WO2009041619A1 - ポジ型感光性樹脂組成物及びそれを用いた硬化膜形成方法 - Google Patents

ポジ型感光性樹脂組成物及びそれを用いた硬化膜形成方法 Download PDF

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Publication number
WO2009041619A1
WO2009041619A1 PCT/JP2008/067496 JP2008067496W WO2009041619A1 WO 2009041619 A1 WO2009041619 A1 WO 2009041619A1 JP 2008067496 W JP2008067496 W JP 2008067496W WO 2009041619 A1 WO2009041619 A1 WO 2009041619A1
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WO
WIPO (PCT)
Prior art keywords
positive
resin composition
cured film
photosensitive resin
type photosensitive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/067496
Other languages
English (en)
French (fr)
Japanese (ja)
Inventor
Satoshi Takita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Corp
Original Assignee
Fujifilm Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujifilm Corp filed Critical Fujifilm Corp
Priority to CN2008801088385A priority Critical patent/CN101809503B/zh
Priority to EP08833502A priority patent/EP2196852A4/en
Priority to US12/680,273 priority patent/US9034440B2/en
Publication of WO2009041619A1 publication Critical patent/WO2009041619A1/ja
Anticipated expiration legal-status Critical
Priority to US14/684,812 priority patent/US9964848B2/en
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20—Exposure; Apparatus therefor
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26—Processing photosensitive materials; Apparatus therefor
    • G03F7/40—Treatment after imagewise removal, e.g. baking
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26—Processing photosensitive materials; Apparatus therefor
    • G03F7/40—Treatment after imagewise removal, e.g. baking
    • G03F7/405—Treatment with inorganic or organometallic reagents after imagewise removal
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P76/00—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography
    • H10P76/20—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising organic materials
    • H10P76/204—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising organic materials of organic photoresist masks
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P76/00—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography
    • H10P76/20—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising organic materials
    • H10P76/204—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising organic materials of organic photoresist masks
    • H10P76/2041—Photolithographic processes
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B32—LAYERED PRODUCTS
    • B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2457/00—Electrical equipment
    • B32B2457/20—Displays, e.g. liquid crystal displays, plasma displays
    • B32B2457/202—LCD, i.e. liquid crystal displays
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B32—LAYERED PRODUCTS
    • B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2457/00—Electrical equipment
    • B32B2457/20—Displays, e.g. liquid crystal displays, plasma displays
    • B32B2457/206—Organic displays, e.g. OLED
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K2323/00—Functional layers of liquid crystal optical display excluding electroactive liquid crystal layer characterised by chemical composition
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00—Stock material or miscellaneous articles
    • Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
    • Y10T428/24802—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Organic Chemistry (AREA)
  • Materials For Photolithography (AREA)
  • Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
  • Electroluminescent Light Sources (AREA)
  • Liquid Crystal (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
PCT/JP2008/067496 2007-09-28 2008-09-26 ポジ型感光性樹脂組成物及びそれを用いた硬化膜形成方法 Ceased WO2009041619A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
CN2008801088385A CN101809503B (zh) 2007-09-28 2008-09-26 正型感光性树脂组合物、以及使用该组合物形成固化膜的方法
EP08833502A EP2196852A4 (en) 2007-09-28 2008-09-26 POSITIVE LIGHT-SENSITIVE RESIN COMPOSITION AND METHOD FOR FORMING A CURED FILM USING THIS
US12/680,273 US9034440B2 (en) 2007-09-28 2008-09-26 Positive photosensitive resin composition and cured film forming method using the same
US14/684,812 US9964848B2 (en) 2007-09-28 2015-04-13 Positive photosensitive resin composition and cured film forming method using the same

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2007256203 2007-09-28
JP2007-256203 2007-09-28
JP2008-246883 2008-09-25
JP2008246883A JP4637221B2 (ja) 2007-09-28 2008-09-25 ポジ型感光性樹脂組成物及びそれを用いた硬化膜形成方法

Related Child Applications (2)

Application Number Title Priority Date Filing Date
US12/680,273 A-371-Of-International US9034440B2 (en) 2007-09-28 2008-09-26 Positive photosensitive resin composition and cured film forming method using the same
US14/684,812 Continuation US9964848B2 (en) 2007-09-28 2015-04-13 Positive photosensitive resin composition and cured film forming method using the same

Publications (1)

Publication Number Publication Date
WO2009041619A1 true WO2009041619A1 (ja) 2009-04-02

Family

ID=40511499

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/067496 Ceased WO2009041619A1 (ja) 2007-09-28 2008-09-26 ポジ型感光性樹脂組成物及びそれを用いた硬化膜形成方法

Country Status (7)

Country Link
US (2) US9034440B2 (https=)
EP (1) EP2196852A4 (https=)
JP (1) JP4637221B2 (https=)
KR (1) KR101021187B1 (https=)
CN (1) CN101809503B (https=)
TW (1) TWI345137B (https=)
WO (1) WO2009041619A1 (https=)

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009119878A1 (ja) * 2008-03-28 2009-10-01 富士フイルム株式会社 ポジ型感光性樹脂組成物及びそれを用いた硬化膜形成方法
JP2009258723A (ja) * 2008-03-28 2009-11-05 Fujifilm Corp ポジ型感光性樹脂組成物及びそれを用いた硬化膜形成方法
WO2010007993A1 (ja) * 2008-07-15 2010-01-21 Jsr株式会社 ポジ型感放射線性組成物及びレジストパターン形成方法
WO2010010899A1 (ja) * 2008-07-24 2010-01-28 富士フイルム株式会社 ポジ型感光性樹脂組成物及びそれを用いた硬化膜形成方法
JP2010282177A (ja) * 2009-05-01 2010-12-16 Fujifilm Corp ポジ型感光性樹脂組成物及びそれを用いた硬化膜形成方法
CN102043335A (zh) * 2009-10-16 2011-05-04 富士胶片株式会社 感光性树脂组合物、固化膜、固化膜的形成方法、有机el显示装置以及液晶显示装置
WO2011086997A1 (ja) * 2010-01-15 2011-07-21 富士フイルム株式会社 感光性樹脂組成物、硬化膜の形成方法、硬化膜、有機ｅｌ表示装置、及び、液晶表示装置
CN102213918A (zh) * 2010-04-01 2011-10-12 Jsr株式会社 正型放射线敏感性组合物、层间绝缘膜及其形成方法
CN102221781A (zh) * 2010-04-14 2011-10-19 Jsr株式会社 正型放射线敏感性组合物、层间绝缘膜及其形成方法
CN102221782A (zh) * 2010-04-15 2011-10-19 Jsr株式会社 正型放射线敏感性组合物、层间绝缘膜及其形成方法
WO2011136073A1 (ja) * 2010-04-28 2011-11-03 Jsr株式会社 ポジ型感放射線性組成物、表示素子用層間絶縁膜及びその形成方法
CN102243386A (zh) * 2010-05-14 2011-11-16 Jsr株式会社 液晶显示元件、正型放射线敏感性组合物、液晶显示元件用层间绝缘膜及其形成方法
JP2012230134A (ja) * 2011-04-22 2012-11-22 Jsr Corp 感放射線性樹脂組成物、表示素子用層間絶縁膜及びその形成方法
WO2025204201A1 (ja) * 2024-03-29 2025-10-02 三井化学Ictマテリア株式会社 表面保護用組成物および表面保護膜

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JP4637209B2 (ja) 2007-06-05 2011-02-23 富士フイルム株式会社 ポジ型感光性樹脂組成物及びそれを用いた硬化膜形成方法
JP5452102B2 (ja) * 2009-07-02 2014-03-26 東京応化工業株式会社 レジスト組成物及びレジストパターン形成方法
JP5520590B2 (ja) * 2009-10-06 2014-06-11 富士フイルム株式会社 パターン形成方法、化学増幅型レジスト組成物及びレジスト膜
JP5451570B2 (ja) * 2009-10-16 2014-03-26 富士フイルム株式会社 感光性樹脂組成物、硬化膜の形成方法、硬化膜、有機ｅｌ表示装置、及び、液晶表示装置
JP5425031B2 (ja) * 2009-10-16 2014-02-26 富士フイルム株式会社 感光性樹脂組成物、硬化膜の形成方法、硬化膜、有機ｅｌ表示装置、及び、液晶表示装置
JP5451569B2 (ja) * 2009-10-16 2014-03-26 富士フイルム株式会社 感光性樹脂組成物、硬化膜、硬化膜の形成方法、有機ｅｌ表示装置、及び、液晶表示装置
KR101618897B1 (ko) * 2010-01-20 2016-05-09 후지필름 가부시키가이샤 경화막의 제조 방법, 감광성 수지 조성물, 경화 막, 유기 ｅｌ 표시 장치, 및 액정 표시 장치
JP5528314B2 (ja) * 2010-01-20 2014-06-25 富士フイルム株式会社 硬化膜の製造方法、感光性樹脂組成物、硬化膜、有機ｅｌ表示装置、及び、液晶表示装置
CN102741752B (zh) * 2010-02-02 2014-08-20 日产化学工业株式会社 正型感光性树脂组合物和拒液性被膜
WO2011136074A1 (ja) * 2010-04-27 2011-11-03 Jsr株式会社 ポジ型感放射線性組成物、表示素子用層間絶縁膜及びその形成方法
JP5703819B2 (ja) * 2010-05-14 2015-04-22 Jsr株式会社 液晶表示素子、ポジ型感放射線性組成物、液晶表示素子用層間絶縁膜及びその形成方法
JP5771377B2 (ja) * 2010-10-05 2015-08-26 株式会社ジャパンディスプレイ 表示装置の製造方法
JP5536625B2 (ja) * 2010-12-15 2014-07-02 富士フイルム株式会社 感光性樹脂組成物、硬化膜の形成方法、硬化膜、有機ｅｌ表示装置、及び、液晶表示装置
JP5510347B2 (ja) * 2011-01-26 2014-06-04 Ｊｓｒ株式会社 ポジ型感放射線性組成物、層間絶縁膜及びその形成方法
KR101909072B1 (ko) * 2011-08-31 2018-10-18 후지필름 가부시키가이샤 감광성 수지 조성물, 경화막, 경화막의 형성 방법, 유기 ｅｌ 표시 장치, 및, 액정 표시 장치
JP5433654B2 (ja) * 2011-08-31 2014-03-05 富士フイルム株式会社 感光性樹脂組成物、硬化膜、硬化膜の形成方法、有機ｅｌ表示装置、及び、液晶表示装置
JP5686708B2 (ja) * 2011-09-16 2015-03-18 富士フイルム株式会社 ポジ型感光性樹脂組成物、硬化膜の形成方法、硬化膜、有機ｅｌ表示装置、及び、液晶表示装置
KR20150003158A (ko) * 2012-04-09 2015-01-08 아사히 가라스 가부시키가이샤 미세 패턴을 표면에 갖는 물품의 제조 방법
JP5889704B2 (ja) 2012-04-18 2016-03-22 株式会社ジャパンディスプレイ 液晶表示装置の製造方法
JP5871706B2 (ja) * 2012-04-27 2016-03-01 富士フイルム株式会社 化学増幅型ポジ型感光性樹脂組成物および層間絶縁膜
CN102981291B (zh) 2012-12-04 2015-06-17 深圳市华星光电技术有限公司 断线修补方法和断线修补结构
WO2015033880A1 (ja) * 2013-09-04 2015-03-12 富士フイルム株式会社 樹脂組成物、硬化膜の製造方法、硬化膜、液晶表示装置および有機ｅｌ表示装置
US20180090720A1 (en) * 2016-09-27 2018-03-29 Universal Display Corporation Flexible OLED Display Module
JP6841233B2 (ja) * 2016-09-30 2021-03-10 東レ株式会社 感光性樹脂組成物、導電性パターンの製造方法、基板、タッチパネル及びディスプレイ
WO2018069274A1 (en) * 2016-10-12 2018-04-19 Az Electronic Materials (Luxembourg) S.A.R.L. Chemically amplified positive photoresist composition and pattern forming method using same
TWI796410B (zh) * 2018-12-25 2023-03-21 奇美實業股份有限公司 化學增幅型正型感光性樹脂組成物及其應用

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