 2013-09-17 International Business Machines Corporation Multi-spindle chemical mechanical planarization tool
JP5687647B2 (ja) * 2012-03-14 2015-03-18 株式会社東芝 半導体装置の製造方法、半導体製造装置
KR101409752B1 (ko) * 2012-04-26 2014-07-08 주식회사 탑 엔지니어링 기판 이송 로봇을 이용한 멀티 챔버 기판 처리 장치
US9142916B2 (en) 2013-03-15 2015-09-22 Tyco Electronics Corporation Connector assembly with receptacle carriers
CN104227705A (zh) * 2014-08-20 2014-12-24 苏州昌飞自动化设备厂 一种带三坐标微调的升降吸盘机械手
CN104227704A (zh) * 2014-08-20 2014-12-24 苏州昌飞自动化设备厂 一种带三坐标微调的升降吸盘机械手的y轴微调座
US9748090B2 (en) 2015-01-22 2017-08-29 Toshiba Memory Corporation Semiconductor manufacturing apparatus and manufacturing method of semiconductor device
JP6503194B2 (ja) * 2015-02-16 2019-04-17 株式会社Screenホールディングス 基板処理装置
KR102541489B1 (ko) * 2016-02-26 2023-06-08 삼성전자주식회사 기판 세정 장치 및 이를 이용한 기판 세정 설비
WO2018068854A1 (en) * 2016-10-13 2018-04-19 Osram Opto Semiconductors Gmbh Pick-up tool
CN109352492A (zh) * 2018-12-12 2019-02-19 徐锐 一种多工位3d海绵打磨机
CN110919526A (zh) * 2019-11-24 2020-03-27 湖南凯通电子有限公司 陶瓷基板研磨机
US20210323117A1 (en) * 2020-04-16 2021-10-21 Applied Materials, Inc. High throughput polishing modules and modular polishing systems
US20220134505A1 (en) * 2020-11-05 2022-05-05 Applied Materials, Inc. Horizontal buffing module
KR20230117437A (ko) 2020-12-18 2023-08-08 어플라이드 머티어리얼스, 인코포레이티드 수평 사전 세정 모듈을 위한 패드 캐리어
EP4377047A1 (de) * 2021-07-28 2024-06-05 Applied Materials, Inc. Poliermodule mit hohem durchsatz und modulare poliersysteme
CN114260217A (zh) * 2021-12-13 2022-04-01 上海提牛机电设备有限公司 晶圆清洗系统
CN114850113B (zh) * 2022-04-26 2024-01-09 中环领先半导体材料有限公司 一种减薄载台的清洗方法

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4141180A (en) * 1977-09-21 1979-02-27 Kayex Corporation Polishing apparatus
JPS58182234A (ja) * 1982-04-17 1983-10-25 Dainippon Screen Mfg Co Ltd 複数種のブラシ使用可能な洗浄装置
JPS60155358A (ja) * 1984-01-23 1985-08-15 Disco Abrasive Sys Ltd 半導体ウエ−ハの表面を研削する方法及び装置
US4680893A (en) * 1985-09-23 1987-07-21 Motorola, Inc. Apparatus for polishing semiconductor wafers
US4638601A (en) * 1985-11-04 1987-01-27 Silicon Technology Corporation Automatic edge grinder
JPS63106139A (ja) 1986-06-23 1988-05-11 Toyoda Mach Works Ltd 4輪駆動車
JP2511994B2 (ja) 1987-08-04 1996-07-03 曙ブレーキ工業株式会社 デイスクブレ−キ用間隙自動調整装置
JPH02131892A (ja) 1988-11-05 1990-05-21 Sharp Corp 部品保持装置
US5189843A (en) * 1990-08-30 1993-03-02 Silicon Technology Corporation Wafer slicing and grinding machine and a method of slicing and grinding wafers
JP3121886B2 (ja) 1991-11-29 2001-01-09 京セラ株式会社 真空吸着装置
JPH0615565A (ja) * 1991-12-18 1994-01-25 Shin Etsu Handotai Co Ltd ウエーハ自動ラッピング装置
DE4213492C1 (de) * 1992-04-24 1993-11-11 Deutsche Aerospace Airbus Spannvorrichtung für Werkstücke
JP2513426B2 (ja) * 1993-09-20 1996-07-03 日本電気株式会社 ウェ―ハ研磨装置
JPH07211677A (ja) * 1993-11-30 1995-08-11 M Setetsuku Kk 基板のスクラビング方法とその装置
US5421595A (en) * 1994-03-28 1995-06-06 Motorola, Inc. Vacuum chuck with venturi jet for converting positive pressure to a vacuum
US5649854A (en) * 1994-05-04 1997-07-22 Gill, Jr.; Gerald L. Polishing apparatus with indexing wafer processing stations
KR0132274B1 (ko) 1994-05-16 1998-04-11 김광호 웨이퍼 연마 설비
US5674115A (en) * 1994-07-06 1997-10-07 Sony Corporation Apparatus for grinding a master disc
US5679060A (en) * 1994-07-14 1997-10-21 Silicon Technology Corporation Wafer grinding machine
JPH0855896A (ja) 1994-08-11 1996-02-27 Disco Abrasive Syst Ltd ウェーハ搬送手段
JPH08148450A (ja) 1994-11-21 1996-06-07 Shibayama Kikai Kk 半導体ウエハのシリコンスラッジ洗浄方法
JP2616735B2 (ja) * 1995-01-25 1997-06-04 日本電気株式会社 ウェハの研磨方法およびその装置
JP3111892B2 (ja) * 1996-03-19 2000-11-27 ヤマハ株式会社 研磨装置
JPH09254027A (ja) * 1996-03-25 1997-09-30 Chiyoda Kk 研磨用マウンテン材
JPH10193260A (ja) * 1996-12-27 1998-07-28 Shin Etsu Handotai Co Ltd ウエーハ保持治具
US6074288A (en) * 1997-10-30 2000-06-13 Lsi Logic Corporation Modified carrier films to produce more uniformly polished substrate surfaces
US5944588A (en) * 1998-06-25 1999-08-31 International Business Machines Corporation Chemical mechanical polisher

Also Published As

Publication number Publication date
US6517420B2 (en) 2003-02-11
DE69928319D1 (de) 2005-12-22
EP0953409B1 (de) 2005-11-16
EP0953409A2 (de) 1999-11-03
US20010024936A1 (en) 2001-09-27
EP0953409A3 (de) 2002-01-09
DE69928319T2 (de) 2006-04-20
US6257966B1 (en) 2001-07-10

Similar Documents

Publication Publication Date Title
ATE309884T1 (de) Oberflächenbearbeitungsverfahren und oberflächenbearbeitungsvorrichtung für halbleiterscheiben
TW338015B (en) Improved method and apparatus for chemical mechanical polishing
DE69512971D1 (de) Linear Poliergerät und Wafer Planarisierungsverfahren
EP1055486A3 (de) Abrichtvorrichtung und Poliervorrichtung
EP0958889A3 (de) Verfahren und Vorrichtung zum Abfasen einer Halbleiterplatte
EP1389505A3 (de) Poliergerät.
EP0776030A3 (de) Vorrichtung und Verfahren zur beidseitigen Polierung einer Halbleiterscheibe
ATE228915T1 (de) Halbleiterscheiben-polierkopf
WO2001069660A3 (en) Method and apparatus for supporting a substrate
WO2002001613A3 (en) Method and apparatus for wafer cleaning
ATE392709T1 (de) Verfahren und vorrichtung zur reinigung von einem einzigem substrat
GB0027626D0 (en) Treatment of substrates
MY140551A (en) System for processing electronic devices
SG73498A1 (en) Wafer processing apparatus and method wafer convey robot semiconductor substrate fabrication method and semiconductor fabrication apparatus
JP3325650B2 (ja) ウェーハの研磨方法
WO2003022523A1 (fr) Outil, dispositif et procede de finissage, dispositif de traitement et procede de production de dispositif a semiconducteurs
SG100709A1 (en) Semiconductor wafer assembly and machining apparatus having chuck tables for holding the same
SG148017A1 (en) Transport method and transport apparatus for semiconductor wafer
TW376352B (en) Wafer polishing apparatus having measurement device and polishing method thereby
TW375551B (en) Polishing apparatus for semiconductor wafer
GB2375883A (en) A method and apparatus for implanting semiconductor wafer substrates
EP1050369A3 (de) Verfahren und Vorrichtung zum Polieren von Werkstücken
SG97161A1 (en) Polishing method and polishing apparatus
TW200420380A (en) Polishing method
EP0911114A3 (de) Poliervorrichtung

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties