YU43009B - Power mosfet device with anode area - Google Patents

Power mosfet device with anode area

Info

Publication number
YU43009B
YU43009B YU774/81A YU77481A YU43009B YU 43009 B YU43009 B YU 43009B YU 774/81 A YU774/81 A YU 774/81A YU 77481 A YU77481 A YU 77481A YU 43009 B YU43009 B YU 43009B
Authority
YU
Yugoslavia
Prior art keywords
power mosfet
mosfet device
anode area
anode
area
Prior art date
Application number
YU774/81A
Other languages
English (en)
Other versions
YU77481A (en
Inventor
H W Becke
C F Wheatley
Original Assignee
Rca Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=22460824&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=YU43009(B) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Rca Corp filed Critical Rca Corp
Publication of YU77481A publication Critical patent/YU77481A/xx
Publication of YU43009B publication Critical patent/YU43009B/xx

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70—Bipolar devices
    • H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
    • H01L29/739—Transistor-type devices, i.e. able to continuously respond to applied control signals controlled by field-effect, e.g. bipolar static induction transistors [BSIT]
    • H01L29/7393—Insulated gate bipolar mode transistors, i.e. IGBT; IGT; COMFET
    • H01L29/7395—Vertical transistors, e.g. vertical IGBT
    • H01L29/7396—Vertical transistors, e.g. vertical IGBT with a non planar surface, e.g. with a non planar gate or with a trench or recess or pillar in the surface of the emitter, base or collector region for improving current density or short circuiting the emitter and base regions
    • H01L29/7397—Vertical transistors, e.g. vertical IGBT with a non planar surface, e.g. with a non planar gate or with a trench or recess or pillar in the surface of the emitter, base or collector region for improving current density or short circuiting the emitter and base regions and a gate structure lying on a slanted or vertical surface or formed in a groove, e.g. trench gate IGBT
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/1095—Body region, i.e. base region, of DMOS transistors or IGBTs
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70—Bipolar devices
    • H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
    • H01L29/739—Transistor-type devices, i.e. able to continuously respond to applied control signals controlled by field-effect, e.g. bipolar static induction transistors [BSIT]
    • H01L29/7393—Insulated gate bipolar mode transistors, i.e. IGBT; IGT; COMFET
    • H01L29/7395—Vertical transistors, e.g. vertical IGBT

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Thyristors (AREA)
YU774/81A 1980-03-25 1981-03-24 Power mosfet device with anode area YU43009B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/133,902 US4364073A (en) 1980-03-25 1980-03-25 Power MOSFET with an anode region

Publications (2)

Publication Number Publication Date
YU77481A YU77481A (en) 1983-06-30
YU43009B true YU43009B (en) 1989-02-28

Family

ID=22460824

Family Applications (1)

Application Number Title Priority Date Filing Date
YU774/81A YU43009B (en) 1980-03-25 1981-03-24 Power mosfet device with anode area

Country Status (9)

Country Link
US (1) US4364073A (de)
JP (1) JPS56150870A (de)
DE (1) DE3110230C3 (de)
FR (1) FR2479567B1 (de)
GB (1) GB2072422B (de)
IT (1) IT1194027B (de)
PL (1) PL137347B1 (de)
SE (1) SE456292B (de)
YU (1) YU43009B (de)

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Also Published As

Publication number Publication date
GB2072422A (en) 1981-09-30
IT1194027B (it) 1988-08-31
PL137347B1 (en) 1986-05-31
SE8101263L (sv) 1981-09-26
SE456292B (sv) 1988-09-19
FR2479567A1 (fr) 1981-10-02
JPS56150870A (en) 1981-11-21
YU77481A (en) 1983-06-30
DE3110230C3 (de) 1998-07-09
JPS6150397B2 (de) 1986-11-04
GB2072422B (en) 1984-05-16
PL230318A1 (de) 1982-01-04
FR2479567B1 (fr) 1986-04-18
DE3110230A1 (de) 1982-01-14
DE3110230C2 (de) 1992-12-24
IT8120225A0 (it) 1981-03-09
US4364073A (en) 1982-12-14

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