WO2011071146A1 - 積層型セラミックコンデンサ - Google Patents
積層型セラミックコンデンサ Download PDFInfo
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- WO2011071146A1 WO2011071146A1 PCT/JP2010/072218 JP2010072218W WO2011071146A1 WO 2011071146 A1 WO2011071146 A1 WO 2011071146A1 JP 2010072218 W JP2010072218 W JP 2010072218W WO 2011071146 A1 WO2011071146 A1 WO 2011071146A1
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- WIPO (PCT)
- Prior art keywords
- ceramic
- sintered body
- internal electrodes
- ceramic sintered
- electrodes
- Prior art date
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- 239000003985 ceramic capacitor Substances 0.000 title claims abstract description 31
- 239000000919 ceramic Substances 0.000 claims abstract description 96
- 230000035939 shock Effects 0.000 abstract description 9
- 238000005336 cracking Methods 0.000 abstract description 2
- 238000010030 laminating Methods 0.000 abstract description 2
- 238000000034 method Methods 0.000 description 13
- 239000004020 conductor Substances 0.000 description 11
- 238000010304 firing Methods 0.000 description 6
- 239000003990 capacitor Substances 0.000 description 5
- 150000001875 compounds Chemical class 0.000 description 5
- 229910010293 ceramic material Inorganic materials 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 229910000679 solder Inorganic materials 0.000 description 3
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 238000005452 bending Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000032798 delamination Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000007654 immersion Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000007650 screen-printing Methods 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 230000007847 structural defect Effects 0.000 description 2
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 1
- 229910002367 SrTiO Inorganic materials 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 229910052783 alkali metal Inorganic materials 0.000 description 1
- 150000001340 alkali metals Chemical class 0.000 description 1
- 229910052784 alkaline earth metal Inorganic materials 0.000 description 1
- 150000001342 alkaline earth metals Chemical class 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000005385 borate glass Substances 0.000 description 1
- 239000005388 borosilicate glass Substances 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 238000007756 gravure coating Methods 0.000 description 1
- 238000007646 gravure printing Methods 0.000 description 1
- 230000002706 hydrostatic effect Effects 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 239000005365 phosphate glass Substances 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- -1 rare earth compound Chemical class 0.000 description 1
- 229910052761 rare earth metal Inorganic materials 0.000 description 1
- 239000005368 silicate glass Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/30—Stacked capacitors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/005—Electrodes
- H01G4/012—Form of non-self-supporting electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/08—Inorganic dielectrics
- H01G4/12—Ceramic dielectrics
Definitions
- the present invention relates to a multilayer ceramic capacitor.
- the present invention is a laminate comprising a ceramic sintered body and a plurality of first and second internal electrodes provided alternately inside the ceramic sintered body so as to face each other via a ceramic layer.
- Type ceramic capacitor is a laminate comprising a ceramic sintered body and a plurality of first and second internal electrodes provided alternately inside the ceramic sintered body so as to face each other via a ceramic layer.
- multilayer ceramic capacitors are frequently used in electronic devices such as mobile phones and laptop computers.
- the capacitance of a multilayer ceramic capacitor is proportional to the relative dielectric constant of the dielectric layer, the opposing area of the internal electrodes, the number of stacked internal electrodes, and inversely proportional to the thickness of the dielectric layer. For this reason, in order to obtain a large capacitance within the determined dimensions, it is necessary to increase the number of laminated internal electrodes and reduce the thickness of the dielectric layer, but structural defects such as cracks and delamination during firing are required. There is a problem that it is easy to invite. In response to this, for example, the following Patent Document 1 proposes various means that can prevent structural defects such as cracks and delamination during firing even if the ceramic green sheet and internal electrodes are made thin and highly laminated. .
- a multilayer ceramic capacitor having a thin ceramic layer and a large number of stacked layers has a problem that cracks are likely to occur due to thermal shock applied during soldering.
- the present invention has been made in view of the above points, and an object of the present invention is to provide a multilayer ceramic capacitor that is small in size and large in capacity and is less susceptible to cracking due to thermal shock.
- the multilayer ceramic capacitor according to the present invention includes a rectangular parallelepiped ceramic sintered body and first and second internal electrodes.
- the ceramic sintered body includes a plurality of laminated ceramic layers.
- the ceramic sintered body includes first and second main surfaces extending along a length direction and a width direction perpendicular to the length direction, a thickness direction perpendicular to both the length and width directions, and the length direction. And first and second side surfaces extending along the width and thickness directions.
- the first and second internal electrodes are alternately provided inside the ceramic sintered body so as to face each other in the third direction via the ceramic layer.
- the number of ceramic layers provided between the first internal electrode and the second internal electrode is 232 or more.
- the ceramic sintered body is located on both sides of the inner layer portion where the first and second internal electrodes face each other and the inner layer portion in the thickness direction when viewed from the thickness direction, and the first and second internal electrodes. These include an outer layer portion in which none of these are provided, and a side gap portion that is located on both sides of the inner layer portion in the width direction and in which neither of the first and second inner electrodes is provided.
- the volume ratio occupied by the first and second internal electrodes in the ceramic sintered body is 0.37 or more.
- the dimension of the side gap in the width direction is 40 ⁇ m or less.
- the number N of ceramic layers provided between the first internal electrode and the second internal electrode is 232 or more.
- the multilayer ceramic capacitor according to the present invention has a high number of ceramic layers and is small in size and high in performance.
- the volume ratio occupied by the first and second internal electrodes in the ceramic sintered body is 0.37 or more.
- the dimension of the side gap part in the width direction is 40 micrometers or less. For this reason, cracks are unlikely to occur in the multilayer ceramic capacitor according to the present invention.
- FIG. 1 is a schematic perspective view of a ceramic capacitor according to an embodiment of the present invention.
- FIG. 2 is a schematic cross-sectional view taken along line II-II in FIG.
- FIG. 3 is a schematic cross-sectional view taken along line III-III in FIG. 4 is a schematic cross-sectional view taken along line IV-IV in FIG.
- FIG. 5 is a schematic plan view of a ceramic green sheet on which a conductor pattern is printed.
- FIG. 6 is a schematic perspective view of a ceramic member.
- FIG. 7 is a schematic perspective view showing a process of forming a ceramic layer on both side surfaces.
- a ceramic capacitor 1 shown in FIG. 1 will be described as another example of a preferred embodiment of the present invention.
- the ceramic capacitor of the present invention is not limited to the ceramic capacitor 1 at all.
- FIG. 1 is a schematic perspective view of a ceramic capacitor according to an embodiment of the present invention.
- FIG. 2 is a schematic cross-sectional view taken along line II-II in FIG.
- FIG. 3 is a schematic cross-sectional view taken along line III-III in FIG. 4 is a schematic cross-sectional view taken along line IV-IV in FIG.
- the ceramic capacitor 1 of the present embodiment includes a rectangular parallelepiped ceramic sintered body 10.
- the ceramic sintered body 10 includes first and second main surfaces 10a and 10b, first and second side surfaces 10c and 10d, and first and second end surfaces 10e and 10f.
- the first and second main surfaces 10a and 10b extend along the length direction L and the width direction W.
- the first and second side surfaces 10c and 10d extend along the length direction L and the thickness direction T.
- the first and second end faces 10e, 10f extend along the width direction W and the thickness direction T.
- the “cuboid” includes those in which at least a part of a corner portion or a ridge line portion is chamfered or rounded.
- the ceramic sintered body 10 includes a plurality of ceramic layers 15.
- the number N of ceramic layers provided between the first internal electrode 11 and the second internal electrode 12 is 232 or more.
- the ceramic layer 15 is made of a ceramic material.
- the ceramic material includes a firing aid such as Si or a glass component in addition to the ceramic.
- a firing aid such as Si or a glass component in addition to the ceramic.
- the glass component as the firing aid include silicate glass, borate glass, borosilicate glass, and phosphate glass containing an alkali metal component and an alkaline earth metal component.
- the ceramic material mainly contained in the ceramic material include dielectric ceramics.
- the dielectric ceramic include BaTiO 3 , CaTiO 3 , SrTiO 3 , and CaZrO 3 .
- subcomponents such as a Mn compound, a Fe compound, a Mg compound, a Co compound, a Ni compound, and a rare earth compound may be appropriately added to the dielectric ceramic.
- a plurality of first and second internal electrodes 11 and 12 are provided inside the ceramic sintered body 10.
- the plurality of first and second internal electrodes 11 and 12 are alternately arranged so as to face each other with the ceramic layer 15 in the thickness direction T.
- Each of the first and second internal electrodes 11 and 12 is provided in parallel to the first and second main surfaces 10a and 10b.
- the planar shape of each of the first and second internal electrodes 11 and 12 is a rectangle.
- the first internal electrode 11 is exposed at the first end face 10e, while the second end face 10f, the first and second side faces 10c, 10d, and the first and second main faces 10a, 10b Not exposed.
- the second inner electrode 12 is exposed at the second end face 10f, while the first end face 10f, the first and second side faces 10c, 10d, and the first and second main faces 10a, 10b. Is not exposed.
- the first external electrode 13 is provided on the first end face 10e.
- the first external electrode 13 is connected to the first internal electrode 11.
- a second external electrode 14 is provided on the second end face 10f.
- the second external electrode 14 is connected to the second internal electrode 12.
- the material for forming the first and second internal electrodes 11 and 12 and the first and second external electrodes 13 and 14 is not particularly limited as long as it is a conductive material.
- the first and second internal electrodes 11 and 12 and the first and second external electrodes 13 and 14 are made of, for example, metals such as Ag, Au, Pt, Pd, Ni, Cr, and Cu, It can form with the alloy containing 1 or more types of these.
- the first and second internal electrodes 11 and 12 and the first and second external electrodes 13 and 14 may be formed of a laminate of a plurality of conductive films.
- the ceramic sintered body 10 includes first and second outer layer portions 10A and 10B, first and second side gap portions 10C and 10D, and an inner layer portion 10E. Is provided.
- the first and second outer layer portions 10 ⁇ / b> A and 10 ⁇ / b> B are provided at both end portions in the thickness direction T of the ceramic sintered body 10.
- the inner layer portion 10E is a portion excluding the first and second outer layer portions 10A and 10B and the first and second side gap portions 10C and 10D of the ceramic sintered body 10.
- the ceramic sintered body 10 is provided in a region excluding both end portions in the width direction W and both end portions in the thickness direction T.
- the inner layer portion 10E only the portion where the first and second internal electrodes 11, 12 are opposed to each other in the thickness direction T and the first or second internal electrodes 11, 12 when viewed from the thickness direction T. Are provided.
- the dimensions of the side gap portions 10C and 10D in the width direction W are 40 ⁇ m or less.
- the number N of the ceramic layers 15 provided between the first and second internal electrodes 11 and 12 is 232 or more. In such a multilayer ceramic capacitor, cracks are likely to occur due to thermal shock applied during soldering.
- the volume ratio of the first and second internal electrodes 11 and 12 in the ceramic sintered body 10 is set to 0.37 or more. For this reason, the ratio for which the metal component (a metal and an alloy are included) in the ceramic sintered compact 10 is high. Therefore, high mechanical strength can be realized. That is, according to the present embodiment, it is possible to achieve both the small size and the high performance and the high mechanical strength such as the bending strength and the bending strength.
- each of the outer layer portions 10A and 10B is preferably small.
- the dimensions of the side gap portions 10C and 10D in the width direction are 40 ⁇ m or less. For this reason, cracks are unlikely to occur in the multilayer ceramic capacitor 1. The reason for this is not clear, but when a thermal shock is applied to the multilayer ceramic capacitor 1, the inner layer portion 10E in which the ratio of the internal electrodes 11 and 12 is relatively high tends to thermally expand in the thickness direction T.
- the side gap portions 10C and 10D disposed in the upper portion of the inner gap portion 10E do not attempt to resist the thermal expansion of the inner layer portion 10E and follow flexibly. This is considered to be because the difference in distortion between the inner layer portion 10E and the side gap portions 10C and 10D is reduced.
- the ceramic green sheet 20 shown in FIG. 5 is formed.
- the method for forming the ceramic green sheet 20 is not particularly limited.
- the conductor pattern 21 is for forming the first and second internal electrodes 11 and 12.
- the method for forming the conductor pattern 21 is not particularly limited.
- the conductor pattern 21 can be formed by, for example, a screen printing method, an ink jet method, a gravure printing method, or the like.
- the ceramic green sheets 20 on which the conductor pattern 21 is formed are alternately shifted to one side and the other side in the x direction. Laminate multiple sheets. Further, a plurality of ceramic green sheets 20 on which the conductor pattern 21 is not formed are laminated thereon to complete the laminate.
- the ceramic green sheet 20 that is laminated at the beginning and at the end and on which the conductor pattern 21 is not formed is for forming the first and second outer layer portions 10A and 10B.
- the obtained laminate is pressed in the lamination direction z by a hydrostatic pressure press method or the like.
- a plurality of rectangular parallelepiped ceramic members 23 shown in FIG. 6 are formed by cutting the pressed laminate along a virtual cut line L shown in FIG. Note that the laminated body can be cut by dicing or pressing. Moreover, you may cut
- ceramic layers 24 and 25 are formed on the end faces 23e and 23f of the ceramic member 23 so as to cover the end faces 23e and 23f.
- the ceramic layers 24 and 25 are for forming the first and second side gap portions 10C and 10D.
- the formation method of the ceramic layers 24 and 25 is not particularly limited, and can be performed by a printing method such as a screen printing method, a coating method such as an inkjet method or a gravure coating method, a spraying method, or the like.
- the ceramic member 23 on which the ceramic layers 24 and 25 are formed is sintered. Thereby, the ceramic sintered body 10 is completed.
- first and second external electrodes 13 and 14 are formed to complete the ceramic capacitor 1 shown in FIGS.
- the formation method of the 1st and 2nd external electrodes 13 and 14 is not specifically limited.
- the first and second external electrodes 13 and 14 may be formed, for example, by baking after applying a conductive paste. In that case, a conductive paste may be applied before firing the ceramic member 23, and the first and second external electrodes 13, 14 may be formed simultaneously with firing.
- the first and second inner electrodes 11, 12 are parallel to the first and second side surfaces 10c, 10d, and the first inner electrode 11 is drawn out to the first main surface 10a.
- the example in which the second internal electrode 12 is drawn out to the second main surface 10b has been described.
- the arrangement of the first and second internal electrodes is not particularly limited as long as the gap layer is formed in the ceramic sintered body.
- first and second internal electrodes may be formed in parallel to the first and second main surfaces or the first and second end surfaces.
- the length, width, and thickness of the ceramic sintered body were measured with an optical microscope (MEASURESCOPE MM-10 manufactured by Nikon Corporation) with a magnification of 50 times and an accuracy of ⁇ 0.00. Measured at 01 mm.
- the thickness of the ceramic layer and the thickness of the internal electrode were measured with a scanning electron microscope (JSM-5800, manufactured by JEOL Ltd.) with an acceleration voltage of 20 kV, a magnification of 15000 times, and an accuracy of ⁇ 0.01 ⁇ m.
- Other dimensions were measured with an optical microscope at a magnification of 500 times and an accuracy of ⁇ 0.001 mm.
- the distance from the tip of the internal electrode to the external electrode was measured at the center in the width direction of the capacitor.
- the dimension of the side gap part was measured at the central part in the length direction.
- the thickness of the outer layer portion, the thickness of the ceramic layer, and the thickness of the internal electrode were measured at the center in plan view.
- the internal electrode coverage was measured as follows. That is, the capacitor was polished to leave only the portion of the inner layer portion where the first and second internal electrodes face each other in the thickness direction T. The portion was polished until the thickness was halved to expose the internal electrode. Next, the internal electrode was peeled off by dipping in an aqueous potassium hydroxide solution. Next, the central part of the peeled internal electrode was photographed using an optical microscope and binarized to obtain the coverage by obtaining the ratio of the part with the electrode.
- the volume occupied by the internal electrode in the ceramic sintered body is (the length of the ceramic sintered body ⁇ the length of the end gap portion) ⁇ (the width of the ceramic sintered body ⁇ the width of the side gap portion ⁇ 2) ⁇ the thickness of the internal electrode.
- X number of laminated ceramic layers + 1) x Coverage of internal electrodes.
- the end gap portion is a portion of the inner layer portion where the first and second internal electrodes are not opposed in the thickness direction.
- the length of the end gap portion is a dimension along the length direction of the end gap portion.
- the width of the side gap part is a dimension in the width direction of the side gap part.
- the volume of the ceramic sintered body is the length of the ceramic sintered body ⁇ (the width of the ceramic sintered body ⁇ the width of the side gap portion ⁇ 2) ⁇ the number of laminated ceramic layers + the length of the ceramic sintered body ⁇ the ceramic sintered body.
- the width of the body ⁇ the thickness of the outer layer portion ⁇ 2 + the width of the side gap portion ⁇ (the thickness of the ceramic sintered body ⁇ the thickness of the outer layer portion ⁇ 2) ⁇ 2.
- the volume ratio occupied by the first and second internal electrodes 11 and 12 in the ceramic sintered body 10 is 0.37 or more, and the dimensions of the side gap portions 10C and 10D are 40 ⁇ m or less. When it is, it turns out that a crack is hard to produce and heat shock tolerance is high.
- Ceramic capacitor 10 Ceramic sintered body 10A, 10B ... outer layer 10C, 10D ... Gap 10E ... inner layer 10G ... 1st part 10a ... 1st main surface 10b ... 2nd main surface 10c ... 1st side 10d ... 2nd side 10e ... first end face 10f ... second end face 11: First internal electrode 12 ... Second internal electrode 13: First external electrode 14 ... Second external electrode 20 ... Ceramic green sheet 21 ... Conductor pattern 22 ... Laminate 23. Ceramic member 23e, 23f ... End face of the ceramic member 24, 25 ... Ceramic layer
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- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Ceramic Capacitors (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
Description
上記実施形態に係るセラミックコンデンサ1を、同一の材料で下記表1~3に示す条件で、各条件につき300個ずつサンプルを作製した。
・はんだ温度:室温+275℃
・はんだへの浸漬速度:40±5mm/秒
・浸漬時間:3秒
・試験サンプル数:300個
10…セラミック焼結体
10A,10B…外層部
10C,10D…ギャップ部
10E…内層部
10G…第1の部分
10a…第1の主面
10b…第2の主面
10c…第1の側面
10d…第2の側面
10e…第1の端面
10f…第2の端面
11…第1の内部電極
12…第2の内部電極
13…第1の外部電極
14…第2の外部電極
20…セラミックグリーンシート
21…導体パターン
22…積層体
23…セラミック部材
23e、23f…セラミック部材の端面
24,25…セラミック層
Claims (1)
-
積層された複数のセラミック層を含み、長さ方向と、前記長さ方向に垂直な幅方向とに沿って延びる第1及び第2の主面と、前記長さ方向及び幅方向の両方に垂直な厚み方向と前記長さ方向とに沿って延びる第1及び第2の側面と、前記幅方向及び厚み方向に沿って延びる第1及び第2の端面とを有する直方体状のセラミック焼結体と、
前記セラミック焼結体の内部に、前記セラミック層を介して、前記厚み方向において互いに対向するように交互に設けられている第1及び第2の内部電極とを備え、
前記セラミック層のうち、前記第1の内部電極と前記第2の内部電極との間に設けられているセラミック層の層数Nが232以上である積層型セラミックコンデンサであって、
前記セラミック焼結体は、
前記厚み方向から視た際に、前記第1及び第2の内部電極が対向している内層部と、
前記厚み方向における前記内層部の両側に位置し、前記第1及び第2の内部電極のいずれもが設けられていない外層部と、
前記幅方向における前記内層部の両側に位置し、前記第1及び第2の内部電極のいずれもが設けられていないサイドギャップ部とを含み、
前記セラミック焼結体における前記第1及び第2の内部電極の占める体積割合が、0.37以上であり、
前記幅方向における各サイドギャップ部の寸法が40μm以下である、積層型セラミックコンデンサ。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
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CN201080055237.XA CN102652342B (zh) | 2009-12-11 | 2010-12-10 | 层叠型陶瓷电容器 |
KR1020127014680A KR101400262B1 (ko) | 2009-12-11 | 2010-12-10 | 적층형 세라믹 콘덴서 |
US13/491,626 US9082556B2 (en) | 2009-12-11 | 2012-06-08 | Monolithic ceramic capacitor |
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JP2009281684 | 2009-12-11 | ||
JP2009-281684 | 2009-12-11 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
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US13/491,626 Continuation US9082556B2 (en) | 2009-12-11 | 2012-06-08 | Monolithic ceramic capacitor |
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WO2011071146A1 true WO2011071146A1 (ja) | 2011-06-16 |
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PCT/JP2010/072218 WO2011071146A1 (ja) | 2009-12-11 | 2010-12-10 | 積層型セラミックコンデンサ |
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US (1) | US9082556B2 (ja) |
KR (1) | KR101400262B1 (ja) |
CN (1) | CN102652342B (ja) |
WO (1) | WO2011071146A1 (ja) |
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Publication number | Priority date | Publication date | Assignee | Title |
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US20120229950A1 (en) * | 2011-03-09 | 2012-09-13 | Samsung Electro-Mechanics Co., Ltd. | Multilayer ceramic capacitor and method of manufacturing the same |
US20140185185A1 (en) * | 2012-12-28 | 2014-07-03 | Murata Manufacturing Co., Ltd. | Method for manufacturing ceramic electronic component, and ceramic electronic component |
JP2016187023A (ja) * | 2015-03-27 | 2016-10-27 | Tdk株式会社 | 積層セラミック電子部品 |
JP2016201567A (ja) * | 2016-08-02 | 2016-12-01 | 太陽誘電株式会社 | 積層コンデンサ及びその製造方法 |
JP2017118083A (ja) * | 2015-03-30 | 2017-06-29 | 太陽誘電株式会社 | 積層セラミックコンデンサ |
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KR101452058B1 (ko) * | 2012-12-06 | 2014-10-22 | 삼성전기주식회사 | 적층 세라믹 전자부품 |
JP2015053502A (ja) * | 2014-10-23 | 2015-03-19 | 株式会社村田製作所 | 積層セラミックコンデンサ |
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CN102652342A (zh) | 2012-08-29 |
US20120250217A1 (en) | 2012-10-04 |
KR101400262B1 (ko) | 2014-05-27 |
KR20120082029A (ko) | 2012-07-20 |
CN102652342B (zh) | 2016-08-03 |
US9082556B2 (en) | 2015-07-14 |
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